| Year |
Citation |
Score |
| 2023 |
Lee S, Verkhoturov DS, Eller MJ, Verkhoturov SV, Shaw MA, Gwon K, Kim Y, Lucien F, Malhi H, Revzin A, Schweikert EA. Nanoprojectile Secondary Ion Mass Spectrometry Enables Multiplexed Analysis of Individual Hepatic Extracellular Vesicles. Acs Nano. PMID 38033295 DOI: 10.1021/acsnano.3c06604 |
0.673 |
|
| 2023 |
Lee S, Verkhoturov DS, Eller MJ, Verkhoturov SV, Shaw MA, Gwon K, Kim Y, Lucien F, Malhi H, Revzin A, Schweikert EA. Nanoprojectile Secondary Ion Mass Spectrometry Enables Multiplexed Analysis of Individual Hepatic Extracellular Vesicles. Biorxiv : the Preprint Server For Biology. PMID 37662200 DOI: 10.1101/2023.08.21.554053 |
0.672 |
|
| 2022 |
Eller MJ, Sandoval JM, Verkhoturov SV, Schweikert EA. Nanoprojectile Secondary Ion Mass Spectrometry for Nanometrology of Nanoparticles and Their Interfaces. Analytical Chemistry. 94: 7868-7876. PMID 35594187 DOI: 10.1021/acs.analchem.2c00303 |
0.699 |
|
| 2022 |
Kang N, Cho S, Leonhardt EE, Liu C, Verkhoturov SV, Woodward WHH, Eller MJ, Yuan T, Fitzgibbons TC, Borguet YP, Jahnke AA, Sokolov AN, McIntire T, Reinhardt C, Fang L, ... Schweikert EA, et al. Topological Design of Highly Anisotropic Aligned Hole Transporting Molecular Bottlebrushes for Solution-Processed OLEDs. Journal of the American Chemical Society. PMID 35471843 DOI: 10.1021/jacs.2c00420 |
0.573 |
|
| 2021 |
Lee S, Crulhas BP, Suvakov S, Verkhoturov SV, Verkhoturov DS, Eller MJ, Malhi H, Garovic VD, Schweikert EA, Stybayeva G, Revzin A. Nanoparticle-Enabled Multiplexed Electrochemical Immunoassay for Detection of Surface Proteins on Extracellular Vesicles. Acs Applied Materials & Interfaces. PMID 34709783 DOI: 10.1021/acsami.1c14506 |
0.657 |
|
| 2021 |
Verkhoturov DS, Crulhas BP, Eller MJ, Han YD, Verkhoturov SV, Bisrat Y, Revzin A, Schweikert EA. Nanoprojectile Secondary Ion Mass Spectrometry for Analysis of Extracellular Vesicles. Analytical Chemistry. PMID 33988360 DOI: 10.1021/acs.analchem.1c00689 |
0.683 |
|
| 2019 |
Verkhoturov SV, Gołuński M, Verkhoturov DS, Czerwinski B, Eller MJ, Geng S, Postawa Z, Schweikert EA. Hypervelocity cluster ion impacts on free standing graphene: Experiment, theory, and applications. The Journal of Chemical Physics. 150: 160901. PMID 31042896 DOI: 10.1063/1.5080606 |
0.681 |
|
| 2019 |
Eller MJ, Chandra K, Coughlin E, Odom TW, Schweikert EA. Label Free Particle-by-Particle Quantification of DNA-Loading on Sorted Gold Nanostars. Analytical Chemistry. PMID 30932475 DOI: 10.1021/Acs.Analchem.8B03715 |
0.629 |
|
| 2019 |
Debord JD, Fernandez-Lima FA, Verkhoturov SV, Schweikert EA, Della-Negra S. Characteristics of positive and negative secondary ions emitted from [Formula: see text] and [Formula: see text] impacts. Surface and Interface Analysis : Sia. 45: 134-137. PMID 24163486 DOI: 10.1002/sia.5009 |
0.505 |
|
| 2019 |
Eller MJ, Li M, Hou X, Verkhoturov SV, Schweikert EA, Trefonas P. Nanoscale molecular analysis of photoresist films with massive cluster secondary-ion mass spectrometry Journal of Micro/Nanolithography, Mems, and Moems. 18: 1. DOI: 10.1117/1.Jmm.18.2.023504 |
0.741 |
|
| 2018 |
Eller MJ, Vinjamuri A, Tomlin BE, Schweikert EA. Molecular co-localization using massive gold cluster secondary ion mass spectrometry. Analytical Chemistry. PMID 30296057 DOI: 10.1021/Acs.Analchem.8B02950 |
0.779 |
|
| 2018 |
Verkhoturov SV, Gołuński M, Verkhoturov DS, Geng S, Postawa Z, Schweikert EA. "Trampoline" ejection of organic molecules from graphene and graphite via keV cluster ions impacts. The Journal of Chemical Physics. 148: 144309. PMID 29655321 DOI: 10.1063/1.5021352 |
0.372 |
|
| 2018 |
Humood M, Meyer JL, Verkhoturov SV, Ozkan T, Eller M, Schweikert EA, Economy J, Polycarpou AA. 2D AlB2 flakes for epitaxial thin film growth Journal of Materials Research. 33: 2318-2326. DOI: 10.1557/Jmr.2018.173 |
0.566 |
|
| 2018 |
Price JS, Wang B, Kim T, Grede AJ, Sandoval JM, Xie R, Shen Y, Adams DR, Eller MJ, Sokolov A, Mukhopadhyay S, Trefonas P, Gomez ED, Schweikert EA, Giebink NC. Fluoropolymer-diluted small molecule organic semiconductors with extreme thermal stability Applied Physics Letters. 113: 263302. DOI: 10.1063/1.5053923 |
0.573 |
