Jeffrey Bokor - Publications

Affiliations: 
Electrical Engineering and Computer Sciences University of California, Berkeley, Berkeley, CA 
Area:
nanoscale science
Website:
http://www.eecs.berkeley.edu/Faculty/Homepages/bokor.html

153 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Pitner G, Hills G, Llinas JP, Persson KM, Park RS, Bokor J, Mitra S, Wong HP. Low-Temperature Side-Contact to Carbon Nanotube Transistors: Resistance Distributions Down to 10 nm Contact Length. Nano Letters. PMID 30677297 DOI: 10.1021/Acs.Nanolett.8B04370  0.317
2019 Navarrete B, Stone M, Wang P, Guduru R, Luongo K, Hadjikhani A, Toledo D, Emirov Y, Arkook B, Liang P, Hong J, Bokor J, Khizroev S. Nanomagnetic Particle-Based Information Processing Ieee Transactions On Nanotechnology. 18: 983-988. DOI: 10.1109/Tnano.2019.2939009  0.326
2019 El-Ghazaly A, Tran B, Ceballos A, Lambert C, Pattabi A, Salahuddin S, Hellman F, Bokor J. Ultrafast magnetization switching in nanoscale magnetic dots Applied Physics Letters. 114: 232407. DOI: 10.1063/1.5098453  0.336
2018 Lo Conte R, Xiao Z, Chen C, Stan CV, Gorchon J, El-Ghazaly A, Nowakowski ME, Sohn H, Pattabi A, Scholl A, Tamura N, Sepulveda A, Carman GP, Candler RN, Bokor J. Influence of Non-Uniform Micron-Scale Strain Distributions on the Electrical Reorientation of Magnetic Micro-Structures in a Composite Multiferroic Heterostructure. Nano Letters. PMID 29481758 DOI: 10.1021/Acs.Nanolett.7B05342  0.317
2018 Hong J, Stone M, Navarrete B, Luongo K, Zheng Q, Yuan Z, Xia K, Xu N, Bokor J, You L, Khizroev S. 3D multilevel spin transfer torque devices Applied Physics Letters. 112: 112402. DOI: 10.1063/1.5021336  0.323
2017 Yang Y, Wilson RB, Gorchon J, Lambert CH, Salahuddin S, Bokor J. Ultrafast magnetization reversal by picosecond electrical pulses. Science Advances. 3: e1603117. PMID 29119135 DOI: 10.1126/Sciadv.1603117  0.32
2017 Llinas JP, Fairbrother A, Borin Barin G, Shi W, Lee K, Wu S, Yong Choi B, Braganza R, Lear J, Kau N, Choi W, Chen C, Pedramrazi Z, Dumslaff T, Narita A, ... ... Bokor J, et al. Short-channel field-effect transistors with 9-atom and 13-atom wide graphene nanoribbons. Nature Communications. 8: 633. PMID 28935943 DOI: 10.1038/S41467-017-00734-X  0.303
2017 Gorchon J, Lambert C, Yang Y, Pattabi A, Wilson RB, Salahuddin S, Bokor J. Single shot ultrafast all optical magnetization switching of ferromagnetic Co/Pt multilayers Applied Physics Letters. 111: 042401. DOI: 10.1063/1.4994802  0.32
2016 Desai SB, Madhvapathy SR, Sachid AB, Llinas JP, Wang Q, Ahn GH, Pitner G, Kim MJ, Bokor J, Hu C, Wong HP, Javey A. MoS2 transistors with 1-nanometer gate lengths. Science (New York, N.Y.). 354: 99-102. PMID 27846499 DOI: 10.1126/Science.Aah4698  0.344
2016 Hong J, Lambson B, Dhuey S, Bokor J. Experimental test of Landauer's principle in single-bit operations on nanomagnetic memory bits. Science Advances. 2: e1501492. PMID 26998519 DOI: 10.1126/Sciadv.1501492  0.764
2016 Hong J, Hadjikhani A, Stone M, Allen FI, Safonov V, Liang P, Bokor J, Khizroev S. The Physics of Spin-Transfer Torque Switching in Magnetic Tunneling Junctions in Sub-10 nm Size Range Ieee Transactions On Magnetics. 52. DOI: 10.1109/Tmag.2016.2530622  0.344
2016 Kang Y, Bokor J, Stojanovic V. Design Requirements for a Spintronic MTJ Logic Device for Pipelined Logic Applications Ieee Transactions On Electron Devices. DOI: 10.1109/Ted.2016.2527046  0.313
2015 Gu Z, Nowakowski ME, Carlton DB, Storz R, Im MY, Hong J, Chao W, Lambson B, Bennett P, Alam MT, Marcus MA, Doran A, Young A, Scholl A, Fischer P, ... Bokor J, et al. Sub-nanosecond signal propagation in anisotropy-engineered nanomagnetic logic chains. Nature Communications. 6: 6466. PMID 25774621 DOI: 10.1038/Ncomms7466  0.777
2015 Pattabi A, Gu Z, Gorchon J, Yang Y, Finley J, Lee OJ, Raziq HA, Salahuddin S, Bokor J. Direct optical detection of current induced spin accumulation in metals by magnetization-induced second harmonic generation Applied Physics Letters. 107. DOI: 10.1063/1.4933094  0.49
2015 Gu Z, Storz R, Marcus M, Doran A, Young A, Scholl A, Chao W, Carlton D, Lambson B, Nowakowski M, Bokor J. Time-resolved photo-emission electron microscopy of nanomagnetic logic chains Springer Proceedings in Physics. 159: 281-283. DOI: 10.1007/978-3-319-07743-7_87  0.382
2014 Schmidt AR, Henry E, Lo CC, Wang YT, Li H, Greenman L, Namaan O, Schenkel T, Whaley KB, Bokor J, Yablonovitch E, Siddiqi I. A prototype silicon double quantum dot with dispersive microwave readout Journal of Applied Physics. 116. DOI: 10.1063/1.4890835  0.554
