| Year |
Citation |
Score |
| 2017 |
Jurewicz AJG, Burnett DS, Rieck KD, Hervig R, Friedmann TA, Williams P, Daghlian CP, Wiens R. Understanding heterogeneity in Genesis diamond-like carbon film using SIMS analysis of implants. Journal of Materials Science. 52: 11282-11305. PMID 32025048 DOI: 10.1007/S10853-017-1267-3 |
0.373 |
|
| 2015 |
Zhang J, Franzreb K, Aksyonov S, Williams P. Mass Spectra and Yields of Intact Charged Biomolecules Ejected by Massive Cluster Impact for Bioimaging in a Time-of-Flight Secondary Ion Microscope. Analytical Chemistry. PMID 26452076 DOI: 10.1021/Acs.Analchem.5B01802 |
0.366 |
|
| 2014 |
Zhang J, Franzreb K, Williams P. Imaging with biomolecular ions generated by massive cluster impact in a time-of-flight secondary ion microscope. Rapid Communications in Mass Spectrometry : Rcm. 28: 2211-6. PMID 25178725 DOI: 10.1002/Rcm.7006 |
0.323 |
|
| 2011 |
Lorincik J, Denton MB, Sperline RP, Young ET, Williams P. Testing of a micro Faraday cup array for ion detection in SIMS Analytical Letters. 44: 1050-1057. DOI: 10.1080/00032719.2010.511739 |
0.428 |
|
| 2011 |
Williams P. Raymond Castaing's Ion Microscope and Secondary Ion Mass Spectrometry Microscopy and Microanalysis. 17: 562-563. DOI: 10.1017/S1431927611003680 |
0.414 |
|
| 2011 |
Franzreb K, Williams P. Negative ion yield and sputter yield variations for Cs+ bombardment of Si with O2 gas flooding Surface and Interface Analysis. 43: 129-133. DOI: 10.1002/Sia.3483 |
0.422 |
|
| 2010 |
Williams P, Franzreb K. Identification at high mass resolution of the positive ion at m/z 19 produced by electron-stimulated desorption: F+ (rather than H 3 O+) Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 28: 622-624. DOI: 10.1116/1.3420442 |
0.382 |
|
| 2010 |
Williams P, Franzreb K, Sobers RC, Lörinčík J. On the effect of oxygen flooding on the detection of noble gas ions in a SIMS instrument Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 268: 2758-2765. DOI: 10.1016/J.Nimb.2010.05.037 |
0.792 |
|
| 2009 |
Fiser J, Franzreb K, Lörincík J, Williams P. Oxygen-containing diatomic dications in the gas phase. European Journal of Mass Spectrometry (Chichester, England). 15: 315-24. PMID 19423916 DOI: 10.1255/Ejms.972 |
0.472 |
|
| 2009 |
Chou CW, Nelson RW, Williams P. Dependence of the ejection velocities of laser-ablated ions on the laser wavelength and fluence European Journal of Mass Spectrometry. 15: 305-314. PMID 19423915 DOI: 10.1255/Ejms.971 |
0.311 |
|
| 2007 |
Franzreb K, Sommerfeld T, Williams P. Small gas-phase dianions of Zn3O(4)(2-), Zn4O(5)(2-), CuZn2O(4)(2-), Si2GeO(6)(2-), Ti2O(5)(2-) and Ti3O(7)(2-). Physical Chemistry Chemical Physics : Pccp. 9: 846-52. PMID 17287878 DOI: 10.1039/b615088h |
0.323 |
|
| 2007 |
Franzreb K, Sommerfeld T, Williams P. Small gas-phase dianions of Zn3O4 2-, Zn4O5 2-, CuZn2O4 2-, Si2GeO6 2-, Ti2O 5 2- and Ti3O7 2- Physical Chemistry Chemical Physics. 9: 846-852. DOI: 10.1039/B615088H |
0.462 |
|
| 2006 |
Aksyonov SA, Bittner M, Bloom LB, Reha-Krantz LJ, Gould IR, Hayes MA, Kiernan UA, Niederkofler EE, Pizziconi V, Rivera RS, Williams DJ, Williams P. Multiplexed DNA sequencing-by-synthesis. Analytical Biochemistry. 348: 127-38. PMID 16289447 DOI: 10.1016/J.Ab.2005.10.001 |
0.726 |
|
| 2006 |
Franzreb K, Williams P. Observation of small gas-phase metal-oxygen dianions Chemical Physics Letters. 419: 379-384. DOI: 10.1016/J.Cplett.2005.11.106 |