|
| 2017 |
Geng S, Verkhoturov SV, Eller MJ, Della-Negra S, Schweikert EA. The collision of a hypervelocity massive projectile with free-standing graphene: Investigation of secondary ion emission and projectile fragmentation. The Journal of Chemical Physics. 146: 054305. PMID 28178829 DOI: 10.1063/1.4975171 |
0.698 |
|
| 2016 |
Eller MJ, Verkhoturov SV, Schweikert EA. Testing Molecular Homogeneity at the Nanoscale with Massive Cluster Secondary Ion Mass Spectrometry. Analytical Chemistry. PMID 27373342 DOI: 10.1021/Acs.Analchem.6B01466 |
0.74 |
|
| 2016 |
Geng S, Verkhoturov SV, Eller MJ, Clubb AB, Schweikert EA. Characterization of individual free-standing nano-objects by cluster SIMS in transmission Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 34. DOI: 10.1116/1.4943027 |
0.744 |
|
| 2016 |
Clubb AB, Eller MJ, Verkhoturov SV, Schweikert EA, Anderson RM, Crooks RM. Characterization of nanometric inclusions via nanoprojectile impacts Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 34. DOI: 10.1116/1.4940152 |
0.734 |
|
| 2015 |
Verkhoturov SV, Geng S, Czerwinski B, Young AE, Delcorte A, Schweikert EA. Single impacts of keV fullerene ions on free standing graphene: Emission of ions and electrons from confined volume. The Journal of Chemical Physics. 143: 164302. PMID 26520508 DOI: 10.1063/1.4933310 |
0.341 |
|
| 2015 |
Liang CK, Eller MJ, Verkhoturov SV, Schweikert EA. Mass Spectrometry of Nanoparticles is Different. Journal of the American Society For Mass Spectrometry. PMID 25944367 DOI: 10.1007/S13361-015-1151-9 |
0.689 |
|
| 2015 |
Eller MJ, Liang CK, Della-Negra S, Clubb AB, Kim H, Young AE, Schweikert EA. Hypervelocity nanoparticle impacts on free-standing graphene: a sui generis mode of sputtering. The Journal of Chemical Physics. 142: 044308. PMID 25637988 DOI: 10.1063/1.4906343 |
0.675 |
|
| 2015 |
Yang F, Cho S, Sun G, Verkhoturov SV, Thackeray JW, Trefonas P, Wooley KL, Schweikert EA. Nanodomain analysis with cluster-SIMS: Application to the characterization of macromolecular brush architecture Surface and Interface Analysis. 47: 1051-1055. DOI: 10.1002/Sia.5812 |
0.363 |
|
| 2014 |
Cho S, Yang F, Sun G, Eller MJ, Clark C, Schweikert EA, Thackeray JW, Trefonas P, Wooley KL. Directing self-assembly of nanoscopic cylindrical diblock brush terpolymers into films with desired spatial orientations: expansion of chemical composition scope. Macromolecular Rapid Communications. 35: 437-41. PMID 24347368 DOI: 10.1002/Marc.201300845 |
0.587 |
|
| 2013 |
Eller MJ, Verkhoturov SV, Della-Negra S, Schweikert EA. SIMS instrumentation and methodology for mapping of co-localized molecules. The Review of Scientific Instruments. 84: 103706. PMID 24182118 DOI: 10.1063/1.4824199 |
0.695 |
|
| 2013 |
Eller MJ, Verkhoturov SV, Fernandez-Lima FA, Debord JD, Schweikert EA, Della-Negra S. Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts. Surface and Interface Analysis : Sia. 45. PMID 24163488 DOI: 10.1002/Sia.4949 |
0.76 |
|
| 2013 |
DeBord JD, Verkhoturov SV, Perez LM, North SW, Hall MB, Schweikert EA. Measuring the internal energies of species emitted from hypervelocity nanoprojectile impacts on surfaces using recalibrated benzylpyridinium probe ions. The Journal of Chemical Physics. 138: 214301. PMID 23758365 DOI: 10.1063/1.4807602 |
0.414 |
|
| 2013 |
Sun G, Cho S, Clark C, Verkhoturov SV, Eller MJ, Li A, Pavía-Jiménez A, Schweikert EA, Thackeray JW, Trefonas P, Wooley KL. Nanoscopic cylindrical dual concentric and lengthwise block brush terpolymers as covalent preassembled high-resolution and high-sensitivity negative-tone photoresist materials. Journal of the American Chemical Society. 135: 4203-6. PMID 23480169 DOI: 10.1021/Ja3126382 |
0.592 |
|
| 2013 |
Trefonas P, Thackeray JW, Sun G, Cho S, Clark C, Verkhoturov SV, Eller MJ, Li A, Pavía-Jiménez A, Schweikert EA, Wooley KL. Bottom-up / top-down high resolution, high throughput lithography using vertically assembled block bottle brush polymers Proceedings of Spie - the International Society For Optical Engineering. 8682. DOI: 10.1117/12.2014528 |
0.596 |
|
| 2013 |
