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Brian P. Gorman - Publications

Affiliations: 
Metallurgical and Materials Engineering Colorado School of Mines, Golden, CO, United States 
Area:
Materials Science Engineering
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96 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Roberts DM, Bardgett D, Gorman BP, Perkins JD, Zakutayev A, Bauers SR. Synthesis of tunable SnS-TaS nanoscale superlattices. Nano Letters. PMID 32945683 DOI: 10.1021/Acs.Nanolett.0C02115  0.324
2020 Chiaramonti AN, Miaja-Avila L, Caplins BW, Blanchard PT, Diercks DR, Gorman BP, Sanford NA. Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-9. PMID 32160938 DOI: 10.1017/S1431927620000203  0.394
2020 Bauers SR, Mangum J, Harvey SP, Perkins JD, Gorman B, Zakutayev A. Epitaxial growth of rock salt MgZrN2 semiconductors on MgO and GaN Applied Physics Letters. 116: 102102. DOI: 10.1063/1.5140469  0.35
2020 Agirseven O, Rivella DT, Haggerty JES, Berry PO, Diffendaffer K, Patterson A, Kreb J, Mangum JS, Gorman BP, Perkins JD, Chen BR, Schelhas LT, Tate J. Crystallization of TiO2 polymorphs from RF-sputtered, amorphous thin-film precursors Aip Advances. 10: 025109. DOI: 10.1063/1.5140368  0.31
2019 Burton GL, Wright S, Stokes A, Diercks DR, Clarke A, Gorman BP. Orientation mapping with Kikuchi patterns generated from a focused STEM probe and indexing with commercially available EDAX software. Ultramicroscopy. 209: 112882. PMID 31765818 DOI: 10.1016/J.Ultramic.2019.112882  0.317
2019 Xiao C, Jiang CS, Liu J, Norman A, Moseley J, Schulte K, Ptak AJ, Gorman B, Al-Jassim M, Haegel NM, Moutinho H. Carrier-Transport Study of Gallium Arsenide Hillock Defects. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-7. PMID 31475657 DOI: 10.1017/S1431927619014909  0.323
2019 Bauers SR, Holder A, Sun W, Melamed CL, Woods-Robinson R, Mangum J, Perkins J, Tumas W, Gorman B, Tamboli A, Ceder G, Lany S, Zakutayev A. Ternary nitride semiconductors in the rocksalt crystal structure. Proceedings of the National Academy of Sciences of the United States of America. PMID 31270238 DOI: 10.1073/Pnas.1904926116  0.323
2019 Chiaramonti AN, Miaja-Avila L, Blanchard PT, Diercks DR, Gorman BP, Sanford NA. A Three-Dimensional Atom Probe Microscope Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source Mrs Advances. 4: 2367-2375. DOI: 10.1557/Adv.2019.296  0.39
2019 Proudian AP, Jaskot MB, Diercks DR, Gorman BP, Zimmerman JD. Atom Probe Tomography of Molecular Organic Materials: Sub-Dalton Nanometer-Scale Quantification Chemistry of Materials. 31: 2241-2247. DOI: 10.1021/Acs.Chemmater.8B04476  0.322
2019 Chiaramonti AN, Miaja-Avila L, Blanchard PT, Diercks DR, Gorman BP, Sanford NA. Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source Microscopy and Microanalysis. 25: 314-315. DOI: 10.1017/S1431927619002307  0.346
2019 Kartopu G, Oklobia O, Turkay D, Diercks DR, Gorman BP, Barrioz V, Campbell S, Major JD, Turkestani MKA, Yerci S, Barnes TM, Beattie N, Zoppi G, Jones S, Irvine SJC. Study of thin film poly-crystalline CdTe solar cells presenting high acceptor concentrations achieved by in-situ arsenic doping Solar Energy Materials and Solar Cells. 194: 259-267. DOI: 10.1016/J.Solmat.2019.02.025  0.308