2014 Lo CC, Simmons S, Lo Nardo R, Weis CD, Tyryshkin AM, Meijer J, Rogalla D, Lyon SA, Bokor J, Schenkel T, Morton JJL. Stark shift and field ionization of arsenic donors in 28Si- silicon-on-insulator structures Applied Physics Letters. 104. DOI: 10.1063/1.4876175  0.57
2013 Lo CC, Weis CD, van Tol J, Bokor J, Schenkel T. All-electrical nuclear spin polarization of donors in silicon. Physical Review Letters. 110: 057601. PMID 23414045 DOI: 10.1103/Physrevlett.110.057601  0.561
2013 Choi SJ, Bennett P, Takei K, Wang C, Lo CC, Javey A, Bokor J. Short-channel transistors constructed with solution-processed carbon nanotubes. Acs Nano. 7: 798-803. PMID 23259742 DOI: 10.1021/Nn305277D  0.502
2013 Choi SJ, Bennett P, Takei K, Wang C, Lo CC, Javey A, Bokor J. Short-channel transistors constructed with solution-processed carbon nanotubes. Acs Nano. 7: 798-803. PMID 23259742 DOI: 10.1021/Nn305277D  0.502
2013 Schenkel T, Lo CC, Weis CD, Bokor J, Tyryshkin AM, Lyonc SA. A spin quantum bit architecture with coupled donors and quantum dots in silicon Single-Atom Nanoelectronics. 255-279. DOI: 10.4032/9789814316699  0.466
2013 Lo CC, Weis CD, Van Tol J, Bokor J, Schenkel T, Morton JJL. Spins in silicon MOSFETs: Electron spin relaxation and hyperpolarization of nuclear spins Proceedings of Spie - the International Society For Optical Engineering. 8813. DOI: 10.1117/12.2023595  0.552
2013 Lo CC, Weis CD, Van Tol J, Bokor J, Schenkel T. All-electrical nuclear spin polarization of donors in silicon Physical Review Letters. 110. DOI: 10.1103/PhysRevLett.110.057601  0.474
2013 Bennett PB, Pedramrazi Z, Madani A, Chen YC, De Oteyza DG, Chen C, Fischer FR, Crommie MF, Bokor J. Bottom-up graphene nanoribbon field-effect transistors Applied Physics Letters. 103. DOI: 10.1063/1.4855116  0.305
2013 Lambson B, Gu Z, Monroe M, Dhuey S, Scholl A, Bokor J. Concave nanomagnets: Investigation of anisotropy properties and applications to nanomagnetic logic Applied Physics a: Materials Science and Processing. 111: 413-421. DOI: 10.1007/S00339-013-7654-Y  0.772
2012 Carlton D, Lambson B, Gu Z, Dhuey S, Gao L, Hughes B, Olynick D, Rettner C, Scholl A, Youngblood B, Young A, Krivorotov I, Parkin S, Bokor J. Signal propagation in dipole coupled nanomagnets for logic applications Proceedings of Spie - the International Society For Optical Engineering. 8461. DOI: 10.1117/12.930776  0.779
2012 Carlton D, Lambson B, Scholl A, Young A, Ashby P, Dhuey S, Bokor J. Investigation of defects and errors in nanomagnetic logic circuits Ieee Transactions On Nanotechnology. 11: 760-762. DOI: 10.1109/Tnano.2012.2196445  0.767
2012 Lambson B, Gu Z, Bokor J, Carlton D, Dhuey S. Error immunity techniques for nanomagnetic logic Technical Digest - International Electron Devices Meeting, Iedm. 11.5.1-11.5.4. DOI: 10.1109/IEDM.2012.6479025  0.354
2012 Weis CD, Lo CC, Lang V, Tyryshkin AM, George RE, Yu KM, Bokor J, Lyon SA, Morton JJL, Schenkel T. Electrical activation and electron spin resonance measurements of implanted bismuth in isotopically enriched silicon-28 Applied Physics Letters. 100. DOI: 10.1063/1.4704561  0.545
2012 Lambson B, Gu Z, Carlton D, Dhuey S, Scholl A, Doran A, Young A, Bokor J. Cascade-like signal propagation in chains of concave nanomagnets Applied Physics Letters. 100. DOI: 10.1063/1.3703591  0.773
2012 Lo CC, Bradbury FR, Tyryshkin AM, Weis CD, Bokor J, Schenkel T, Lyon SA. Suppression of microwave rectification effects in electrically detected magnetic resonance measurements Applied Physics Letters. 100. DOI: 10.1063/1.3684247  0.578
2012 Choo H, Kim MK, Staffaroni M, Seok TJ, Bokor J, Cabrini S, Schuck PJ, Wu MC, Yablonovitch E. Nanofocusing in a metal-insulator-metal gap plasmon waveguide with a three-dimensional linear taper Nature Photonics. 6: 838-844. DOI: 10.1038/Nphoton.2012.277  0.333
2012 Martínez MT, Tseng YC, González M, Bokor J. Streptavidin as CNTs and DNA linker for the specific electronic and optical detection of DNA hybridization Journal of Physical Chemistry C. 116: 22579-22586. DOI: 10.1021/Jp306535D  0.496
2011 Lambson B, Carlton D, Bokor J. Exploring the thermodynamic limits of computation in integrated systems: magnetic memory, nanomagnetic logic, and the Landauer limit. Physical Review Letters. 107: 010604. PMID 21797532 DOI: 10.1103/Physrevlett.107.010604  0.771
2011 Lo CC, Lang V, George RE, Morton JJ, Tyryshkin AM, Lyon SA, Bokor J, Schenkel T. Electrically detected magnetic resonance of neutral donors interacting with a two-dimensional electron gas. Physical Review Letters. 106: 207601. PMID 21668263 DOI: 10.1103/Physrevlett.106.207601  0.553
2011 Lang V, Lo CC, George RE, Lyon SA, Bokor J, Schenkel T, Ardavan A, Morton JJ. Electrically detected magnetic resonance in a W-band microwave cavity. The Review of Scientific Instruments. 82: 034704. PMID 21456773 DOI: 10.1063/1.3557395  0.562