Trefonas P, Thackeray JW, Sun G, Cho S, Clark C, Verkhoturov SV, Eller MJ, Li A, Pavia-Sanders A, Schweikert EA, Wooley KL. Bottom-up/top-down, high-resolution, high-throughput lithography using vertically assembled block bottle brush polymers Journal of Micro/Nanolithography, Mems, and Moems. 12. DOI: 10.1117/1.Jmm.12.4.043006 |
0.598 |
|
| 2013 |
Liang CK, Verkhoturov SV, Chen LJ, Schweikert EA. Size-dependent emission of negative ions from gold nanoparticles bombarded with C60 and Au400 International Journal of Mass Spectrometry. 334: 43-48. DOI: 10.1016/j.ijms.2012.10.003 |
0.434 |
|
| 2013 |
Fernandez-Lima FA, Debord JD, Schweikert EA, Della-Negra S, Kellersberger KA, Smotherman M. Surface characterization of biological nanodomains using NP-ToF-SIMS Surface and Interface Analysis. 45: 294-297. DOI: 10.1002/Sia.4901 |
0.409 |
|
| 2012 |
Debord JD, Della-Negra S, Fernandez-Lima FA, Verkhoturov SV, Schweikert EA. Bi-Directional Ion Emission from Massive Gold Cluster Impacts on Nanometric Carbon Foils. The Journal of Physical Chemistry. C, Nanomaterials and Interfaces. 116: 8138-8144. PMID 22888385 DOI: 10.1021/jp212126m |
0.358 |
|
| 2012 |
Fernandez-Lima FA, Eller MJ, Debord JD, Verkhoturov SV, Della-Negra S, Schweikert EA. On the Surface Mapping using Individual Cluster Impacts. Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms. 273: 270-273. PMID 22393269 DOI: 10.1016/J.Nimb.2011.07.092 |
0.746 |
|
| 2012 |
Fernandez-Lima FA, Eller MJ, Debord JD, Levy MJ, Verkhoturov SV, Della-Negra S, Schweikert EA. Analysis of Fluorescent Proteins with a Nanoparticle Probe. The Journal of Physical Chemistry Letters. 3: 337-341. PMID 22308203 DOI: 10.1021/Jz201547X |
0.666 |
|
| 2012 |
Imbesi PM, Gohad NV, Eller MJ, Orihuela B, Rittschof D, Schweikert EA, Mount AS, Wooley KL. Noradrenaline-functionalized hyperbranched fluoropolymer-poly(ethylene glycol) cross-linked networks as dual-mode, anti-biofouling coatings. Acs Nano. 6: 1503-12. PMID 22276525 DOI: 10.1021/Nn204431M |
0.652 |
|
| 2012 |
Imbesi PM, Finlay JA, Aldred N, Eller MJ, Felder SE, Pollack KA, Lonnecker AT, Raymond JE, MacKay ME, Schweikert EA, Clare AS, Callow JA, Callow ME, Wooley KL. Targeted surface nanocomplexity: Two-dimensional control over the composition, physical properties and anti-biofouling performance of hyperbranched fluoropolymer-poly(ethylene glycol) amphiphilic crosslinked networks Polymer Chemistry. 3: 3121-3131. DOI: 10.1039/C2Py20317K |
0.612 |
|
| 2011 |
Fernandez-Lima FA, Post J, DeBord JD, Eller MJ, Verkhoturov SV, Della-Negra S, Woods AS, Schweikert EA. Analysis of native biological surfaces using a 100 kV massive gold cluster source. Analytical Chemistry. 83: 8448-53. PMID 21967684 DOI: 10.1021/Ac201481R |
0.774 |
|
| 2011 |
Chen LJ, Seo JH, Eller MJ, Verkhoturov SV, Shah SS, Revzin A, Schweikert EA. Quantitative label-free characterization of avidin-biotin assemblies on silanized glass. Analytical Chemistry. 83: 7173-8. PMID 21842883 DOI: 10.1021/Ac2016085 |
0.738 |
|
| 2011 |
Chen LJ, Shah SS, Silangcruz J, Eller MJ, Verkhoturov SV, Revzin A, Schweikert EA. Characterization and Quantification of Nanoparticle-Antibody Conjugates on Cells Using C(60) ToF SIMS in the Event-By-Event Bombardment/Detection Mode. International Journal of Mass Spectrometry. 303: 97-102. PMID 21691427 DOI: 10.1016/J.Ijms.2011.01.001 |
0.73 |
|
| 2011 |
Fernandez-Lima FA, Pinnick VT, Della-Negra S, Schweikert EA. Photon emission from massive projectile impacts on solids. Surface and Interface Analysis : Sia. 43: 53-57. PMID 21603128 DOI: 10.1002/Sia.3592 |
0.772 |
|
| 2011 |
Rajagopalachary S, Verkhoturov SV, Schweikert EA. Examination of individual nanoparticles with cluster SIMS Surface and Interface Analysis. 43: 547-550. DOI: 10.1002/sia.3564 |
0.339 |
|
| 2011 |
Della-Negra S, Arianer J, Depauw J, Verkhoturov SV, Schweikert EA. The Pegase project, a new solid surface probe: Focused massive cluster ion beams Surface and Interface Analysis. 43: 66-69. DOI: 10.1002/sia.3478 |
0.433 |
|
| 2011 |
Della-Negra S, Depauw J, Guillermier C, Schweikert EA. Massive clusters: Secondary emission from qkeV to qMeV. New emission processes? New SIMS probe? Surface and Interface Analysis. 43: 62-65. DOI: 10.1002/sia.3416 |
0.489 |
|
| 2011 |
