Rouying Zhan, Ph.D. - Publications

Affiliations: 
2005 Illinois Institute of Technology, Chicago, IL, United States 
Area:
Electronics and Electrical Engineering

10 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Li X, Xie H, Zhan R, Chen D. Effect of Double Bond Position on 2-Phenyl-benzofuran Antioxidants: A Comparative Study of Moracin C and Iso-Moracin C. Molecules (Basel, Switzerland). 23. PMID 29587376 DOI: 10.3390/molecules23040754  0.32
2005 Wang AZH, Feng H, Zhan R, Xie H, Chen G, Wu Q, Guan X, Wang Z, Zhang C. A review on RF ESD protection design Ieee Transactions On Electron Devices. 52: 1304-1311. DOI: 10.1109/Ted.2005.850652  0.542
2005 Xie H, Feng H, Zhan R, Wang A, Rodriguez D, Rice D. A new low-parasitic polysilicon SCR ESD protection structure for RF ICs Ieee Electron Device Letters. 26: 121-123. DOI: 10.1109/Led.2004.841860  0.519
2004 Zhan R, Feng H, Wu Q, Xie H, Guan X, Chen G, Wang AZH. ESDInspector: a new layout-level ESD protection circuitry design verification tool using a smart-parametric checking mechanism Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 23: 1421-1428. DOI: 10.1109/Tcad.2004.833613  0.507
2004 Chen G, Feng H, Xie H, Zhan R, Wu Q, Guan X, Wang A, Takasuka K, Tamura S, Wang Z, Zhang C. Characterizing diodes for RF ESD protection Ieee Electron Device Letters. 25: 323-325. DOI: 10.1109/Led.2004.826531  0.515
2003 Zhan R, Feng H, Wu Q, Xie H, Guan X, Chen G, Wang AZH. ESDExtractor: A new technology-independent CAD tool for arbitrary ESD protection device extraction Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 22: 1362-1370. DOI: 10.1109/Tcad.2003.818140  0.484
2003 Feng H, Chen G, Zhan R, Wu Q, Guan X, Xie H, Wang AZH, Gafiteanu R. A mixed-mode ESD protection circuit simulation-design methodology Ieee Journal of Solid-State Circuits. 38: 995-1006. DOI: 10.1109/Jssc.2003.811978  0.531
2002 Gong K, Feng H, Zhan R, Wang AZH. A study of parasitic effects of ESD protection on RF ICs Ieee Transactions On Microwave Theory and Techniques. 50: 393-402. DOI: 10.1109/22.981291  0.467
2002 Feng H, Zhan R, Wu Q, Chen G, Wang AZ. RC-SCR: Very-low-voltage ESD protection circuit in plain CMOS Electronics Letters. 38: 1099-1100. DOI: 10.1049/El:20020758  0.388
2001 Feng H, Zhan R, Gong K, Wang AZ. A new pad-oriented multiple-mode ESD protection structure and layout optimization Ieee Electron Device Letters. 22: 493-495. DOI: 10.1109/55.954922  0.385
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