Year |
Citation |
Score |
2020 |
Nikoobakht B, Hansen RP, Zong Y, Agrawal A, Shur M, Tersoff J. High-brightness lasing at submicrometer enabled by droop-free fin light-emitting diodes (LEDs). Science Advances. 6: eaba4346. PMID 32851164 DOI: 10.1126/Sciadv.Aba4346 |
0.354 |
|
2020 |
Liu X, Ytterdal T, Shur M. Plasmonic FET Terahertz Spectrometer Ieee Access. 8: 56039-56044. DOI: 10.1109/Access.2020.2982275 |
0.377 |
|
2020 |
Aizin GR, Mikalopas J, Shur M. Plasmonic instabilities in two-dimensional electron channels of variable width Physical Review B. 101. DOI: 10.1103/Physrevb.101.245404 |
0.379 |
|
2020 |
Ryzhii V, Ryzhii M, Otsuji T, E Karasik V, Leiman V, Mitin V, Shur MS. Multiple graphene-layer-based heterostructures with van der Waals barrier layers for terahertz superluminescent and laser diodes with lateral/vertical current injection Semiconductor Science and Technology. 35: 085023. DOI: 10.1088/1361-6641/Ab9398 |
0.356 |
|
2020 |
Ryzhii V, Otsuji T, Shur M. Graphene based plasma-wave devices for terahertz applications Applied Physics Letters. 116: 140501. DOI: 10.1063/1.5140712 |
0.335 |
|
2019 |
Ponomarev DS, Lavrukhin DV, Yachmenev AE, Khabibullin RA, Semenikhin IE, Vyurkov VV, Marem’yanin KV, Gavrilenko VI, Ryzhii M, Shur M, Otsuji T, Ryzhii V. Sub-terahertz FET detector with self-assembled Sn-nanothreads Journal of Physics D: Applied Physics. 53: 075102. DOI: 10.1088/1361-6463/Ab588F |
0.352 |
|
2019 |
Shur M. Wide band gap semiconductor technology: State-of-the-art Solid-State Electronics. 155: 65-75. DOI: 10.1016/J.Sse.2019.03.020 |
0.388 |
|
2018 |
Ryzhii V, Otsuji T, Ryzhii M, Ponomarev DS, Karasik VE, Leiman VG, Mitin V, Shur MS. Electrical modulation of terahertz radiation using graphene-phosphorene heterostructures Semiconductor Science and Technology. 33: 124010. DOI: 10.1088/1361-6641/Aae9B2 |
0.327 |
|
2018 |
Shur M, Rudin S, Rupper G, Ivanov T. p-Diamond as candidate for plasmonic terahertz and far infrared applications Applied Physics Letters. 113: 253502. DOI: 10.1063/1.5053091 |
0.362 |
|
2017 |
Liu G, Rumyantsev S, Bloodgood MA, Salguero TT, Shur M, Balandin AA. Low-Frequency Electronic Noise in Quasi-1D TaSe3 van der Waals Nanowires. Nano Letters. 17: 377-383. PMID 28073263 DOI: 10.1021/Acs.Nanolett.6B04334 |
0.573 |
|
2017 |
Shur M, Rupper G, Rudin S. Ultimate limits for highest modulation frequency and shortest response time of field effect transistor Proceedings of Spie. 10194. DOI: 10.1117/12.2261105 |
0.377 |
|
2017 |
Shatalov M, Jain R, Saxena T, Dobrinsky A, Shur M. Development of Deep UV LEDs and Current Problems in Material and Device Technology Semiconductors and Semimetals. 96: 45-83. DOI: 10.1016/Bs.Semsem.2016.08.002 |
0.366 |
|
2016 |
Stolyarov MA, Liu G, Bloodgood MA, Aytan E, Jiang C, Samnakay R, Salguero TT, Nika DL, Rumyantsev SL, Shur MS, Bozhilov KN, Balandin AA. Breakdown current density in h-BN-capped quasi-1D TaSe3 metallic nanowires: prospects of interconnect applications. Nanoscale. PMID 27531559 DOI: 10.1039/C6Nr03469A |
0.483 |
|
2016 |
Muraviev A, Gutin A, Rupper G, Rudin S, Shen X, Yamaguchi M, Aizin G, Shur M. New optical gating technique for detection of electric field waveforms with subpicosecond resolution. Optics Express. 24: 12730-12739. PMID 27410292 DOI: 10.1364/Oe.24.012730 |
0.334 |
|
2016 |
Coquillat D, Nodjiadjim V, Blin S, Konczykowska A, Dyakonova N, Consejo C, Nouvel P, Pènarier A, Torres J, But D, Ruffenach S, Teppe F, Riet M, Muraviev A, Gutin A, ... Shur M, et al. High-Speed Room Temperature Terahertz Detectors Based on InP Double Heterojunction Bipolar Transistors International Journal of High Speed Electronics and Systems. 25: 1640011. DOI: 10.1142/S0129156416400115 |
0.351 |
|
2016 |
Shur M, Rudin S, Rupper G, Yamaguchi M, Shen X, Muraviev A. Subpicosecond Nonlinear Plasmonic Response Probed by Femtosecond Optical Pulses International Journal of High Speed Electronics and Systems. 25: 1640003. DOI: 10.1142/S0129156416400036 |
0.344 |
|
2016 |
Shur M, Rudin S, Rupper G, Muraviev A. Novel ultrasensitive plasmonic detector of terahertz pulses enhanced by femtosecond optical pulses Proceedings of Spie. 9934. DOI: 10.1117/12.2238067 |
0.321 |
|
2016 |
Rudin S, Rupper G, Reed ML, Shur M. Plasmonic response of partially gated field effect transistors Proceedings of Spie. 9934. DOI: 10.1117/12.2238036 |
0.413 |
|
2016 |
Shur M. Recent developments in terahertz sensing technology Proceedings of Spie. 9836. DOI: 10.1117/12.2218682 |
0.356 |
|
2016 |
Saxena T, Shur M. Silicon-on-Insulator Photoimpedance Sensor Using Capacitance Dispersion Ieee Transactions On Electron Devices. DOI: 10.1109/Ted.2016.2576458 |
0.327 |
|
2016 |
Aizin GR, Mikalopas J, Shur M. Current-driven plasmonic boom instability in three-dimensional gated periodic ballistic nanostructures Physical Review B. 93. DOI: 10.1103/Physrevb.93.195315 |
0.32 |
|
2016 |
Podlipskas, Aleksiejunas R, Kadys A, Mickevičius J, Jurkevičius J, Tamulaitis G, Shur M, Shatalov M, Yang J, Gaska R. Dependence of radiative and nonradiative recombination on carrier density and Al content in thick AlGaN epilayers Journal of Physics D: Applied Physics. 49. DOI: 10.1088/0022-3727/49/14/145110 |
0.321 |
|
2016 |
Mickevičius J, Jurkevičius J, Kadys A, Tamulaitis G, Shur M, Shatalov M, Yang J, Gaska R. Temperature-dependent efficiency droop in AlGaN epitaxial layers and quantum wells Aip Advances. 6. DOI: 10.1063/1.4947574 |
0.327 |
|
2016 |
Sinha R, Karabiyik M, Ahmadivand A, Al-Amin C, Vabbina PK, Shur M, Pala N. Tunable, Room Temperature CMOS-Compatible THz Emitters Based on Nonlinear Mixing in Microdisk Resonators Journal of Infrared, Millimeter, and Terahertz Waves. 37: 230-242. DOI: 10.1007/S10762-015-0227-8 |
0.308 |
|
2016 |
Karabiyik M, Ahmadivand A, Sinha R, Al-Amin C, Vabbina PK, Kaya S, Rupper G, Rudin S, Shur M, Pala N. Plasmonic properties of asymmetric dual grating gate plasmonic crystals Physica Status Solidi (B) Basic Research. 253: 671-675. DOI: 10.1002/Pssb.201552609 |
0.337 |
|
2015 |
Saxena T, Shur M, Nargelas S, Podlipskas Ž, Aleksiejūnas R, Tamulaitis G, Shatalov M, Yang J, Gaska R. Dynamics of nonequilibrium carrier decay in AlGaN epitaxial layers with high aluminum content. Optics Express. 23: 19646-55. PMID 26367622 DOI: 10.1364/Oe.23.019646 |
0.336 |
|
2015 |
Shur M. Terahertz Sensing Technology International Journal of High Speed Electronics and Systems. 24. DOI: 10.1142/S0129156415500019 |
0.335 |
|
2015 |
Shur M. Terahertz electronics for sensing and imaging applications Proceedings of Spie - the International Society For Optical Engineering. 9467. DOI: 10.1117/12.2085442 |
0.348 |
|
2015 |
Otsuji T, Satou A, Watanabe T, Boubanga-Tombet SA, Ryzhii M, Dubinov A, Popov VV, Mitin V, Shur M, Ryzhii V. Recent advances in the research toward graphene-based terahertz lasers Proceedings of Spie - the International Society For Optical Engineering. 9382. DOI: 10.1117/12.2079411 |
0.331 |
|
2015 |
Chao PC, Chu K, Creamer C, Diaz J, Yurovchak T, Shur M, Kallaher R, McGray C, Via GD, Blevins JD. Low-Temperature Bonded GaN-on-Diamond HEMTs With 11 W/mm Output Power at 10 GHz Ieee Transactions On Electron Devices. DOI: 10.1109/Ted.2015.2480756 |
