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John Colligon - Publications

Affiliations: 
2014- University of Huddersfield 
Website:
https://www.linkedin.com/in/john-colligon-362bb1109
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25 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2016 Colligon J, Yurasova V. Editorial for Special Issue with selected papers from the 22nd International Conference on the Interaction of Ions with Surfaces Vacuum. 129: 135-136. DOI: 10.1016/J.Vacuum.2016.04.009  0.37
2014 Vishnyakov V, Crisan O, Dobrosz P, Colligon J. Ion sputter-deposition and in-air crystallisation of Cr2AlC films Vacuum. 100: 61-65. DOI: 10.1016/J.Vacuum.2013.07.045  0.462
2013 Vishnyakov V, Lu J, Eklund P, Hultman L, Colligon J. Ti3SiC2-formation during Ti–C–Si multilayer deposition by magnetron sputtering at 650 °C Vacuum. 93: 56-59. DOI: 10.1016/J.Vacuum.2013.01.003  0.405
2012 Colligon J, Yurasova V. 20th International Conference on Ion Surface Interactions (ISI-2012) Vacuum. 86: 1613. DOI: 10.1016/J.Vacuum.2011.12.017  0.366
2011 Vishnyakov VM, Ehiasarian AP, Vishnyakov V, Hovsepian P, Colligon J. Amorphous Boron containing silicon carbo-nitrides created by ion sputtering Surface & Coatings Technology. 206: 149-154. DOI: 10.1016/J.Surfcoat.2011.07.002  0.48
2010 Milosavljević M, Wong L, Lourenço M, Valizadeh R, Colligon J, Shao G, Homewood K. Correlation of structural and optical properties of sputtered FeSi 2 thin films Japanese Journal of Applied Physics. 49. DOI: 10.1143/Jjap.49.081401  0.395
2006 Whitehead KA, Rogers D, Colligon J, Wright C, Verran J. Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal. Colloids and Surfaces. B, Biointerfaces. 51: 44-53. PMID 16822658 DOI: 10.1016/J.Colsurfb.2006.05.003  0.305
2005 Whitehead KA, Colligon J, Verran J. Retention of microbial cells in substratum surface features of micrometer and sub-micrometer dimensions. Colloids and Surfaces. B, Biointerfaces. 41: 129-38. PMID 15737538 DOI: 10.1016/J.Colsurfb.2004.11.010  0.315
2005 Milosavljević M, Shao G, Loureņo MA, Gwilliam RM, Homewood KP, Edwards SP, Valizadeh R, Colligon JS. Transition from amorphous to crystalline beta phase in co-sputtered Fe Si2 films as a function of temperature Journal of Applied Physics. 98. DOI: 10.1063/1.2148629  0.397
2005 Polini R, Amar M, Ahmed W, Kumashiro S, Sein H, Colligon J. A study of diamond synthesis by hot filament chemical vapour deposition on nanocomposite coatings Thin Solid Films. 489: 116-121. DOI: 10.1016/J.Tsf.2005.04.119  0.437
2005 Colligon J, Vishnyakov V, Valizadeh R, Donnelly SE, Kumashiro S. Study of nanocrystalline TiN/Si3N4 thin films deposited using a dual ion beam method Thin Solid Films. 485: 148-154. DOI: 10.1016/J.Tsf.2005.03.036  0.451
2004 Colligon JS. Ion-assisted sputter deposition. Philosophical Transactions. Series a, Mathematical, Physical, and Engineering Sciences. 362: 103-16. PMID 15306278 DOI: 10.1098/rsta.2003.1303  0.381
2004 Whitehead KA, Colligon JS, Verran J. The production of surfaces of defined topography and chemistry for microbial retention studies, using ion beam sputtering technology International Biodeterioration and Biodegradation. 54: 143-151. DOI: 10.1016/J.Ibiod.2004.03.010  0.4
1996 Arnell R, Colligon J, Minnebaev K, Yurasova V. The effect of nitrogen content on the structure and mechanical properties of TiN films produced by magnetron sputtering Vacuum. 47: 425-431. DOI: 10.1016/0042-207X(95)00241-3  0.409
1995 Colligon J, Kheyrandish H, Carter G, Simmonds M. The modification of alloys by low energy ion-assisted deposition Vacuum. 46: 919-922. DOI: 10.1016/0042-207X(95)00072-0  0.452
1994 Valizadeh R, Colligon J, Donnelly SE, Faunce CA, Park D, Kheyrandish H. Composition and Structure of Zirconium Nitride Films Produced by Ion Assisted Deposition Mrs Proceedings. 354. DOI: 10.1557/Proc-354-81  0.492
1992 Colligon J, Kheyrandish H, Kaye S. Ion bombardment effects on SnO2 and MoS2 films Vacuum. 43: 135. DOI: 10.1016/0042-207X(92)90199-7  0.461
1989 Colligon J, Kheyrandish H. Radiation enhanced adhesion of thin films Vacuum. 39: 705-710. DOI: 10.1016/0042-207X(89)90021-3  0.398
1987 Hull T, Colligon J, Hill A. Measurement of thin film adhesion Vacuum. 37: 327-330. DOI: 10.1016/0042-207X(87)90018-2  0.37
1986 Colligon J. Surface modification by ion beams Vacuum. 36: 413-418. DOI: 10.1016/0042-207X(86)90218-6  0.418
1984 Colligon J, Hill A, Kheyrandish H. Applications of dynamic recoil mixing (DRM) Vacuum. 34: 843-846. DOI: 10.1016/0042-207X(84)90161-1  0.35
1982 Grant W, Colligon J. Ion beam techniques for material modification Vacuum. 32: 675-683. DOI: 10.1016/0042-207X(82)94047-7  0.425
1982 Bolouri H, Colligon J. A simple efficient SIMS apparatus for use on accelerator beam lines Vacuum. 32: 293-295. DOI: 10.1016/0042-207X(82)93817-9  0.346
1979 Colligon J, Kiriakidis G. Effect of impurities on SIMS Vacuum. 29: 357-360. DOI: 10.1016/0042-207X(79)90314-2  0.475
1974 Colligon J. Surface compositional analysis using low energy ion bombardment induced emission processes Vacuum. 24: 373-388. DOI: 10.1016/0042-207X(74)92117-4  0.325
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