2011 Weber-Bargioni A, Schwartzberg A, Cornaglia M, Ismach A, Urban JJ, Pang Y, Gordon R, Bokor J, Salmeron MB, Ogletree DF, Ashby P, Cabrini S, Schuck PJ. Hyperspectral nanoscale imaging on dielectric substrates with coaxial optical antenna scan probes. Nano Letters. 11: 1201-7. PMID 21261258 DOI: 10.1364/Ntm.2011.Nma5  0.305
2011 Carlton DB, Lambson B, Scholl A, Young AT, Dhuey SD, Ashby PD, Tuchfeld E, Bokor J. Computing in thermal equilibrium with dipole-coupled nanomagnets Ieee Transactions On Nanotechnology. 10: 1401-1404. DOI: 10.1109/Tnano.2011.2152851  0.772
2011 Liu Z, Brandt R, Yahagi Y, Hansen B, Harteneck B, Bokor J, Hawkins AR, Schmidt H. Detecting single nanomagnet dynamics beyond the diffraction limit in varying magnetostatic environments Applied Physics Letters. 98. DOI: 10.1063/1.3549302  0.318
2010 Martínez MT, Tseng YC, Salvador JP, Marco MP, Ormategui N, Loinaz I, Bokor J. Electronic anabolic steroid recognition with carbon nanotube field-effect transistors. Acs Nano. 4: 1473-80. PMID 20146439 DOI: 10.1021/Nn901547B  0.506
2010 Tseng YC, Bokor J. Characterization of the junction capacitance of metal-semiconductor carbon nanotube Schottky contacts Applied Physics Letters. 96. DOI: 10.1063/1.3277182  0.514
2009 Garnett EC, Tseng YC, Khanal DR, Wu J, Bokor J, Yang P. Dopant profiling and surface analysis of silicon nanowires using capacitance-voltage measurements. Nature Nanotechnology. 4: 311-4. PMID 19421217 DOI: 10.1038/Nnano.2009.43  0.552
2009 Ford AC, Ho JC, Chueh YL, Tseng YC, Fan Z, Guo J, Bokor J, Javey A. Diameter-dependent electron mobility of InAs nanowires. Nano Letters. 9: 360-5. PMID 19143505 DOI: 10.1021/Nl803154M  0.538
2009 Martinez MT, Tseng YC, Ormategui N, Loinaz I, Eritja R, Bokor J. Label-free DNA biosensors based on functionalized carbon nanotube field effect transistors. Nano Letters. 9: 530-6. PMID 19125575 DOI: 10.1021/Nl8025604  0.491
2009 De Sousa R, Lo CC, Bokor J. Spin-dependent scattering in a silicon transistor Physical Review B - Condensed Matter and Materials Physics. 80. DOI: 10.1103/Physrevb.80.045320  0.551
2009 Lo CC, Persaud A, Dhuey S, Olynick D, Borondics F, Martin MC, Bechtel HA, Bokor J, Schenkel T. Device fabrication and transport measurements of FinFETs built with 28Si SOI wafers toward donor qubits in silicon Semiconductor Science and Technology. 24. DOI: 10.1088/0268-1242/24/10/105022  0.567
2009 Schenkel T, Lo CC, Weis CD, Schuh A, Persaud A, Bokor J. Critical issues in the formation of quantum computer test structures by ion implantation Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 267: 2563-2566. DOI: 10.1016/J.Nimb.2009.05.061  0.537
2009 Weis CD, Schuh A, Batra A, Persaud A, Rangelow IW, Bokor J, Lo CC, Cabrini S, Olynick D, Duhey S, Schenkel T. Mapping of ion beam induced current changes in FinFETs Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 267: 1222-1225. DOI: 10.1016/J.Nimb.2009.01.019  0.541
2008 Carlton DB, Emley NC, Tuchfeld E, Bokor J. Simulation studies of nanomagnet-based logic architecture. Nano Letters. 8: 4173-8. PMID 19053798 DOI: 10.1021/Nl801607P  0.312
2008 Weis CD, Schuh A, Batra A, Persaud A, Rangelow IW, Bokor J, Lo CC, Cabrini S, Sideras-Haddad E, Fuchs GD, Hanson R, Awschalom DD, Schenkel T. Single atom doping for quantum device development in diamond and silicon Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 26: 2596-2600. DOI: 10.1116/1.2968614  0.554
2008 Lo CC, Bokor J, Schenkel T, He J, Tyryshkin AM, Lyon SA. Spin-dependent scattering off neutral antimony donors in Si28 field-effect transistors (Applied Physics Letters (2007) 91 (242106)) Applied Physics Letters. 92. DOI: 10.1063/1.2890086  0.54
2007 Paulo AS, Arellano N, Plaza JA, He R, Carraro C, Maboudian R, Howe RT, Bokor J, Yang P. Suspended mechanical structures based on elastic silicon nanowire arrays. Nano Letters. 7: 1100-4. PMID 17375964 DOI: 10.1021/Nl062877N  0.768
2007 Lo CC, Bokor J, Schenkel T, Tyryshkin AM, Lyon SA. Spin-dependent scattering off neutral antimony donors in Si28 field-effect transistors Applied Physics Letters. 91: 242106. DOI: 10.1063/1.2817966  0.555
2007 Batra A, Weis CD, Reijonen J, Persaud A, Schenkel T, Cabrini S, Lo CC, Bokor J. Detection of low energy single ion impacts in micron scale transistors at room temperature Applied Physics Letters. 91. DOI: 10.1063/1.2805634  0.565
2007 Wang S, Barman A, Schmidt H, Maas JD, Hawkins AR, Kwon S, Harteneck B, Cabrini S, Bokor J. Optimization of nano-magneto-optic sensitivity using dual dielectric layer enhancement Applied Physics Letters. 90. DOI: 10.1063/1.2750389  0.306