Pinnick V, Verkhoturov SV, Kaledin L, Schweikert EA. Probing chemical homogeneity within single cluster impact sites Surface and Interface Analysis. 43: 551-554. DOI: 10.1002/Sia.3395 |
0.822 |
|
| 2010 |
Fernandez-Lima FA, Eller MJ, Verkhoturov SV, Della-Negra S, Schweikert EA. Photon, Electron and Secondary Ion Emission from Single C(60) keV Impacts. The Journal of Physical Chemistry Letters. 1: 3510-3513. PMID 21218166 DOI: 10.1021/Jz1014345 |
0.714 |
|
| 2010 |
Eller MJ, Verkhoturov SV, Della-Negra S, Schweikert EA. Electron emission from hypervelocity C60 impacts Journal of Physical Chemistry C. 114: 17191-17196. DOI: 10.1021/Jp104027Q |
0.716 |
|
| 2009 |
Pinnick VT, Verkhoturov SV, Kaledin L, Bisrat Y, Schweikert EA. Molecular identification of individual nano-objects. Analytical Chemistry. 81: 7527-31. PMID 19655772 DOI: 10.1021/Ac9014337 |
0.825 |
|
| 2009 |
Rajagopalachary S, Verkhoturov SV, Schweikert EA. Characterization of individual ag nanoparticles and their chemical environment. Analytical Chemistry. 81: 1089-94. PMID 19105605 DOI: 10.1021/ac802188c |
0.387 |
|
| 2008 |
Pinnick V, Rajagopalachary S, Verkhoturov SV, Kaledin L, Schweikert EA. Characterization of individual nano-objects by secondary ion mass spectrometry. Analytical Chemistry. 80: 9052-7. PMID 19551978 DOI: 10.1021/Ac8014615 |
0.808 |
|
| 2008 |
Rajagopalachary S, Verkhoturov SV, Schweikert EA. Examination of nanoparticles via single large cluster impacts Nano Letters. 8: 1076-1080. DOI: 10.1021/nl0730716 |
0.366 |
|
| 2008 |
Guillermier C, Della-Negra S, Schweikert EA, Dunlop A, Rizza G. Emission of molecular fragments synthesized in hypervelocity nanoparticle impacts International Journal of Mass Spectrometry. 275: 86-90. DOI: 10.1016/j.ijms.2008.05.023 |
0.318 |
|
| 2008 |
Li Z, Verkhoturov SV, Locklear JE, Schweikert EA. Secondary ion mass spectrometry with C60+ and Au4004+ projectiles: Depth and nature of secondary ion emission from multilayer assemblies International Journal of Mass Spectrometry. 269: 112-117. DOI: 10.1016/J.Ijms.2007.09.018 |
0.82 |
|
| 2007 |
Guillermier C, Negra SD, Rickman RD, Hager GJ, Schweikert EA. Prompt in situ emission of gold adducts from single impacts of large gold clusters on organics solids International Journal of Mass Spectrometry. 263: 298-303. DOI: 10.1016/j.ijms.2007.03.011 |
0.816 |
|
| 2006 |
Li Z, Verkhoturov SV, Schweikert EA. Nanovolume analysis with secondary ion mass spectrometry using massive projectiles. Analytical Chemistry. 78: 7410-6. PMID 17073406 DOI: 10.1021/ac0603779 |
0.449 |
|
| 2006 |
Hager GJ, Guillermier C, Verkhoturov SV, Schweikert EA. Au-analyte adducts resulting from single massive gold cluster impacts Applied Surface Science. 252: 6558-6561. DOI: 10.1016/j.apsusc.2006.02.284 |
0.842 |
|
| 2006 |
Locklear JE, Guillermier C, Verkhoturov SV, Schweikert EA. Matrix-enhanced cluster-SIMS Applied Surface Science. 252: 6624-6627. DOI: 10.1016/j.apsusc.2006.02.206 |
0.79 |
|
| 2006 |
Verkhoturov SV, Rickman RD, Guillermier C, Hager GJ, Locklear JE, Schweikert EA. Molecular ion emission from single large cluster impacts Applied Surface Science. 252: 6490-6493. DOI: 10.1016/j.apsusc.2006.02.196 |
0.81 |
|
| 2006 |
Guillermier C, Pinnick V, Verkhoturov SV, Schweikert EA. Organic SIMS with single massive gold projectile: Ion yield enhancement by silver metallization Applied Surface Science. 252: 6644-6647. DOI: 10.1016/J.Apsusc.2006.02.108 |
0.82 |
|
| 2006 |
Guillermier C, Negra SD, Rickman RD, Pinnick V, Schweikert EA. Influence of massive projectile size and energy on secondary ion yields from organic surfaces Applied Surface Science. 252: 6529-6532. DOI: 10.1016/J.Apsusc.2006.02.077 |
0.784 |
|
| 2005 |
Rickman RD, Verkhoturov SV, Hager GJ, Schweikert EA. Multi-ion emission from large and massive keV cluster impacts International Journal of Mass Spectrometry. 245: 48-52. DOI: 10.1016/j.ijms.2005.06.009 |
0.85 |
|
| 2005 |
Rickman RD, Verkhoturov SV, Hager GJ, Schweikert EA, Bennett JA. Multiple secondary ion emission from keV massive gold projectile impacts International Journal of Mass Spectrometry. 241: 57-61. DOI: 10.1016/j.ijms.2004.10.009 |
0.855 |
|
| 2004 |
