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Brian Sierawski, Ph.D. - Publications

Affiliations: 
2011 Vanderbilt University, Nashville, TN 
Area:
Electronics and Electrical Engineering, Elementary Particles and High Energy Physics
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31 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2015 Trippe JM, Reed RA, Austin RA, Sierawski BD, Weller RA, Funkhouser ED, King MP, Narasimham B, Bartz B, Baumann R, Labello J, Nichols J, Schrimpf RD, Weeden-Wright SL. Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs Ieee Transactions On Nuclear Science. 62: 2709-2716. DOI: 10.1109/Tns.2015.2496967  0.333
2015 DIggins ZJ, Mahadevan N, Pitt EB, Herbison D, Hood RM, Karsai G, Sierawski BD, Barth EJ, Reed RA, Schrimpf RD, Weller RA, Alles ML, Witulski AF. Bayesian Inference Modeling of Total Ionizing Dose Effects on System Performance Ieee Transactions On Nuclear Science. 62: 2517-2524. DOI: 10.1109/Tns.2015.2493882  0.437
2015 Dodds NA, Martinez MJ, Dodd PE, Shaneyfelt MR, Sexton FW, Black JD, Lee DS, Swanson SE, Bhuva BL, Warren KM, Reed RA, Trippe J, Sierawski BD, Weller RA, Mahatme N, et al. The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate Ieee Transactions On Nuclear Science. DOI: 10.1109/Tns.2015.2486763  0.726
2015 Weeden-Wright SL, King MP, Hooten NC, Bennett WG, Sierawski BD, Schrimpf RD, Weller RA, Reed RA, Mendenhall MH, Fleetwood DM, Alles ML, Baumann RC. Effects of energy-deposition variability on soft error rate prediction Ieee Transactions On Nuclear Science. 62: 2181-2186. DOI: 10.1109/Tns.2015.2472296  0.519
2015 Reed RA, Weller RA, Mendenhall MH, Fleetwood DM, Warren KM, Sierawski BD, King MP, Schrimpf RD, Auden EC. Physical Processes and Applications of the Monte Carlo Radiative Energy Deposition (MRED) Code Ieee Transactions On Nuclear Science. DOI: 10.1109/Tns.2015.2454446  0.501
2015 Diggins ZJ, Mahadevan N, Pitt EB, Herbison D, Karsai G, Sierawski BD, Barth EJ, Reed RA, Schrimpf RD, Weller RA, Alles ML, Witulski AF. System Health Awareness in Total-Ionizing Dose Environments Ieee Transactions On Nuclear Science. DOI: 10.1109/Tns.2015.2440993  0.438
2014 Diggins ZJ, Mahadevan N, Herbison D, Karsai G, Sierawski BD, Barth E, Pitt EB, Reed RA, Schrimpf RD, Weller RA, Alles ML, Witulski A. Total-ionizing-dose induced timing window violations in CMOS microcontrollers Ieee Transactions On Nuclear Science. 61: 2979-2984. DOI: 10.1109/Tns.2014.2368125  0.454
2013 King MP, Reed RA, Weller RA, Mendenhall MH, Schrimpf RD, Sierawski BD, Sternberg AL, Narasimham B, Wang JK, Pitta E, Bartz B, Reed D, Monzel C, Baumann RC, Deng X, et al. Electron-induced single-event upsets in static random access memory Ieee Transactions On Nuclear Science. 60: 4122-4129. DOI: 10.1109/Tns.2013.2286523  0.373
2012 El-Mamouni F, Zhang EX, Ball DR, Sierawski B, King MP, Schrimpf RD, Reed RA, Alles ML, Fleetwood DM, Linten D, Simoen E, Vizkelethy G. Heavy-ion-induced current transients in bulk and SOI FinFETs Ieee Transactions On Nuclear Science. 59: 2674-2681. DOI: 10.1109/Tns.2012.2221478  0.553