2019 Mangum JS, Agirseven O, Haggerty JE, Perkins JD, Schelhas LT, Kitchaev DA, Garten LM, Ginley DS, Toney MF, Tate J, Gorman BP. Selective brookite polymorph formation related to the amorphous precursor state in TiO2 thin films Journal of Non-Crystalline Solids. 505: 109-114. DOI: 10.1016/J.Jnoncrysol.2018.10.049  0.324
2018 Diercks DR, Gorman BP. Self-consistent atom probe tomography reconstructions utilizing electron microscopy. Ultramicroscopy. 195: 32-46. PMID 30179773 DOI: 10.1016/J.Ultramic.2018.08.019  0.338
2018 Kirchhofer R, Diercks DR, Gorman BP. Electron diffraction and imaging for atom probe tomography. The Review of Scientific Instruments. 89: 053706. PMID 29864799 DOI: 10.1063/1.4999484  0.777
2018 Mangum JS, Chan LH, Schmidt U, Garten LM, Ginley DS, Gorman BP. Correlative Raman spectroscopy and focused ion beam for targeted phase boundary analysis of titania polymorphs. Ultramicroscopy. 188: 48-51. PMID 29549789 DOI: 10.1016/J.Ultramic.2018.02.007  0.349
2018 Miaja-Avila L, Chiaramonti AN, Blanchard PT, Sanford NA, Kapteyn HC, Murnane MM, Diercks DR, Gorman BP. Coherent Extreme-Ultraviolet Source Applied to Atom Probe Tomography Frontiers in Optics. DOI: 10.1364/Fio.2018.Ftu5C.3  0.341
2018 Burton GL, Diercks DR, Ogedengbe OS, Jayathilaka PARD, Edirisooriya M, Myers TH, Zaunbrecher KN, Moseley J, Barnes TM, Gorman BP. Understanding arsenic incorporation in CdTe with atom probe tomography Solar Energy Materials and Solar Cells. 182: 68-75. DOI: 10.1016/J.Solmat.2018.02.023  0.367
2017 Haggerty JES, Schelhas LT, Kitchaev DA, Mangum JS, Garten LM, Sun W, Stone KH, Perkins JD, Toney MF, Ceder G, Ginley DS, Gorman BP, Tate J. High-fraction brookite films from amorphous precursors. Scientific Reports. 7: 15232. PMID 29123137 DOI: 10.1038/S41598-017-15364-Y  0.315
2017 Burton GL, Diercks DR, Perkins CL, Barnes TM, Ogedengbe OS, Jayathilaka PA, Edirisooriya M, Wang A, Myers TH, Gorman BP. Substrate preparation effects on defect density in molecular beam epitaxial growth of CdTe on CdTe (100) and (211)B Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 35: 041208. DOI: 10.1116/1.4994553  0.359
2017 Schulte KL, Simon J, Mangum J, Packard CE, Gorman BP, Jain N, Ptak AJ. Development of GaInP Solar Cells Grown by Hydride Vapor Phase Epitaxy Ieee Journal of Photovoltaics. 7: 1153-1158. DOI: 10.1109/Jphotov.2017.2691659  0.302
2017 Bikowski A, Siol S, Gu J, Holder A, Mangum JS, Gorman B, Tumas W, Lany S, Zakutayev A. Design of Metastable Tin Titanium Nitride Semiconductor Alloys Chemistry of Materials. 29: 6511-6517. DOI: 10.1021/Acs.Chemmater.7B02122  0.321
2017 Gorman BP, Burton G, Diercks DR. Utilizing Atom Probe Tomography for 3-D Quantification of Point Defects Microscopy and Microanalysis. 23: 1574-1575. DOI: 10.1017/S1431927617008534  0.323
2017 Diercks DR, Gorman BP, Gerstl SS. An Open-Access Atom Probe Tomography Mass Spectrum Database Microscopy and Microanalysis. 23: 664-665. DOI: 10.1017/S1431927617003981  0.316
2017 Xiao C, Jiang C, Johnston S, Yang X, Ye J, Gorman B, Al-Jassim M. Development of in-situ high-voltage and high-temperature stressing capability on atomic force microscopy platform Solar Energy. 158: 746-752. DOI: 10.1016/J.Solener.2017.09.047  0.304
2017 Xiao C, Jiang C, Moseley J, Simon J, Schulte K, Ptak AJ, Johnston S, Gorman B, Al-Jassim M, Haegel NM, Moutinho H. Near-field transport imaging applied to photovoltaic materials Solar Energy. 153: 134-141. DOI: 10.1016/J.Solener.2017.05.056  0.318