0.406 |
|
2015 |
Liu G, Rumyantsev SL, Jiang C, Shur MS, Balandin AA. Selective Gas Sensing with h-BN Capped MoS2 Heterostructure Thin-Film Transistors Ieee Electron Device Letters. 36: 1202-1204. DOI: 10.1109/Led.2015.2481388 |
0.474 |
|
2015 |
Rumyantsev SL, Jiang C, Samnakay R, Shur MS, Balandin AA. 1/f noise characteristics of MoS2 thin-film transistors: Comparison of single and multilayer structures Ieee Electron Device Letters. 36: 517-519. DOI: 10.1109/Led.2015.2412536 |
0.537 |
|
2015 |
Stolyarov MA, Liu G, Rumyantsev SL, Shur M, Balandin AA. Reduced 1/f noise in high-mobility BN-graphene-BN heterostructure transistors Device Research Conference - Conference Digest, Drc. 2015: 153-154. DOI: 10.1109/DRC.2015.7175601 |
0.499 |
|
2015 |
Mickevičius J, Jurkevičius J, Kadys A, Tamulaitis G, Shur M, Shatalov M, Yang J, Gaska R. Low-temperature redistribution of non-thermalized carriers and its effect on efficiency droop in AlGaN epilayers Journal of Physics D: Applied Physics. 48. DOI: 10.1088/0022-3727/48/27/275105 |
0.333 |
|
2015 |
Ryzhii V, Otsuji T, Ryzhii M, Mitin V, Shur MS. Resonant plasmonic terahertz detection in vertical graphene-base hot-electron transistors Journal of Applied Physics. 118. DOI: 10.1063/1.4936265 |
0.306 |
|
2015 |
Saxena T, Nargelas S, Mickevičius J, Kravcov O, Tamulaitis G, Shur M, Shatalov M, Yang J, Gaska R. Spectral dependence of carrier lifetime in high aluminum content AlGaN epitaxial layers Journal of Applied Physics. 118. DOI: 10.1063/1.4929499 |
0.338 |
|
2015 |
Stolyarov MA, Liu G, Rumyantsev SL, Shur M, Balandin AA. Suppression of 1/ f noise in near-ballistic h -BN-graphene- h- BN heterostructure field-effect transistors Applied Physics Letters. 107. DOI: 10.1063/1.4926872 |
0.612 |
|
2015 |
Rudin S, Rupper G, Shur M. Ultimate response time of high electron mobility transistors Journal of Applied Physics. 117. DOI: 10.1063/1.4919706 |
0.365 |
|
2015 |
Jiang C, Rumyantsev SL, Samnakay R, Shur MS, Balandin AA. High-temperature performance of MoS2 thin-film transistors: Direct current and pulse current-voltage characteristics Journal of Applied Physics. 117. DOI: 10.1063/1.4906496 |
0.528 |
|
2015 |
Samnakay R, Jiang C, Rumyantsev SL, Shur MS, Balandin AA. Selective chemical vapor sensing with few-layer MoS2 thin-film transistors: Comparison with graphene devices Applied Physics Letters. 106. DOI: 10.1063/1.4905694 |
0.553 |
|
2015 |
Rupper G, Rudin S, Shur M. Response of plasmonic terahertz detectors to amplitude modulated signals Solid-State Electronics. 111: 76-79. DOI: 10.1016/J.Sse.2015.05.035 |
0.365 |
|
2015 |
Gaska R, Gaevski M, Jain R, Deng J, Islam M, Simin G, Shur M. Novel AlInN/GaN integrated circuits operating up to 500 °C Solid-State Electronics. 113: 22-27. DOI: 10.1016/J.Sse.2015.05.007 |
0.347 |
|
2015 |
Gutin A, Ytterdal T, Muraviev A, Shur M. Modelling effect of parasitics in plasmonic FETs Solid-State Electronics. 104: 75-78. DOI: 10.1016/J.Sse.2014.10.013 |
0.347 |
|
2014 |
Saxena T, Rumyantsev S, Dutta P, Shur M. Frequency tunable photo-impedance sensor Proceedings of Spie - the International Society For Optical Engineering. 9220. DOI: 10.1117/12.2062457 |
0.313 |
|
2014 |
Otsuji T, Ryzhii V, Tombet SAB, Watanabe T, Satou A, Ryzhii M, Dubinov A, Aleshkin VY, Popov V, Mitin V, Shur M. Graphene plasmonic heterostructures for new types of terahertz lasers Proceedings of Spie - the International Society For Optical Engineering. 9199. DOI: 10.1117/12.2061510 |
0.342 |
|
2014 |
Sinha R, Karabiyik M, Al-Amin C, Vabbina PK, Shur M, Pala N. Microdisk resonators for difference frequency generation in THz range Proceedings of Spie - the International Society For Optical Engineering. 9102. DOI: 10.1117/12.2050650 |
0.315 |
|
2014 |
Otsuji T, Shur M. Terahertz plasmonics Ieee Microwave Magazine. 15: 43-50. DOI: 10.1109/Mmm.2014.2355712 |
0.358 |
|
2014 |
Shur M, Rumyantsev S, Jiang C, Samnakay R, Renteria J, Balandin AA. Selective gas sensing with MoS2 Thin Film Transistors Proceedings of Ieee Sensors. 2014: 55-57. DOI: 10.1109/ICSENS.2014.6984931 |
0.426 |
|
2014 |
Shatalov M, Sun W, Jain R, Lunev A, Hu X, Dobrinsky A, Bilenko Y, Yang J, Garrett GA, Rodak LE, Wraback M, Shur M, Gaska R. High power AlGaN ultraviolet light emitters Semiconductor Science and Technology. 29. DOI: 10.1088/0268-1242/29/8/084007 |
0.321 |
|
2014 |
Saxena T, Rumyantsev SL, Dutta PS, Shur M. CdS based novel photo-impedance light sensor Semiconductor Science and Technology. 29. DOI: 10.1088/0268-1242/29/2/025002 |
0.337 |
|
2014 |
Renteria J, Samnakay R, Rumyantsev SL, Jiang C, Goli P, Shur MS, Balandin AA. Low-frequency 1/f noise in MoS2 transistors: Relative contributions of the channel and contacts Applied Physics Letters. 104. DOI: 10.1063/1.4871374 |
0.536 |
|
2014 |
Rudin S, Rupper G, Gutin A, Shur M. Theory and measurement of plasmonic terahertz detector response to large signals Journal of Applied Physics. 115. DOI: 10.1063/1.4862808 |
0.382 |
|
2014 |
Gaevski M, Deng J, Gaska R, Shur M, Simin G. GaN microwave varactors with insulated electrodes Physica Status Solidi (C) Current Topics in Solid State Physics. 11: 853-856. DOI: 10.1002/Pssc.201300667 |
0.347 |
|
2014 |
Gaevski M, Deng J, Dobrinsky A, Gaska R, Shur M, Simin G. Static and transient characteristics of GaN power HFETs with low-conducting coating Physica Status Solidi (C) Current Topics in Solid State Physics. 11: 866-870. DOI: 10.1002/Pssc.201300541 |
0.351 |
|
2014 |
Turin V, Zebrev G, Makarov S, Iñiguez B, Shur M. The correct account of nonzero differential conductance in the saturation regime in the MOSFET compact model International Journal of Numerical Modelling: Electronic Networks, Devices and Fields. 27: 863-874. DOI: 10.1002/Jnm.1969 |
0.303 |
|
2013 |
Ryzhii V, Dubinov AA, Otsuji T, Aleshkin VY, Ryzhii M, Shur M. Double-graphene-layer terahertz laser: concept, characteristics, and comparison. Optics Express. 21: 31567-77. PMID 24514730 DOI: 10.1364/Oe.21.031567 |
0.319 |
|
2013 |
Knap W, Rumyantsev S, Vitiello MS, Coquillat D, Blin S, Dyakonova N, Shur M, Teppe F, Tredicucci A, Nagatsuma T. Nanometer size field effect transistors for terahertz detectors. Nanotechnology. 24: 214002. PMID 23618776 DOI: 10.1088/0957-4484/24/21/214002 |
0.308 |
|
2013 |
But DB, Diakonova N, Drexler C, Drachenko O, Romanov K, Golenkov OG, Sizov FF, Gutin A, Shur M, Ganichev SD, Knap W. The dynamic range of THz broadband FET detectors Proceedings of Spie - the International Society For Optical Engineering. 8846. DOI: 10.1117/12.2024226 |
0.361 |
|
2013 |
Rudin S, Rupper G, Gutin A, Shur M. Response of plasmonic terahertz detector to large signals: Theory and experiment Proceedings of Spie - the International Society For Optical Engineering. 8716. DOI: 10.1117/12.2015330 |
0.356 |
|
2013 |
Gutin A, Nahar S, Hella M, Shur M. Modeling terahertz plasmonic Si FETs with SPICE Ieee Transactions On Terahertz Science and Technology. 3: 545-549. DOI: 10.1109/Tthz.2013.2262799 |
0.333 |
|
2013 |
