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Kaibo Wang, Ph.D. - Publications

Affiliations: 
2006 Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong 
Area:
Industrial Engineering, Mechanical Engineering
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38 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Zang Y, Wang K. Robust profile alignment based on penalised-spline smoothing International Journal of Production Research. 57: 2966-2983. DOI: 10.1080/00207543.2018.1519263  0.346
2018 Wang H, Li B, Tong SH, Chang I, Wang K. A discrete spatial model for wafer yield prediction Quality Engineering. 30: 169-182. DOI: 10.1080/08982112.2017.1328063  0.376
2017 Dong H, Chen N, Wang K. Wafer yield prediction using derived spatial variables Quality and Reliability Engineering International. 33: 2327-2342. DOI: 10.1002/Qre.2192  0.313
2016 Sun H, Deng X, Wang K, Jin R. Logistic regression for crystal growth process modeling through hierarchical nonnegative garrote-based variable selection Iie Transactions (Institute of Industrial Engineers). 48: 787-796. DOI: 10.1080/0740817X.2016.1167286  0.4
2016 Zhang L, Wang K, Chen N. Monitoring wafers geometric quality using an additive Gaussian process model Iie Transactions (Institute of Industrial Engineers). 48: 1-15. DOI: 10.1080/0740817X.2015.1027455  0.475
2016 Tao J, Wang K, Li B, Liu L, Cai Q. Hierarchical models for the spatial–temporal carbon nanotube height variations International Journal of Production Research. 1-20. DOI: 10.1080/00207543.2016.1181809  0.363
2016 Wang K, Jiang W, Li B. A spatial variable selection method for monitoring product surface International Journal of Production Research. 54: 4161-4181. DOI: 10.1080/00207543.2015.1109723  0.507
2016 Zang Y, Wang K, Jin R. Unaligned Profile Monitoring Using Penalized Methods Quality and Reliability Engineering International. 32: 2761-2776. DOI: 10.1002/Qre.2066  0.406
2016 Bao L, Huang Q, Wang K. Robust Parameter Design for Profile Quality Control Quality and Reliability Engineering International. 32: 1059-1070. DOI: 10.1002/Qre.1814  0.452
2015 Wang X, Wu S, Wang K. A Run-to-Run Profile Control Algorithm for Improving the Flatness of Nano-Scale Products Ieee Transactions On Automation Science and Engineering. 12: 192-203. DOI: 10.1109/Tase.2013.2284935  0.4
2015 He F, Xie H, Wang K. Optimal setup adjustment and control of a process under ARMA disturbances Iie Transactions. 47: 230-244. DOI: 10.1080/0740817X.2014.928959  0.472
2014 Wang K, Dai C. A Mixed-Effect Model for Analyzing Experiments with Multistage Processes Quality Technology and Quantitative Management. 11: 491-511. DOI: 10.1080/16843703.2014.11673359  0.398
2014 Zhou X, Wang K, Zhao L. Variable-Selection-Based Epidemic Disease Diagnosis Communications in Statistics - Simulation and Computation. 43: 1595-1610. DOI: 10.1080/03610918.2012.738840  0.36
2014 Wang A, Wang K, Tsung F. Statistical Surface Monitoring by Spatial-Structure Modeling Journal of Quality Technology. 46: 359-376. DOI: 10.1080/00224065.2014.11917977  0.564
2014 Bao L, Wang K, Wu T. A run-to-run controller for product surface quality improvement International Journal of Production Research. 52: 4469-4487. DOI: 10.1080/00207543.2013.865854  0.409
2014 Bao L, Wang K, Jin R. A hierarchical model for characterising spatial wafer variations International Journal of Production Research. 52: 1827-1842. DOI: 10.1080/00207543.2013.849389  0.354
2014 Zhang J, Li W, Wang K, Jin R. Process adjustment with an asymmetric quality loss function Journal of Manufacturing Systems. 33: 159-165. DOI: 10.1016/J.Jmsy.2013.10.001  0.433
2014 Wang K, Yeh AB, Li B. Simultaneous monitoring of process mean vector and covariance matrix via penalized likelihood estimation Computational Statistics and Data Analysis. 78: 206-217. DOI: 10.1016/J.Csda.2014.04.017  0.428