2016 Diercks DR, Gorman BP, Mulders JJ. Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-8. PMID 27748214 DOI: 10.1017/S1431927616011740  0.381
2016 Clark DR, Zhu H, Diercks DR, Ricote S, Kee RJ, Almansoori A, Gorman BP, O'Hayre RP. Probing Grain-Boundary Chemistry and Electronic Structure in Proton-Conducting Oxides by Atom Probe Tomography. Nano Letters. PMID 27696864 DOI: 10.1021/Acs.Nanolett.6B02918  0.394
2016 Garten LM, Zakutayev A, Perkins JD, Gorman BP, Ndione PF, Ginley DS. Structure property relationships in gallium oxide thin films grown by pulsed laser deposition Mrs Communications. 6: 348-353. DOI: 10.1557/Mrc.2016.50  0.359
2016 Lim K, Schelhas LT, Siah SC, Brandt RE, Zakutayev A, Lany S, Gorman B, Sun CJ, Ginley D, Buonassisi T, Toney MF. The effect of sub-oxide phases on the transparency of tin-doped gallium oxide Applied Physics Letters. 109. DOI: 10.1063/1.4964638  0.322
2016 Diercks DR, Tong J, Zhu H, Kee R, Baure G, Nino JC, O'Hayre R, Gorman BP. Three-dimensional quantification of composition and electrostatic potential at individual grain boundaries in doped ceria Journal of Materials Chemistry A. 4: 5167-5175. DOI: 10.1039/C5Ta10064J  0.326
2016 Strand MB, Leong GJ, Tassone CJ, Larsen B, Neyerlin KC, Gorman B, Diercks DR, Pylypenko S, Pivovar B, Richards RM. Mechanistic Study of Shape-Anisotropic Nanomaterials Synthesized via Spontaneous Galvanic Displacement The Journal of Physical Chemistry C. 120: 25053-25060. DOI: 10.1021/Acs.Jpcc.6B07363  0.323
2016 Diercks DR, Gorman BP. Experimental Evaluation of the Interrelationships Between Laser Energy, Temperature, Applied Bias, and Measured Composition in Laser Pulsed Atom Probe Tomography Microscopy and Microanalysis. 22: 648-649. DOI: 10.1017/S1431927616004098  0.384
2016 Stokes A, Al-Jassim M, Gorman B. Semi-statistical Atom Probe Tomography Analysis of Thin Film Grain Boundaries Microscopy and Microanalysis. 22: 644-645. DOI: 10.1017/S1431927616004074  0.333
2016 Stokes A, Al-Jassim M, Diercks DR, Egaas B, Gorman B. 3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography Acta Materialia. 102: 32-37. DOI: 10.1016/J.Actamat.2015.09.035  0.305
2016 Aguiar JA, Stokes A, Jiang CS, Aoki T, Kotula PG, Patel MK, Gorman B, Al-Jassim M. Revealing Surface Modifications of Potassium-Fluoride-Treated Cu(In,Ga)Se2: A Study of Material Structure, Chemistry, and Photovoltaic Performance Advanced Materials Interfaces. DOI: 10.1002/Admi.201600013  0.315
2015 Parman SW, Diercks DR, Gorman BP, Cooper RF. Atom probe tomography of isoferroplatinum American Mineralogist. 100: 852-860. DOI: 10.2138/Am-2015-4998  0.38
2015 Kirchhofer R, Diercks DR, Gorman BP. Near atomic scale quantification of a diffusive phase transformation in (Zn,Mg)O/Al<inf>2</inf>O<inf>3</inf> using dynamic atom probe tomography Journal of Materials Research. 30: 1137-1147. DOI: 10.1557/Jmr.2015.86  0.791
2015 Xiao C, Li Z, Guthrey H, Moseley J, Yang Y, Wozny S, Moutinho H, To B, Berry JJ, Gorman B, Yan Y, Zhu K, Al-Jassim M. Mechanisms of Electron-Beam-Induced Damage in Perovskite Thin Films Revealed by Cathodoluminescence Spectroscopy Journal of Physical Chemistry C. 119: 26904-26911. DOI: 10.1021/Acs.Jpcc.5B09698  0.638
2015 Diercks DR, Gorman BP. Nanoscale Measurement of Laser-Induced Temperature Rise and Field Evaporation Effects in CdTe and GaN Journal of Physical Chemistry C. 119: 20623-20631. DOI: 10.1021/Acs.Jpcc.5B02126  0.366
