Year |
Citation |
Score |
2019 |
Park JB, Davis WR, Franzon PD. 3-D-DATE: A Circuit-Level Three-Dimensional DRAM Area, Timing, and Energy Model Ieee Transactions On Circuits and Systems I: Regular Papers. 66: 756-768. DOI: 10.1109/Tcsi.2018.2868901 |
0.314 |
|
2014 |
Chen X, Zhu T, Davis WR, Franzon PD. Adaptive and reliable clock distribution design for 3-D integrated circuits Ieee Transactions On Components, Packaging and Manufacturing Technology. 4: 1862-1870. DOI: 10.1109/Tcpmt.2014.2361356 |
0.328 |
|
2012 |
Harris TR, Priyadarshi S, Melamed S, Ortega C, Manohar R, Dooley SR, Kriplani NM, Davis WR, Franzon PD, Steer MB. A transient electrothermal analysis of three-dimensional integrated circuits Ieee Transactions On Components, Packaging and Manufacturing Technology. 2: 660-667. DOI: 10.1109/Tcpmt.2011.2178414 |
0.325 |
|
2012 |
Priyadarshi S, Saunders CS, Kriplani NM, Demircioglu H, Davis WR, Franzon PD, Steer MB. Parallel transient simulation of multiphysics circuits using delay-based partitioning Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 1522-1535. DOI: 10.1109/Tcad.2012.2201156 |
0.323 |
|
2012 |
Melamed S, Thorolfsson T, Harris TR, Priyadarshi S, Franzon P, Steer MB, Davis WR. Junction-level thermal analysis of 3-d integrated circuits using high definition power blurring Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 676-689. DOI: 10.1109/Tcad.2011.2180384 |
0.335 |
|
2012 |
Priyadarshi S, Harris TR, Melamed S, Otero C, Kriplani NM, Christoffersen CE, Manohar R, Dooley SR, Davis WR, Franzon PD, Steer MB. Dynamic electrothermal simulation of three-dimensional integrated circuits using standard cell macromodels Iet Circuits, Devices and Systems. 6: 35-44. DOI: 10.1049/Iet-Cds.2011.0061 |
0.335 |
|
2011 |
Chen X, Zhu T, Davis WR. Three-dimensional SRAM design with on-chip access time measurement Electronics Letters. 47: 485-486. DOI: 10.1049/El.2010.3701 |
0.321 |
|
2009 |
Davis WR, Oh EC, Sule AM, Franzon PD. Application exploration for 3-D integrated circuits: TCAM, FIFO, and FFT case studies Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 17: 496-506. DOI: 10.1109/Tvlsi.2008.2009352 |
0.344 |
|
Show low-probability matches. |