| Year |
Citation |
Score |
| 2020 |
El-Ghazaly A, Gorchon J, Wilson RB, Pattabi A, Bokor J. Progress towards ultrafast spintronics applications Journal of Magnetism and Magnetic Materials. 502: 166478. DOI: 10.1016/J.Jmmm.2020.166478 |
0.349 |
|
| 2019 |
Pitner G, Hills G, Llinas JP, Persson KM, Park RS, Bokor J, Mitra S, Wong HP. Low-Temperature Side-Contact to Carbon Nanotube Transistors: Resistance Distributions Down to 10 nm Contact Length. Nano Letters. PMID 30677297 DOI: 10.1021/Acs.Nanolett.8B04370 |
0.318 |
|
| 2019 |
Navarrete B, Stone M, Wang P, Guduru R, Luongo K, Hadjikhani A, Toledo D, Emirov Y, Arkook B, Liang P, Hong J, Bokor J, Khizroev S. Nanomagnetic Particle-Based Information Processing Ieee Transactions On Nanotechnology. 18: 983-988. DOI: 10.1109/Tnano.2019.2939009 |
0.329 |
|
| 2019 |
El-Ghazaly A, Tran B, Ceballos A, Lambert C, Pattabi A, Salahuddin S, Hellman F, Bokor J. Ultrafast magnetization switching in nanoscale magnetic dots Applied Physics Letters. 114: 232407. DOI: 10.1063/1.5098453 |
0.337 |
|
| 2018 |
Lo Conte R, Xiao Z, Chen C, Stan CV, Gorchon J, El-Ghazaly A, Nowakowski ME, Sohn H, Pattabi A, Scholl A, Tamura N, Sepulveda A, Carman GP, Candler RN, Bokor J. Influence of Non-Uniform Micron-Scale Strain Distributions on the Electrical Reorientation of Magnetic Micro-Structures in a Composite Multiferroic Heterostructure. Nano Letters. PMID 29481758 DOI: 10.1021/Acs.Nanolett.7B05342 |
0.318 |
|
| 2018 |
Hong J, Stone M, Navarrete B, Luongo K, Zheng Q, Yuan Z, Xia K, Xu N, Bokor J, You L, Khizroev S. 3D multilevel spin transfer torque devices Applied Physics Letters. 112: 112402. DOI: 10.1063/1.5021336 |
0.324 |
|
| 2017 |
Yang Y, Wilson RB, Gorchon J, Lambert CH, Salahuddin S, Bokor J. Ultrafast magnetization reversal by picosecond electrical pulses. Science Advances. 3: e1603117. PMID 29119135 DOI: 10.1126/Sciadv.1603117 |
0.323 |
|
| 2017 |
Llinas JP, Fairbrother A, Borin Barin G, Shi W, Lee K, Wu S, Yong Choi B, Braganza R, Lear J, Kau N, Choi W, Chen C, Pedramrazi Z, Dumslaff T, Narita A, ... ... Bokor J, et al. Short-channel field-effect transistors with 9-atom and 13-atom wide graphene nanoribbons. Nature Communications. 8: 633. PMID 28935943 DOI: 10.1038/S41467-017-00734-X |
0.305 |
|
| 2017 |
Gorchon J, Lambert C, Yang Y, Pattabi A, Wilson RB, Salahuddin S, Bokor J. Single shot ultrafast all optical magnetization switching of ferromagnetic Co/Pt multilayers Applied Physics Letters. 111: 042401. DOI: 10.1063/1.4994802 |
0.323 |
|
| 2016 |
Desai SB, Madhvapathy SR, Sachid AB, Llinas JP, Wang Q, Ahn GH, Pitner G, Kim MJ, Bokor J, Hu C, Wong HP, Javey A. MoS2 transistors with 1-nanometer gate lengths. Science (New York, N.Y.). 354: 99-102. PMID 27846499 DOI: 10.1126/Science.Aah4698 |
0.349 |
|
| 2016 |
Hong J, Lambson B, Dhuey S, Bokor J. Experimental test of Landauer's principle in single-bit operations on nanomagnetic memory bits. Science Advances. 2: e1501492. PMID 26998519 DOI: 10.1126/Sciadv.1501492 |
0.764 |
|
| 2016 |
Hong J, Hadjikhani A, Stone M, Allen FI, Safonov V, Liang P, Bokor J, Khizroev S. The Physics of Spin-Transfer Torque Switching in Magnetic Tunneling Junctions in Sub-10 nm Size Range Ieee Transactions On Magnetics. 52. DOI: 10.1109/Tmag.2016.2530622 |
0.347 |
|
| 2016 |
Kang Y, Bokor J, Stojanovic V. Design Requirements for a Spintronic MTJ Logic Device for Pipelined Logic Applications Ieee Transactions On Electron Devices. DOI: 10.1109/Ted.2016.2527046 |
0.316 |
|
| 2016 |
Gorchon J, Yang Y, Bokor J. Model for multishot all-thermal all-optical switching in ferromagnets Physical Review B. 94: 20409. DOI: 10.1103/Physrevb.94.020409 |
0.306 |
|
| 2015 |
Gu Z, Nowakowski ME, Carlton DB, Storz R, Im MY, Hong J, Chao W, Lambson B, Bennett P, Alam MT, Marcus MA, Doran A, Young A, Scholl A, Fischer P, ... Bokor J, et al. Sub-nanosecond signal propagation in anisotropy-engineered nanomagnetic logic chains. Nature Communications. 6: 6466. PMID 25774621 DOI: 10.1038/Ncomms7466 |
0.777 |
|
| 2015 |
Pattabi A, Gu Z, Gorchon J, Yang Y, Finley J, Lee OJ, Raziq HA, Salahuddin S, Bokor J. Direct optical detection of current induced spin accumulation in metals by magnetization-induced second harmonic generation Applied Physics Letters. 107. DOI: 10.1063/1.4933094 |
0.487 |
|
| 2015 |
Gu Z, Storz R, Marcus M, Doran A, Young A, Scholl A, Chao W, Carlton D, Lambson B, Nowakowski M, Bokor J. Time-resolved photo-emission electron microscopy of nanomagnetic logic chains Springer Proceedings in Physics. 159: 281-283. DOI: 10.1007/978-3-319-07743-7_87 |
0.376 |
|
| 2014 |
Schmidt AR, Henry E, Lo CC, Wang YT, Li H, Greenman L, Namaan O, Schenkel T, Whaley KB, Bokor J, Yablonovitch E, Siddiqi I. A prototype silicon double quantum dot with dispersive microwave readout Journal of Applied Physics. 116. DOI: 10.1063/1.4890835 |
0.554 |
|
| 2014 |
