Kristine M. Rosfjord, Ph.D. - Publications

Affiliations: 
University of California, Berkeley, Berkeley, CA, United States 

7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2008 Anant V, Kerman AJ, Dauler EA, Yang JK, Rosfjord KM, Berggren KK. Optical properties of superconducting nanowire single-photon detectors. Optics Express. 16: 10750-61. PMID 18607491 DOI: 10.1364/Oe.16.010750  0.321
2006 Rosfjord K, Chang C, Miyakawa R, Barth H, Attwood D. Direct index of refraction measurements at extreme-ultraviolet and soft-x-ray wavelengths Applied Optics. 45: 1730-1736. DOI: 10.1364/AO.45.001730  0.749
2004 Rosfjord K, Chang C, Attwood D. Direct index of refraction measurement of silicon and ruthenium at EUV wavelengths Proceedings of Spie - the International Society For Optical Engineering. 5538: 92-95. DOI: 10.1117/12.559815  0.432
2004 Rosfjord KM, Liu Y, Attwood DT. Tunable coherent soft X-rays Ieee Journal On Selected Topics in Quantum Electronics. 10: 1405-1413. DOI: 10.1109/Jstqe.2004.838036  0.627
2003 Rosfjord K, Denham P, Kemp C, Gullikson E, Batson P, Rekawa S, Attwood D. Initial characterization of new coherent soft X-ray branchline at the advanced light source Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-Leos. 1: 160.  0.506
2002 Chang C, Naulleau P, Anderson E, Rosfjord K, Attwood D. Diffractive optical elements based on Fourier optical techniques: a new class of optics for extreme ultraviolet and soft x-ray wavelengths. Applied Optics. 41: 7384-9. PMID 12502293 DOI: 10.1364/Ao.41.007384  0.471
2002 Chang C, Naulleau P, Anderson E, Rosfjord K, Attwood D. Diffractive optical elements based on Fourier optical techniques: A new class of optics for extreme ultraviolet and soft X-ray wavelengths Applied Optics. 41: 7384-7389.  0.466
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