Jahan F, Yang YH, Gaevski M, Deng J, Gaska R, Shur M, Simin G. 2-to 20-GHz switch using III-nitride capacitively coupled contact varactors Ieee Electron Device Letters. 34: 208-210. DOI: 10.1109/Led.2012.2231396 |
0.353 |
|
2013 |
Hindle F, Shur M, Abbot D, Ozanyan KB. Guest Editorial: THz sensing: Materials, devices, and systems Ieee Sensors Journal. 13: 7. DOI: 10.1109/Jsen.2012.2226647 |
0.347 |
|
2013 |
Gutin A, Ytterdal T, Kachorovskii V, Muraviev A, Shur M. THz SPICE for modeling detectors and nonquadratic response at large input signal Ieee Sensors Journal. 13: 55-62. DOI: 10.1109/Jsen.2012.2224105 |
0.316 |
|
2013 |
Shur M, Muraviev AV, Rumyantsev SL, Knap W, Liu G, Balandin AA. Plasmonic and bolometric terahertz graphene sensors Ieee Sensors 2013 - Proceedings. DOI: 10.1109/ICSENS.2013.6688554 |
0.431 |
|
2013 |
Liu G, Rumyantsev SL, Balandin AA, Shur MS. Surface and volume 1/f noise in multi-layer graphene 2013 22nd International Conference On Noise and Fluctuations, Icnf 2013. DOI: 10.1109/ICNF.2013.6578991 |
0.475 |
|
2013 |
Simin G, Jahan F, Yang J, Gaevski M, Hu X, Deng J, Gaska R, Shur M. III-nitride microwave control devices and ICs Semiconductor Science and Technology. 28. DOI: 10.1088/0268-1242/28/7/074008 |
0.397 |
|
2013 |
Rumyantsev SL, Coquillat D, Ribeiro R, Goiran M, Knap W, Shur MS, Balandin AA, Levinshtein ME. The effect of a transverse magnetic field on 1/f noise in graphene Applied Physics Letters. 103. DOI: 10.1063/1.4826644 |
0.497 |
|
2013 |
Muraviev AV, Rumyantsev SL, Liu G, Balandin AA, Knap W, Shur MS. Plasmonic and bolometric terahertz detection by graphene field-effect transistor Applied Physics Letters. 103. DOI: 10.1063/1.4826139 |
0.515 |
|
2013 |
Mickevičius J, Tamulaitis G, Shur M, Shatalov M, Yang J, Gaska R. Correlation between carrier localization and efficiency droop in AlGaN epilayers Applied Physics Letters. 103. DOI: 10.1063/1.4813259 |
0.315 |
|
2013 |
Kachorovskii VY, Rumyantsev SL, Knap W, Shur M. Performance limits for field effect transistors as terahertz detectors Applied Physics Letters. 102. DOI: 10.1063/1.4809672 |
0.344 |
|
2013 |
Hossain MZ, Rumyantsev S, Shur MS, Balandin AA. Reduction of 1/f noise in graphene after electron-beam irradiation Applied Physics Letters. 102. DOI: 10.1063/1.4802759 |
0.534 |
|
2013 |
Liu G, Rumyantsev S, Shur MS, Balandin AA. Origin of 1/f noise in graphene multilayers: Surface vs. volume Applied Physics Letters. 102. DOI: 10.1063/1.4794843 |
0.522 |
|
2013 |
Dmitriev A, Shur M. Lateral modulation doping of two-dimensional electron or hole gas Physica Status Solidi (B) Basic Research. 250: 318-323. DOI: 10.1002/Pssb.201248222 |
0.319 |
|
2012 |
Chivukula VS, Ciplys D, Kim JH, Rimeika R, Xu JM, Shur MS. Surface acoustic wave response to optical absorption by graphene composite film. Ieee Transactions On Ultrasonics, Ferroelectrics, and Frequency Control. 59: 265-70. PMID 24626034 DOI: 10.1109/TUFFC.2012.2186 |
0.446 |
|
2012 |
Rumyantsev S, Liu G, Shur MS, Potyrailo RA, Balandin AA. Selective gas sensing with a single pristine graphene transistor. Nano Letters. 12: 2294-8. PMID 22506589 DOI: 10.1021/Nl3001293 |
0.524 |
|
2012 |
Shatalov M, Sun W, Lunev A, Hu X, Dobrinsky A, Bilenko Y, Yang J, Shur M, Gaska R, Moe C, Garrett G, Wraback M. AlGaN deep-ultraviolet light-emitting diodes with external quantum efficiency above 10% Applied Physics Express. 5. DOI: 10.1143/Apex.5.082101 |
0.316 |
|
2012 |
Shatalov M, Lunev A, Hu X, Bilenko O, Gaska I, Sun W, Yang J, Dobrinsky A, Bilenko Y, Gaska R, Shur M. Performance and applications of deep UV LED International Journal of High Speed Electronics and Systems. 21. DOI: 10.1142/S0129156412500115 |
0.326 |
|
2012 |
Mitin V, Ramaswamy R, Wang K, Choi JK, Pakmehr M, Muraviev A, Shur M, Gaska R, Pogrebnyak V, Sergeev A. THz detectors based on heating of two-dimensional electron gas in disordered nitride heterostructures Proceedings of Spie - the International Society For Optical Engineering. 8363. DOI: 10.1117/12.919267 |
0.336 |
|
2012 |
Balandin AA, Rumyantsev S, Liu G, Shur MS, Potyrailo RA. Selective gas sensing with a single graphene-on-silicon transistor 2012 Ieee Silicon Nanoelectronics Workshop, Snw 2012. DOI: 10.1109/SNW.2012.6243283 |
0.476 |
|
2012 |
Rumyantsev S, Liu G, Potyrailo RA, Balandin AA, Shur MS. Selective gas sensing by graphene Proceedings of Ieee Sensors. DOI: 10.1109/ICSENS.2012.6411434 |
0.44 |
|
2012 |
Mickevičius J, Tamulaitis G, Shur M, Shatalov M, Yang J, Gaska R. Internal quantum efficiency in AlGaN with strong carrier localization Applied Physics Letters. 101. DOI: 10.1063/1.4767657 |
0.301 |
|
2012 |
Gutin A, Kachorovskii V, Muraviev A, Shur M. Plasmonic terahertz detector response at high intensities Journal of Applied Physics. 112: 014508. DOI: 10.1063/1.4732138 |
0.355 |
|
2012 |
Liu G, Rumyantsev S, Shur M, Balandin AA. Graphene thickness-graded transistors with reduced electronic noise Applied Physics Letters. 100: 033103. DOI: 10.1063/1.3676277 |
0.585 |
|
2012 |
Jahan F, Gaevski M, Deng J, Gaska R, Shur M, Simin G. RF power limiter using capacitively-coupled contacts III-nitride varactor Electronics Letters. 48: 1480-1481. DOI: 10.1049/El.2012.3428 |
0.363 |
|
2011 |
Hossain MZ, Rumyantsev SL, Shahil KM, Teweldebrhan D, Shur M, Balandin AA. Low-frequency current fluctuations in "graphene-like" exfoliated thin-films of bismuth selenide topological insulators. Acs Nano. 5: 2657-63. PMID 21413716 DOI: 10.1021/Nn102861D |
0.592 |
|
2011 |
Hadi WA, Shur M, Eastman LF, O'Leary SK. Steady-state and transient electron transport in ZnO: Recent progress Materials Research Society Symposium Proceedings. 1327: 1-6. DOI: 10.1557/Opl.2011.851 |
0.34 |
|
2011 |
Liu G, Rumyantsev S, Stillman W, Shur M, Balandin AA. 1/f Noise in Graphene Field-Effect Transistors: Dependence on the Device Channel Area Mrs Proceedings. 1344. DOI: 10.1557/Opl.2011.1357 |
0.59 |
|
2011 |
Hossain MZ, Rumyantsev SL, Shahil KMF, Teweldebrhan D, Shur M, Balandin AA. Low-Frequency Noise in “Graphene-Like” Exfoliated Thin Films of Topological Insulators Mrs Proceedings. 1344. DOI: 10.1557/Opl.2011.1349 |
0.565 |
|
2011 |
Bhalerao S, Koudymov A, Shur M, Ytterdal T, Jackson W, Taussig C. Compact capacitance model for printed thin film transistors with non-ideal contacts International Journal of High Speed Electronics and Systems. 20: 801-813. DOI: 10.1142/S0129156411007069 |
0.365 |
|
2011 |
Simin G, Wang J, Khan B, Yang J, Sattu A, Gaska R, Shur M. Novel approaches to microwave switching devices using nitride technology International Journal of High Speed Electronics and Systems. 20: 219-227. DOI: 10.1142/S0129156411006556 |
0.369 |
|
2011 |
LIU G, STILLMAN W, RUMYANTSEV S, SHUR M, BALANDIN AA. LOW-FREQUENCY ELECTRONIC NOISE IN GRAPHENE TRANSISTORS: COMPARISON WITH CARBON NANOTUBES International Journal of High Speed Electronics and Systems. 20: 161-170. DOI: 10.1142/S0129156411006490 |
0.589 |
|
2011 |
Rumyantsev S, Stillman W, Shur M, Heeg T, Schlom DG, Koveshnikov S, Kambhampati R, Tokranov V, Oktyabrsky S. Low frequency noise and interface density of traps in InGaAs MOSFETs with GdScO3 high-K dielectric International Journal of High Speed Electronics and Systems. 20: 105-113. DOI: 10.1142/S0129156411006441 |