Lo CC, Simmons S, Lo Nardo R, Weis CD, Tyryshkin AM, Meijer J, Rogalla D, Lyon SA, Bokor J, Schenkel T, Morton JJL. Stark shift and field ionization of arsenic donors in 28Si- silicon-on-insulator structures Applied Physics Letters. 104. DOI: 10.1063/1.4876175 |
0.572 |
|
| 2013 |
Lo CC, Weis CD, van Tol J, Bokor J, Schenkel T. All-electrical nuclear spin polarization of donors in silicon. Physical Review Letters. 110: 057601. PMID 23414045 DOI: 10.1103/Physrevlett.110.057601 |
0.561 |
|
| 2013 |
Choi SJ, Bennett P, Takei K, Wang C, Lo CC, Javey A, Bokor J. Short-channel transistors constructed with solution-processed carbon nanotubes. Acs Nano. 7: 798-803. PMID 23259742 DOI: 10.1021/Nn305277D |
0.503 |
|
| 2013 |
Choi SJ, Bennett P, Takei K, Wang C, Lo CC, Javey A, Bokor J. Short-channel transistors constructed with solution-processed carbon nanotubes. Acs Nano. 7: 798-803. PMID 23259742 DOI: 10.1021/Nn305277D |
0.503 |
|
| 2013 |
Schenkel T, Lo CC, Weis CD, Bokor J, Tyryshkin AM, Lyonc SA. A spin quantum bit architecture with coupled donors and quantum dots in silicon Single-Atom Nanoelectronics. 255-279. DOI: 10.4032/9789814316699 |
0.463 |
|
| 2013 |
Lo CC, Weis CD, Van Tol J, Bokor J, Schenkel T, Morton JJL. Spins in silicon MOSFETs: Electron spin relaxation and hyperpolarization of nuclear spins Proceedings of Spie - the International Society For Optical Engineering. 8813. DOI: 10.1117/12.2023595 |
0.552 |
|
| 2013 |
Lo CC, Weis CD, Van Tol J, Bokor J, Schenkel T. All-electrical nuclear spin polarization of donors in silicon Physical Review Letters. 110. DOI: 10.1103/PhysRevLett.110.057601 |
0.472 |
|
| 2013 |
Bennett PB, Pedramrazi Z, Madani A, Chen YC, De Oteyza DG, Chen C, Fischer FR, Crommie MF, Bokor J. Bottom-up graphene nanoribbon field-effect transistors Applied Physics Letters. 103. DOI: 10.1063/1.4855116 |
0.306 |
|
| 2013 |
Lambson B, Gu Z, Monroe M, Dhuey S, Scholl A, Bokor J. Concave nanomagnets: Investigation of anisotropy properties and applications to nanomagnetic logic Applied Physics a: Materials Science and Processing. 111: 413-421. DOI: 10.1007/S00339-013-7654-Y |
0.772 |
|
| 2012 |
Carlton D, Lambson B, Gu Z, Dhuey S, Gao L, Hughes B, Olynick D, Rettner C, Scholl A, Youngblood B, Young A, Krivorotov I, Parkin S, Bokor J. Signal propagation in dipole coupled nanomagnets for logic applications Proceedings of Spie - the International Society For Optical Engineering. 8461. DOI: 10.1117/12.930776 |
0.779 |
|
| 2012 |
Carlton D, Lambson B, Scholl A, Young A, Ashby P, Dhuey S, Bokor J. Investigation of defects and errors in nanomagnetic logic circuits Ieee Transactions On Nanotechnology. 11: 760-762. DOI: 10.1109/Tnano.2012.2196445 |
0.767 |
|
| 2012 |
Lambson B, Gu Z, Bokor J, Carlton D, Dhuey S. Error immunity techniques for nanomagnetic logic Technical Digest - International Electron Devices Meeting, Iedm. 11.5.1-11.5.4. DOI: 10.1109/IEDM.2012.6479025 |
0.346 |
|
| 2012 |
Weis CD, Lo CC, Lang V, Tyryshkin AM, George RE, Yu KM, Bokor J, Lyon SA, Morton JJL, Schenkel T. Electrical activation and electron spin resonance measurements of implanted bismuth in isotopically enriched silicon-28 Applied Physics Letters. 100. DOI: 10.1063/1.4704561 |
0.545 |
|
| 2012 |
Lambson B, Gu Z, Carlton D, Dhuey S, Scholl A, Doran A, Young A, Bokor J. Cascade-like signal propagation in chains of concave nanomagnets Applied Physics Letters. 100. DOI: 10.1063/1.3703591 |
0.773 |
|
| 2012 |
Lo CC, Bradbury FR, Tyryshkin AM, Weis CD, Bokor J, Schenkel T, Lyon SA. Suppression of microwave rectification effects in electrically detected magnetic resonance measurements Applied Physics Letters. 100. DOI: 10.1063/1.3684247 |
0.58 |
|
| 2012 |
Choo H, Kim MK, Staffaroni M, Seok TJ, Bokor J, Cabrini S, Schuck PJ, Wu MC, Yablonovitch E. Nanofocusing in a metal-insulator-metal gap plasmon waveguide with a three-dimensional linear taper Nature Photonics. 6: 838-844. DOI: 10.1038/Nphoton.2012.277 |
0.335 |
|
| 2012 |
Martínez MT, Tseng YC, González M, Bokor J. Streptavidin as CNTs and DNA linker for the specific electronic and optical detection of DNA hybridization Journal of Physical Chemistry C. 116: 22579-22586. DOI: 10.1021/Jp306535D |
0.493 |
|
| 2011 |
Lambson B, Carlton D, Bokor J. Exploring the thermodynamic limits of computation in integrated systems: magnetic memory, nanomagnetic logic, and the Landauer limit. Physical Review Letters. 107: 010604. PMID 21797532 DOI: 10.1103/Physrevlett.107.010604 |
0.77 |
|
| 2011 |
Lo CC, Lang V, George RE, Morton JJ, Tyryshkin AM, Lyon SA, Bokor J, Schenkel T. Electrically detected magnetic resonance of neutral donors interacting with a two-dimensional electron gas. Physical Review Letters. 106: 207601. PMID 21668263 DOI: 10.1103/Physrevlett.106.207601 |
0.552 |
|
| 2011 |
Lang V, Lo CC, George RE, Lyon SA, Bokor J, Schenkel T, Ardavan A, Morton JJ. Electrically detected magnetic resonance in a W-band microwave cavity. The Review of Scientific Instruments. 82: 034704. PMID 21456773 DOI: 10.1063/1.3557395 |
0.563 |
|
| 2011 |