2015 Gorman BP, Diercks DR, Parman S, Cooper R. Atomic Scale Analysis of Terrestrial and Extra-Terrestrial Geomaterials Using Atom Probe Tomography Microscopy and Microanalysis. 21: 1311-1312. DOI: 10.1017/S1431927615007345  0.351
2015 Burton GL, Diercks DR, Gorman BP. Dopant and Interfacial Analysis of Epitaxial CdTe Using Atom Probe Tomography Microscopy and Microanalysis. 21: 693-694. DOI: 10.1017/S1431927615004262  0.377
2015 Diercks DR, Musselman M, Kumar M, Gorman BP, Packard CE. Microscopy of Chemical and Mechanical Heterogeneities in Lithium Cobalt Oxide Microscopy and Microanalysis. 21: 523-524. DOI: 10.1017/S1431927615003414  0.302
2014 Diercks DR, Musselman M, Morgenstern A, Wilson T, Kumar M, Smith K, Kawase M, Gorman BP, Eberhart M, Packard CE. Evidence for anisotropic mechanical behavior and nanoscale chemical heterogeneity in cycled LiCoO2 Journal of the Electrochemical Society. 161: F3039-F3045. DOI: 10.1149/2.0071411Jes  0.32
2014 Kirchhofer R, Diercks DR, Gorman BP, Ihlefeld JF, Kotula PG, Shelton CT, Brennecka GL. Quantifying compositional homogeneity in Pb (Zr, Ti) O 3 using atom probe tomography Journal of the American Ceramic Society. 97: 2677-2697. DOI: 10.1111/Jace.13135  0.784
2014 Diercks DR, Gorman BP, Manerbino A, Coors G. Atom Probe Tomography of Yttrium-Doped Barium-Cerium-Zirconium Oxide with NiO Addition Journal of the American Ceramic Society. 97: 3301-3306. DOI: 10.1111/Jace.13093  0.403
2014 Guthrey H, Johnston S, Gorman B, Al-Jassim M. Characterization of photovoltaics: From cells properties to atoms Microscopy and Microanalysis. 20: 952-953. DOI: 10.1017/S1431927614006485  0.638
2014 Teague M, Gorman B. Utilization of dual-column focused ion beam and scanning electron microscope for three dimensional characterization of high burn-up mixed oxide fuel Progress in Nuclear Energy. 72: 67-71. DOI: 10.1016/J.Pnucene.2013.08.006  0.774
2014 Teague M, Gorman B, Miller B, King J. EBSD and TEM characterization of high burn-up mixed oxide fuel Journal of Nuclear Materials. 444: 475-480. DOI: 10.1016/J.Jnucmat.2013.10.037  0.776
2014 Sanford NA, Blanchard PT, Brubaker M, Bertness KA, Roshko A, Schlager JB, Kirchhofer R, Diercks DR, Gorman B. Laser-assisted atom probe tomography of MBE grown GaN nanowire heterostructures Physica Status Solidi (C) Current Topics in Solid State Physics. 11: 608-612. DOI: 10.1002/Pssc.201300579  0.775
2013 Polley CM, Clarke WR, Miwa JA, Scappucci G, Wells JW, Jaeger DL, Bischof MR, Reidy RF, Gorman BP, Simmons M. Exploring the limits of N-type ultra-shallow junction formation. Acs Nano. 7: 5499-505. PMID 23721101 DOI: 10.1021/Nn4016407  0.32
2013 Guthrey H, Johnston S, Gorman B, Al-Jassim M. Atomic-scale origin of emission from extended defects in mc-Si Conference Record of the Ieee Photovoltaic Specialists Conference. 2637-2640. DOI: 10.1109/PVSC.2013.6745015  0.608
2013 Diercks DR, Gorman BP, Kirchhofer R, Sanford N, Bertness K, Brubaker M. Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects Journal of Applied Physics. 114. DOI: 10.1063/1.4830023  0.781
2013 Gorman B, Diercks D, Kirchhofer R. Laser and Material Effects on Laser Pulsed Atom Probe Analysis of Oxide and Nitride Ceramics Microscopy and Microanalysis. 19: 1882-1883. DOI: 10.1017/S1431927613011409  0.785
