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|Yu H, Yang J, Peng R, et al. (2016) Reliability evaluation of linear multi-state consecutively-connected systems constrained by m consecutive and n total gaps Reliability Engineering and System Safety. 150: 35-43|
|Xu S, Yang X, Yu H, et al. (2016) Multi-label learning with label-specific feature reduction Knowledge-Based Systems. 104: 52-61|
|Shin C, Kim JK, Yu HY. (2016) Threshold voltage variation-immune FinFET design with metal-interlayer-semiconductor source/drain structure Current Applied Physics. 16: 618-622|