Weber-Bargioni A, Schwartzberg A, Cornaglia M, Ismach A, Urban JJ, Pang Y, Gordon R, Bokor J, Salmeron MB, Ogletree DF, Ashby P, Cabrini S, Schuck PJ. Hyperspectral nanoscale imaging on dielectric substrates with coaxial optical antenna scan probes. Nano Letters. 11: 1201-7. PMID 21261258 DOI: 10.1364/Ntm.2011.Nma5 |
0.304 |
|
| 2011 |
Carlton DB, Lambson B, Scholl A, Young AT, Dhuey SD, Ashby PD, Tuchfeld E, Bokor J. Computing in thermal equilibrium with dipole-coupled nanomagnets Ieee Transactions On Nanotechnology. 10: 1401-1404. DOI: 10.1109/Tnano.2011.2152851 |
0.772 |
|
| 2011 |
Liu Z, Brandt R, Yahagi Y, Hansen B, Harteneck B, Bokor J, Hawkins AR, Schmidt H. Detecting single nanomagnet dynamics beyond the diffraction limit in varying magnetostatic environments Applied Physics Letters. 98. DOI: 10.1063/1.3549302 |
0.319 |
|
| 2010 |
MartÃnez MT, Tseng YC, Salvador JP, Marco MP, Ormategui N, Loinaz I, Bokor J. Electronic anabolic steroid recognition with carbon nanotube field-effect transistors. Acs Nano. 4: 1473-80. PMID 20146439 DOI: 10.1021/Nn901547B |
0.505 |
|
| 2010 |
Tseng YC, Bokor J. Characterization of the junction capacitance of metal-semiconductor carbon nanotube Schottky contacts Applied Physics Letters. 96. DOI: 10.1063/1.3277182 |
0.514 |
|
| 2009 |
Garnett EC, Tseng YC, Khanal DR, Wu J, Bokor J, Yang P. Dopant profiling and surface analysis of silicon nanowires using capacitance-voltage measurements. Nature Nanotechnology. 4: 311-4. PMID 19421217 DOI: 10.1038/Nnano.2009.43 |
0.555 |
|
| 2009 |
Ford AC, Ho JC, Chueh YL, Tseng YC, Fan Z, Guo J, Bokor J, Javey A. Diameter-dependent electron mobility of InAs nanowires. Nano Letters. 9: 360-5. PMID 19143505 DOI: 10.1021/Nl803154M |
0.539 |
|
| 2009 |
Martinez MT, Tseng YC, Ormategui N, Loinaz I, Eritja R, Bokor J. Label-free DNA biosensors based on functionalized carbon nanotube field effect transistors. Nano Letters. 9: 530-6. PMID 19125575 DOI: 10.1021/Nl8025604 |
0.488 |
|
| 2009 |
De Sousa R, Lo CC, Bokor J. Spin-dependent scattering in a silicon transistor Physical Review B - Condensed Matter and Materials Physics. 80. DOI: 10.1103/Physrevb.80.045320 |
0.551 |
|
| 2009 |
Lo CC, Persaud A, Dhuey S, Olynick D, Borondics F, Martin MC, Bechtel HA, Bokor J, Schenkel T. Device fabrication and transport measurements of FinFETs built with 28Si SOI wafers toward donor qubits in silicon Semiconductor Science and Technology. 24. DOI: 10.1088/0268-1242/24/10/105022 |
0.568 |
|
| 2009 |
Schenkel T, Lo CC, Weis CD, Schuh A, Persaud A, Bokor J. Critical issues in the formation of quantum computer test structures by ion implantation Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 267: 2563-2566. DOI: 10.1016/J.Nimb.2009.05.061 |
0.537 |
|
| 2009 |
Weis CD, Schuh A, Batra A, Persaud A, Rangelow IW, Bokor J, Lo CC, Cabrini S, Olynick D, Duhey S, Schenkel T. Mapping of ion beam induced current changes in FinFETs Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 267: 1222-1225. DOI: 10.1016/J.Nimb.2009.01.019 |
0.541 |
|
| 2008 |
Carlton DB, Emley NC, Tuchfeld E, Bokor J. Simulation studies of nanomagnet-based logic architecture. Nano Letters. 8: 4173-8. PMID 19053798 DOI: 10.1021/Nl801607P |
0.313 |
|
| 2008 |
Weis CD, Schuh A, Batra A, Persaud A, Rangelow IW, Bokor J, Lo CC, Cabrini S, Sideras-Haddad E, Fuchs GD, Hanson R, Awschalom DD, Schenkel T. Single atom doping for quantum device development in diamond and silicon Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 26: 2596-2600. DOI: 10.1116/1.2968614 |
0.554 |
|
| 2008 |
Lo CC, Bokor J, Schenkel T, He J, Tyryshkin AM, Lyon SA. Spin-dependent scattering off neutral antimony donors in Si28 field-effect transistors (Applied Physics Letters (2007) 91 (242106)) Applied Physics Letters. 92. DOI: 10.1063/1.2890086 |
0.539 |
|
| 2007 |
Paulo AS, Arellano N, Plaza JA, He R, Carraro C, Maboudian R, Howe RT, Bokor J, Yang P. Suspended mechanical structures based on elastic silicon nanowire arrays. Nano Letters. 7: 1100-4. PMID 17375964 DOI: 10.1021/Nl062877N |
0.766 |
|
| 2007 |
Wang Y, Bokor J. Ultra-high-resolution monolithic thermal bubble inkjet print head Journal of Micro/Nanolithography, Mems, and Moems. 6. DOI: 10.1117/1.2816449 |
0.319 |
|
| 2007 |
Lo CC, Bokor J, Schenkel T, Tyryshkin AM, Lyon SA. Spin-dependent scattering off neutral antimony donors in Si28 field-effect transistors Applied Physics Letters. 91: 242106. DOI: 10.1063/1.2817966 |
0.555 |
|
| 2007 |
Batra A, Weis CD, Reijonen J, Persaud A, Schenkel T, Cabrini S, Lo CC, Bokor J. Detection of low energy single ion impacts in micron scale transistors at room temperature Applied Physics Letters. 91. DOI: 10.1063/1.2805634 |
0.568 |
|
| 2007 |
Wang S, Barman A, Schmidt H, Maas JD, Hawkins AR, Kwon S, Harteneck B, Cabrini S, Bokor J. Optimization of nano-magneto-optic sensitivity using dual dielectric layer enhancement Applied Physics Letters. 90. DOI: 10.1063/1.2750389 |
0.305 |
|
| 2007 |
