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Ralf Widenhorn, Ph.D. - Publications

Affiliations: 
2005 Portland State University, Portland, OR, United States 
Area:
Electricity and Magnetism Physics, Electronics and Electrical Engineering, Environmental Sciences
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27 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Hendrickson B, Widenhorn R, Blouke M, Heidtmann D, Bodegom E. Wavelet Analysis of RTS Noise in CMOS Image Sensors Irradiated With High-Energy Photons Ieee Transactions On Nuclear Science. 67: 1732-1737. DOI: 10.1109/Tns.2020.2995309  0.704
2019 Allen T, Chally A, Moser B, Widenhorn R. Sound Propagation, Reflection, and Its Relevance to Ultrasound Imaging The Physics Teacher. 57: 134-137. DOI: 10.1119/1.5092466  0.316
2016 Dunlap JC, Blouke MM, Bodegom E, Widenhorn R. Interpreting activation energies in digital image sensors Ieee Transactions On Electron Devices. 63: 26-31. DOI: 10.1109/Ted.2015.2451661  0.728
2015 Dunlap JC, Kutschera E, Van Ness GR, Widenhorn R. The electrocardiogram as an electronic filter and why ac circuits are important for pre-health physics students Physics Education. 50: 81-87. DOI: 10.1088/0031-9120/50/1/81  0.321
2014 Mylott E, Kutschera EM, Widenhorn R. Bioelectrical impedance analysis as a laboratory activity: At the interface of physics and the body American Journal of Physics. 82: 521-528. DOI: 10.1119/1.4866276  0.336
2012 Dunlap JC, Blouke MM, Bodegom E, Widenhorn R. Dynamic CCD pixel depletion edge model and the effects on dark current production Proceedings of Spie - the International Society For Optical Engineering. 8298. DOI: 10.1117/12.909217  0.769
2012 Dunlap JC, Blouke MM, Bodegom E, Widenhorn R. Dark current modeling with a moving depletion edge Journal of Electronic Imaging. 21. DOI: 10.1117/1.Jei.21.4.043011  0.745
2012 Dunlap JC, Blouke MM, Bodegom E, Widenhorn R. Modeling nonlinear dark current behavior in CCDs Ieee Transactions On Electron Devices. 59: 1114-1122. DOI: 10.1109/Ted.2012.2183000  0.753
2011 Dunlap JC, Bodegom E, Widenhorn R. Nonlinear time dependence of dark current in charge-coupled devices Proceedings of Spie - the International Society For Optical Engineering. 7875. DOI: 10.1117/12.871962  0.76
2011 Dunlap JC, Porter WC, Bodegom E, Widenhorn R. Dark current in an active pixel complementary metal-oxide-semiconductor sensor Journal of Electronic Imaging. 20. DOI: 10.1117/1.3533328  0.753
2011 Mylott E, Klepetka R, Dunlap JC, Widenhorn R. An easily assembled laboratory exercise in computed tomography European Journal of Physics. 32: 1227-1235. DOI: 10.1088/0143-0807/32/5/010  0.356
2010 Dunlap JC, Bodegom E, Widenhorn R. Characterization and correction of dark current in compact consumer cameras Proceedings of Spie - the International Society For Optical Engineering. 7536. DOI: 10.1117/12.840440  0.764
2010 Widenhorn R, Weber A, Blouke MM, Bae AJ, Bodegom E. Charge diffusion in the field-free region of charge-coupled devices Optical Engineering. 49. DOI: 10.1117/1.3386514  0.709
2010 Dunlap JC, Bodegom E, Widenhorn R. Correction of dark current in consumer cameras Journal of Electronic Imaging. 19. DOI: 10.1117/1.3358365  0.768
2010 Widenhorn R, Dunlap JC, Bodegom E. Exposure time dependence of dark current in CCD imagers Ieee Transactions On Electron Devices. 57: 581-587. DOI: 10.1109/Ted.2009.2038649  0.763
2009 Dunlap JC, Sostin O, Widenhorn R, Bodegom E. Dark current behavior in DSLR cameras Proceedings of Spie - the International Society For Optical Engineering. 7249. DOI: 10.1117/12.806128  0.775
2009 Widenhorn R, Hartwig I, Dunlap JC, Bodegom E. Influence of illumination on dark current in charge-coupled device imagers Journal of Electronic Imaging. 18. DOI: 10.1117/1.3222943  0.786
2008 Widenhorn R, Hartwig I, Dunlap JC, Bodegom E. Measurements of dark current in a CCD imager during light exposures Proceedings of Spie - the International Society For Optical Engineering. 6816. DOI: 10.1117/12.769082  0.781
2008 Porter WC, Kopp B, Dunlap JC, Widenhorn R, Bodegom E. Dark current measurements in a CMOS imager Proceedings of Spie - the International Society For Optical Engineering. 6816. DOI: 10.1117/12.769079  0.778
2007 Widenhorn R, Rest A, Blouke MM, Berry RL, Bodegom E. Computation of dark frames in digital imagers Electronic Imaging. 6501: 650103. DOI: 10.1117/12.714784  0.765
2005 Loch M, Widenhorn R, Bodegom E. Infrared response of charge-coupled devices Electronic Imaging. 5677: 201-208. DOI: 10.1117/12.610650  0.693
2004 Widenhorn R, Fitzgibbons M, Bodegom E. The Meyer-Neldel rule for diodes in forward bias Journal of Applied Physics. 96: 7379-7382. DOI: 10.1063/1.1818353  0.727
2003 Widenhorn R, Weber A, Blouke MM, Bae AJ, Bodegom E. PSF measurements on back-illuminated CCDs Proceedings of Spie - the International Society For Optical Engineering. 5017: 176-184. DOI: 10.1117/12.482797  0.701
2002 Widenhorn R, Blouke MM, Weber A, Rest A, Bodegom E. Temperature dependence of dark current in a CCD Proceedings of Spie - the International Society For Optical Engineering. 4669: 193-201. DOI: 10.1117/12.463446  0.742
2002 Rest A, Mündermann L, Widenhorn R, Bodegom E, McGlinn TC. Residual images in charged-coupled device detectors Review of Scientific Instruments. 73: 2028. DOI: 10.1063/1.1470234  0.743
2002 Widenhorn R, Rest A, Bodegom E. The Meyer-Neldel rule for a property determined by two transport mechanisms Journal of Applied Physics. 91: 6524-6528. DOI: 10.1063/1.1469666  0.673
2001 Widenhorn R, Mündermann L, Rest A, Bodegom E. Meyer-Neldel rule for dark current in charge-coupled devices Journal of Applied Physics. 89: 8179-8182. DOI: 10.1063/1.1372365  0.735
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