| Year |
Citation |
Score |
| 2017 |
Datta A, Chee SW, Bammes B, Jin L, Loh D. What Can We Learn from the Shapes of Secondary Electron Puddles on Direct Electron Detectors Microscopy and Microanalysis. 23: 190-191. DOI: 10.1017/S1431927617001635 |
0.402 |
|
| 2015 |
Guo H, Jin L, Lu P, Wang Z, Shan Z, Bammes B, Spilman M, Bilhorn R. From Scintillator-based Detector to Direct Electron Detector: High Performance of Next Generation of Camera for In-situ TEM Testing and TEM Imaging Microscopy and Microanalysis. 21: 343-344. DOI: 10.1017/S1431927615002512 |
0.462 |
|
| 2014 |
Jin L, Bammes BE, Chen DH, Spilman MS, Robert BB. In situ TEM observation of solid electrolyte interface using high speed direct electron camera Microscopy and Microanalysis. 20: 1592-1593. DOI: 10.1017/S1431927614009696 |
0.39 |
|
| 2013 |
Bammes BE, Chen D, Jin L, Bilhorn RB. Visualizing and Correcting Dynamic Specimen Processes in TEM Using a Direct Detection Device Microscopy and Microanalysis. 19: 1320-1321. DOI: 10.1017/S1431927613008593 |
0.453 |
|
| 2011 |
Ellisman M, Deerinck T, Bushong E, Bouwer J, Shone T, Jin L, Milazzo A, Peltier S, Xuong N. Advances in Extreme-Scale 3D EM: Specimen Preparation and Recording Systems for Electron Microscopic Tomography and Serial Block Face SEM Microscopy and Microanalysis. 17: 976-977. DOI: 10.1017/S1431927611005757 |
0.582 |
|
| 2010 |
Milazzo AC, Moldovan G, Lanman J, Jin L, Bouwer JC, Klienfelder S, Peltier ST, Ellisman MH, Kirkland AI, Xuong NH. Characterization of a direct detection device imaging camera for transmission electron microscopy. Ultramicroscopy. 110: 744-7. PMID 20382479 DOI: 10.1016/J.Ultramic.2010.03.007 |
0.697 |
|
| 2009 |
Milazzo AC, Lanman J, Bouwer JC, Jin L, Peltier ST, Johnson JE, Kleinfelder S, Xuong NH, Ellisman MH. Advanced detector development for electron microscopy enables new insight into the study of the virus life cycle in cells and alzheimers disease Microscopy and Microanalysis. 15: 8-9. DOI: 10.1017/S1431927609098766 |
0.622 |
|
| 2008 |
Jin L, Milazzo AC, Kleinfelder S, Li S, Leblanc P, Duttweiler F, Bouwer JC, Peltier ST, Ellisman MH, Xuong NH. Applications of direct detection device in transmission electron microscopy. Journal of Structural Biology. 161: 352-8. PMID 18054249 DOI: 10.1016/J.Jsb.2007.10.007 |
0.695 |
|
| 2007 |
Xuong NH, Jin L, Kleinfelder S, Li S, Leblanc P, Duttweiler F, Bouwer JC, Peltier ST, Milazzo AC, Ellisman M. Future directions for camera systems in electron microscopy. Methods in Cell Biology. 79: 721-39. PMID 17327181 DOI: 10.1016/S0091-679X(06)79028-8 |
0.695 |
|
| 2007 |
Jin L, Milazzo A, Kleinfelder S, Li S, Leblanc P, Duttweiler F, Bouwer JC, Peltier ST, Ellisman M, Xuong N. The Intermediate Size Direct Detection Detector for Electron Microscopy Electronic Imaging. 6501. DOI: 10.1117/12.704329 |
0.708 |
|
| 2006 |
Li S, Bouwer J, Duttweiler F, Ellisman M, Jin L, Leblanc P, Milazzo A, Peltier S, Xuong N, Kleinfelder S. A new direct detection camera system for electron microscopy Proceedings of Spie - the International Society For Optical Engineering. 6068. DOI: 10.1117/12.650673 |
0.705 |
|
| 2005 |
Milazzo AC, Leblanc P, Duttweiler F, Jin L, Bouwer JC, Peltier S, Ellisman M, Bieser F, Matis HS, Wieman H, Denes P, Kleinfelder S, Xuong NH. Active pixel sensor array as a detector for electron microscopy. Ultramicroscopy. 104: 152-9. PMID 15890445 DOI: 10.1016/J.Ultramic.2005.03.006 |
0.694 |
|
| 2005 |
Bouwer JC, Peltier ST, Jin L, Khodjasaryan K, Geist S, Xuong NH, Ellisman MH. Analysis of the performance of an 8k x 8k lens coupled detector for wide-field, high-resolution transmission electron microscopy (TEM) Microscopy and Microanalysis. 11: 62-63. DOI: 10.1017/S1431927605510250 |
0.367 |
|
| 2005 |
Peltier ST, Bouwer JC, Jin L, Khodjasaryan K, Geist S, Xuong N, Ellisman MH. Design of a New 8k x 8k Lens Coupled Detector for Wide-field, High-resolution Transmission Electron Microscopy Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605510249 |
0.359 |
|
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