Barman A, Wang S, Maas J, Hawkins AR, Kwon S, Bokor J, Liddle A, Schmidt H. Size dependent damping in picosecond dynamics of single nanomagnets Applied Physics Letters. 90. DOI: 10.1063/1.2740588 |
0.337 |
|
| 2007 |
San Paulo A, Quevy E, Black J, Howe RT, White R, Bokor J. Mode shape imaging of out-of-plane and in-plane vibrating RF micromechanical resonators by atomic force microscopy Microelectronic Engineering. 84: 1354-1357. DOI: 10.1016/J.Mee.2007.01.223 |
0.498 |
|
| 2006 |
Barman A, Wang S, Maas JD, Hawkins AR, Kwon S, Liddle A, Bokor J, Schmidt H. Magneto-optical observation of picosecond dynamics of single nanomagnets. Nano Letters. 6: 2939-44. PMID 17163735 DOI: 10.1021/Nl0623457 |
0.326 |
|
| 2006 |
Bradbury FR, Tyryshkin AM, Sabouret G, Bokor J, Schenkel T, Lyon SA. Stark tuning of donor electron spins in silicon. Physical Review Letters. 97: 176404. PMID 17155489 DOI: 10.1103/Physrevlett.97.176404 |
0.306 |
|
| 2006 |
Tseng YC, Phoa K, Carlton D, Bokor J. Effect of diameter variation in a large set of carbon nanotube transistors. Nano Letters. 6: 1364-8. PMID 16834412 DOI: 10.1021/Nl060305X |
0.508 |
|
| 2006 |
Schenkel T, Liddle JA, Persaud A, Tyryshkin AM, Lyon SA, De Sousa R, Whaley KB, Bokor J, Shangkuan J, Chakarov I. Electrical activation and electron spin coherence of ultralow dose antimony implants in silicon Applied Physics Letters. 88. DOI: 10.1063/1.2182068 |
0.308 |
|
| 2006 |
Schenkel T, Liddle JA, Bokor J, Persaud A, Park SJ, Shangkuan J, Lo CC, Kwon S, Lyon SA, Tyryshkin AM, Rangelow IW, Sarov Y, Schneider DH, Ager J, de Sousa R. Strategies for integration of donor electron spin qubits in silicon Microelectronic Engineering. 83: 1814-1817. DOI: 10.1016/J.Mee.2006.01.234 |
0.559 |
|
| 2006 |
Quévy EP, San Paulo A, Basol E, Howe RT, King TJ, Bokor J. Back-end-of-line poly-SiGe disk resonators Proceedings of the Ieee International Conference On Micro Electro Mechanical Systems (Mems). 2006: 234-237. |
0.404 |
|
| 2005 |
Kwon S, Yan X, Contreras AM, Liddle JA, Somorjai GA, Bokor J. Fabrication of metallic nanodots in large-area arrays by mold-to-mold cross imprinting (MTMCI). Nano Letters. 5: 2557-62. PMID 16351215 DOI: 10.1021/Nl051932+ |
0.302 |
|
| 2005 |
Qureshi N, Wang S, Lowther MA, Hawkins AR, Kwon S, Liddle A, Bokor J, Schmidt H. Cavity-enhanced magnetooptical observation of magnetization reversal in individual single-domain nanomagnets. Nano Letters. 5: 1413-7. PMID 16178249 DOI: 10.1021/Nl050753P |
0.304 |
|
| 2005 |
Lin J, Xuan P, Bokor J. Characterization of chemical vapor deposition growth yields of carbon nanotube transistors Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 44: 6859-6861. DOI: 10.1143/Jjap.44.6859 |
0.576 |
|
| 2005 |
Shumway MD, Naulleau P, Goldberg KA, Bokor J. Measuring line roughness through aerial image contrast variation using coherent exteme ultraviolet spatial filtering techniques Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 2844-2847. DOI: 10.1116/1.2134717 |
0.764 |
|
| 2005 |
Xiong S, King TJ, Bokor J. A comparison study of symmetric ultrathin-body double-gate devices with metal source/drain and doped source/drain Ieee Transactions On Electron Devices. 52: 1859-1867. DOI: 10.1109/Ted.2005.852893 |
0.507 |
|
| 2005 |
Xiong S, Bokor J. Structural optimization of SUTBDG devices for low-power applications Ieee Transactions On Electron Devices. 52: 360-366. DOI: 10.1109/Ted.2005.843869 |
0.514 |
|
| 2005 |
Xiong S, King TJ, Bokor J. Study of the extrinsic parasitics in nano-scale transistors Semiconductor Science and Technology. 20: 652-657. DOI: 10.1088/0268-1242/20/6/029 |
0.503 |
|
| 2005 |
Paulo AS, Bokor J, Howe RT, He R, Yang P, Gao D, Carraro C, Maboudian R. Mechanical elasticity of single and double clamped silicon nanobeams fabricated by the vapor-liquid-solid method Applied Physics Letters. 87. DOI: 10.1063/1.2008364 |
0.649 |
|
| 2005 |
Persaud A, Park SJ, Liddle JA, Rangelow IW, Bokor J, Keller R, Allen FI, Schneider DH, Schenkel T. Quantum computer development with single ion implantation Experimental Aspects of Quantum Computing. 233-245. DOI: 10.1007/S11128-004-3879-1 |
0.313 |
|
| 2005 |
Yan XM, Kwon S, Contreras AM, Koebel MM, Bokor J, Somorjai GA. Fabrication of dense arrays of platinum nanowires on silica, alumina, zirconia and ceria surfaces as 2-D model catalysts Catalysis Letters. 105: 127-132. DOI: 10.1007/S10562-005-8681-X |
0.304 |
|
| 2004 |
Yueh W, Cao H, Chandhok M, Lee S, Shumway M, Bokor J. Patterning capabilities of EUV resists Proceedings of Spie - the International Society For Optical Engineering. 5376: 434-442. DOI: 10.1117/12.536021 |
0.745 |
|
| 2004 |
Shumway MD, Snow EL, Goldberg KA, Naulleau P, Cao H, Chandhok M, Liddle A, Anderson E, Bokor J. EUV resist imaging below 50 nm using coherent spatial filtering techniques Proceedings of Spie - the International Society For Optical Engineering. 5374: 454-459. DOI: 10.1117/12.535666 |
0.755 |
|
| 2004 |