2007 Barman A, Wang S, Maas J, Hawkins AR, Kwon S, Bokor J, Liddle A, Schmidt H. Size dependent damping in picosecond dynamics of single nanomagnets Applied Physics Letters. 90. DOI: 10.1063/1.2740588  0.334
2007 San Paulo A, Quevy E, Black J, Howe RT, White R, Bokor J. Mode shape imaging of out-of-plane and in-plane vibrating RF micromechanical resonators by atomic force microscopy Microelectronic Engineering. 84: 1354-1357. DOI: 10.1016/J.Mee.2007.01.223  0.499
2006 Barman A, Wang S, Maas JD, Hawkins AR, Kwon S, Liddle A, Bokor J, Schmidt H. Magneto-optical observation of picosecond dynamics of single nanomagnets. Nano Letters. 6: 2939-44. PMID 17163735 DOI: 10.1021/Nl0623457  0.325
2006 Bradbury FR, Tyryshkin AM, Sabouret G, Bokor J, Schenkel T, Lyon SA. Stark tuning of donor electron spins in silicon. Physical Review Letters. 97: 176404. PMID 17155489 DOI: 10.1103/Physrevlett.97.176404  0.306
2006 Tseng YC, Phoa K, Carlton D, Bokor J. Effect of diameter variation in a large set of carbon nanotube transistors. Nano Letters. 6: 1364-8. PMID 16834412 DOI: 10.1021/Nl060305X  0.509
2006 Schenkel T, Liddle JA, Persaud A, Tyryshkin AM, Lyon SA, De Sousa R, Whaley KB, Bokor J, Shangkuan J, Chakarov I. Electrical activation and electron spin coherence of ultralow dose antimony implants in silicon Applied Physics Letters. 88. DOI: 10.1063/1.2182068  0.307
2006 Schenkel T, Liddle JA, Bokor J, Persaud A, Park SJ, Shangkuan J, Lo CC, Kwon S, Lyon SA, Tyryshkin AM, Rangelow IW, Sarov Y, Schneider DH, Ager J, de Sousa R. Strategies for integration of donor electron spin qubits in silicon Microelectronic Engineering. 83: 1814-1817. DOI: 10.1016/J.Mee.2006.01.234  0.559
2006 Quévy EP, San Paulo A, Basol E, Howe RT, King TJ, Bokor J. Back-end-of-line poly-SiGe disk resonators Proceedings of the Ieee International Conference On Micro Electro Mechanical Systems (Mems). 2006: 234-237.  0.408
2005 Kwon S, Yan X, Contreras AM, Liddle JA, Somorjai GA, Bokor J. Fabrication of metallic nanodots in large-area arrays by mold-to-mold cross imprinting (MTMCI). Nano Letters. 5: 2557-62. PMID 16351215 DOI: 10.1021/Nl051932+  0.301
2005 Qureshi N, Wang S, Lowther MA, Hawkins AR, Kwon S, Liddle A, Bokor J, Schmidt H. Cavity-enhanced magnetooptical observation of magnetization reversal in individual single-domain nanomagnets. Nano Letters. 5: 1413-7. PMID 16178249 DOI: 10.1021/Nl050753P  0.304
2005 Lin J, Xuan P, Bokor J. Characterization of chemical vapor deposition growth yields of carbon nanotube transistors Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 44: 6859-6861. DOI: 10.1143/Jjap.44.6859  0.576
2005 Shumway MD, Naulleau P, Goldberg KA, Bokor J. Measuring line roughness through aerial image contrast variation using coherent exteme ultraviolet spatial filtering techniques Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 2844-2847. DOI: 10.1116/1.2134717  0.764
2005 Xiong S, King TJ, Bokor J. A comparison study of symmetric ultrathin-body double-gate devices with metal source/drain and doped source/drain Ieee Transactions On Electron Devices. 52: 1859-1867. DOI: 10.1109/Ted.2005.852893  0.506
2005 Xiong S, Bokor J. Structural optimization of SUTBDG devices for low-power applications Ieee Transactions On Electron Devices. 52: 360-366. DOI: 10.1109/Ted.2005.843869  0.513
2005 Xiong S, King TJ, Bokor J. Study of the extrinsic parasitics in nano-scale transistors Semiconductor Science and Technology. 20: 652-657. DOI: 10.1088/0268-1242/20/6/029  0.504
2005 Paulo AS, Bokor J, Howe RT, He R, Yang P, Gao D, Carraro C, Maboudian R. Mechanical elasticity of single and double clamped silicon nanobeams fabricated by the vapor-liquid-solid method Applied Physics Letters. 87. DOI: 10.1063/1.2008364  0.648
2005 Persaud A, Park SJ, Liddle JA, Rangelow IW, Bokor J, Keller R, Allen FI, Schneider DH, Schenkel T. Quantum computer development with single ion implantation Experimental Aspects of Quantum Computing. 233-245. DOI: 10.1007/S11128-004-3879-1  0.311
2005 Yan XM, Kwon S, Contreras AM, Koebel MM, Bokor J, Somorjai GA. Fabrication of dense arrays of platinum nanowires on silica, alumina, zirconia and ceria surfaces as 2-D model catalysts Catalysis Letters. 105: 127-132. DOI: 10.1007/S10562-005-8681-X  0.302
2004 Yueh W, Cao H, Chandhok M, Lee S, Shumway M, Bokor J. Patterning capabilities of EUV resists Proceedings of Spie - the International Society For Optical Engineering. 5376: 434-442. DOI: 10.1117/12.536021  0.746
2004 Shumway MD, Snow EL, Goldberg KA, Naulleau P, Cao H, Chandhok M, Liddle A, Anderson E, Bokor J. EUV resist imaging below 50 nm using coherent spatial filtering techniques Proceedings of Spie - the International Society For Optical Engineering. 5374: 454-459. DOI: 10.1117/12.535666  0.756