Locklear JE, Verkhoturov SV, Schweikert EA. Coincidental emission of molecular ions from keV carbon cluster impacts International Journal of Mass Spectrometry. 238: 59-64. DOI: 10.1016/j.ijms.2004.08.002 |
0.82 |
|
| 2004 |
Verkhoturov SV, Rickman RD, Balderas S, Schweikert EA. Nanodomain analysis via coincidence ion mass spectrometry Applied Surface Science. 231: 113-116. DOI: 10.1016/j.apsusc.2004.03.082 |
0.407 |
|
| 2004 |
Li Z, Rickman RD, Verkhoturov SV, Schweikert EA. Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry Applied Surface Science. 231: 328-331. DOI: 10.1016/j.apsusc.2004.03.081 |
0.391 |
|
| 2004 |
Rickman RD, Verkhoturov SV, Schweikert EA. Cluster secondary ion mass spectrometry: An insight into "super-efficient" collision cascades Applied Surface Science. 231: 54-58. DOI: 10.1016/j.apsusc.2004.03.026 |
0.416 |
|
| 2004 |
Rickman RD, Verkhoturov SV, Parilis ES, Schweikert EA. Simultaneous Ejection of Two Molecular Ions from keV Gold Atomic and Polyatomic Projectile Impacts Physical Review Letters. 92: 476011-476014. |
0.431 |
|
| 2002 |
Verkhoturov SV, Schweikert EA. A novel approach for coincidence ion mass spectrometry. Analytical and Bioanalytical Chemistry. 373: 609-11. PMID 12185572 DOI: 10.1007/s00216-002-1382-z |
0.436 |
|
| 2002 |
Diehnelt CW, English RD, Van Stipdonk MJ, Schweikert EA. Coincidence experiments in desorption mass spectrometry Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 193: 883-890. DOI: 10.1016/S0168-583X(02)00920-5 |
0.804 |
|
| 2002 |
Rickman RD, Hager GJ, Verkhoturov SV, Schweikert EA. An evaluation of coincidental secondary ion emission from keV mono- and polyatomic projectile impacts Proceedings 50th Asms Conference On Mass Spectrometry and Allied Topics. 775-776. |
0.842 |
|
| 2001 |
Verkhoturov SV, Schweikert EA, Chechik V, Sabapathy RC, Crooks RM, Parilis ES. Auger stimulated ion desorption of negative ions via K-capture radioactive decay. Physical Review Letters. 87: 037601. PMID 11461591 DOI: 10.1103/Physrevlett.87.037601 |
0.381 |
|
| 2001 |
English RD, Van Stipdonk MJ, Diehnelt CW, Schweikert EA. Influence of constituent mass on secondary ion yield enhancements from polyatomic ion impacts on aminoethanethiol self-assembled monolayer surfaces. Rapid Communications in Mass Spectrometry : Rcm. 15: 370-2. PMID 11241769 DOI: 10.1002/Rcm.236 |
0.782 |
|
| 2000 |
Van Stipdonk MJ, English RD, Schweikert EA. SIMS of organic anions adsorbed onto an aminoethanethiol self-assembled monolayer: An approach for enhanced secondary ion emission Analytical Chemistry. 72: 2618-2626. DOI: 10.1021/ac9914925 |
0.516 |
|
| 2000 |
Van Stipdonk MJ, Justes DR, Force CM, Schweikert EA. Speciation of sodium nitrate and sodium nitrite using kiloelectronvolt energy atomic and polyatomic and megaelectronvolt energy atomic projectiles with secondary ion mass spectrometry Analytical Chemistry. 72: 2468-2474. DOI: 10.1021/ac991427v |
0.44 |
|
| 2000 |
Van Stipdonk MJ, Santiago V, Schweikert EA, Chusuei CC, Goodman DW. Secondary ion emission from keV energy atomic and polyatomic projectile impacts on sodium iodate International Journal of Mass Spectrometry. 197: 149-161. DOI: 10.1016/S1387-3806(99)00255-9 |
0.46 |
|
| 2000 |
Van Stipdonk MJ, Justes DR, Schweikert EA. Determination of the metastable dissociation pathways for chromium/oxygen cluster ions sputtered from potassium chromate and dichromate using the ion-neutral correlation method International Journal of Mass Spectrometry. 203: 59-69. DOI: 10.1016/S1387-3806(00)00264-5 |
0.462 |
|
| 1999 |
Harris RD, Baker WS, Van Stipdonk MJ, Crooks RM, Schweikert EA. Secondary ion yields produced by keV atomic and polyatomic ion impacts on a self-assembled monolayer surface Rapid Communications in Mass Spectrometry : Rcm. 13: 1374-80. PMID 10407327 DOI: 10.1002/(Sici)1097-0231(19990730)13:14<1374::Aid-Rcm645>3.0.Co;2-5 |
0.463 |
|
| 1999 |
Diehnelt CW, Van Stipdonk MJ, Schweikert EA. Carbon-cluster formation from polymers caused by MeV-ion impacts and keV-cluster-ion impacts Physical Review a - Atomic, Molecular, and Optical Physics. 59: 4470-4474. DOI: 10.1103/Physreva.59.4470 |
0.792 |
|
| 1999 |