0.392 |
|
| 2006 |
Sommerfeld T, Franzreb K, Sobers RC, Williams P. Small silicon-oxygen dianions in the gas phase Chemical Physics. 329: 216-221. DOI: 10.1016/J.Chemphys.2006.05.025 |
0.769 |
|
| 2006 |
Hervig RL, Mazdab FK, Williams P, Guan Y, Huss GR, Leshin LA. Useful ion yields for Cameca IMS 3f and 6f SIMS: Limits on quantitative analysis Chemical Geology. 227: 83-99. DOI: 10.1016/J.Chemgeo.2005.09.008 |
0.403 |
|
| 2006 |
Lorincik J, Hervig R, Franzreb K, Slodzian G, Williams P. Isotope ratio measurement with a multicollector detector on the cameca IMS nf Applied Surface Science. 252: 7301-7303. DOI: 10.1016/J.Apsusc.2006.02.151 |
0.402 |
|
| 2006 |
Williams P, Sobers RC, Franzreb K, Lörinčík J. Quantitative fundamental SIMS studies using 18O implant standards Applied Surface Science. 252: 6429-6432. DOI: 10.1016/J.Apsusc.2006.02.091 |
0.781 |
|
| 2005 |
Franzreb K, Sobers RC, Lörinčik J, Williams P. Observation of small long-lived diatomic dications BeH2+ and BeD2+ Physical Review a - Atomic, Molecular, and Optical Physics. 71. DOI: 10.1103/Physreva.71.024701 |
0.741 |
|
| 2005 |
Franzreb K, Williams P. Small gas-phase dianions produced by sputtering and gas flooding Journal of Chemical Physics. 123. DOI: 10.1063/1.2136154 |
0.385 |
|
| 2005 |
Franzreb K, Hrušák J, Alikhani ME, Lörinčík J, Sobers RC, Williams P. Erratum: Gas-phase diatomic trications of Se23+, Te23+, and LaF3+ [J. Chem. Phys. 121, 12293 (2004)] The Journal of Chemical Physics. 123: 209901. DOI: 10.1063/1.2135774 |
0.738 |
|
| 2004 |
Franzreb K, Hrusák J, Alikhani ME, Lörincík J, Sobers RC, Williams P. Gas-phase diatomic trications of Se2(3+), Te2(3+), and LaF3+. The Journal of Chemical Physics. 121: 12293-302. PMID 15606247 DOI: 10.1063/1.1821496 |
0.785 |
|
| 2004 |
Franzreb K, Sobers RC, Lorincik J, Williams P. Formation of doubly positively charged diatomic ions of Mo2(2+) produced by Ar+ sputtering of an Mo metal surface. The Journal of Chemical Physics. 120: 7983-6. PMID 15267715 DOI: 10.1063/1.1690234 |
0.787 |
|
| 2004 |
Hervig RL, Mazdab FK, Danielson L, Sharp TG, Hamed A, Williams P. SIMS microanalyses for Au in silicates American Mineralogist. 89: 498-504. DOI: 10.2138/Am-2004-0404 |
0.416 |
|
| 2004 |
Franzreb K, Lörinčík J, Williams P. Quantitative study of oxygen enhancement of sputtered ion yields. I. Argon ion bombardment of a silicon surface with O2 flood Surface Science. 573: 291-309. DOI: 10.1016/J.Susc.2004.10.001 |
0.453 |
|
| 2004 |
Lorincik J, Franzreb K, Williams P. SIMION modeling of ion optical effects in Cameca ion microanalyzers: Simulation of ion transmission losses Applied Surface Science. 231: 921-925. DOI: 10.1016/J.Apsusc.2004.03.173 |
0.337 |
|
| 2004 |
Franzreb K, Sobers RC, Lörincík J, Williams P. Detection of the diatomic dications SiH2+ and AlH2+ Applied Surface Science. 231: 82-85. DOI: 10.1016/J.Apsusc.2004.03.040 |
0.775 |
|
| 2004 |
Sobers RC, Franzreb K, Williams P. Quantitative measurement of O/Si ratios in oxygen-sputtered silicon using 18O implant standards Applied Surface Science. 231: 729-733. DOI: 10.1016/J.Apsusc.2004.03.033 |
0.78 |
|
| 2003 |
Franzreb K, Williams P. Inert gas clusters ejected from bursting bubbles during sputtering Physical Review Letters. 91: 015501/1-015501/4. DOI: 10.1103/Physrevlett.91.015501 |