2013 Kirchhofer R, Diercks D, Gorman B, Brennecka G. Atomic Scale Composition Profiling of Ferroelectrics via Laser-Pulsed Atom Probe Tomography and Cross-Correlative Transmission Electron Microscopy Microscopy and Microanalysis. 19: 980-981. DOI: 10.1017/S1431927613006892  0.794
2013 Fields JD, Gorman B, Merdzhanova T, Yan B, Su T, Taylor PC. On the origin of deep oxygen defects in hydrogenated nanocrystalline silicon thin films used in photovoltaic applications Solar Energy Materials and Solar Cells. 113: 61-70. DOI: 10.1016/J.Solmat.2013.01.038  0.331
2013 Teague M, Gorman B, King J, Porter D, Hayes S. Microstructural characterization of high burn-up mixed oxide fast reactor fuel Journal of Nuclear Materials. 441: 267-273. DOI: 10.1016/J.Jnucmat.2013.05.067  0.76
2013 Kirchhofer R, Teague MC, Gorman BP. Thermal effects on mass and spatial resolution during laser pulse atom probe tomography of cerium oxide Journal of Nuclear Materials. 436: 23-28. DOI: 10.1016/J.Jnucmat.2012.12.052  0.761
2013 Kirchhofer R, Hunn JD, Demkowicz PA, Cole JI, Gorman BP. Microstructure of TRISO coated particles from the AGR-1 experiment: SiC grain size and grain boundary character Journal of Nuclear Materials. 432: 127-134. DOI: 10.1016/J.Jnucmat.2012.08.052  0.772
2012 Scappucci G, Klesse WM, Hamilton AR, Capellini G, Jaeger DL, Bischof MR, Reidy RF, Gorman BP, Simmons MY. Stacking of 2D electron gases in Ge probed at the atomic level and its correlation to low-temperature magnetotransport. Nano Letters. 12: 4953-9. PMID 22935029 DOI: 10.1021/Nl302558B  0.377
2012 Schmucker SW, Kumar N, Abelson JR, Daly SR, Girolami GS, Bischof MR, Jaeger DL, Reidy RF, Gorman BP, Alexander J, Ballard JB, Randall JN, Lyding JW. Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography. Nature Communications. 3: 935. PMID 22760634 DOI: 10.1038/Ncomms1907  0.388
2012 Gorman BP, Guthrey HL, Al-Jassim MM. Quantification of atomic scale defects in poly Si PV devices using atom probe tomography Conference Record of the Ieee Photovoltaic Specialists Conference. 1498-1500. DOI: 10.1109/PVSC.2012.6317880  0.641
2012 Guthrey H, Johnston S, Yan F, Gorman B, Al-Jassim M. Defect band luminescence intensity reversal as related to application of anti-reflection coating on mc-Si PV Cells Conference Record of the Ieee Photovoltaic Specialists Conference. 227-230. DOI: 10.1109/PVSC.2012.6317606  0.561
2012 Arey B, Perera D, Kovarik L, Qafoku O, Felmy A, Gorman B. Atom Probe and TEM Investigation of Natural Olivines Microscopy and Microanalysis. 18: 658-659. DOI: 10.1017/S1431927612005144  0.387
2012 Tong J, Subramaniyan A, Guthrey H, Clark D, Gorman BP, O'Hayre R. Electrical conductivities of nano ionic composite based on yttrium-doped barium zirconate and palladium metal Solid State Ionics. 211: 26-33. DOI: 10.1016/J.Ssi.2012.01.018  0.594
2011 Gorman BP, Norman AG, Lawrence D, Prosa T, Guthrey H, Al-Jassim M. Atomic scale characterization of compound semiconductors using atom probe tomography Conference Record of the Ieee Photovoltaic Specialists Conference. 003357-003359. DOI: 10.1109/PVSC.2011.6186667  0.663
2011 Gorman B, Kelly T. Discussion of Standard Specimens for Performance Evaluation in Atom Probe Tomography Microscopy and Microanalysis. 17: 850-851. DOI: 10.1017/S1431927611005125  0.357
2011 Kuchibhatla S, Shutthanandan V, Arey B, Kovarik L, Wang C, Prosa T, Ulfig R, Thevuthasan S, Gorman B. Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy Microscopy and Microanalysis. 17: 760-761. DOI: 10.1017/S1431927611004673  0.379