Van Stipdonk MJ, Justes DR, English RD, Schweikert EA. Ion-neutral correlations from the dissociation of metal oxide cluster ions in a reflectron time-of-flight mass spectrometer Journal of Mass Spectrometry. 34: 677-683. DOI: 10.1002/(SICI)1096-9888(199906)34:6<677::AID-JMS821>3.0.CO;2-J |
0.431 |
|
| 1999 |
Van Stipdonk MJ, Santiago V, Schweikert EA. Negative secondary ion emission from NaBF4: Comparison of atomic and polyatomic projectiles at different impact energies Journal of Mass Spectrometry. 34: 554-562. DOI: 10.1002/(SICI)1096-9888(199905)34:5<554::AID-JMS808>3.0.CO;2-I |
0.496 |
|
| 1999 |
Van Stipdonk MJ, English RD, Schweikert EA. Sputtering of tetrafluoro- and tetraphenylborate anions adsorbed to an amine-terminated self-assembled monolayer surface Journal of Physical Chemistry B. 103: 7929-7934. |
0.411 |
|
| 1998 |
Diehnelt CW, Van Stipdonk MJ, Schweikert EA. Recoiled ions from polyatomic cluster impacts on organic and inorganic targets Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 142: 606-611. DOI: 10.1016/S0168-583X(98)00343-7 |
0.737 |
|
| 1998 |
Van Stipdonk MJ, Justes DR, Santiago V, Schweikert EA. A comparison of ion emission from naNO3 produced by keV energy atomic and polyatomic primary ions Rapid Communications in Mass Spectrometry. 12: 1639-1643. DOI: 10.1002/(SICI)1097-0231(19981115)12:21<1639::AID-RCM374>3.0.CO;2-2 |
0.448 |
|
| 1998 |
Da Silveira EF, Duarte SB, Schweikert EA. Multiplicity analysis: A study of secondary particle distribution and correlation Surface Science. 408: 28-42. |
0.301 |
|
| 1998 |
Harris RD, Van Stipdonk MJ, Schweikert EA. Kiloelectron volt cluster impacts: Prospects for cluster-SIMS International Journal of Mass Spectrometry and Ion Processes. 174: 167-177. |
0.496 |
|
| 1998 |
Baudin K, Parilis ES, Blankenship JF, Van Stipdonk MJ, Schweikert EA. Sublinear effect in light emission from cesium iodide bombarded by keV polyatomic projectiles Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 134: 352-359. |
0.336 |
|
| 1998 |
Baudin K, Deprun C, Le Beyec Y, Schultz JA, Schoppmann C, Schweikert EA. A spontaneous desorption source for polyatomic ion production Rapid Communications in Mass Spectrometry. 12: 852-856. |
0.439 |
|
| 1997 |
Van Stipdonk MJ, Harris RD, Schweikert EA. Time-of-flight-secondary ion mass spectrometry of NaBF4: A comparison of atomic and polyatomic primary ions at constant impact energy Rapid Communications in Mass Spectrometry. 11: 1794-1798. DOI: 10.1002/(SICI)1097-0231(19971030)11:16<1794::AID-RCM79>3.0.CO;2-L |
0.465 |
|
| 1997 |
Van Stipdonk MJ, Schweikert EA, Park MA. Special feature: Tutorial. Coincidence measurements in mass spectrometry Journal of Mass Spectrometry. 32: 1151-1161. DOI: 10.1002/(SICI)1096-9888(199711)32:11<1151::AID-JMS605>3.0.CO;2-1 |
0.457 |
|
| 1997 |
Blankenship JF, VanStipdonk MJ, Schweikert EA. Matrix effects on the fragmentation of vitamin B12 in plasma desorption mass spectrometry Rapid Communications in Mass Spectrometry. 11: 143-147. |
0.376 |
|
| 1996 |
Van Stipdonk MJ, Harris RD, Schweikert EA. A comparison of desorption yields from C60/+ to atomic and polyatomic projectiles at keV energies Rapid Communications in Mass Spectrometry. 10: 1987-1991. DOI: 10.1002/(SICI)1097-0231(199612)10:15<1987::AID-RCM788>3.0.CO;2-K |
0.45 |
|
| 1996 |
Van Stipdonk MJ, Schweikert EA. The use of coincidence counting mass spectrometry to study the emission and metastable dissociation of cluster ions Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 112: 68-71. |
0.502 |
|
| 1996 |
Ferrell WR, Van Stipdonk MJ, Schweikert EA. A plasma desorption mass spectrometry study of cluster ion formation from group IIA nitrates Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 112: 55-58. |
0.356 |
|
| 1996 |
Ferrell WR, Von Heimburg SL, Van Stipdonk MJ, Schweikert EA. Secondary cluster ion distributions produced by MeV ion impacts on Group IIA oxides and nitrates International Journal of Mass Spectrometry and Ion Processes. 155: 89-97. |
0.41 |
|
| 1995 |
Van Stipdonk MJ, Schweikert EA. High energy chemistry caused by fast ion-solid interactions Nuclear Inst. and Methods in Physics Research, B. 96: 530-535. DOI: 10.1016/0168-583X(95)00253-7 |
0.432 |
|
| 1995 |