0.396 |
|
2011 |
Stillman W, Donais C, Rumyantsev S, Shur M, Veksler D, Hobbs C, Smith C, Bersuker G, Taylor W, Jammy R. Silicon finfets as detectors of terahertz and sub-terahertz radiation International Journal of High Speed Electronics and Systems. 20: 27-42. DOI: 10.1142/S0129156411006374 |
0.31 |
|
2011 |
Ramaswamy R, Wang K, Stier A, Muraviev A, Strasser G, Markelz A, Shur M, Gaska R, Sergeev A, Mitin V. 2DEG GaN hot electron microbolometers and quantum cascade lasers for THz heterodyne sensing Proceedings of Spie - the International Society For Optical Engineering. 8031. DOI: 10.1117/12.883329 |
0.405 |
|
2011 |
Shur M. Silicon and nitride FETs for THz sensing Proceedings of Spie. 8031. DOI: 10.1117/12.883309 |
0.402 |
|
2011 |
Sattu AK, Yang J, Gaska R, Khan MB, Shur M, Simin G. Small- and large-signal performance of III-nitride RF switches with hybrid fast/slow gate design Ieee Microwave and Wireless Components Letters. 21: 305-307. DOI: 10.1109/Lmwc.2011.2138686 |
0.339 |
|
2011 |
Sattu A, Deng J, Billingsley D, Yang J, Shur M, Gaska R, Simin G. Enhanced power and breakdown in III-N RF switches with a slow gate Ieee Electron Device Letters. 32: 749-751. DOI: 10.1109/Led.2011.2126557 |
0.349 |
|
2011 |
Rumyantsev SL, Liu G, Shur MS, Balandin AA. Observation of the memory steps in graphene at elevated temperatures Applied Physics Letters. 98: 222107. DOI: 10.1063/1.3596441 |
0.481 |
|
2011 |
Sattu A, Billingsley D, Deng J, Yang J, Simin G, Shur M, Gaska R. Low-loss AlInN/GaN microwave switch Electronics Letters. 47: 863-865. DOI: 10.1049/El.2011.1010 |
0.347 |
|
2011 |
Young CD, Veksler D, Rumyantsev S, Huang J, Park H, Taylor W, Shur M, Bersuker G. Evaluation of the N- and La-induced defects in the high-κ gate stack using low frequency noise characterization Microelectronic Engineering. 88: 1255-1258. DOI: 10.1016/J.Mee.2011.03.109 |
0.325 |
|
2011 |
Billingsley D, Yang J, Gaska R, Shur M. Migration-enhanced metalorganic chemical vapor deposition of Al xIn1-xN/GaN heterostructures (x>0.75) on c-plane sapphire Journal of Crystal Growth. 327: 98-101. DOI: 10.1016/J.Jcrysgro.2011.06.015 |
0.304 |
|
2010 |
Rumyantsev S, Liu G, Stillman W, Shur M, Balandin AA. Electrical and noise characteristics of graphene field-effect transistors: ambient effects, noise sources and physical mechanisms. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 22: 395302. PMID 21403224 DOI: 10.1088/0953-8984/22/39/395302 |
0.588 |
|
2010 |
Shatalov M, Sun W, Bilenko Y, Sattu A, Hu X, Deng J, Yang J, Shur M, Moe C, Wraback M, Gaska R. Large chip high power deep ultraviolet light-emitting diodes Applied Physics Express. 3. DOI: 10.1143/Apex.3.062101 |
0.369 |
|
2010 |
Sattu A, Yang J, Shur M, Gaska R, Simin G. AlGaN/GaN microwave switch with hybrid slow and fast gate design Ieee Electron Device Letters. 31: 1389-1391. DOI: 10.1109/Led.2010.2073676 |
0.371 |
|
2010 |
Chivukula V, Ciplys D, Sereika A, Shur M, Yang J, Gaska R. AlGaN based highly sensitive radio-frequency UV sensor Applied Physics Letters. 96. DOI: 10.1063/1.3405692 |
0.315 |
|
2010 |
Sun W, Shatalov M, Deng J, Hu X, Yang J, Lunev A, Bilenko Y, Shur M, Gaska R. Efficiency droop in 245-247 nm AlGaN light-emitting diodes with continuous wave 2 mW output power Applied Physics Letters. 96. DOI: 10.1063/1.3302466 |
0.361 |
|
2010 |
Shur M. Plasma wave terahertz electronics Electronics Letters. 46: S18. DOI: 10.1049/El.2010.8457 |
0.319 |
|
2010 |
Deng J, Yang J, Hu X, Gaska R, Khan B, Simin G, Shur M. Insertion loss and linearity of III-nitride microwave switches Physica Status Solidi (C) Current Topics in Solid State Physics. 7: 2423-2425. DOI: 10.1002/Pssc.200983898 |
0.36 |
|
2010 |
Hossain MZ, Rumyantsev SL, Teweldebrhan D, Shahil KMF, Shur M, Balandin AA. 1/f noise in conducting channels of topological insulator materials Physica Status Solidi (a). 208: 144-146. DOI: 10.1002/Pssa.201026604 |
0.608 |
|
2009 |
Simin G, Shur MS, Gaska R. 5-Terminal THz GaN based transistor with field- and space-charge control electrodes International Journal of High Speed Electronics and Systems. 19: 7-14. DOI: 10.1142/S0129156409006047 |
0.305 |
|
2009 |
Simin G, Khan B, Wang J, Koudymov A, Gaevski M, Jain R, Yang J, Hu X, Gaska R, Shur M. Multigate GaN RF switches with capacitively coupled contacts Ieee Electron Device Letters. 30: 895-897. DOI: 10.1109/Led.2009.2025675 |
0.341 |
|
2009 |
Koudymov A, Pala N, Tokranov V, Oktyabrsky S, Gaevski M, Jain R, Yang J, Hu X, Shur M, Gaska R, Simin G. HfO2-III-nitride RF switch with capacitively coupled contacts Ieee Electron Device Letters. 30: 478-480. DOI: 10.1109/Led.2009.2017284 |
0.36 |
|
2009 |
Shao Q, Liu G, Teweldebrhan D, Balandin AA, Rumyantsev S, Shur MS, Yan D. Flicker Noise in Bilayer Graphene Transistors Ieee Electron Device Letters. 30: 288-290. DOI: 10.1109/Led.2008.2011929 |
0.548 |
|
2009 |
Liu G, Stillman W, Rumyantsev S, Shao Q, Shur M, Balandin AA. Low-frequency electronic noise in the double-gate single-layer graphene transistors Applied Physics Letters. 95: 033103. DOI: 10.1063/1.3180707 |
0.602 |
|
2009 |
Shatalov M, Yang J, Sun W, Kennedy R, Gaska R, Liu K, Shur M, Tamulaitis G. Efficiency of light emission in high aluminum content AlGaN quantum wells Journal of Applied Physics. 105. DOI: 10.1063/1.3103321 |
0.317 |
|
2009 |
Simin G, Koudymov A, Yang Z, Hu X, Yang J, Shur M, Gaska R. Cryogenic RF switch using III-nitride MOSHFETs Electronics Letters. 45: 207-208. DOI: 10.1049/El:20092562 |
0.336 |
|
2008 |
Koudymov A, Shur M. Non-ideal current transport in heterostructure field effect transistors International Journal of High Speed Electronics and Systems. 18: 935-947. DOI: 10.1142/S0129156408005898 |
0.398 |
|
2008 |
Yang Z, Wang J, Hu X, Yang J, Simin G, Shur M, Gaska R. Current crowding in high performance low-loss HFET RF switches Ieee Electron Device Letters. 29: 15-17. DOI: 10.1109/Led.2007.911621 |
0.368 |
|
2008 |
Popov VV, Koudymov AN, Shur M, Polischuk OV. Tuning of ungated plasmons by a gate in the field-effect transistor with two-dimensional electron channel Journal of Applied Physics. 104. DOI: 10.1063/1.2955731 |
0.365 |
|
2008 |
Sawyer S, Rumyantsev S, Shur M. Degradation of AlGaN-based ultraviolet light emitting diodes Solid-State Electronics. 52: 968-972. DOI: 10.1016/J.Sse.2008.01.027 |
0.565 |
|
2006 |
Sawyer S, Rumyantsev SL, Shur MS, Pala N, Bilenko Y, Zhang JP, Hu X, Lunev A, Deng J, Gaska R. Current and optical noise of GaN/AlGaN light emitting diodes Journal of Applied Physics. 100. DOI: 10.1063/1.2204355 |
0.542 |
|
2005 |
Satou A, Khmyrova I, Chaplik A, Ryzhii V, Shur M. Spectrum of Plasma Oscillations in Slot Diode with Two-Dimensional Electron Channel Japanese Journal of Applied Physics. 44: 2592-2595. DOI: 10.7567/Ssdm.2004.P8-11L |
0.306 |
|
2005 |
Dyakonov M, Shur MS. Current instability and plasma waves generation in ungated two-dimensional electron layers Applied Physics Letters. 87: 111501. DOI: 10.1142/S0129156406003771 |
0.359 |
|
2005 |