2004 Park SJ, Liddle JA, Persaud A, Allen FI, Schenkel T, Bokor J. Formation of 15 nm scale Coulomb blockade structures in silicon by electron beam lithography with a bilayer resist process Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22: 3115-3118. DOI: 10.1116/1.1825012  0.304
2004 Xiong S, Bokor J, Xiang Q, Fisher P, Dudley I, Rao P, Wang H, En B. Is gate line edge roughness a first-order issue in affecting the performance of deep sub-micro bulk MOSFET devices? Ieee Transactions On Semiconductor Manufacturing. 17: 357-361. DOI: 10.1109/Tsm.2004.831560  0.534
2004 Xiong S, Bokor J. A simulation study of gate line edge roughness effects on doping profiles of short-channel MOSFET devices Ieee Transactions On Electron Devices. 51: 228-232. DOI: 10.1109/Ted.2003.821563  0.52
2004 Liu H, Sin JKO, Xuan P, Bokor J. Characterization of the ultrathin vertical channel CMOS technology Ieee Transactions On Electron Devices. 51: 106-112. DOI: 10.1109/Ted.2003.821388  0.605
2004 Tseng YC, Xuan P, Javey A, Malloy R, Wang Q, Bokor J, Dai H. Monolithic Integration of Carbon Nanotube Devices with Silicon MOS Technology Nano Letters. 4: 123-127. DOI: 10.1021/Nl0349707  0.684
2004 Park SJ, Persaud A, Liddle JA, Nilsson J, Bokor J, Schneider DH, Rangelow IW, Schenkel T. Processing issues in top-down approaches to quantum computer development in silicon Microelectronic Engineering. 73: 695-700. DOI: 10.1016/J.Mee.2004.03.037  0.342
2004 Pu NW, Pan EY, Bokor J. Sensitive detection of laser damage to Mo/Si multilayers by picosecond ultrasonics Applied Physics B: Lasers and Optics. 79: 107-112. DOI: 10.1007/S00340-004-1462-1  0.587
2003 Pu NW, Bokor J. Study of surface and bulk acoustic phonon excitations in superlattices using picosecond ultrasonics. Physical Review Letters. 91: 076101. PMID 12935032 DOI: 10.1103/Physrevlett.91.076101  0.583
2003 Naulleau PP, Goldberg KA, Batson P, Bokor J, Denham P, Rekawa S. Fourier-synthesis custom-coherence illuminator for extreme ultraviolet microfield lithography. Applied Optics. 42: 820-6. PMID 12593485 DOI: 10.1364/Ao.42.000820  0.579
2003 Choi Y, Lee JS, Zhu J, Somorjai GA, Lee LP, Bokor J. Sublithographic nanofabrication technology for nanocatalysts and DNA chips Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 21: 2951. DOI: 10.1116/1.1627805  0.332
2003 Naulleau P, Goldberg KA, Anderson EH, Bokor J, Harteneck B, Jackson K, Olynick D, Salmassi F, Baker S, Mirkarimi P, Spiller E, Walton C, O’Connell D, Yan P, Zhang G. Printing-based performance analysis of the engineering test stand set-2 optic using a synchrotron exposure station with variable sigma Journal of Vacuum Science & Technology B. 21: 2697-2700. DOI: 10.1116/1.1621669  0.562
2003 Naulleau P, Goldberg KA, Anderson EH, Bokor J, Gullikson E, Harteneck B, Jackson K, Olynick D, Salmassi F, Baker S, Mirkarimi P, Spiller E, Walton C, Zhang G. Lithographic characterization of the printability of programmed extreme ultraviolet substrate defects Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 21: 1286. DOI: 10.1116/1.1580839  0.534
2003 Xiong S, Bokor J. Sensitivity of Double-Gate and FinFET Devices to Process Variations Ieee Transactions On Electron Devices. 50: 2255-2261. DOI: 10.1109/Ted.2003.818594  0.531
2003 Chang L, Choi YK, Kedzierski J, Lindert N, Xuan P, Bokor J, Hu C, King TJ. Moore's law lives on Ieee Circuits and Devices Magazine. 19: 35-42. DOI: 10.1109/Mcd.2003.1175106  0.603
2003 Xuan P, Bokor J. Investigation of NiSi and TiSi as CMOS Gate Materials Ieee Electron Device Letters. 24: 634-636. DOI: 10.1109/Led.2003.817371  0.599
2003 Schenkel T, Persaud A, Park SJ, Nilsson J, Bokor J, Liddle JA, Keller R, Schneider DH, Cheng DW, Humphries DE. Solid state quantum computer development in silicon with single ion implantation Journal of Applied Physics. 94: 7017-7024. DOI: 10.1063/1.1622109  0.308
2003 Choi Y, Zhu J, Grunes J, Bokor J, Somorjai GA. Fabrication of Sub-10-nm Silicon Nanowire Arrays by Size Reduction Lithography The Journal of Physical Chemistry B. 107: 3340-3343. DOI: 10.1021/Jp0222649  0.316
2002 Goldberg KA, Naulleau P, Bokor J. Fourier transform interferometer alignment method. Applied Optics. 41: 4477-83. PMID 12153074 DOI: 10.1364/Ao.41.004477  0.545
2002 Naulleau P, Goldberg KA, Anderson EH, Attwood D, Batson P, Bokor J, Denham P, Gullikson E, Harteneck B, Hoef B, Jackson K, Olynick D, Rekawa S, Salmassi F, Blaedel K, et al. Sub-70 nm extreme ultraviolet lithography at the Advanced Light Source static microfield exposure station using the engineering test stand set-2 optic Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 20: 2829. DOI: 10.1116/1.1524976  0.571