Ferrell WR, VanStipdonk MJ, da Silveira EF, Schweikert EA. Secondary ion correlations in plasma desorption mass spectrometry as a function of fission fragment energy Nuclear Inst. and Methods in Physics Research, B. 96: 536-540. DOI: 10.1016/0168-583X(95)00236-7 |
0.395 |
|
| 1995 |
Kaercher RG, da Silveira EF, Blankenship JF, Schweikert EA. Luminescence of self-trapped excitons induced by single keV ion bombardment Nuclear Inst. and Methods in Physics Research, B. 100: 383-388. DOI: 10.1016/0168-583X(94)00823-X |
0.341 |
|
| 1995 |
Betts RL, da Silveira EF, Schweikert EA. A plasma desorption mass spectrometry study of CHn + and C2Hn + ion formation from frozen organic surfaces International Journal of Mass Spectrometry and Ion Processes. 145: 9-23. DOI: 10.1016/0168-1176(95)04180-S |
0.339 |
|
| 1995 |
Van Stipdonk MJ, Shapiro JB, Schweikert EA. A mass spectrometric method for probing surface structure Vacuum. 46: 1227-1230. DOI: 10.1016/0042-207X(95)00147-6 |
0.534 |
|
| 1994 |
VanStipdonk MJ, Schweikert EA. On the formation of polyatomic ions from solid surfaces Nuclear Inst. and Methods in Physics Research, B. 88: 55-60. DOI: 10.1016/0168-583X(94)96080-1 |
0.454 |
|
| 1994 |
Kaercher RG, da Silveira EF, Leite CVB, Schweikert EA. Simultaneous detection of secondary ions and photons produced by the impact of keV polyatomic ions Nuclear Inst. and Methods in Physics Research, B. 94: 207-217. DOI: 10.1016/0168-583X(94)95356-2 |
0.45 |
|
| 1994 |
Ray KB, da Silveira EF, Jeronymo JMF, Baptista GB, Leite CVB, Schweikert EA. Coincidence counting analysis of secondary ions emitted from a phenylalanine target under multicharged MeV carbon bombardment International Journal of Mass Spectrometry and Ion Processes. 136: 107-117. DOI: 10.1016/0168-1176(94)04045-1 |
0.417 |
|
| 1993 |
Yau AY, Park MA, Kaercher RG, Schweikert EA. A spontaneous desorption-based polyatomic ion source Review of Scientific Instruments. 64: 1748-1753. DOI: 10.1063/1.1144004 |
0.395 |
|
| 1993 |
Ray KB, Park MA, Schweikert EA. Exit conditions for secondary ion emission induced by keV cluster bombardment Nuclear Inst. and Methods in Physics Research, B. 82: 317-322. DOI: 10.1016/0168-583X(93)96034-A |
0.512 |
|
| 1993 |
VanStipdonk M, Park MA, Schweikert EA, Sylvester P, Clearfield A. Surface structure investigations using plasma desorption mass spectrometry and coincidence counting International Journal of Mass Spectrometry and Ion Processes. 128: 133-141. DOI: 10.1016/0168-1176(93)87061-V |
0.44 |
|
| 1993 |
Park MA, Schweikert EA. Primary ion production from various gases in spontaneous desorption International Journal of Mass Spectrometry and Ion Processes. 128: 107-113. DOI: 10.1016/0168-1176(93)87020-S |
0.362 |
|
| 1992 |
Park MA, Schweikert EA, Da Silveira EF. Coincidence counting for the study of hydrocarbon ion desorption in plasma desorption mass spectrometry The Journal of Chemical Physics. 96: 3206-3210. |
0.473 |
|
| 1992 |
Park MA, Cox BD, Schweikert EA. A coincidence counting study of polyatomic ion induced sputtering The Journal of Chemical Physics. 96: 8171-8176. |
0.462 |
|
| 1991 |
Park MA, Schweikert EA, da Silveira EF, Leite CVB, Jeronymo JMF. Surface analysis with keV polyatomic projectiles Nuclear Inst. and Methods in Physics Research, B. 56: 361-364. DOI: 10.1016/0168-583X(91)96048-P |
0.376 |
|
| 1990 |
Schweikert EA, Blain MG, Park MA, Da Silveira EF. Surface characterization with keV clusters and MeV ions Nuclear Inst. and Methods in Physics Research, B. 50: 307-313. DOI: 10.1016/0168-583X(90)90373-3 |
0.481 |
|
| 1990 |
McAfee CD, Silveira EF, Schweikert EA. Spontaneous desorption: field assisted ion induced desorption mass spectrometry International Journal of Mass Spectrometry and Ion Processes. 97: 311-324. DOI: 10.1016/0168-1176(90)85007-O |
0.352 |
|
| 1989 |
Blain MG, Della-Negra S, Joret H, Le Beyec Y, Schweikert EA. Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions Physical Review Letters. 63: 1625-1628. DOI: 10.1103/PhysRevLett.63.1625 |
0.456 |
|
| 1989 |
Van Vaeck L, Bennett J, van Espen P, Schweikert E, Gijbels R, Adams F, Lauwers W. Structural characterization of organic molecules by negative ions in laser microprobe mass spectrometry. Part 2—Salts Organic Mass Spectrometry. 24: 797-806. DOI: 10.1002/Oms.1210240913 |