0.4 |
|
| 2003 |
Franzreb K, Williams P. Mass-resolved low-energy back-scattering of alkali ions Applied Surface Science. 203: 98-101. DOI: 10.1016/S0169-4332(02)00707-9 |
0.362 |
|
| 2003 |
Franzreb K, Williams P, Lörinčík J, Šroubek Z. Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2 + bombardment Applied Surface Science. 203: 39-42. DOI: 10.1016/S0169-4332(02)00648-7 |
0.388 |
|
| 2002 |
Kiernan UA, Black JA, Williams P, Nelson RW. High-throughput analysis of hemoglobin from neonates using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry. Clinical Chemistry. 48: 947-9. PMID 12029016 DOI: 10.1093/Clinchem/48.6.947 |
0.69 |
|
| 2002 |
Kiernan UA, Tubbs KA, Gruber K, Nedelkov D, Niederkofler EE, Williams P, Nelson RW. High-throughput protein characterization using mass spectrometric immunoassay. Analytical Biochemistry. 301: 49-56. PMID 11811966 DOI: 10.1006/Abio.2001.5478 |
0.754 |
|
| 2002 |
Kiernan UA, Williams P, Nelson RW. High throughput characterization of hemoglobin from neonates using MALDI-TOF MS Proceedings 50th Asms Conference On Mass Spectrometry and Allied Topics. 269-270. |
0.632 |
|
| 2002 |
Niederkofler EE, Nedelkov D, Tubbs KA, Kiernan UA, Williams P, Nelson RW. Rapid apolipoprotein phenotyping using mass spectrometric immunoassay approaches Proceedings 50th Asms Conference On Mass Spectrometry and Allied Topics. 253-254. |
0.748 |
|
| 2001 |
Aksyonov SA, Williams P. Impact desolvation of electrosprayed microdroplets - A new ionization method for mass spectrometry of large biomolecules Rapid Communications in Mass Spectrometry. 15: 2001-2006. PMID 11675666 DOI: 10.1002/Rcm.470 |
0.429 |
|
| 2001 |
Niederkofler EE, Tubbs KA, Gruber K, Nedelkov D, Kiernan UA, Williams P, Nelson RW. Determination of beta-2 microglobulin levels in plasma using a high-throughput mass spectrometric immunoassay system. Analytical Chemistry. 73: 3294-9. PMID 11476228 DOI: 10.1021/Ac010143J |
0.763 |
|
| 1999 |
Chou CW, Williams P, Limbach PA. Matrix influence on the formation of positively charged oligonucleotides in matrix-assisted laser desorption/ionization mass spectrometry International Journal of Mass Spectrometry. 193: 15-27. DOI: 10.1016/S1387-3806(99)00104-9 |
0.368 |
|
| 1997 |
Krone JR, Nelson RW, Dogruel D, Williams P, Granzow R. BIA/MS: Interfacing biomolecular interaction analysis with mass spectrometry Analytical Biochemistry. 244: 124-132. PMID 9025918 DOI: 10.1006/Abio.1996.9871 |
0.353 |
|
| 1996 |
Chou CW, Bingham SE, Williams P. Affinity methods for purification of DNA sequencing reaction products for mass spectrometric analysis Rapid Communications in Mass Spectrometry. 10: 1410-1414. PMID 8805847 DOI: 10.1002/(Sici)1097-0231(199608)10:11<1410::Aid-Rcm671>3.0.Co;2-F |
0.32 |
|
| 1996 |
Dogruel D, Nelson RW, Williams P. The effects of matrix pH and cation availability on the matrix-assisted laser desorption/ionization mass spectrometry of poly(methyl methacrylate) Rapid Communications in Mass Spectrometry. 10: 801-804. DOI: 10.1002/(Sici)1097-0231(199605)10:7<801::Aid-Rcm555>3.0.Co;2-G |
0.304 |
|
| 1995 |
Nelson RW, Dogruel D, Krone JR, Williams P. Peptide characterization using bioreactive mass spectrometer probe tips Rapid Communications in Mass Spectrometry. 9: 1380-1385. PMID 8534888 DOI: 10.1002/Rcm.1290091411 |
0.31 |
|
| 1994 |