2002 Goldberg KA, Naulleau P, Bokor J, Chapman HN, Barty A. Testing extreme ultraviolet optics with visible-light and extreme ultraviolet interferometry Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 20: 2834. DOI: 10.1116/1.1523401  0.568
2002 Yeo YC, Subramanian V, Kedzierski J, Xuan P, King TJ, Bokor J, Hu C. Design and fabrication of 50-nm thin-body p-MOSFETs with a SiGe heterostructure channel Ieee Transactions On Electron Devices. 49: 279-286. DOI: 10.1109/16.981218  0.579
2001 Goldberg KA, Bokor J. Fourier-transform method of phase-shift determination. Applied Optics. 40: 2886-94. PMID 18357307 DOI: 10.1364/Ao.40.002886  0.509
2001 Lee SH, Naulleau P, Goldberg KA, Cho CH, Jeong S, Bokor J. Extreme-ultraviolet lensless Fourier-transform holography. Applied Optics. 40: 2655-61. PMID 18357280 DOI: 10.1364/Ao.40.002655  0.563
2001 Tichenor DA, Ray-Chaudhuri AK, Replogle WC, Stulen RH, Kubiak GD, Rockett PD, Klebanoff LE, Jefferson KL, Leung AH, Wronosky JB, Hale LC, Chapman HN, Taylor JS, Folta JA, Montcalm C, ... ... Bokor J, et al. System integration and performance of the EUV engineering test stand Proceedings of Spie - the International Society For Optical Engineering. 4343: 19-37. DOI: 10.1117/12.436665  0.573
2001 Naulleau PP, Goldberg KA, Anderson EH, Batson PJ, Denham P, Jackson KH, Rekawa S, Bokor J. Adding static printing capabilities to the EUV phase-shifting point diffraction interferometer Lawrence Berkeley National Laboratory. 4343: 639-645. DOI: 10.1117/12.436633  0.569
2001 Naulleau P, Goldberg KA, Anderson EH, Batson P, Denham PE, Jackson KH, Gullikson EM, Rekawa S, Bokor J. At-wavelength characterization of the extreme ultraviolet engineering test stand set-2 optic Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 19: 2396-2400. DOI: 10.1116/1.1421545  0.556
2001 Chapman HN, Ray-Chaudhuri AK, Tichenor DA, Replogle WC, Stulen RH, Kubiak GD, Rockett PD, Klebanoff LE, O'Connell D, Leung AH, Jefferson KL, Wronosky JB, Taylor JS, Hale LC, Blaedel K, ... ... Bokor J, et al. First lithographic results from the extreme ultraviolet engineering test stand Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 19: 2389-2395. DOI: 10.1116/1.1414017  0.539
2001 Lindert N, Chang L, Choi YK, Anderson EH, Lee WC, King TJ, Bokor J, Hu C. Sub-60-nm quasi-planar FinFETs fabricated using a simplified process Ieee Electron Device Letters. 22: 487-489. DOI: 10.1109/55.954920  0.348
2001 Huang X, Lee W, Kuo C, Hisamoto D, Chang L, Kedzierski J, Anderson E, Takeuchi H, Choi Y, Asano K, Subramanian V, King T, Bokor J, Hu C. Sub-50 nm P-channel FinFET Ieee Transactions On Electron Devices. 48: 880-886. DOI: 10.1109/16.918235  0.316
2001 Naulleau PP, Anderson EH, Gullikson EM, Bokor J. Fabrication of high-efficiency multilayer-coated binary blazed gratings in the EUV regime Optics Communications. 200: 27-34. DOI: 10.1016/S0030-4018(01)01647-9  0.301
2000 Naulleau P, Goldberg KA, Gullikson EM, Bokor J. At-wavelength, system-level flare characterization of extreme-ultraviolet optical systems. Applied Optics. 39: 2941-7. PMID 18345220 DOI: 10.1364/Ao.39.002941  0.563
2000 Naulleau PP, Goldberg KA, Bokor J. Extreme ultraviolet carrier-frequency shearing interferometry of a lithographic four-mirror optical system Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 2939-2943. DOI: 10.1116/1.1321290  0.537
2000 Goldberg KA, Naulleau P, Batson P, Denham P, Anderson EH, Chapman H, Bokor J. Extreme ultraviolet alignment and testing of a four-mirror ring field extreme ultraviolet optical system Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 18: 2911. DOI: 10.1116/1.1319703  0.572
2000 Kedzierski J, Anderson E, Bokor J. Calixarene G-line double resist process with 15 nm resolution and large area exposure capability Journal of Vacuum Science & Technology B. 18: 3428-3430. DOI: 10.1116/1.1314386  0.727
2000 Lee SH, Bokor J, Naulleau P, Jeong ST, Goldberg KA. Extreme ultraviolet holographic microscopy and its application to extreme ultraviolet mask-blank defect characterization Journal of Vacuum Science & Technology B. 18: 2935-2938. DOI: 10.1116/1.1314382  0.568
2000 Choi YK, Asano K, Lindert N, Subramanian V, King TJ, Bokor J, Chenming H. Ultrathin-body SOI MOSFET for deep-sub-tenth micron era Ieee Electron Device Letters. 21: 254-255. DOI: 10.1109/55.841313  0.316
2000 Yeo YC, Subramanian V, Kedzierski J, Xuan P, King TJ, Bokor J, Hu C. Nanoscale ultra-thin-body silicon-on-insulator P-MOSFET with a SiGe/Si heterostructure channel Ieee Electron Device Letters. 21: 161-163. DOI: 10.1109/55.830968  0.579