Park SJ, Liddle JA, Persaud A, Allen FI, Schenkel T, Bokor J. Formation of 15 nm scale Coulomb blockade structures in silicon by electron beam lithography with a bilayer resist process Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22: 3115-3118. DOI: 10.1116/1.1825012 |
0.303 |
|
| 2004 |
Xiong S, Bokor J, Xiang Q, Fisher P, Dudley I, Rao P, Wang H, En B. Is gate line edge roughness a first-order issue in affecting the performance of deep sub-micro bulk MOSFET devices? Ieee Transactions On Semiconductor Manufacturing. 17: 357-361. DOI: 10.1109/Tsm.2004.831560 |
0.537 |
|
| 2004 |
Xiong S, Bokor J. A simulation study of gate line edge roughness effects on doping profiles of short-channel MOSFET devices Ieee Transactions On Electron Devices. 51: 228-232. DOI: 10.1109/Ted.2003.821563 |
0.522 |
|
| 2004 |
Liu H, Sin JKO, Xuan P, Bokor J. Characterization of the ultrathin vertical channel CMOS technology Ieee Transactions On Electron Devices. 51: 106-112. DOI: 10.1109/Ted.2003.821388 |
0.607 |
|
| 2004 |
Tseng YC, Xuan P, Javey A, Malloy R, Wang Q, Bokor J, Dai H. Monolithic Integration of Carbon Nanotube Devices with Silicon MOS Technology Nano Letters. 4: 123-127. DOI: 10.1021/Nl0349707 |
0.685 |
|
| 2004 |
Park SJ, Persaud A, Liddle JA, Nilsson J, Bokor J, Schneider DH, Rangelow IW, Schenkel T. Processing issues in top-down approaches to quantum computer development in silicon Microelectronic Engineering. 73: 695-700. DOI: 10.1016/J.Mee.2004.03.037 |
0.346 |
|
| 2004 |
Pu NW, Pan EY, Bokor J. Sensitive detection of laser damage to Mo/Si multilayers by picosecond ultrasonics Applied Physics B: Lasers and Optics. 79: 107-112. DOI: 10.1007/S00340-004-1462-1 |
0.588 |
|
| 2003 |
Pu NW, Bokor J. Study of surface and bulk acoustic phonon excitations in superlattices using picosecond ultrasonics. Physical Review Letters. 91: 076101. PMID 12935032 DOI: 10.1103/Physrevlett.91.076101 |
0.583 |
|
| 2003 |
Naulleau PP, Goldberg KA, Batson P, Bokor J, Denham P, Rekawa S. Fourier-synthesis custom-coherence illuminator for extreme ultraviolet microfield lithography. Applied Optics. 42: 820-6. PMID 12593485 DOI: 10.1364/Ao.42.000820 |
0.576 |
|
| 2003 |
Choi Y, Ha D, King T, Bokor J. Investigation of Gate-Induced Drain Leakage (GIDL) Current in Thin Body Devices: Single-Gate Ultra-Thin Body, Symmetrical Double-Gate, and Asymmetrical Double-Gate MOSFETs Japanese Journal of Applied Physics. 42: 2073-2076. DOI: 10.1143/Jjap.42.2073 |
0.308 |
|
| 2003 |
Choi Y, Lee JS, Zhu J, Somorjai GA, Lee LP, Bokor J. Sublithographic nanofabrication technology for nanocatalysts and DNA chips Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 21: 2951. DOI: 10.1116/1.1627805 |
0.334 |
|
| 2003 |
Naulleau P, Goldberg KA, Anderson EH, Bokor J, Harteneck B, Jackson K, Olynick D, Salmassi F, Baker S, Mirkarimi P, Spiller E, Walton C, O’Connell D, Yan P, Zhang G. Printing-based performance analysis of the engineering test stand set-2 optic using a synchrotron exposure station with variable sigma Journal of Vacuum Science & Technology B. 21: 2697-2700. DOI: 10.1116/1.1621669 |
0.557 |
|
| 2003 |
Naulleau P, Goldberg KA, Anderson EH, Bokor J, Gullikson E, Harteneck B, Jackson K, Olynick D, Salmassi F, Baker S, Mirkarimi P, Spiller E, Walton C, Zhang G. Lithographic characterization of the printability of programmed extreme ultraviolet substrate defects Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 21: 1286. DOI: 10.1116/1.1580839 |
0.531 |
|
| 2003 |
Xiong S, Bokor J. Sensitivity of Double-Gate and FinFET Devices to Process Variations Ieee Transactions On Electron Devices. 50: 2255-2261. DOI: 10.1109/Ted.2003.818594 |
0.533 |
|
| 2003 |
Chang L, Choi YK, Kedzierski J, Lindert N, Xuan P, Bokor J, Hu C, King TJ. Moore's law lives on Ieee Circuits and Devices Magazine. 19: 35-42. DOI: 10.1109/Mcd.2003.1175106 |
0.604 |
|
| 2003 |
Xuan P, Bokor J. Investigation of NiSi and TiSi as CMOS Gate Materials Ieee Electron Device Letters. 24: 634-636. DOI: 10.1109/Led.2003.817371 |
0.602 |
|
| 2003 |
Schenkel T, Persaud A, Park SJ, Nilsson J, Bokor J, Liddle JA, Keller R, Schneider DH, Cheng DW, Humphries DE. Solid state quantum computer development in silicon with single ion implantation Journal of Applied Physics. 94: 7017-7024. DOI: 10.1063/1.1622109 |
0.308 |
|
| 2003 |
Choi Y, Zhu J, Grunes J, Bokor J, Somorjai GA. Fabrication of Sub-10-nm Silicon Nanowire Arrays by Size Reduction Lithography The Journal of Physical Chemistry B. 107: 3340-3343. DOI: 10.1021/Jp0222649 |
0.317 |
|
| 2002 |
Goldberg KA, Naulleau P, Bokor J. Fourier transform interferometer alignment method. Applied Optics. 41: 4477-83. PMID 12153074 DOI: 10.1364/Ao.41.004477 |
0.539 |
|
| 2002 |
Naulleau P, Goldberg KA, Anderson EH, Attwood D, Batson P, Bokor J, Denham P, Gullikson E, Harteneck B, Hoef B, Jackson K, Olynick D, Rekawa S, Salmassi F, Blaedel K, et al. Sub-70 nm extreme ultraviolet lithography at the Advanced Light Source static microfield exposure station using the engineering test stand set-2 optic Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 20: 2829. DOI: 10.1116/1.1524976 |