2011 Clemens MA, Sierawski BD, Warren KM, Mendenhall MH, Dodds NA, Weller RA, Reed RA, Dodd PE, Shaneyfelt MR, Schwank JR, Wender SA, Baumann RC. The effects of neutron energy and high-Z materials on single event upsets and multiple cell upsets Ieee Transactions On Nuclear Science. 58: 2591-2598. DOI: 10.1109/Tns.2011.2171716  0.702
2011 Alles ML, Schrimpf RD, Reed RA, Massengill LW, Weller RA, Mendenhall MH, Ball DR, Warren KM, Loveless TD, Kauppila JS, Sierawski BD. Radiation hardness of FDSOI and FinFET technologies Proceedings - Ieee International Soi Conference. DOI: 10.1109/SOI.2011.6081714  0.341
2011 García R, Daly EJ, Evans HDR, Nieminen P, Santin G, Sierawski BD, Mendenhall MH. Combined use of heavy ion and proton test data in the determination of a GaAs power MESFET critical charge and sensitive depth Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 244-251. DOI: 10.1109/RADECS.2011.6131402  0.374
2011 Sierawski BD, Reed RA, Mendenhall MH, Weller RA, Schrimpf RD, Wen SJ, Wong R, Tam N, Baumann RC. Effects of scaling on muon-induced soft errors Ieee International Reliability Physics Symposium Proceedings. DOI: 10.1109/IRPS.2011.5784484  0.522
2011 Warren K, Reed R, Weller R, Mendenhall M, Sierawski B. Applications of Monte Carlo radiation transport imulation techniques for predicting single event effects n microelectronics Aip Conference Proceedings. 1336: 643-648. DOI: 10.1063/1.3586181  0.318
2010 Sierawski BD, Mendenhall MH, Reed RA, Clemens MA, Weller RA, Schrimpf RD, Blackmore EW, Trinczek M, Hitti B, Pellish JA, Baumann RC, Wen SJ, Wong R, Tam N. Muon-induced single event upsets in deep-submicron technology Ieee Transactions On Nuclear Science. 57: 3273-3278. DOI: 10.1109/Tns.2010.2080689  0.537
2010 Pellish JA, Xapsos MA, Label KA, Marshall PW, Heidel DF, Rodbell KP, Hakey MC, Dodd PE, Shaneyfelt MR, Schwank JR, Baumann RC, Deng X, Marshall A, Sierawski BD, Black JD, et al. Heavy ion testing with iron at 1 GeV/amu Ieee Transactions On Nuclear Science. 57: 2948-2954. DOI: 10.1109/TNS.2010.2066575  0.444
2010 Weller RA, Mendenhall MH, Reed RA, Schrimpf RD, Warren KM, Sierawski BD, Massengill LW. Monte Carlo simulation of single event effects Ieee Transactions On Nuclear Science. 57: 1726-1746. DOI: 10.1109/Tns.2010.2044807  0.547
2010 Weller RA, Mendenhall MH, Reed RA, Warren KM, Sierawski BD, Schrimpf RD, Massengill LW, Asai M. Monte Carlo simulation of radiation effects in microelectronics Ieee Nuclear Science Symposium Conference Record. 1262-1268. DOI: 10.1109/NSSMIC.2010.5873969  0.529
2010 Sierawski BD, Mendenhall MH, Weller RA, Reed RA, Adams JH, Watts JW, Barghouty AF. CRÉME-MC: A physics-based single event effects tool Ieee Nuclear Science Symposium Conference Record. 1258-1261. DOI: 10.1109/NSSMIC.2010.5873968  0.37
2010 Sierawski BD, Warren KM, Reed RA, Weller RA, Mendenhall MM, Schrimpf RD, Baumann RC, Zhu V. Contribution of low-energy (< 10 MeV) neutrons to upset rate in a 65 nm SRAM Ieee International Reliability Physics Symposium Proceedings. 395-399. DOI: 10.1109/IRPS.2010.5488796  0.538
2010 Sheshadri VB, Bhuva BL, Reed RA, Weller RA, Mendenhall MH, Schrimpf RD, Warren KM, Sierawski BD, Wen SJ, Wong R. Effects of multi-node charge collection in flip-flop designs at advanced technology nodes Ieee International Reliability Physics Symposium Proceedings. 1026-1030. DOI: 10.1109/IRPS.2010.5488683  0.303
