3 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2022 Kölker A, Gramse G, Stock TJZ, Aeppli G, Curson NJ. charge transport imaging of atomically thin dopant nanostructures in silicon. Nanoscale. PMID 35416206 DOI: 10.1039/d1nr08381c  0.677
2020 Stock TJZ, Warschkow O, Constantinou PC, Li J, Fearn S, Crane E, Hofmann EVS, Kölker A, McKenzie DR, Schofield SR, Curson NJ. Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy. Acs Nano. 14: 3316-3327. PMID 32142256 DOI: 10.1021/acsnano.9b08943  0.573
2017 Gramse G, Kölker A, Lim T, Stock TJZ, Solanki H, Schofield SR, Brinciotti E, Aeppli G, Kienberger F, Curson NJ. Nondestructive imaging of atomically thin nanostructures buried in silicon. Science Advances. 3: e1602586. PMID 28782006 DOI: 10.1126/sciadv.1602586  0.592
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