0.567 |
|
| 2002 |
Goldberg KA, Naulleau P, Bokor J, Chapman HN, Barty A. Testing extreme ultraviolet optics with visible-light and extreme ultraviolet interferometry Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 20: 2834. DOI: 10.1116/1.1523401 |
0.564 |
|
| 2002 |
Yeo YC, Subramanian V, Kedzierski J, Xuan P, King TJ, Bokor J, Hu C. Design and fabrication of 50-nm thin-body p-MOSFETs with a SiGe heterostructure channel Ieee Transactions On Electron Devices. 49: 279-286. DOI: 10.1109/16.981218 |
0.581 |
|
| 2001 |
Goldberg KA, Bokor J. Fourier-transform method of phase-shift determination. Applied Optics. 40: 2886-94. PMID 18357307 DOI: 10.1364/Ao.40.002886 |
0.503 |
|
| 2001 |
Lee SH, Naulleau P, Goldberg KA, Cho CH, Jeong S, Bokor J. Extreme-ultraviolet lensless Fourier-transform holography. Applied Optics. 40: 2655-61. PMID 18357280 DOI: 10.1364/Ao.40.002655 |
0.559 |
|
| 2001 |
Tichenor DA, Ray-Chaudhuri AK, Replogle WC, Stulen RH, Kubiak GD, Rockett PD, Klebanoff LE, Jefferson KL, Leung AH, Wronosky JB, Hale LC, Chapman HN, Taylor JS, Folta JA, Montcalm C, ... ... Bokor J, et al. System integration and performance of the EUV engineering test stand Proceedings of Spie - the International Society For Optical Engineering. 4343: 19-37. DOI: 10.1117/12.436665 |
0.57 |
|
| 2001 |
Naulleau PP, Goldberg KA, Anderson EH, Batson PJ, Denham P, Jackson KH, Rekawa S, Bokor J. Adding static printing capabilities to the EUV phase-shifting point diffraction interferometer Lawrence Berkeley National Laboratory. 4343: 639-645. DOI: 10.1117/12.436633 |
0.565 |
|
| 2001 |
Naulleau P, Goldberg KA, Anderson EH, Batson P, Denham PE, Jackson KH, Gullikson EM, Rekawa S, Bokor J. At-wavelength characterization of the extreme ultraviolet engineering test stand set-2 optic Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 19: 2396-2400. DOI: 10.1116/1.1421545 |
0.551 |
|
| 2001 |
Chapman HN, Ray-Chaudhuri AK, Tichenor DA, Replogle WC, Stulen RH, Kubiak GD, Rockett PD, Klebanoff LE, O'Connell D, Leung AH, Jefferson KL, Wronosky JB, Taylor JS, Hale LC, Blaedel K, ... ... Bokor J, et al. First lithographic results from the extreme ultraviolet engineering test stand Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 19: 2389-2395. DOI: 10.1116/1.1414017 |
0.533 |
|
| 2001 |
Lindert N, Chang L, Choi YK, Anderson EH, Lee WC, King TJ, Bokor J, Hu C. Sub-60-nm quasi-planar FinFETs fabricated using a simplified process Ieee Electron Device Letters. 22: 487-489. DOI: 10.1109/55.954920 |
0.353 |
|
| 2001 |
Huang X, Lee W, Kuo C, Hisamoto D, Chang L, Kedzierski J, Anderson E, Takeuchi H, Choi Y, Asano K, Subramanian V, King T, Bokor J, Hu C. Sub-50 nm P-channel FinFET Ieee Transactions On Electron Devices. 48: 880-886. DOI: 10.1109/16.918235 |
0.319 |
|
| 2001 |
Naulleau PP, Anderson EH, Gullikson EM, Bokor J. Fabrication of high-efficiency multilayer-coated binary blazed gratings in the EUV regime Optics Communications. 200: 27-34. DOI: 10.1016/S0030-4018(01)01647-9 |
0.301 |
|
| 2000 |
Naulleau P, Goldberg KA, Gullikson EM, Bokor J. At-wavelength, system-level flare characterization of extreme-ultraviolet optical systems. Applied Optics. 39: 2941-7. PMID 18345220 DOI: 10.1364/Ao.39.002941 |
0.558 |
|
| 2000 |
Naulleau PP, Goldberg KA, Bokor J. Extreme ultraviolet carrier-frequency shearing interferometry of a lithographic four-mirror optical system Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 2939-2943. DOI: 10.1116/1.1321290 |
0.531 |
|
| 2000 |
Goldberg KA, Naulleau P, Batson P, Denham P, Anderson EH, Chapman H, Bokor J. Extreme ultraviolet alignment and testing of a four-mirror ring field extreme ultraviolet optical system Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 18: 2911. DOI: 10.1116/1.1319703 |
0.569 |
|
| 2000 |
Kedzierski J, Anderson E, Bokor J. Calixarene G-line double resist process with 15 nm resolution and large area exposure capability Journal of Vacuum Science & Technology B. 18: 3428-3430. DOI: 10.1116/1.1314386 |
0.727 |
|
| 2000 |
Lee SH, Bokor J, Naulleau P, Jeong ST, Goldberg KA. Extreme ultraviolet holographic microscopy and its application to extreme ultraviolet mask-blank defect characterization Journal of Vacuum Science & Technology B. 18: 2935-2938. DOI: 10.1116/1.1314382 |
0.567 |
|
| 2000 |
Choi YK, Asano K, Lindert N, Subramanian V, King TJ, Bokor J, Chenming H. Ultrathin-body SOI MOSFET for deep-sub-tenth micron era Ieee Electron Device Letters. 21: 254-255. DOI: 10.1109/55.841313 |
0.319 |
|
| 2000 |
Yeo YC, Subramanian V, Kedzierski J, Xuan P, King TJ, Bokor J, Hu C. Nanoscale ultra-thin-body silicon-on-insulator P-MOSFET with a SiGe/Si heterostructure channel Ieee Electron Device Letters. 21: 161-163. DOI: 10.1109/55.830968 |
0.58 |
|
| 2000 |
Hisamoto D, Lee W, Kedzierski J, Takeuchi H, Asano K, Kuo C, Anderson E, King T, Bokor J, Hu C. FinFET-a self-aligned double-gate MOSFET scalable to 20 nm Ieee Transactions On Electron Devices. 47: 2320-2325. DOI: 10.1109/16.887014 |