2011 McMurray S, Gorman B, Diercks D. TEM and Atom Probe Investigation of Calcium Carbonate Precipitation in Seawater Microscopy and Microanalysis. 17: 758-759. DOI: 10.1017/S1431927611004661  0.325
2011 Gorman B, Shepard J, Kirchhofer R, Olson J, Kelly T. Development of Atom Probe Tomography with In-situ STEM Imaging and Diffraction Microscopy and Microanalysis. 17: 710-711. DOI: 10.1017/S1431927611004429  0.767
2011 Liu F, Jiang CS, Guthrey H, Johnston S, Romero MJ, Gorman BP, Al-Jassim MM. Optical response of grain boundaries in upgraded metallurgical-grade silicon for photovoltaics Solar Energy Materials and Solar Cells. 95: 2497-2501. DOI: 10.1016/J.Solmat.2011.04.039  0.639
2010 Gorman B, Ballard J, Romanes M, Jaeger D, Reidy R, Randall J. Mediation of Electrostatic Discharge Induced Morphological Damage in Atomically Precise Tips Microscopy and Microanalysis. 16: 480-481. DOI: 10.1017/S1431927610059878  0.355
2010 Kirchhofer R, Hansford B, Reimanis I, Gorman B. Characterization of Stresses in the SiC Layer of TRISO Coated Nuclear Fuels Using Raman Spectroscopy and EBSD Microscopy and Microanalysis. 16: 1616-1617. DOI: 10.1017/S1431927610058770  0.75
2009 Giannuzzi LA, Gorman BP. Particle-induced x-ray emission in stainless steel using 30 keV Ga+ focused ion beams Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 27: 668-671. DOI: 10.1116/1.3136852  0.313
2009 Evans JE, Arslan I, Jaeger DL, Marquis EA, Gorman BP, Browning ND. 3-D atom probe tomography of resin embedded samples? Microscopy and Microanalysis. 15: 274-275. DOI: 10.1017/S1431927609098973  0.326
2008 Poudel PR, Hossain K, Li J, Gorman B, Neogi A, Rout B, Duggan JL, McDaniel FD. Characterization and light emission properties of osmium silicides synthesized by low energy ion implantation Mrs Proceedings. 1066. DOI: 10.1557/Proc-1066-A07-11  0.325
2008 Gorman BP, Puthucode A, Diercks DR, Kaufman MJ. Cross-correlative TEM and atom probe analysis of partial crystallisation in NiNbSn metallic glasses Materials Science and Technology. 24: 682-688. DOI: 10.1179/174328408X293595  0.399
2008 Choppali U, Gorman BP. Nanocrystalline ZnO thin film synthesis using glycerol in aqueous polymeric precursor processing Journal of the American Ceramic Society. 91: 2553-2558. DOI: 10.1111/J.1551-2916.2008.02523.X  0.305
2008 Gorman BP. Atomic scale chemical and structural characterization of internal interfaces with atom probe tomography Ieee International Symposium On Applications of Ferroelectrics. 3. DOI: 10.1109/ISAF.2008.4693792  0.327
2008 Gorman BP, Diercks D, Salmon N, Stach E, Amador G, Hartfield C. Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis Microscopy Today. 16: 42-47. DOI: 10.1017/S1551929500059782  0.365
2008 Choppali U, Gorman BP. Preferentially oriented ZnO thin films on basal plane sapphire substrates derived from polymeric precursors Materials Chemistry and Physics. 112: 916-922. DOI: 10.1016/J.Matchemphys.2008.07.007  0.303
2008 Choppali U, Gorman BP. Structural and optical properties of nanocrystalline ZnO thin films synthesized by the citrate precursor route Journal of Luminescence. 128: 1641-1648. DOI: 10.1016/J.Jlumin.2008.03.013  0.326
2007 Gorman BP, Norman AG, Yan Y. Atom probe analysis of III-V and Si-based semiconductor photovoltaic structures. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 13: 493-502. PMID 18001514 DOI: 10.1017/S1431927607070894  0.401