Nelson RW, Dogruel D, Williams P, Beavis R. Mass determination of human immunoglobulin IgM using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry. Rapid Communications in Mass Spectrometry. 8: 627-631. PMID 7949330 DOI: 10.1002/Rcm.1290080811 |
0.356 |
|
| 1994 |
Deng RC, Williams P. Suppression of cluster ion interferences in glow discharge mass spectrometry by sampling high-energy ions from a reversed hollow cathode ion source Analytical Chemistry. 66: 1890-1896. DOI: 10.1021/Ac00083A019 |
0.381 |
|
| 1994 |
Williams P. Time of flight mass spectrometry of DNA laser-ablated from frozen aqueous solutions: applications to the Human Genome Project International Journal of Mass Spectrometry and Ion Processes. 131: 335-344. DOI: 10.1016/0168-1176(93)03887-R |
0.313 |
|
| 1993 |
Schauer SN, Thomas R, Williams P. Energy distributions of ions produced by electron-stimulated desorption Surface Science. 290: 277-285. DOI: 10.1016/0039-6028(93)90711-R |
0.41 |
|
| 1992 |
Schieltz DM, Chou CW, Luo CW, Thomas RM, Williams P. Mass spectrometry of DNA mixtures by laser ablation from frozen aqueous solution. Rapid Communications in Mass Spectrometry : Rcm. 6: 631-6. PMID 1421515 DOI: 10.1002/Rcm.1290061009 |
0.328 |
|
| 1992 |
Schauer SN, Williams P. Doubly charged sputtered ions of fourth-row elements Physical Review B. 46: 15452-15464. DOI: 10.1103/Physrevb.46.15452 |
0.379 |
|
| 1992 |
Hervig RL, Williams P, Thomas RM, Schauer SN, Steele IM. Microanalysis of oxygen isotopes in insulators by secondary ion mass spectrometry International Journal of Mass Spectrometry and Ion Processes. 120: 45-63. DOI: 10.1016/0168-1176(92)80051-2 |
0.437 |
|
| 1991 |
Williams P. Spectrometry for biology. Science. 252: 1865-1865. PMID 17753265 DOI: 10.1126/Science.252.5014.1865 |
0.331 |
|
| 1990 |
Gillen G, Simons DS, Williams P. Molecular ion imaging and dynamic secondary ion mass spectrometry of organic compounds Analytical Chemistry. 62: 2122-2130. PMID 2256549 DOI: 10.1021/Ac00218A014 |
0.384 |
|
| 1990 |
Schauer SN, Williams P. Elimination of cluster interferences in secondary ion mass spectrometry using extreme energy filtering International Journal of Mass Spectrometry and Ion Processes. 103: 21-29. DOI: 10.1016/0168-1176(90)80013-S |
0.43 |
|
| 1990 |
Nelson RW, Thomas RM, Williams P. Time‐of‐flight mass spectrometry of nucleic acids by laser ablation and ionization from a frozen aqueous matrix Rapid Communications in Mass Spectrometry. 4: 348-351. DOI: 10.1002/Rcm.1290040911 |
0.379 |
|
| 1989 |
Gillen G, Phelps JM, Nelson RW, Williams P, Hues SM. Secondary ion yield matrix effects in SIMS depth profiles of Si/Ge multilayers Surface and Interface Analysis. 14: 771-780. DOI: 10.1002/Sia.740141114 |
0.443 |
|
| 1988 |
Gillen G, Christiansen JW, Tsong IST, Kimball B, Williams P, Cooks RG. Sputter yields of ammonium chloride and solid glycerol Rapid Communications in Mass Spectrometry. 2: 67-68. DOI: 10.1002/Rcm.1290020404 |
0.361 |
|
| 1987 |
Streit LA, Williams P. Quantitative analysis of chemical vapor deposition refractory metal silicides Journal of Vacuum Science and Technology. 5: 1979-1983. DOI: 10.1116/1.574898 |
0.406 |
|
| 1987 |
Williams P, Sundqvist B. Mechanism of sputtering of large biomolecular ions by impact of highly ionizing particles Physical Review Letters. 58: 1031-1034. DOI: 10.1103/Physrevlett.58.1031 |
0.343 |
