Navin Srivastava, Ph.D. - Publications
Affiliations: | 2009 | Electrical & Computer Engineering | University of California, Santa Barbara, Santa Barbara, CA, United States |
Area:
Computer Engineering/ Electronics & PhotonicsYear | Citation | Score | |||
---|---|---|---|---|---|
2012 | Xu C, Srivastava N, Suaya R, Banerjee K. Fast high-frequency impedance extraction of horizontal interconnects and inductors in 3-D ICs with multiple substrates Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 1698-1710. DOI: 10.1109/Tcad.2012.2203598 | 0.588 | |||
2011 | Li H, Srivastava N, Mao JF, Yin WY, Banerjee K. Carbon nanotube vias: Does ballistic electron-phonon transport imply improved performance and reliability? Ieee Transactions On Electron Devices. 58: 2689-2701. DOI: 10.1109/Ted.2011.2157825 | 0.558 | |||
2010 | Srivastava N, Xu C, Suaya R, Banerjee K. Corrections to “Analytical Expressions for High-Frequency VLSI Interconnect Impedance Extraction in the Presence of a Multilayer Conductive Substrate” [Jul 09 1047-1060 Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 29: 849-849. DOI: 10.1109/Tcad.2010.2047753 | 0.542 | |||
2009 | Li H, Xu C, Srivastava N, Banerjee K. Carbon Nanomaterials for Next-Generation Interconnects and Passives: Physics, Status, and Prospects Ieee Transactions On Electron Devices. 56: 1799-1821. DOI: 10.7567/Ssdm.2009.D-8-1 | 0.599 | |||
2009 | Srivastava N, Li H, Kreupl F, Banerjee K. On the applicability of single-walled carbon nanotubes as VLSI interconnects Ieee Transactions On Nanotechnology. 8: 542-559. DOI: 10.1109/Tnano.2009.2013945 | 0.579 | |||
2009 | Srivastava N, Suaya R, Banerjee K. Analytical expressions for high-frequency VLSI interconnect impedance extraction in the presence of a multilayer conductive substrate Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 28: 1047-1060. DOI: 10.1109/Tcad.2009.2017432 | 0.554 | |||
2007 | Mysore S, Agrawal B, Srivastava N, Lin S, Banerjee K, Sherwood T. 3D Integration for Introspection Ieee Micro. 27: 77-83. DOI: 10.1109/Mm.2007.1 | 0.505 | |||
2004 | Srivastava N, Banerjee K. Interconnect challenges for nanoscale electronic circuits Jom. 56: 30-31. DOI: 10.1007/S11837-004-0285-1 | 0.513 | |||
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