Deepak R. Sahoo, Ph.D.
Affiliations: | 2006 | Iowa State University, Ames, IA, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"Deepak Sahoo"Parents
Sign in to add mentorMurti V. Salapaka | grad student | 2006 | Iowa State | |
(Transient force atomic force microscopy: Systems approaches to emerging applications.) |
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Publications
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Memoli G, Caleap M, Asakawa M, et al. (2017) Metamaterial bricks and quantization of meta-surfaces. Nature Communications. 8: 14608 |
Tuma T, Pantazi A, Sahoo DR, et al. (2014) A high-bandwidth spintronic position sensor. Nanotechnology. 25: 375501 |
Kartik V, Sebastian A, Tuma T, et al. (2012) High-bandwidth nanopositioner with magnetoresistance based position sensing Mechatronics. 22: 295-301 |
Sahoo DR, Sebastian A, Häberle W, et al. (2011) Scanning probe microscopy based on magnetoresistive sensing. Nanotechnology. 22: 145501 |
Sahoo DR, Häberle W, Sebastian A, et al. (2011) High-bandwidth intermittent-contact mode scanning probe microscopy using electrostatically-actuated microcantilevers Lecture Notes in Control and Information Sciences. 413: 119-135 |
Sahoo DR, Häberle W, Sebastian A, et al. (2010) High-throughput intermittent-contact scanning probe microscopy. Nanotechnology. 21: 75701 |
Sahoo DR, Kartik V, Sebastian A, et al. (2010) Scanning probe microscopy using higher-mode electrostatically-actuated microcantilevers Ifac Proceedings Volumes (Ifac-Papersonline). 212-219 |
Kartik V, Sebastian A, Tuma T, et al. (2010) High speed nanopositioner with magneto resistance-based position sensing Ifac Proceedings Volumes (Ifac-Papersonline). 306-310 |
Agarwal P, Sahoo DR, Sebastian A, et al. (2010) Real-time models of electrostatically actuated cantilever probes with integrated thermal sensor for nanoscale interrogation Journal of Microelectromechanical Systems. 19: 83-98 |
Sahoo DR, Häberle W, Bächtold P, et al. (2009) High-speed intermittent-contact mode scanning probe microscopy using cantilevers with integrated electrostatic actuator and thermoelectric sensor Proceedings of the American Control Conference. 2278-2283 |