2000 Kedzierski J, Xuan P, Subramanian V, Bokor J, King TJ, Hu C, Anderson E. 20 nm gate-length ultra-thin body p-MOSFET with silicide source/drain Superlattices and Microstructures. 28: 445-452. DOI: 10.1006/Spmi.2000.0947  0.615
1999 Naulleau PP, Goldberg KA, Lee SH, Chang C, Attwood D, Bokor J. Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy. Applied Optics. 38: 7252-63. PMID 18324274 DOI: 10.1364/Ao.38.007252  0.54
1999 Kedzierski J, Bokor J, Anderson E. Novel method for silicon quantum wire transistor fabrication Journal of Vacuum Science & Technology B. 17: 3244-3247. DOI: 10.1116/1.590989  0.732
1999 Pu N, Bokor J, Jeong S, Zhao R. Nondestructive picosecond-ultrasonic characterization of Mo/Si extreme ultraviolet multilayer reflection coatings Journal of Vacuum Science & Technology B. 17: 3014-3018. DOI: 10.1116/1.590945  0.595
1999 Naulleau PP, Goldberg KA, Gullikson EM, Bokor J. Interferometric at-wavelength flare characterization of extreme ultraviolet optical systems Journal of Vacuum Science & Technology B. 17: 2987-2991. DOI: 10.1116/1.590940  0.567
1999 Goldberg KA, Naulleau PP, Bokor J. Extreme ultraviolet interferometric measurements of diffraction-limited optics Journal of Vacuum Science & Technology B. 17: 2982-2986. DOI: 10.1116/1.590939  0.571
1999 Attwood DT, Naulleau P, Goldberg KA, Tejnil E, Chang C, Beguiristain R, Batson P, Bokor J, Gullikson EM, Koike M, Medecki H, Underwood JH. Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions Ieee Journal of Quantum Electronics. 35: 709-719. DOI: 10.1109/3.760317  0.555
1999 Pu N, Bokor J, Jeong S, Zhao R. Picosecond ultrasonic study of Mo/Si multilayer structures using an alternating-pump technique Applied Physics Letters. 74: 320-322. DOI: 10.1063/1.123010  0.589
1998 Tejnil E, Goldberg KA, Bokor J. Phase effects owing to multilayer coatings in a two-mirror extreme-ultraviolet schwarzschild objective. Applied Optics. 37: 8021-9. PMID 18301694 DOI: 10.1364/Ao.37.008021  0.539
1998 Budiarto E, Pu NW, Jeong S, Bokor J. Near-field propagation of terahertz pulses from a large-aperture antenna. Optics Letters. 23: 213-5. PMID 18084463 DOI: 10.1364/Ol.23.000213  0.592
1998 Goldberg KA, Naulleau P, Lee S, Bresloff C, Henderson C, Attwood D, Bokor J. High-accuracy interferometry of extreme ultraviolet lithographic optical systems Journal of Vacuum Science & Technology B. 16: 3435-3439. DOI: 10.1116/1.590498  0.557
1998 Lee SH, Naulleau P, Goldberg K, Tejnil E, Medecki H, Bresloff C, Chang C, Attwood D, Bokor J. At-wavelength interferometry of extreme ultraviolet lithographic optics Characterization and Metrology For Ulsi Technology. 449: 553-557. DOI: 10.1063/1.56843  0.562
1997 Kedzierski J, Bokor J, Kisielowski C. Fabrication of planar silicon nanowires on silicon-on-insulator using stress limited oxidation Journal of Vacuum Science & Technology B. 15: 2825-2828. DOI: 10.1116/1.589736  0.725
1997 Tejnil E, Goldberg KA, Lee S, Medecki H, Batson PJ, Denham PE, MacDowell AA, Bokor J, Attwood D. At-wavelength interferometry for extreme ultraviolet lithography Journal of Vacuum Science & Technology B. 15: 2455-2461. DOI: 10.1116/1.589666  0.559
1996 Medecki H, Tejnil E, Goldberg KA, Bokor J. Phase-shifting point diffraction interferometer. Optics Letters. 21: 1526-8. PMID 19881713  0.507
1996 Bokor J, Neureuther AR, Oldham WG. Advanced lithography for ULSI Ieee Circuits and Devices Magazine. 12: 11-15. DOI: 10.1109/101.481203  0.302
1996 Beguiristain R, Goldberg KA, Tejnil E, Bokor J, Medecki H, Attwood DT, Jackson K. Interferometry using undulator sources (invited, abstract) Review of Scientific Instruments. 67: 3353-3353. DOI: 10.1063/1.1147396  0.543
1995 Goldberg KA, Beguiristain R, Bokor J, Medecki H, Attwood DT, Jackson K, Tejnil E, Sommargren GE. Progress towards λ/20 extreme ultraviolet interferometry Journal of Vacuum Science & Technology B. 13: 2923-2927. DOI: 10.1116/1.588280  0.545
1993 Macdowell AA, Bjorkholm JE, Early K, Freeman RR, Himel MD, Mulgrew PP, Szeto LH, Taylor DW, Tennant DM, Wood Ii OR, Bokor J, Eichner L, Jewell TE, Waskiewicz WK, White DL, et al. Soft-x-ray projection imaging with a 1:1 ring-field optic. Applied Optics. 32: 7072-8. PMID 20856570 DOI: 10.1364/Ao.32.007072  0.305
1993 Murnane MM, Kapteyn HC, Gordon SP, Bokor J, Glytsis EN, Falcone RW. Efficient coupling of high-intensity subpicosecond laser pulses into solids Applied Physics Letters. 62: 1068-1070. DOI: 10.1063/1.108797  0.516
1992 Yan RH, Lee KF, Jeon DY, Kim YO, Park BG, Pinto MR, Rafferty CS, Tennant DM, Westerwick EH, Chin GM, Morris MD, Early K, Mulgrew P, Mansfield WM, Watts RK, ... ... Bokor J, et al. 89-GHz fT Room-Temperature Silicon MOSFET's Ieee Electron Device Letters. 13: 256-258. DOI: 10.1109/55.145045  0.318