2007 Thompson K, Lawrence D, Larson DJ, Olson JD, Kelly TF, Gorman B. In situ site-specific specimen preparation for atom probe tomography. Ultramicroscopy. 107: 131-139. PMID 16938398 DOI: 10.1016/J.Ultramic.2006.06.008  0.377
2007 Kelly TF, Larson DJ, Thompson K, Alvis RL, Bunton JH, Olson JD, Gorman BP. Atom Probe Tomography of Electronic Materials Annual Review of Materials Research. 37: 681-727. DOI: 10.1146/Annurev.Matsci.37.052506.084239  0.392
2007 Gorman B. Atom Probe Reconstruction Refinements by Pre- and Post- Analysis TEM Structure Quantification Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607079408  0.35
2007 Brostow W, Gorman BP, Olea-Mejia O. Focused ion beam milling and scanning electron microscopy characterization of polymer + metal hybrids Materials Letters. 61: 1333-1336. DOI: 10.1016/J.Matlet.2006.07.026  0.311
2006 Cottier RJ, Amir FZ, Zhao W, Hossain K, Gorman BP, Golding TD, Anibou N, Donner W. Molecular beam epitaxial growth of osmium silicides Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 24: 1488-1491. DOI: 10.1116/1.2192527  0.331
2006 Gorman BP, Diercks D, Kaufman M, Ulfig R, Lawrence D, Thompson K, Larson DJ. Atomic scale compositional and structural characterization of nanostructured materials using combined FIB, STEM, and LEAP Microscopy and Microanalysis. 12: 1720-1721. DOI: 10.1017/S1431927606066979  0.326
2006 Lawrence D, Thompson K, Larson D, Gorman B. Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis Microscopy and Microanalysis. 12: 1742-1743. DOI: 10.1017/S1431927606064099  0.357
2006 Coutinho D, Gorman B, Ferraris JP, Yang DJ, Balkus KJ. Transformation of mesoporous benzene silica to nanoporous carbon Microporous and Mesoporous Materials. 91: 276-285. DOI: 10.1016/J.Micromeso.2005.10.004  0.316
2005 Cottier RJ, Amir FZ, Hossain K, House JB, Gorman BP, Perez JM, Holland OW, Golding TD, Stokes DW. Molecular beam epitaxial growth of Fe(Si 1-x Ge x) 2 epilayers Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 1299-1303. DOI: 10.1116/1.1924607  0.328
2005 Gorman BP, Norman AG, Lukic-Zrnic R, Littler CL, Moutinho HR, Golding TD, Birdwell AG. Atomic ordering-induced band gap reductions in GaAsSb epilayers grown by molecular beam epitaxy Journal of Applied Physics. 97. DOI: 10.1063/1.1834983  0.354
2004 Zhao W, Lukic-Zrnic R, Gorman BP, Cottier RL, Golding TD, Littler CL, Dinan JH, Almeida LA, Dura JA, Lindstrom RM, Schaake HF, Liao P. Magnetoconductivity tensor analysis of anomalous transport effects in neutron irradiated HgCdTe epilayers Physica E: Low-Dimensional Systems and Nanostructures. 20: 246-250. DOI: 10.1016/J.Physe.2003.08.011  0.311
2003 Gorman BP, Norman AG, Lukic-Zrnic R, Golding TD, Littler CL. Effects of substrate orientation on the spontaneous ordering of GaAsSb epilayers grown by molecular beam epitaxy Materials Research Society Symposium - Proceedings. 794: 309-314. DOI: 10.1557/Proc-794-T10.6  0.351
2001 Gorman BP, Orozco-Teran RA, Roepsch JA, Mueller DW, Reidy RF. Low Dielectric Constant Functionalized Silica Gels Mrs Proceedings. 714. DOI: 10.1557/Proc-714-L7.17.1  0.322
2001 Gorman BP, Orozco-Teran RA, Roepsch JA, Dong H, Reidy RF, Mueller DW. High strength, low dielectric constant fluorinated silica xerogel films Applied Physics Letters. 79: 4010-4012. DOI: 10.1063/1.1418267  0.336
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