Chunsheng Liu, Ph.D. - Publications
Affiliations: | 2003 | Duke University, Durham, NC |
Area:
Electronics and Electrical EngineeringYear | Citation | Score | |||
---|---|---|---|---|---|
2005 | Liu C, Chakrabarty K. Design and analysis of compact dictionaries for diagnosis in scan-BIST Ieee Transactions On Very Large Scale Integration Systems. 13: 979-984. DOI: 10.1109/Tvlsi.2005.853624 | 0.452 | |||
2005 | Pradhan DK, Liu C. EBIST: a novel test generator with built-in fault detection capability Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 24: 1457-1466. DOI: 10.1109/Tcad.2005.850815 | 0.339 | |||
2004 | Liu C, Chakrabarty K. Identification of Error-Capturing Scan Cells in Scan-BIST With Applications to System-on-Chip Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 23: 1447-1459. DOI: 10.1109/Tcad.2004.833620 | 0.454 | |||
2003 | Liu C, Chakrabarty K. Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 22: 593-604. DOI: 10.1109/Tcad.2003.810739 | 0.477 | |||
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