Murti V. Salapaka

Affiliations: 
Electrical and Computer Engineering Iowa State University, Ames, IA, United States 
Area:
Electronics and Electrical Engineering, Automotive Engineering
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"Murti Salapaka"

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Abu Sebastian grad student 2004 Iowa State
Deepak R. Sahoo grad student 2006 Iowa State
Vikas Yadav grad student 2007 Iowa State
Tathagata De grad student 2008 Iowa State
Naveen Kumar grad student 2010 Iowa State
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Publications

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Prakash M, Talukdar S, Attree S, et al. (2020) Distributed Stopping Criterion for Consensus in the Presence of Delays Ieee Transactions On Control of Network Systems. 7: 85-95
Baranwal M, Askarian A, Salapaka S, et al. (2019) A Distributed Architecture for Robust and Optimal Control of DC Microgrids Ieee Transactions On Industrial Electronics. 66: 3082-3092
Bhaban S, Talukdar S, Li M, et al. (2018) Single Molecule Studies Enabled by Model-Based Controller Design. Ieee/Asme Transactions On Mechatronics : a Joint Publication of the Ieee Industrial Electronics Society and the Asme Dynamic Systems and Control Division. 23: 1532-1542
Ghosal S, Pradhan S, Salapaka M. (2018) Note: Design of FPGA based system identification module with application to atomic force microscopy. The Review of Scientific Instruments. 89: 056103
Ghosal S, Salapaka M. (2018) Fidelity Measurement on Signal Detection Algorithms With Application to AFM Imaging Ieee Access. 6: 52831-52842
Ghosal S, Gannepalli A, Salapaka M. (2017) Toward quantitative estimation of material properties with dynamic mode atomic force microscopy: A comparative study. Nanotechnology
Ghosal S, Saraswat G, Salapaka M. (2016) Model detection with application to probe based data storage Automatica. 74: 171-182
Ghosal S, Salapaka M. (2015) Fidelity imaging for atomic force microscopy Applied Physics Letters. 106
Saraswat G, Agarwal P, Haugstad G, et al. (2013) Real-time probe based quantitative determination of material properties at the nanoscale. Nanotechnology. 24: 265706
Kumar N, Ramamoorthy A, Salapaka MV. (2013) Error analysis for ML sequence detection in ISI channels with gauss markov noise Ieee Transactions On Signal Processing. 61: 3647-3652
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