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Francis Ho - Publications

Affiliations: 
1988-1996 Physics Caltech, Stanford 
Area:
Atomic Force Microscopy, Ultrafast Measurement
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4 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
1998 Ho F. Analysis and optimization of force sensitivity in atomic force microscopy using optical and electrical detection Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 16: 43. DOI: 10.1116/1.589827  0.377
1996 Ho F, Hou AS, Nechay BA, Bloom DM. Ultrafast voltage-contrast scanning probe microscopy Nanotechnology. 7: 385-389. DOI: 10.1088/0957-4484/7/4/014  0.507
1996 Hou AS, Nechay BA, Ho F, Bloom DM. Scanning probe microscopy for testing ultrafast electronic devices Optical and Quantum Electronics. 28: 819-841. DOI: 10.1007/Bf00820151  0.556
1995 Nechay BA, Ho F, Hou AS, Bloom DM. Applications of an atomic force microscope voltage probe with ultrafast time resolution Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 13: 1369-1374. DOI: 10.1116/1.587855  0.508
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