0.334 |
|
| 2000 |
Kedzierski J, Xuan P, Subramanian V, Bokor J, King TJ, Hu C, Anderson E. 20 nm gate-length ultra-thin body p-MOSFET with silicide source/drain Superlattices and Microstructures. 28: 445-452. DOI: 10.1006/Spmi.2000.0947 |
0.618 |
|
| 1999 |
Naulleau PP, Goldberg KA, Lee SH, Chang C, Attwood D, Bokor J. Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy. Applied Optics. 38: 7252-63. PMID 18324274 DOI: 10.1364/Ao.38.007252 |
0.535 |
|
| 1999 |
Kedzierski J, Bokor J, Anderson E. Novel method for silicon quantum wire transistor fabrication Journal of Vacuum Science & Technology B. 17: 3244-3247. DOI: 10.1116/1.590989 |
0.733 |
|
| 1999 |
Pu N, Bokor J, Jeong S, Zhao R. Nondestructive picosecond-ultrasonic characterization of Mo/Si extreme ultraviolet multilayer reflection coatings Journal of Vacuum Science & Technology B. 17: 3014-3018. DOI: 10.1116/1.590945 |
0.595 |
|
| 1999 |
Naulleau PP, Goldberg KA, Gullikson EM, Bokor J. Interferometric at-wavelength flare characterization of extreme ultraviolet optical systems Journal of Vacuum Science & Technology B. 17: 2987-2991. DOI: 10.1116/1.590940 |
0.563 |
|
| 1999 |
Goldberg KA, Naulleau PP, Bokor J. Extreme ultraviolet interferometric measurements of diffraction-limited optics Journal of Vacuum Science & Technology B. 17: 2982-2986. DOI: 10.1116/1.590939 |
0.567 |
|
| 1999 |
Attwood DT, Naulleau P, Goldberg KA, Tejnil E, Chang C, Beguiristain R, Batson P, Bokor J, Gullikson EM, Koike M, Medecki H, Underwood JH. Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions Ieee Journal of Quantum Electronics. 35: 709-719. DOI: 10.1109/3.760317 |
0.551 |
|
| 1999 |
Pu N, Bokor J, Jeong S, Zhao R. Picosecond ultrasonic study of Mo/Si multilayer structures using an alternating-pump technique Applied Physics Letters. 74: 320-322. DOI: 10.1063/1.123010 |
0.589 |
|
| 1998 |
Tejnil E, Goldberg KA, Bokor J. Phase effects owing to multilayer coatings in a two-mirror extreme-ultraviolet schwarzschild objective. Applied Optics. 37: 8021-9. PMID 18301694 DOI: 10.1364/Ao.37.008021 |
0.534 |
|
| 1998 |
Budiarto E, Pu NW, Jeong S, Bokor J. Near-field propagation of terahertz pulses from a large-aperture antenna. Optics Letters. 23: 213-5. PMID 18084463 DOI: 10.1364/Ol.23.000213 |
0.591 |
|
| 1998 |
Goldberg KA, Naulleau P, Lee S, Bresloff C, Henderson C, Attwood D, Bokor J. High-accuracy interferometry of extreme ultraviolet lithographic optical systems Journal of Vacuum Science & Technology B. 16: 3435-3439. DOI: 10.1116/1.590498 |
0.552 |
|
| 1998 |
Lee SH, Naulleau P, Goldberg K, Tejnil E, Medecki H, Bresloff C, Chang C, Attwood D, Bokor J. At-wavelength interferometry of extreme ultraviolet lithographic optics Characterization and Metrology For Ulsi Technology. 449: 553-557. DOI: 10.1063/1.56843 |
0.558 |
|
| 1997 |
Kedzierski J, Bokor J, Kisielowski C. Fabrication of planar silicon nanowires on silicon-on-insulator using stress limited oxidation Journal of Vacuum Science & Technology B. 15: 2825-2828. DOI: 10.1116/1.589736 |
0.725 |
|
| 1997 |
Tejnil E, Goldberg KA, Lee S, Medecki H, Batson PJ, Denham PE, MacDowell AA, Bokor J, Attwood D. At-wavelength interferometry for extreme ultraviolet lithography Journal of Vacuum Science & Technology B. 15: 2455-2461. DOI: 10.1116/1.589666 |
0.554 |
|
| 1997 |
Assaderaghi F, Sinitsky D, Bokor J, Ko PK, Gaw H, Hu C. High-field transport of inversion-layer electrons and holes including velocity overshoot Ieee Transactions On Electron Devices. 44: 664-671. DOI: 10.1109/16.563373 |
0.305 |
|
| 1996 |
Medecki H, Tejnil E, Goldberg KA, Bokor J. Phase-shifting point diffraction interferometer. Optics Letters. 21: 1526-8. PMID 19881713 |
0.502 |
|
| 1996 |
Nguyen KB, Cardinale GF, Tichenor DA, Kubiak GD, Berger K, Ray-Chaudhuri AK, Perras Y, Haney SJ, Nissen R, Krenz K, Stulen RH, Fujioka H, Hu C, Bokor J, Tennant DM, et al. Fabrication of metal–oxide–semiconductor devices with extreme ultraviolet lithography Journal of Vacuum Science & Technology B. 14: 4188-4192. DOI: 10.1116/1.588618 |
0.31 |
|
| 1996 |
Bokor J, Neureuther AR, Oldham WG. Advanced lithography for ULSI Ieee Circuits and Devices Magazine. 12: 11-15. DOI: 10.1109/101.481203 |
0.301 |
|
| 1996 |
Beguiristain R, Goldberg KA, Tejnil E, Bokor J, Medecki H, Attwood DT, Jackson K. Interferometry using undulator sources (invited, abstract) Review of Scientific Instruments. 67: 3353-3353. DOI: 10.1063/1.1147396 |
0.538 |
|
| 1995 |
Goldberg KA, Beguiristain R, Bokor J, Medecki H, Attwood DT, Jackson K, Tejnil E, Sommargren GE. Progress towards λ/20 extreme ultraviolet interferometry Journal of Vacuum Science & Technology B. 13: 2923-2927. DOI: 10.1116/1.588280 |
0.54 |
|
| 1993 |
Macdowell AA, Bjorkholm JE, Early K, Freeman RR, Himel MD, Mulgrew PP, Szeto LH, Taylor DW, Tennant DM, Wood Ii OR, Bokor J, Eichner L, Jewell TE, Waskiewicz WK, White DL, et al. Soft-x-ray projection imaging with a 1:1 ring-field optic. Applied Optics. 32: 7072-8. PMID 20856570 DOI: 10.1364/Ao.32.007072 |
