Year |
Citation |
Score |
2018 |
Li X, Xie H, Zhan R, Chen D. Effect of Double Bond Position on 2-Phenyl-benzofuran Antioxidants: A Comparative Study of Moracin C and Iso-Moracin C. Molecules (Basel, Switzerland). 23. PMID 29587376 DOI: 10.3390/molecules23040754 |
0.32 |
|
2005 |
Wang AZH, Feng H, Zhan R, Xie H, Chen G, Wu Q, Guan X, Wang Z, Zhang C. A review on RF ESD protection design Ieee Transactions On Electron Devices. 52: 1304-1311. DOI: 10.1109/Ted.2005.850652 |
0.542 |
|
2005 |
Xie H, Feng H, Zhan R, Wang A, Rodriguez D, Rice D. A new low-parasitic polysilicon SCR ESD protection structure for RF ICs Ieee Electron Device Letters. 26: 121-123. DOI: 10.1109/Led.2004.841860 |
0.519 |
|
2004 |
Zhan R, Feng H, Wu Q, Xie H, Guan X, Chen G, Wang AZH. ESDInspector: a new layout-level ESD protection circuitry design verification tool using a smart-parametric checking mechanism Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 23: 1421-1428. DOI: 10.1109/Tcad.2004.833613 |
0.507 |
|
2004 |
Chen G, Feng H, Xie H, Zhan R, Wu Q, Guan X, Wang A, Takasuka K, Tamura S, Wang Z, Zhang C. Characterizing diodes for RF ESD protection Ieee Electron Device Letters. 25: 323-325. DOI: 10.1109/Led.2004.826531 |
0.515 |
|
2003 |
Zhan R, Feng H, Wu Q, Xie H, Guan X, Chen G, Wang AZH. ESDExtractor: A new technology-independent CAD tool for arbitrary ESD protection device extraction Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 22: 1362-1370. DOI: 10.1109/Tcad.2003.818140 |
0.484 |
|
2003 |
Feng H, Chen G, Zhan R, Wu Q, Guan X, Xie H, Wang AZH, Gafiteanu R. A mixed-mode ESD protection circuit simulation-design methodology Ieee Journal of Solid-State Circuits. 38: 995-1006. DOI: 10.1109/Jssc.2003.811978 |
0.531 |
|
2002 |
Gong K, Feng H, Zhan R, Wang AZH. A study of parasitic effects of ESD protection on RF ICs Ieee Transactions On Microwave Theory and Techniques. 50: 393-402. DOI: 10.1109/22.981291 |
0.467 |
|
2002 |
Feng H, Zhan R, Wu Q, Chen G, Wang AZ. RC-SCR: Very-low-voltage ESD protection circuit in plain CMOS Electronics Letters. 38: 1099-1100. DOI: 10.1049/El:20020758 |
0.388 |
|
2001 |
Feng H, Zhan R, Gong K, Wang AZ. A new pad-oriented multiple-mode ESD protection structure and layout optimization Ieee Electron Device Letters. 22: 493-495. DOI: 10.1109/55.954922 |
0.385 |
|
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