2009 Weller RA, Reed RA, Warren KM, Mendenhall MH, Sierawski BD, Schrimpf RD, Massengill LW. General framework for single event effects rate prediction in microelectronics Ieee Transactions On Nuclear Science. 56: 3098-3108. DOI: 10.1109/Tns.2009.2033916  0.313
2009 Sierawski BD, Pellish JA, Reed RA, Schrimpf RD, Warren KM, Weller RA, Mendenhall MH, Black JD, Tipton AD, Xapsos MA, Baumann RC, Deng X, Campola MJ, Friendlich MR, Kim HS, et al. Impact of low-energy proton induced upsets on test methods and rate predictions Ieee Transactions On Nuclear Science. 56: 3085-3092. DOI: 10.1109/Tns.2009.2032545  0.73
2009 Pellish JA, Xapsos MA, Label KA, Marshall PW, Heidel DF, Rodbell KP, Hakey MC, Dodd PE, Shaneyfelt MR, Schwank JR, Baumann RC, Deng X, Marshall A, Sierawski BD, Black JD, et al. Heavy ion testing at the galactic cosmic ray energy peak Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 559-562. DOI: 10.1109/RADECS.2009.5994714  0.506
2007 Pellish JA, Reed RA, Sutton AK, Weller RA, Carts MA, Marshall PW, Marshall CJ, Krithivasan R, Cressler JD, Mendenhall MH, Schrimpf RD, Warren KM, Sierawski BD, Niu GF. A generalized SiGe HBT single-event effects model for on-orbit event rate calculations Ieee Transactions On Nuclear Science. 54: 2322-2329. DOI: 10.1109/Tns.2007.909987  0.39
2007 Reed RA, Weller RA, Mendenhall MH, Lauenstein JM, Warren KM, Pellish JA, Schrimpf RD, Sierawski BD, Massengill LW, Dodd PE, Shanevfelt MR, Felix JA, Schwank JR, Haddad NK, Lawrence RK, et al. Impact of ion energy and species on single event effects analysis Ieee Transactions On Nuclear Science. 54: 2312-2321. DOI: 10.1109/Tns.2007.909901  0.396
2007 Howe CL, Weller RA, Reed RA, Sierawski BD, Marshall PW, Marshall CJ, Mendenhall MH, Schrimpf RD, Hubbs JE. Distribution of proton-induced transients in silicon focal plane arrays Ieee Transactions On Nuclear Science. 54: 2444-2449. DOI: 10.1109/Tns.2007.909511  0.364
2007 Warren KM, Sierawski BD, Reed RA, Weller RA, Carmichael C, Lesea A, Mendenhall MH, Dodd PE, Schrimpf RD, Massengill LW, Hoang T, Wan H, De Jong JL, Padovani R, Fabula JJ. Monte-Carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch Ieee Transactions On Nuclear Science. 54: 2419-2425. DOI: 10.1109/Tns.2007.907678  0.399
2007 Reed RA, Vizkelethy G, Pellish JA, Sierawski B, Warren KM, Porter M, Wilkinson J, Marshall PW, Niu G, Cressler JD, Schrimpf RD, Tipton A, Weller RA. Applications of heavy ion microprobe for single event effects analysis Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 261: 443-446. DOI: 10.1016/J.Nimb.2007.04.163  0.716
2007 Reed RA, Vizkelethy G, Pellish JA, Sierawski B, Warren KM, Porter M, Wilkinson J, Marshall PW, Niu G, Cressler JD, Schrimpf RD, Tipton A, Weller RA. WITHDRAWN: Applications of Heavy Ion Microprobe for Single Event Effects Analysis Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. DOI: 10.1016/J.Nimb.2007.04.152  0.702
2006 Tipton AD, Pellish JA, Reed RA, Schrimpf RD, Weller RA, Mendenhall MH, Sierawski B, Sutton AK, Diestelhorst RM, Espinel G, Cressler JD, Marshall PW, Vizkelethy G. Multiple-bit upset in 130 nm CMOS technology Ieee Transactions On Nuclear Science. 53: 3259-3264. DOI: 10.1109/Tns.2006.884789  0.735
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