Rumyantsev SL, Sawyer S, Pala N, Shur MS, Bilenko Y, Zhang JP, Hu X, Lunev A, Deng J, Gaska R. Low frequency noise of light emitting diodes Proceedings of Spie - the International Society For Optical Engineering. 5844: 75-85. DOI: 10.1117/12.608559 |
0.543 |
|
2005 |
Rumyantsev SL, Sawyer S, Shur MS, Pala N, Bilenko Y, Zhang JP, Hu X, Lunev A, Deng J, Gaska R. Low-frequency noise of GaN-based ultraviolet light-emitting diodes Journal of Applied Physics. 97. DOI: 10.1063/1.1928310 |
0.539 |
|
2004 |
Simin G, Khan MA, Shur MS, Gaska R. Insulated Gate Iii-N Heterostructure Field-Effect Transistors International Journal of High Speed Electronics and Systems. 14: 197-224. DOI: 10.1142/S0129156404002302 |
0.347 |
|
2004 |
Sawyer S, Rumyantsev SL, Pala N, Shur MS, Bilenko Y, Gaska R, Kosterin PV, Salzberg BM. Noise characteristics of 340 nm and 280 nm GaN-based light emitting diodes International Journal of High Speed Electronics and Systems. 14: 702-707. DOI: 10.1109/Lechpd.2004.1549675 |
0.529 |
|
2003 |
Simin G, Adivarahan V, Fatima H, Saygi S, Koudymov A, He X, Shuai W, Rai S, Yang J, Khan MA, Tarakji A, Deng J, Gaska R, Shur MS. Insulated gate 111-N devices and ICs 2003 International Semiconductor Device Research Symposium, Isdrs 2003 - Proceedings. 398-399. DOI: 10.1109/ISDRS.2003.1272152 |
0.324 |
|
2003 |
Pala N, Rumyantsev S, Shur M, Gaska R, Hu X, Yang J, Simin G, Khan MA. Low frequency noise in AlGaN/InGaN/GaN double heterostructure field effect transistors Solid-State Electronics. 47: 1099-1104. DOI: 10.1016/S0038-1101(02)00475-6 |
0.397 |
|
2002 |
Ryzhii V, Shur M. Analysis of Tunneling-Injection Transit-Time Effects and Self-Excitation of Terahertz Plasma Oscillations in High-Electron-Mobility Transistors Japanese Journal of Applied Physics. 41: L922-L924. DOI: 10.1143/Jjap.41.L922 |
0.326 |
|
2002 |
Pala N, Rumyantsev S, Shur M, Gaska R, Hu X, Yang J, Simin G, Khan MA. GENERATION-RECOMBINATION AND 1/f NOISE IN Al0.4Ga0.6N THIN FILMS Fluctuation and Noise Letters. 2. DOI: 10.1142/S0219477502000968 |
0.334 |
|
2002 |
Rumyantsev SL, Shur MS, Gaska R, Levinshtein ME, Khan MA, Simin G, Yang JW. Low Frequency Noise in Gallium Nitride Field Effect Transistors International Journal of High Speed Electronics and Systems. 12: 449-458. DOI: 10.1142/S012915640200137X |
0.305 |
|
2002 |
Ryzhii V, Shur M. Tunnelling- and barrier-injection transit-time mechanisms of terahertz plasma instability in high-electron mobility transistors Semiconductor Science and Technology. 17: 1168-1171. DOI: 10.1088/0268-1242/17/11/306 |
0.357 |
|
2002 |
Ryzhii V, Khmyrova I, Satou A, Vaccaro PO, Aida T, Shur M. Plasma mechanism of terahertz photomixing in high-electron mobility transistor under interband photoexcitation Journal of Applied Physics. 92: 5756-5760. DOI: 10.1063/1.1510596 |
0.346 |
|
2002 |
Ryzhii V, Khmyrova I, Shur M. Terahertz photomixing in quantum well structures using resonant excitation of plasma oscillations Journal of Applied Physics. 91: 1875-1881. DOI: 10.1063/1.1431436 |
0.335 |
|
2002 |
Carlos Rojo J, Schowalter LJ, Gaska R, Shur M, Khan MA, Yang J, Koleske DD. Growth and characterization of epitaxial layers on aluminum nitride substrates prepared from bulk, single crystals Journal of Crystal Growth. 240: 508-512. DOI: 10.1016/S0022-0248(02)01078-3 |
0.302 |
|
2001 |
Zhang JP, Adivarahan V, Wang HM, Fareed Q, Kuokstis E, Chitnis A, Shatalov M, Yang JW, Simin G, Khan MA, Shur M, Gaska R. Quaternary AlInGaN Multiple Quantum Wells for Ultraviolet Light Emitting Diodes Japanese Journal of Applied Physics. 40: 921. DOI: 10.1143/Jjap.40.L921 |
0.311 |
|
2001 |
Rumyantsev SL, Pala N, Shur MS, Levinshtein ME, Ivanov PA, Khan MA, Simin G, Yang J, Hu X, Tarakji A, Gaska R. Low-Frequency Noise in AlGaN/GaN Heterostructure Field Effect Transistors and Metal Oxide Semiconductor Heterostructure Field Effect Transistors Fluctuation and Noise Letters. 1. DOI: 10.1142/S0219477501000469 |
0.319 |
|
2001 |
Gaska R, Shur MS, Hu X, Yang JW, Tarakji A, Simin G, Khan A, Deng J, Werner T, Rumyantsev S, Pala N. Highly doped thin-channel GaN-metal-semiconductor field-effect transistors Applied Physics Letters. 78: 769-771. DOI: 10.1063/1.1344577 |
0.301 |
|
2001 |
Contreras S, Knap W, Frayssinet E, Sadowski ML, Goiran M, Shur M. High magnetic field studies of two-dimensional electron gas in a GaN/GaAlN heterostructure: Mechanisms of parallel conduction Journal of Applied Physics. 89: 1251-1255. DOI: 10.1063/1.1328788 |
0.354 |
|
2001 |
Zhang JP, Kuokstis E, Fareed Q, Wang HM, Yang JW, Simin G, Khan MA, Tamulaitis G, Kurilcik G, Jursenas S, Zukauskas A, Gaska R, Shur M. Pulsed Atomic Layer Epitaxy of Quaternary AlInGaN Layers for Ultraviolet Light Emitters Physica Status Solidi (a). 188: 95-99. DOI: 10.1002/1521-396X(200111)188:1<95::Aid-Pssa95>3.0.Co;2-Q |
0.313 |
|
2000 |
Pala N, Gaska R, Shur M, Yang JW, Khan MA. Low-Frequency Noise in SiO2 /AlGaN/GaN Heterostructures on SiC and Sapphire Substrates Mrs Internet Journal of Nitride Semiconductor Research. 5: 612-618. DOI: 10.1557/S109257830000483X |
0.356 |
|
2000 |
Necliudov PV, Shur M, Gundlach DJ, Jackson TN. Electrical Instabilities and 1/f Noise in Organic Pentacene Thin Film Transistors Mrs Proceedings. 660. DOI: 10.1557/Proc-660-Jj7.10 |
0.385 |
|
2000 |
Wang L, Fjeldly TA, Iniguez B, Slade HC, Shur M. Self-heating and kink effects in a-Si:H thin film transistors Ieee Transactions On Electron Devices. 47: 387-397. DOI: 10.1109/16.822285 |
0.314 |
|
2000 |
Chitnis A, Kumar A, Shatalov M, Adivarahan V, Lunev A, Yang JW, Simin G, Khan MA, Gaska R, Shur M. High-quality p–n junctions with quaternary AlInGaN/InGaN quantum wells Applied Physics Letters. 77: 3800-3802. DOI: 10.1063/1.1331084 |
0.356 |
|
2000 |
Adivarahan V, Simin G, Yang JW, Lunev A, Khan MA, Pala N, Shur M, Gaska R. SiO 2 -Passivated Lateral-Geometry GaN Transparent Schottky-Barrier Detectors Applied Physics Letters. 77: 863-865. DOI: 10.1063/1.1306647 |
0.421 |
|
2000 |
Khan MA, Hu X, Tarakji A, Simin G, Yang J, Gaska R, Shur MS. AlGaN/GaN metal–oxide–semiconductor heterostructure field-effect transistors on SiC substrates Applied Physics Letters. 77: 1339-1341. DOI: 10.1063/1.1290269 |
0.313 |
|
2000 |
Ryzhii V, Khmyrova I, Shur M. Resonant detection and frequency multiplication of terahertz radiation utilizing plasma waves in resonant-tunneling transistors Journal of Applied Physics. 88: 2868-2871. DOI: 10.1063/1.1287759 |
0.329 |
|
2000 |
Khan MA, Yang JW, Knap W, Frayssinet E, Hu X, Simin G, Prystawko P, Leszczynski M, Grzegory I, Porowski S, Gaska R, Shur MS, Beaumont B, Teisseire M, Neu G. GaN-AlGaN Heterostructure Field-Effect Transistors over Bulk GaN Substrates Applied Physics Letters. 76: 3807-3809. DOI: 10.1063/1.126788 |
0.321 |
|
2000 |
Pala N, Gaska R, Rumyantsev S, Shur MS, Asif Khan M, Hu X, Simin G, Yang J. Low-frequency noise in AlGaN/GaN MOSHFETs Electronics Letters. 36: 268-270. DOI: 10.1049/El:20000171 |
0.303 |
|
1999 |
Pala N, Gaska R, Shur M, Yang JW, Khan MA. Low-Frequency Noise in SiO2/AlGaN/GaN Heterostructures on SiC and Sapphire Substrates Mrs Proceedings. 595. DOI: 10.1557/Proc-595-F99W11.9 |
0.43 |
|
1999 |