0.435 |
|
| 1989 |
Van Vaeck L, Bennett J, Van Epsen P, Schweikert E, Gijbels R, Adams F, Lauwers W. Structural characterization of organic molecules by negative ions in laser microprobe mass spectrometry. Part 1—Neutral compounds Organic Mass Spectrometry. 24: 782-796. DOI: 10.1002/Oms.1210240912 |
0.444 |
|
| 1988 |
Della-Negra S, Depauw J, Joret H, Le Beyec Y, Schweikert EA. Secondary ion emission induced by multicharged 18-keV ion bombardment of solid targets Physical Review Letters. 60: 948-951. DOI: 10.1103/PhysRevLett.60.948 |
0.449 |
|
| 1988 |
Davis KV, Da Silveira EF, Schweikert EA. Design and performance evaluation of a miniaturized particle desorption mass spectrometer Nuclear Inst. and Methods in Physics Research, A. 273: 203-210. DOI: 10.1016/0168-9002(88)90815-7 |
0.311 |
|
| 1988 |
Summers WR, Beug-Deeb MUD, Schweikert EA. Surface characterization of a national bureau of standards glass reference material by252Cf particle desorption mass spectrometry Analytical® Chemistry. 60: 1944-1947. |
0.313 |
|
| 1987 |
Schweikert EA, Summers WR, Beug-Deeb MUD, Filpus-Luyckx PE, Quiñones L. Micro and surface analysis with fast heavy ions Analytica Chimica Acta. 195: 163-172. DOI: 10.1016/S0003-2670(00)85658-5 |
0.385 |
|
| 1987 |
Friedli C, Schweikert EA, Lerch P. Studies in heavy ion activation analysis trace determination possibilities with9Be bombardment Journal of Radioanalytical and Nuclear Chemistry Articles. 116: 401-408. DOI: 10.1007/BF02035784 |
0.359 |
|
| 1987 |
Schweikert EA, Filpus-Luyckx PE. Recent developments in chemical characterization with MeV ion beams Journal of Radioanalytical and Nuclear Chemistry Articles. 110: 451-460. DOI: 10.1007/BF02035536 |
0.397 |
|
| 1986 |
Summers WR, Schweikert EA. Application of particle desorption mass spectrometry to the characterization of minerals Analytical Chemistry. 58: 2126-2129. |
0.306 |
|
| 1986 |
Schweikert EA, Summers WR, Keith DJ, Filpus-Luyckx PE, Beug-Deeb MUD. SURFACE AND MICROCHEMICAL ANALYSIS WITH MEV IONS J Trace Microprobe Tech. 5: 1-22. |
0.433 |
|
| 1985 |
Filpus-Luyckx PE, Thomas JP, Fallavier M, Schweikert EA. Desorption mass spectrometry using cluster ions Nuclear Inst. and Methods in Physics Research, B. 10: 751-753. DOI: 10.1016/0168-583X(85)90099-0 |
0.43 |
|
| 1983 |
Filpus-Luyckx PE, Schweikert EA. Spatially resolved heavy ion induced desorption mass spectrometry International Journal of Mass Spectrometry and Ion Physics. 53: 331-334. DOI: 10.1016/0020-7381(83)85124-9 |
0.323 |
|
| 1983 |
Sullins RT, Barros Leite CV, Schweikert EA. Rutherford backscattering with heavy ions - Part II: Sensitivities and applications Journal of Radioanalytical Chemistry. 78: 181-187. DOI: 10.1007/BF02519763 |
0.318 |
|
| 1983 |
Sullins RT, Barros Leite CV, Schweikert EA. Rutherford backscattering with heavy ions - Part I: Mass and depth resolution Journal of Radioanalytical Chemistry. 78: 171-179. DOI: 10.1007/BF02519762 |
0.41 |
|
| 1981 |
Lass BD, Schweikert EA. Activation analysis with l MeV/AMU heavy ion beams Ieee Transactions On Nuclear Science. 28: 1672-1674. DOI: 10.1109/TNS.1981.4331496 |
0.325 |
|
| 1981 |
Schweikert EA. Advances in accelerator based analysis techniques Journal of Radioanalytical Chemistry. 64: 195-212. DOI: 10.1007/BF02518351 |
0.407 |
|
| 1980 |
Schweikert EA, Johnson SA, Thurston EL. Radioactive ion microscopy Naturwissenschaften. 67: 254-255. DOI: 10.1007/BF01054537 |
0.423 |
|
| 1979 |
Barros Leite CV, Schweikert EA. Studies in heavy ion activation analysis I. on the selection of activation reactions Journal of Radioanalytical Chemistry. 53: 173-180. DOI: 10.1007/BF02517917 |
0.317 |
|
| 1978 |
McGinley JR, Stock GJ, Schweikert EA, Cross JB, Zeisler R, Zikovsky L. Nuclear and atomic activation with heavy ion beams Journal of Radioanalytical Chemistry. 43: 559-573. DOI: 10.1007/BF02519512 |
0.305 |
|
| 1977 |
Cross JB, Zeisler R, Schweikert EA. High energy heavy-ion induced X-ray emission analysis Nuclear Instruments and Methods. 142: 111-119. DOI: 10.1016/0029-554X(77)90818-7 |
0.323 |
|
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