1992 MacDowell AA, Bjorkholm JE, Bokor J, Eichner L, Freeman RR, Pastalan JZ, Szeto LH, Tennant DM, Wood OR, Jewell TE, Mansfield WM, Waskiewicz WK, White DL, Windt DL. Reduction imaging with soft x rays for projection lithography Review of Scientific Instruments. 63: 737-740. DOI: 10.1063/1.1142648  0.308
1991 MacDowell AA, Bjorkholm JE, Bokor J, Eichner L, Freeman RR, Mansfield WM, Pastalan J, Szeto LH, Tennant DM, Wood OR, Jewell TE, Waskiewicz WK, White DL, Windt DL, Silfvast WT, et al. Soft x‐ray projection lithography using a 1:1 ring field optical system Journal of Vacuum Science & Technology B. 9: 3193-3197. DOI: 10.1116/1.585315  0.307
1991 Bjorkholm JE, Bokor J, Eichner L, Freeman RR, Gregus J, Jewell TE, Mansfield WM, MacDowell AA, O'Malley ML, Raab EL, Silfvast WT, Szeto LH, Tennant DM, Waskiewicz WK, White DL, et al. Experiments in projection lithography using soft x-ray Microelectronic Engineering. 13: 243-250. DOI: 10.1016/0167-9317(91)90085-R  0.3
1990 Bjorkholm JE, Bokor J, Eichner L, Freeman RR, Gregus J, Jewell TE, Mansfield WM, Dowell AAM, Raab EL, Silfvast WT, Szeto LH, Tennant DM, Waskiewicz WK, White DL, Windt DL, et al. Reduction imaging at 14 nm using multilayer‐coated optics: Printing of features smaller than 0.1 μm Journal of Vacuum Science & Technology B. 8: 1509-1513. DOI: 10.1116/1.585106  0.33
1989 Halas NJ, Bokor J. Surface Recombination on the Si(111) 2 x 1 Surface. Physical Review Letters. 62: 1679-1682. PMID 10039736 DOI: 10.1103/PhysRevLett.62.1679  0.375
1989 Bokor J, Halas N. Time-resolved study of silicon surface recombination Ieee Journal of Quantum Electronics. 25: 2550-2555. DOI: 10.1109/3.40641  0.478
1986 Bokor J, Storz R, Freeman RR, Bucksbaum PH. Picosecond surface electron dynamics on photoexcited Si(111)(2 x 1) surfacs surfaces. Physical Review Letters. 57: 881-884. PMID 10034185 DOI: 10.1103/PhysRevLett.57.881  0.436
1985 Haight R, Bokor J, Stark J, Storz RH, Freeman RR, Bucksbaum PH. Picosecond time-resolved photoemission study of the InP(110) surface. Physical Review Letters. 54: 1302-1305. PMID 10030990 DOI: 10.1103/Physrevlett.54.1302  0.517
1985 Bokor J, Haight R, Storz RH, Stark J, Freeman RR, Bucksbaum PH. Time- and angle-resolved photoemission study of InP(110). Physical Review. B, Condensed Matter. 32: 3669-3675. PMID 9937516 DOI: 10.1103/Physrevb.32.3669  0.5
1983 Bokor J, Bucksbaum PH, Freeman RR. Generation of 35.5-nm coherent radiation. Optics Letters. 8: 217-9. PMID 19714189 DOI: 10.1364/Ol.8.000217  0.513
1983 Falcone RW, Bokor J. Dichroic beam splitter for extreme-ultraviolet and visible radiation. Optics Letters. 8: 21-3. PMID 19714122 DOI: 10.1364/Ol.8.000021  0.516
1982 Srinivasan T, Egger H, Boyer K, Pummer H, Rhodes CK, Luk TS, Muller DF, Rothschild M, Bokor J, Freeman RR, Cooke WE, Schomburg H, Döbele HF, Rückle B, Bloomfield LA, et al. New lasers, VUV sources Applied Physics B Photophysics and Laser Chemistry. 28: 198-207. DOI: 10.1007/Bf00697846  0.479
1981 Rothschild M, Egger H, Hawkins RT, Bokor J, Pummer H, Rhodes CK. High-resolution spectroscopy of molecular hydrogen in the extreme ultraviolet region Physical Review A. 23: 206-213. DOI: 10.1103/Physreva.23.206  0.51
1980 Egger H, Hawkins RT, Bokor J, Pummer H, Rothschild M, Rhodes CK. Generation of high-spectral-brightness tunable XUV radiation at 83 nm. Optics Letters. 5: 282-4. PMID 19693201 DOI: 10.1364/Ol.5.000282  0.532
1980 Kligler DJ, Bokor J, Rhodes CK. Collisional and radiative properties of the H2 E,F g1+ state Physical Review A. 21: 607-617. DOI: 10.1103/Physreva.21.607  0.509
1980 Bokor J, Zavelovich J, Rhodes CK. Multiphoton ultraviolet spectroscopy of some 6p levels in krypton Physical Review A. 21: 1453-1459. DOI: 10.1103/Physreva.21.1453  0.439
1980 Hawkins RT, Egger H, Bokor J, Rhodes CK. A tunable, ultrahigh spectral brightness KrF* excimer laser source Applied Physics Letters. 36: 391-392. DOI: 10.1063/1.91528  0.528
1980 Bokor J, Zavelovich J, Rhodes CK. Isotope effect in multiphoton ultraviolet photolysis of CO The Journal of Chemical Physics. 72: 965-971. DOI: 10.1063/1.439215  0.409
1979 Bischel W, Bokor J, Kligler D, Rhodes C. Nonlinear optical processes in atoms and molecules using rare-gas halide lasers Ieee Journal of Quantum Electronics. 15: 380-392. DOI: 10.1109/Jqe.1979.1070000  0.512
1979 Bokor J, Bischel WK, Rhodes CK. Doppler-free spectroscopy of the ν2 band in 14NH3: Application to 16-μm generation Journal of Applied Physics. 50: 4541-4544. DOI: 10.1063/1.326561  0.538
Show low-probability matches.