Tager AA, Gaska R, Avrutsky IA, Fay M, Chik H, SpringThorpe A, Eicher S, Xu JM, Shur M. Ion-implanted GaAs-InGaAs lateral current injection laser Ieee Journal On Selected Topics in Quantum Electronics. 5: 664-672. DOI: 10.1109/2944.788433 |
0.701 |
|
1999 |
Lü JQ, Pala N, Shur M, Hurt MJ, Peatman WCB. High temperature performance of ion implanted hetero-dimensional JFETs Electronics Letters. 35: 845-846. DOI: 10.1049/El:19990562 |
0.341 |
|
1998 |
Chen Q, Yang J, Gaska R, Khan M, Shur M, Sullivan G, Sailor A, Higgings J, Ping A, Adesida I. High-power microwave 0.25-μm gate doped-channel GaN/AlGaN heterostructure field effect transistor Ieee Electron Device Letters. 19: 44-46. DOI: 10.1109/55.658598 |
0.306 |
|
1998 |
Levinshtein ME, Rumyantsev SL, Gaska R, Yang JW, Shur MS. AlGaN/GaN high electron mobility field effect transistors with low 1/f noise Applied Physics Letters. 73: 1089-1091. DOI: 10.1063/1.122093 |
0.31 |
|
1998 |
Peatman W, Tsai R, Weikle R, Shur M. Microwave operation of multi-channel 2D MESFET Electronics Letters. 34: 1029. DOI: 10.1049/El:19980706 |
0.327 |
|
1997 |
Shur MS. GaN And Related Materials For High Power Applications Mrs Proceedings. 483. DOI: 10.1557/PROC-483-15 |
0.306 |
|
1997 |
Gaska R, Yang JW, Osinsky A, Bykhovski AD, Shur MS. Piezoeffect and gate current in AlGaN/GaN high electron mobility transistors Applied Physics Letters. 71: 3673-3675. DOI: 10.1063/1.120477 |
0.302 |
|
1997 |
Alause H, Knap W, Azema SC, Bluet J, Sadowski M, Huant S, Young J, Khan MA, Chen Q, Shur M. Optical and electrical properties of 2-dimensional electron gas in GaN/AlGaN heterostructures Materials Science and Engineering: B. 46: 79-83. DOI: 10.1016/S0921-5107(96)01936-8 |
0.304 |
|
1997 |
Khan MA, Chen Q, Shur MS, Dermott BT, Higgins JA, Burm J, Schaff WJ, Eastman LF. GaN based heterostructure for high power devices Solid-State Electronics. 41: 1555-1559. DOI: 10.1016/S0038-1101(97)00104-4 |
0.3 |
|
1996 |
Ytterdal T, Hurt M, Shur M, Park H, Tsai R, Peatman WCB. High-temperature characteristics of 2-D MESFET's Ieee Electron Device Letters. 17: 214-216. DOI: 10.1109/55.491833 |
0.365 |
|
1996 |
Peatman WCB, Tsai R, Ytterdal T, Hurt M, Park H, Gonzales J, Shur M. Sub-half-micrometer width 2-D MESFET Ieee Electron Device Letters. 17: 40-42. DOI: 10.1109/55.484117 |
0.392 |
|
1996 |
Tsai R, Schuermeyer F, Peatman W, Shur M. The optoelectronic response of a laterally contacted 2-D MESFET Ieee Transactions On Electron Devices. 43: 2300-2301. DOI: 10.1109/16.544424 |
0.332 |
|
1996 |
Dyakonov M, Shur M. Detection, mixing, and frequency multiplication of terahertz radiation by two-dimensional electronic fluid Ieee Transactions On Electron Devices. 43: 380-387. DOI: 10.1109/16.485650 |
0.376 |
|
1996 |
Hurt M, Peatman W, Tsai R, Ytterdal T, Shur M, Moon B. Ion-implanted 0.4 [micro sign]m wide 2-D MESFET for low power electronics Electronics Letters. 32: 772. DOI: 10.1049/El:19960477 |
0.339 |
|
1996 |
Shur M, Gelmont B, Khan MA. Electron mobility in two-dimensional electron gas in AlGaN/GaN heterostructures and in bulk GaN Journal of Electronic Materials. 25: 777-785. DOI: 10.1007/Bf02666636 |
0.353 |
|
1995 |
Khan MA, Chen Q, Sun CJ, Yang JW, Shur MS. Recent Progress in Gan Based Field Effect Transistors Mrs Proceedings. 410. DOI: 10.1557/PROC-410-17 |
0.316 |
|
1995 |
Bykhovski A, Gelmont B, Shur M, Khan A. Current‐voltage characteristics of strained piezoelectric structures Journal of Applied Physics. 77: 1616-1620. DOI: 10.1063/1.358916 |
0.325 |
|
1995 |
Asif Khan M, Chen Q, Sun CJ, Shur M, Gelmont B. Two‐dimensional electron gas in GaN–AlGaN heterostructures deposited using trimethylamine‐alane as the aluminum source in low pressure metalorganic chemical vapor deposition Applied Physics Letters. 67: 1429-1431. DOI: 10.1063/1.114516 |
0.324 |
|
1994 |
Globus T, Slade HC, Shur M, Hack M. Density of Deep Bandgap States in Amorphous Silicon From the Temperature Dependence of Thin Film Transistor Current Mrs Proceedings. 336. DOI: 10.1557/Proc-336-823 |
0.354 |
|
1994 |
Peatman W, Park H, Shur M. Two-dimensional metal-semiconductor field effect transistor for ultra low power circuit applications Ieee Electron Device Letters. 15: 245-247. DOI: 10.1109/55.294084 |
0.405 |
|
1994 |
Peatman W, Brown E, Rooks M, Maki P, Grimm W, Shur M. Novel resonant tunneling transistor with high transconductance at room temperature Ieee Electron Device Letters. 15: 236-238. DOI: 10.1109/55.294081 |
0.403 |
|
1994 |
Martinez E, Shur M, Schuermeyer F. Heterostructure Insulated Gate Field Effect Transistors Operated in Hot Electron Regime Ieee Transactions On Electron Devices. 41: 854-856. DOI: 10.1109/16.285045 |
0.359 |
|
1994 |
Asif Khan M, Kuznia JN, Olson DT, Schaff WJ, Burm JW, Shur MS. Microwave performance of a 0.25 μm gate AlGaN/GaN heterostructure field effect transistor Applied Physics Letters. 65: 1121-1123. DOI: 10.1063/1.112116 |
0.302 |
|
1994 |
Schuermeyer F, Shur M, Martinez E, Cerny C. Gate currents in heterostructure field-effect transistors: contribution by “warm” electrons Materials Science and Engineering: B. 28: 264-267. DOI: 10.1016/0921-5107(94)90061-2 |
0.382 |
|
1993 |
Dyakonov M, Shur M. Shallow water analogy for a ballistic field effect transistor: New mechanism of plasma wave generation by dc current. Physical Review Letters. 71: 2465-2468. PMID 10054687 DOI: 10.1103/Physrevlett.71.2465 |
0.308 |
|
1993 |
Levinshtein ME, Simin GS, Shur M. Getting to Know Semiconductors American Journal of Physics. 61: 765-765. DOI: 10.1119/1.17164 |
0.338 |
|
1993 |
Shur M. Future impact of solid-state technology on computers Computer. 26: 103-104. DOI: 10.1109/2.206547 |
0.321 |
|
1993 |
Fjeldly T, Shur M. Threshold voltage modeling and the subthreshold regime of operation of short-channel MOSFETs Ieee Transactions On Electron Devices. 40: 137-145. DOI: 10.1109/16.249436 |
0.359 |
|
1993 |
Rho K, Lee K, Shur M, Fjeldly T. Unified quasi-static MOSFET capacitance model Ieee Transactions On Electron Devices. 40: 131-136. DOI: 10.1109/16.249435 |
0.33 |
|
1993 |
Moon Bj, Lee S, Shur M, Morkoç H, Gopinath A. Measurements of Gate Voltage Dependence of Electron Mobility in δ-Doped HFET's Ieee Transactions On Electron Devices. 40: 1711-1713. DOI: 10.1109/16.231581 |
0.393 |
|
1993 |
Bykhovski A, Gelmont B, Shur M. The influence of the strain‐induced electric field on the charge distribution in GaN‐AlN‐GaN structure Journal of Applied Physics. 74: 6734-6739. DOI: 10.1063/1.355070 |
0.31 |
|
1993 |
Gelmont B, Kim K, Shur M. Monte Carlo simulation of electron transport in gallium nitride Journal of Applied Physics. 74: 1818-1821. DOI: 10.1063/1.354787 |
0.317 |
|
1993 |
Bykhovski A, Gelmont B, Shur M. Strain and charge distribution in GaN‐AlN‐GaN semiconductor‐insulator‐semiconductor structure for arbitrary growth orientation Applied Physics Letters. 63: 2243-2245. DOI: 10.1063/1.110540 |
0.313 |
|
1992 |
Globus T, Shur M, Hack M. Studies of the Stability of Amorphous Silicon Thin Film Transistors Mrs Proceedings. 258. DOI: 10.1557/Proc-258-1013 |
0.373 |
|
1992 |