|
| 1987 |
Farley CW, Kim TS, Streetman BG, Lareau RT, Williams P. Encapsulation and annealing studies of semi- insulating InP Thin Solid Films. 146: 221-231. DOI: 10.1016/0040-6090(87)90429-9 |
0.335 |
|
| 1987 |
Williams P, Gillen G. Direct evidence for Coulombic ejection of electron-desorbed ions Surface Science. 180: L109-L112. DOI: 10.1016/0039-6028(87)90030-6 |
0.343 |
|
| 1986 |
Hues SM, Williams P. A variable temperature sample stage for the Cameca IMS 3F secondary ion microanalyzer Journal of Vacuum Science and Technology. 4: 1942-1943. DOI: 10.1116/1.573751 |
0.303 |
|
| 1986 |
Williams P, Streit LA. Quantitative analysis using sputtered neutrals in a secondary ion microanalyser Nuclear Inst. and Methods in Physics Research, B. 15: 159-164. DOI: 10.1016/0168-583X(86)90274-0 |
0.445 |
|
| 1986 |
Coghlan WA, Rhee MH, Williams JM, Streit LA, Williams P. Effect of microstructure on the arsenic profile in implanted silicon Nuclear Inst. and Methods in Physics Research, B. 16: 171-176. DOI: 10.1016/0168-583X(86)90009-1 |
0.338 |
|
| 1986 |
Lien CD, Nicolet MA, Williams P. Effects of ion irradiation on thermally formed silicides in the presence of interfacial oxide Thin Solid Films. 136: 69-76. DOI: 10.1016/0040-6090(86)90109-4 |
0.326 |
|
| 1985 |
Lareau RT, Williams P. IN SITU ION IMPLANTATION FOR QUANTITATIVE SIMS ANALYSIS Materials Research Society Symposia Proceedings. 48: 273-279. DOI: 10.1557/Proc-48-273 |
0.4 |
|
| 1985 |
Williams P. Secondary Ion Mass Spectrometry Annual Review of Materials Science. 15: 327-377. DOI: 10.1146/Annurev.Ms.15.080185.002505 |
0.434 |
|
| 1985 |
Williams P. LIMITS OF QUANTITATIVE MICROANALYSIS USING SECONDARY ION MASS SPECTROMETRY Scanning Electron Microscopy. 553-561. |
0.312 |
|
| 1984 |
Williams P. MODERN ANALYTICAL USAGE OF SECONDARY ION MASS SPECTROMETRY . 1-7. |
0.306 |
|
| 1983 |
Williams P, Stika KM, Davies JA, Jackman TE. Quantitative SIMS analysis of hydrogenated amorphous silicon using superimposed deuterium implant standards Nuclear Instruments and Methods in Physics Research. 218: 299-302. DOI: 10.1016/0167-5087(83)90994-8 |
0.355 |
|
| 1983 |
Williams P. Sputtered ion ejection from ionic materials International Journal of Mass Spectrometry and Ion Physics. 53: 101-109. DOI: 10.1016/0020-7381(83)85105-5 |
0.378 |
|
| 1983 |
Pettit GR, Holzapfel CW, Cragg GM, Herald CL, Williams P. Broad scope secondary ion mass spectrometry Journal of Natural Products. 46: 917-922. |
0.311 |
|
| 1982 |
Williams P. On mechanisms of sputtered ion emission Applications of Surface Science. 13: 241-259. DOI: 10.1016/0378-5963(82)90030-7 |
0.321 |
|
| 1979 |
Chelgren JE, Katz W, Deline VR, Evans CA, Blattner RJ, Williams P. Surface cesium concentrations in cesium‐ion‐bombarded elemental and compound targets Journal of Vacuum Science and Technology. 16: 324-327. DOI: 10.1116/1.569939 |
0.362 |
|
| 1978 |
Williams P, Lewis RK, Evans CA, Hanley PR. Improvements in the chemistry of secondary ion mass spectrometry — negative ion techniques Nuclear Instruments and Methods. 149: 567-567. DOI: 10.1016/0029-554X(78)90928-X |
0.429 |
|
| 1977 |
Williams P, Lewis RK, Evans CA, Hanley PR. Evaluation of a Cesium Primary Ion Source on an Ion Microprobe Mass Spectrometer Analytical Chemistry. 49: 1399-1403. DOI: 10.1021/Ac50017A027 |
0.442 |
|
| Show low-probability matches. |