2014 Dai C, Wang K, Jin R. Monitoring Profile Trajectories with Dynamic Time Warping Alignment Quality and Reliability Engineering International. 30: 815-827. DOI: 10.1002/Qre.1667  0.398
2013 Wang K, Han K. A batch-based run-to-run process control scheme for semiconductor manufacturing Iie Transactions. 45: 658-669. DOI: 10.1080/0740817X.2012.757681  0.498
2013 Li B, Wang K, Yeh AB. Monitoring the covariance matrix via penalized likelihood estimation Iie Transactions (Institute of Industrial Engineers). 45: 132-146. DOI: 10.1080/0740817X.2012.663952  0.405
2013 Wang K, Lin J. A run-to-run control algorithm based on timely and delayed mixed-resolution information International Journal of Production Research. 51: 4704-4717. DOI: 10.1080/00207543.2013.793423  0.494
2013 Han K, Wang K. Coordination and control of batch-based multistage processes Journal of Manufacturing Systems. 32: 372-381. DOI: 10.1016/J.Jmsy.2012.12.004  0.43
2012 Lin J, Wang K. A Bayesian framework for online parameter estimation and process adjustment using categorical observations Iie Transactions. 44: 291-300. DOI: 10.1080/0740817X.2011.568039  0.44
2012 Jiang W, Wang K, Tsung F. A Variable-Selection-Based Multivariate EWMA Chart for Process Monitoring and Diagnosis Journal of Quality Technology. 44: 209-230. DOI: 10.1080/00224065.2012.11917896  0.633
2012 Yeh AB, Li B, Wang K. Monitoring multivariate process variability with individual observations via penalised likelihood estimation International Journal of Production Research. 50: 6624-6638. DOI: 10.1080/00207543.2012.676684  0.476
2011 Lin J, Wang K. Online parameter estimation and run-to-run process adjustment using categorical observations International Journal of Production Research. 49: 4103-4117. DOI: 10.1080/00207543.2010.492806  0.45
2010 Wang K, Tsung F. Recursive parameter estimation for categorical process control International Journal of Production Research. 48: 1381-1394. DOI: 10.1080/00207540802570651  0.633
2009 He F, Wang K, Jiang W. A General Harmonic Rule Controller for Run-to-Run Process Control Ieee Transactions On Semiconductor Manufacturing. 22: 232-244. DOI: 10.1109/Tsm.2009.2017627  0.493
2009 Wang K, Jiang W. High-Dimensional Process Monitoring and Fault Isolation via Variable Selection Journal of Quality Technology. 41: 247-258. DOI: 10.1080/00224065.2009.11917780  0.42
2009 Lu JC, Jeng SL, Wang K. A Review of Statistical Methods for Quality Improvement and Control in Nanotechnology Journal of Quality Technology. 41: 148-164. DOI: 10.1080/00224065.2009.11917770  0.318
2009 Shang Y, Wang K, Tsung F. An improved run-to-run process control scheme for categorical observations with misclassification errors Quality and Reliability Engineering International. 25: 397-407. DOI: 10.1002/Qre.976  0.709
2009 Wang K, Tsung F. An adaptive dimension reduction scheme for monitoring feedback‐controlled processes Quality and Reliability Engineering International. 25: 283-298. DOI: 10.1002/Qre.968  0.659
2008 Wang K, Tsung F. An Adaptive T-Squared Chart for Monitoring Dynamic Systems Journal of Quality Technology. 40: 109-123. DOI: 10.1080/00224065.2008.11917716  0.591
2007 Wang K, Tsung F. Run-to-Run Process Adjustment Using Categorical Observations Journal of Quality Technology. 39: 312-325. DOI: 10.1080/00224065.2007.11917698  0.65
2007 Wang K, Tsung F. Monitoring feedback-controlled processes using adaptive T 2 schemes International Journal of Production Research. 45: 5601-5619. DOI: 10.1080/00207540701325488  0.664
2005 Wang K, Tsung F. Using Profile Monitoring Techniques for a Data-rich Environment with Huge Sample Size Quality and Reliability Engineering International. 21: 677-688. DOI: 10.1002/Qre.711  0.598
1979 Wang KK. SYSTEM APPROACH TO INJECTION MOLDING PROCESS . 82-88.  0.349
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