Globus T, Shur M, Byun Y, Hack M. New Split FET Technique for Measurements of Source Series Resistance Applied to Amorphous Silicon Thin-Film Transistors Ieee Electron Device Letters. 13: 108-110. DOI: 10.1109/55.144974 |
0.373 |
|
1992 |
Peatman W, Crowe T, Shur M. A novel Schottky/2-DEG diode for millimeter- and submillimeter-wave multiplier applications Ieee Electron Device Letters. 13: 11-13. DOI: 10.1109/55.144935 |
0.381 |
|
1992 |
Bhaumik K, Gelmont B, Mattauch R, Shur M. Series impedance of GaAs planar Schottky diodes operated to 500 GHz Ieee Transactions On Microwave Theory and Techniques. 40: 880-885. DOI: 10.1109/22.137393 |
0.353 |
|
1992 |
Gelmont B, Shur M, Moglesture C. Theory of junction between two-dimensional electron gas and p-type semiconductor Ieee Transactions On Electron Devices. 39: 1216-1222. DOI: 10.1109/16.129106 |
0.378 |
|
1992 |
Chao PC, Shur M, Lee BR, Kao MY. Breakdown Walkout in AlGaAs/GaAs HEMT’s Ieee Transactions On Electron Devices. 39: 738-740. DOI: 10.1109/16.123504 |
0.409 |
|
1992 |
Zou J, Shur M, Dong H, Gopinath A. Performance and Optimization of Dipole Heterostructure Field-Effect Transistor Ieee Transactions On Electron Devices. 39: 250-256. DOI: 10.1109/16.121680 |
0.393 |
|
1992 |
Kanamori M, Jensen G, Shur M, Lee K. Effect of p-i-p/sup +/ buffer on characteristics of n-channel heterostructure field-effect transistors Ieee Transactions On Electron Devices. 39: 226-233. DOI: 10.1109/16.121677 |
0.323 |
|
1992 |
Gelmont B, Lund B, Kim KS, Jensen GU, Shur M, Fjeldly TA. Monte Carlo simulation of electron transport in mercury cadmium telluride Journal of Applied Physics. 71: 4977-4982. DOI: 10.1063/1.350596 |
0.318 |
|
1992 |
Schuermeyer F, Martinez E, Shur M, Grider D, Nohava J. Subthreshold and above threshold gate current in heterostructure insulated gate field-effect transistors Electronics Letters. 28: 1024-1026. DOI: 10.1049/El:19920650 |
0.367 |
|
1992 |
Kelner G, Binari S, Shur M, Sleger K, Palmour J, Kong H. α-SiC buried-gate junction field effect transistors Materials Science and Engineering: B. 11: 121-124. DOI: 10.1016/0921-5107(92)90203-L |
0.416 |
|
1992 |
Shur M, Fjeldly T, Ytterdal T, Lee K. Unified MOSFET model Solid-State Electronics. 35: 1795-1802. DOI: 10.1016/0038-1101(92)90263-C |
0.345 |
|
1992 |
Byun YH, Shur M, Hack M, Lee K. New analytical polycrystalline-silicon thin-film transistor model for computer aided design and parameter extraction Solid-State Electronics. 35: 655-663. DOI: 10.1016/0038-1101(92)90033-9 |
0.367 |
|
1992 |
Jones SH, Tait GB, Shur M. Modulated-impurity-concentration transferred-electron devices exhibiting large harmonic frequency content Microwave and Optical Technology Letters. 5: 354-359. DOI: 10.1002/Mop.4650050804 |
0.382 |
|
1991 |
Schuermeyer F, Shur M, Grider D. Gate current in self-aligned n-channel and p-channel pseudomorphic heterostructure field-effect transistors Ieee Electron Device Letters. 12: 571-573. DOI: 10.1109/55.119192 |
0.357 |
|
1991 |
Gelmont B, Shur M, Mattauch RJ. Capacitance-voltage characteristics of microwave Schottky diodes Ieee Transactions On Microwave Theory and Techniques. 39: 857-863. DOI: 10.1109/22.79114 |
0.387 |
|
1991 |
Jensen GU, Lund B, Fjeldly TA, Shur M. Monte Carlo Simulation of Short-Channel Heterostructure Field-Effect Transistors Ieee Transactions On Electron Devices. 38: 840-851. DOI: 10.1109/16.75214 |
0.379 |
|
1991 |
Byun Y, Schuermeyer F, Lee K, Shur M, Cook P, Martinez E, Martinez E, Evans K, Stutz C. Quantum-well doped p-channel AlGaAs/GaAs/sub 0.85/Sb/sub 0.15//GaAs heterostructure field-effect transistors Ieee Transactions On Electron Devices. 38: 672-674. DOI: 10.1109/16.75180 |
0.379 |
|
1991 |
Moon B, Park C, Lee K, Shur M. New short-channel n-MOSFET current-voltage model in strong inversion and unified parameter extraction method Ieee Transactions On Electron Devices. 38: 592-602. DOI: 10.1109/16.75171 |
0.359 |
|
1991 |
Moon B, Park C, Rho K, Lee K, Shur M, Fjeldly T. Analytical model for p-channel MOSFETs Ieee Transactions On Electron Devices. 38: 2632-2646. DOI: 10.1109/16.158685 |
0.348 |
|
1991 |
Kelner G, Binari S, Shur M, Palmour J. High temperature operation of α-silicon carbide buried-gate junction field-effect transistors Electronics Letters. 27: 1038. DOI: 10.1049/El:19910646 |
0.354 |
|
1991 |
Jensen GU, Lund B, Fjeldly TA, Shur M. Monte Carlo simulation of semiconductor devices Computer Physics Communications. 67: 1-61. DOI: 10.1016/0010-4655(91)90220-F |
0.425 |
|
1990 |
Byun Y, Lee K, Shur M. Unified charge control model and subthreshold current in heterostructure field-effect transistors Ieee Electron Device Letters. 11: 50-53. DOI: 10.1109/55.46928 |
0.391 |
|
1990 |
Ruden PP, Shur M, Akinwande AI, Baek J, Nohava JC, Grider DE. AlGaAs/InGaAs/GaAs Quantum Well Doped Channel Heterostructure Field Effect Transistors Ieee Transactions On Electron Devices. 37: 2171-2175. DOI: 10.1109/16.59906 |
0.382 |
|
1990 |
Baek J, Shur M. Mechanism of Negative Transconductance in Heterostructure Field-Effect Transistors Ieee Transactions On Electron Devices. 37: 1917-1921. DOI: 10.1109/16.57145 |
0.379 |
|
1990 |
Moon BJ, Byun YH, Lee K, Shur M. New Continuous Hetero Structure Field-Effect-Transistor Model And Unified Parameter Extraction Technique Ieee Transactions On Electron Devices. 37: 908-919. DOI: 10.1109/16.52424 |
0.401 |
|
1990 |
Chen Y, Dahlberg ED, Shur M, Akinwande A. Effect of a magnetic field on the gate current in heterostructure field‐effect transistors Applied Physics Letters. 56: 2028-2030. DOI: 10.1063/1.103007 |
0.379 |
|
1989 |
Hack M, Shaw JG, Shur M. Development of Spice Models for Amorphous Silicon Thin-Film Transistors Mrs Proceedings. 149. DOI: 10.1557/Proc-149-233 |
0.328 |
|
1989 |
Ruden P, Shur M, Arch D, Daniels R, Grider D, Nohava T. Quantum-well p-channel AlGaAs/InGaAs/GaAs heterostructure insulated-gate field-effect transistors Ieee Transactions On Electron Devices. 36: 2371-2379. DOI: 10.1109/16.43656 |
0.399 |
|
1989 |
Ruden PP, Shur M, Akinwande AI, Jenkins P. Distributive Nature of Gate Current and Negative Transconductance in Heterostructure Field-Effect Transistors Ieee Transactions On Electron Devices. 36: 453-456. DOI: 10.1109/16.19951 |
0.383 |
|
1989 |
Shur M, Hack M, Shaw JG. A new analytic model for amorphous silicon thin-film transistors Journal of Applied Physics. 66: 3371-3380. DOI: 10.1063/1.344481 |
0.365 |
|
1989 |
Shur M, Hack M, Shaw JG, Martin RA. Capacitance-voltage characteristics of amorphous silicon thin-film transistors Journal of Applied Physics. 66: 3381-3385. DOI: 10.1063/1.344134 |
0.365 |
|
1989 |
Costa J, Peczalski A, Shur M. Monte Carlo studies of electronic transport in compensated InP Journal of Applied Physics. 66: 674-679. DOI: 10.1063/1.343536 |
0.374 |
|
1989 |
Grinberg AA, Shur M. A new analytical model for heterostructure field‐effect transistors Journal of Applied Physics. 65: 2116-2120. DOI: 10.1063/1.342859 |
0.387 |
|
1989 |
Hack M, Shur M, Tsai CC. Amorphous silicon photoconductive diode Applied Physics Letters. 54: 96-98. DOI: 10.1063/1.101200 |
0.333 |
|
1989 |