0.303 |
|
| 1993 |
Murnane MM, Kapteyn HC, Gordon SP, Bokor J, Glytsis EN, Falcone RW. Efficient coupling of high-intensity subpicosecond laser pulses into solids Applied Physics Letters. 62: 1068-1070. DOI: 10.1063/1.108797 |
0.517 |
|
| 1992 |
Yan RH, Lee KF, Jeon DY, Kim YO, Park BG, Pinto MR, Rafferty CS, Tennant DM, Westerwick EH, Chin GM, Morris MD, Early K, Mulgrew P, Mansfield WM, Watts RK, ... ... Bokor J, et al. 89-GHz fT Room-Temperature Silicon MOSFET's Ieee Electron Device Letters. 13: 256-258. DOI: 10.1109/55.145045 |
0.321 |
|
| 1992 |
MacDowell AA, Bjorkholm JE, Bokor J, Eichner L, Freeman RR, Pastalan JZ, Szeto LH, Tennant DM, Wood OR, Jewell TE, Mansfield WM, Waskiewicz WK, White DL, Windt DL. Reduction imaging with soft x rays for projection lithography Review of Scientific Instruments. 63: 737-740. DOI: 10.1063/1.1142648 |
0.306 |
|
| 1991 |
MacDowell AA, Bjorkholm JE, Bokor J, Eichner L, Freeman RR, Mansfield WM, Pastalan J, Szeto LH, Tennant DM, Wood OR, Jewell TE, Waskiewicz WK, White DL, Windt DL, Silfvast WT, et al. Soft x‐ray projection lithography using a 1:1 ring field optical system Journal of Vacuum Science & Technology B. 9: 3193-3197. DOI: 10.1116/1.585315 |
0.305 |
|
| 1990 |
Bjorkholm JE, Bokor J, Eichner L, Freeman RR, Gregus J, Jewell TE, Mansfield WM, Dowell AAM, Raab EL, Silfvast WT, Szeto LH, Tennant DM, Waskiewicz WK, White DL, Windt DL, et al. Reduction imaging at 14 nm using multilayer‐coated optics: Printing of features smaller than 0.1 μm Journal of Vacuum Science & Technology B. 8: 1509-1513. DOI: 10.1116/1.585106 |
0.329 |
|
| 1989 |
Halas NJ, Bokor J. Surface Recombination on the Si(111) 2 x 1 Surface. Physical Review Letters. 62: 1679-1682. PMID 10039736 DOI: 10.1103/PhysRevLett.62.1679 |
0.37 |
|
| 1989 |
Bokor J, Halas N. Time-resolved study of silicon surface recombination Ieee Journal of Quantum Electronics. 25: 2550-2555. DOI: 10.1109/3.40641 |
0.476 |
|
| 1986 |
Bokor J, Storz R, Freeman RR, Bucksbaum PH. Picosecond surface electron dynamics on photoexcited Si(111)(2 x 1) surfacs surfaces. Physical Review Letters. 57: 881-884. PMID 10034185 DOI: 10.1103/PhysRevLett.57.881 |
0.436 |
|
| 1985 |
Haight R, Bokor J, Stark J, Storz RH, Freeman RR, Bucksbaum PH. Picosecond time-resolved photoemission study of the InP(110) surface. Physical Review Letters. 54: 1302-1305. PMID 10030990 DOI: 10.1103/Physrevlett.54.1302 |
0.518 |
|
| 1985 |
Bokor J, Haight R, Storz RH, Stark J, Freeman RR, Bucksbaum PH. Time- and angle-resolved photoemission study of InP(110). Physical Review. B, Condensed Matter. 32: 3669-3675. PMID 9937516 DOI: 10.1103/Physrevb.32.3669 |
0.499 |
|
| 1983 |
Bokor J, Bucksbaum PH, Freeman RR. Generation of 35.5-nm coherent radiation. Optics Letters. 8: 217-9. PMID 19714189 DOI: 10.1364/Ol.8.000217 |
0.513 |
|
| 1983 |
Falcone RW, Bokor J. Dichroic beam splitter for extreme-ultraviolet and visible radiation. Optics Letters. 8: 21-3. PMID 19714122 DOI: 10.1364/Ol.8.000021 |
0.516 |
|
| 1982 |
Srinivasan T, Egger H, Boyer K, Pummer H, Rhodes CK, Luk TS, Muller DF, Rothschild M, Bokor J, Freeman RR, Cooke WE, Schomburg H, Döbele HF, Rückle B, Bloomfield LA, et al. New lasers, VUV sources Applied Physics B Photophysics and Laser Chemistry. 28: 198-207. DOI: 10.1007/Bf00697846 |
0.479 |
|
| 1981 |
Rothschild M, Egger H, Hawkins RT, Bokor J, Pummer H, Rhodes CK. High-resolution spectroscopy of molecular hydrogen in the extreme ultraviolet region Physical Review A. 23: 206-213. DOI: 10.1103/Physreva.23.206 |
0.51 |
|
| 1980 |
Egger H, Hawkins RT, Bokor J, Pummer H, Rothschild M, Rhodes CK. Generation of high-spectral-brightness tunable XUV radiation at 83 nm. Optics Letters. 5: 282-4. PMID 19693201 DOI: 10.1364/Ol.5.000282 |
0.532 |
|
| 1980 |
Kligler DJ, Bokor J, Rhodes CK. Collisional and radiative properties of the H2 E,F g1+ state Physical Review A. 21: 607-617. DOI: 10.1103/Physreva.21.607 |
0.509 |
|
| 1980 |
Bokor J, Zavelovich J, Rhodes CK. Multiphoton ultraviolet spectroscopy of some 6p levels in krypton Physical Review A. 21: 1453-1459. DOI: 10.1103/Physreva.21.1453 |
0.438 |
|
| 1980 |
Hawkins RT, Egger H, Bokor J, Rhodes CK. A tunable, ultrahigh spectral brightness KrF* excimer laser source Applied Physics Letters. 36: 391-392. DOI: 10.1063/1.91528 |
0.529 |
|
| 1980 |
Bokor J, Zavelovich J, Rhodes CK. Isotope effect in multiphoton ultraviolet photolysis of CO The Journal of Chemical Physics. 72: 965-971. DOI: 10.1063/1.439215 |
0.406 |
|
| 1979 |
Bischel W, Bokor J, Kligler D, Rhodes C. Nonlinear optical processes in atoms and molecules using rare-gas halide lasers Ieee Journal of Quantum Electronics. 15: 380-392. DOI: 10.1109/Jqe.1979.1070000 |
0.511 |
|
| 1979 |
Bokor J, Bischel WK, Rhodes CK. Doppler-free spectroscopy of the ν2 band in 14NH3: Application to 16-μm generation Journal of Applied Physics. 50: 4541-4544. DOI: 10.1063/1.326561 |
0.539 |
|
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