Deepak R. Sahoo, Ph.D.

Affiliations: 
2006 Iowa State University, Ames, IA, United States 
Area:
Electronics and Electrical Engineering
Google:
"Deepak Sahoo"

Parents

Sign in to add mentor
Murti V. Salapaka grad student 2006 Iowa State
 (Transient force atomic force microscopy: Systems approaches to emerging applications.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Memoli G, Caleap M, Asakawa M, et al. (2017) Metamaterial bricks and quantization of meta-surfaces. Nature Communications. 8: 14608
Tuma T, Pantazi A, Sahoo DR, et al. (2014) A high-bandwidth spintronic position sensor. Nanotechnology. 25: 375501
Kartik V, Sebastian A, Tuma T, et al. (2012) High-bandwidth nanopositioner with magnetoresistance based position sensing Mechatronics. 22: 295-301
Sahoo DR, Sebastian A, Häberle W, et al. (2011) Scanning probe microscopy based on magnetoresistive sensing. Nanotechnology. 22: 145501
Sahoo DR, Häberle W, Sebastian A, et al. (2011) High-bandwidth intermittent-contact mode scanning probe microscopy using electrostatically-actuated microcantilevers Lecture Notes in Control and Information Sciences. 413: 119-135
Sahoo DR, Häberle W, Sebastian A, et al. (2010) High-throughput intermittent-contact scanning probe microscopy. Nanotechnology. 21: 75701
Sahoo DR, Kartik V, Sebastian A, et al. (2010) Scanning probe microscopy using higher-mode electrostatically-actuated microcantilevers Ifac Proceedings Volumes (Ifac-Papersonline). 212-219
Kartik V, Sebastian A, Tuma T, et al. (2010) High speed nanopositioner with magneto resistance-based position sensing Ifac Proceedings Volumes (Ifac-Papersonline). 306-310
Agarwal P, Sahoo DR, Sebastian A, et al. (2010) Real-time models of electrostatically actuated cantilever probes with integrated thermal sensor for nanoscale interrogation Journal of Microelectromechanical Systems. 19: 83-98
Sahoo DR, Häberle W, Bächtold P, et al. (2009) High-speed intermittent-contact mode scanning probe microscopy using cantilevers with integrated electrostatic actuator and thermoelectric sensor Proceedings of the American Control Conference. 2278-2283
See more...