Hack M, Shaw JG, Shur M. Simulations and physics of amorphous silicon thin-film transistors Journal of Non-Crystalline Solids. 115: 150-155. DOI: 10.1016/0022-3093(89)90389-X |
0.345 |
|
1988 |
Berroth M, Shur M, Haydl W. Experimental Studies of Hot Electron Effects in GaAs MESFETs The Japan Society of Applied Physics. DOI: 10.7567/Ssdm.1988.D-1-3 |
0.307 |
|
1988 |
Daniels RR, Ruden PP, Shur M, Grider D, Nohava TE, Arch DK. Quantum-Well p-Channel AlGaAs/InGaAs/GaAs Heterostructure Insulated-Gate Field-Effect Transistors with Very High Transconductance Ieee Electron Device Letters. 9: 355-357. DOI: 10.1109/55.742 |
0.397 |
|
1988 |
Xu J, Shur M. Temperature dependence of electron mobility and peak velocity in compensated GaAs Applied Physics Letters. 52: 922-923. DOI: 10.1063/1.99274 |
0.313 |
|
1988 |
Ruden PP, Han CJ, Shur M. Gate current of modulation-doped field-effect transistors Journal of Applied Physics. 64: 1541-1546. DOI: 10.1063/1.341830 |
0.418 |
|
1988 |
Xu J, Shur M. Erratum: Temperature dependence of electron mobility and peak velocity in compensated GaAs [Appl. Phys. Lett. 52, 922 (1988)] Applied Physics Letters. 53: 1219-1219. DOI: 10.1063/1.100422 |
0.315 |
|
1988 |
Sweeny M, Xu J, Shur M. Hole subbands in one-dimensional quantum well wires Superlattices and Microstructures. 4: 623-626. DOI: 10.1016/0749-6036(88)90249-2 |
0.321 |
|
1988 |
Xu J, Shur M. Double base hot electron transistor Superlattices and Microstructures. 4: 329-332. DOI: 10.1016/0749-6036(88)90177-2 |
0.338 |
|
1988 |
Xu J, Shur M. Double Ridley-Watkins-Hilsum-Gunn effect in compensated GaAs Solid-State Electronics. 31: 607-610. DOI: 10.1016/0038-1101(88)90352-8 |
0.351 |
|
1987 |
Hack M, Tuan H, Shaw J, Shur M, Yap P. Physics of Novel Amorphous Silicon High-Voltage Transistor Mrs Proceedings. 95. DOI: 10.1557/Proc-95-457 |
0.385 |
|
1987 |
Xu J, Shur M. Velocity-field dependence in GaAs Ieee Transactions On Electron Devices. 34: 1831-1832. DOI: 10.1109/T-Ed.1987.23158 |
0.306 |
|
1987 |
Xu J, Shur M, Hack M. Amplification of bipolar current flow by charge induced from an insulated gate electrode Journal of Applied Physics. 62: 1108-1111. DOI: 10.1063/1.339717 |
0.336 |
|
1987 |
Xu J, Shur M. Ballistic transport in hot‐electron transistors Journal of Applied Physics. 62: 3816-3820. DOI: 10.1063/1.339223 |
0.351 |
|
1987 |
Arch DK, Shur M, Abrokwah JK, Daniels RR. Superlattice conduction in superlattice modulation‐doped field‐effect transistors Journal of Applied Physics. 61: 1503-1509. DOI: 10.1063/1.338083 |
0.368 |
|
1987 |
Hack M, Shur M. Analysis of amorphous silicon thin-film transistors Journal of Non-Crystalline Solids. 1291-1294. DOI: 10.1016/0022-3093(87)90309-7 |
0.34 |
|
1987 |
Hack M, Street RA, Shur M. Capacitance studies of thermal equilibrium changes in n-type amorphous silicon Journal of Non-Crystalline Solids. 803-806. DOI: 10.1016/0022-3093(87)90192-X |
0.343 |
|
1986 |
Hack M, Shur M, Czubatyj W. Double Injection Field Effect Transistor A New Type of Solid State Device Mrs Proceedings. 70. DOI: 10.1557/Proc-70-643 |
0.39 |
|
1986 |
Chen C, Shur M, Peczalski A. Trapping-enhanced temperature variation of the threshold voltage of GaAs MESFET's Ieee Transactions On Electron Devices. 33: 792-798. DOI: 10.1109/T-Ed.1986.22570 |
0.382 |
|
1986 |
Baek JH, Shur M, Daniels RR, Arch DK, Abrokwah JK, Tufte ON. New mechanism of gate current in heterostructure insulated gate field-effect transistors Ieee Electron Device Letters. 7: 519-521. DOI: 10.1109/Edl.1986.26458 |
0.401 |
|
1986 |
Hack M, Shur M. Limitations to the open circuit voltage of amorphous silicon solar cells Applied Physics Letters. 49: 1432-1434. DOI: 10.1063/1.97345 |
0.343 |
|
1986 |
Xu J, Bernhardt BA, Shur M, Chen C, Peczalski A. Electron mobility and velocity in compensated GaAs Applied Physics Letters. 49: 342-344. DOI: 10.1063/1.97162 |
0.343 |
|
1986 |
Hack M, Shur M, Czubatyj W. Double‐injection field‐effect transistor: A new type of solid‐state device Applied Physics Letters. 48: 1386-1388. DOI: 10.1063/1.96917 |
0.39 |
|
1986 |
Shur M, Hyun C, Hack M. New high field-effect mobility regimes of amorphous silicon alloy thin-film transistor operation Journal of Applied Physics. 59: 2488-2497. DOI: 10.1063/1.336994 |
0.341 |
|
1986 |
Shur M, Hack M. Determination of density of localized states in amorphous silicon alloys from the low field conductance of thinn‐i‐ndiodes Journal of Applied Physics. 59: 803-807. DOI: 10.1063/1.336601 |
0.331 |
|
1986 |
Hack M, Shur M. Implications of light‐induced defects on the performance of amorphous silicon alloyp‐i‐nsolar cells Journal of Applied Physics. 59: 2222-2228. DOI: 10.1063/1.336363 |
0.339 |
|
1985 |
Hack M, Shur M, Hyun C, Yaniv Z, Cannella V, Yang M. Experimental and Theoretical Analysis of the above Threshold Characteristics of Amorphous Silicon Alloy Field Effect Transistors Mrs Proceedings. 49. DOI: 10.1557/Proc-49-373 |
0.402 |
|
1985 |
Shur M. Spill‐over effects in planar doped barrier devices Applied Physics Letters. 47: 869-871. DOI: 10.1063/1.95959 |
0.356 |
|
1985 |
Hack M, Shur M. Analysis of light-induced degradation in amorphous silicon alloy p-i-n solar cells Journal of Applied Physics. 58: 1656-1661. DOI: 10.1063/1.336056 |
0.314 |
|
1985 |
Hack M, Shur M. Analysis of light-induced degradation in amorphous silicon alloy p-i-n solar cells Journal of Non-Crystalline Solids. 1481-1484. DOI: 10.1016/0022-3093(85)90934-2 |
0.309 |
|
1985 |
Shur M, Hyun C, Hack M, Yaniv Z, Yang M, Cannella V. Localized states distribution and the characteristics of amorphous silicon alloy field defect transistors Journal of Non-Crystalline Solids. 1401-1404. DOI: 10.1016/0022-3093(85)90917-2 |
0.355 |
|
1984 |
Shur M, Hack M, Hyun C. Characteristics of Amorphous Silicon Based Alloy Field Effect Transistors Mrs Proceedings. 33. DOI: 10.1557/Proc-33-307 |
0.364 |
|
1984 |
Shur M. Folded gate—A novel logic gate structure Ieee Electron Device Letters. 5: 454-455. DOI: 10.1109/Edl.1984.25985 |
0.368 |
|
1984 |
Shur M, Hack M. Physics of amorphous silicon based alloy field‐effect transistors Journal of Applied Physics. 55: 3831-3842. DOI: 10.1063/1.332893 |
0.375 |
|
1983 |
Lee K, Shur M, Drummond TJ, Morkoç H. Electron density of the two‐dimensional electron gas in modulation doped layers Journal of Applied Physics. 54: 2093-2096. DOI: 10.1063/1.332259 |
0.367 |
|
1983 |
Shur M, Hack M. A new analytical approach to amorphous silicon thin film transistors Journal of Non-Crystalline Solids. 1171-1174. DOI: 10.1016/0022-3093(83)90376-9 |
0.386 |
|
1983 |
Hack M, Shur M, Czubatyj W, Yang J, McGill J. Amorphous silicon based alloy solar cell modeling with new diffusion length interpretation Journal of Non-Crystalline Solids. 1115-1118. DOI: 10.1016/0022-3093(83)90362-9 |
0.382 |
|
1982 |
Drummond T, Morkoc H, Lee K, Shur M. Model for modulation doped field effect transistor Ieee Electron Device Letters. 3: 338-341. DOI: 10.1109/Edl.1982.25593 |
0.353 |
|
1976 |
Shur M. Influence of nonuniform field distribution on frequency limits of GaAs field-effect transistors Electronics Letters. 12: 615. DOI: 10.1049/El:19760470 |
0.34 |
|
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