Year |
Citation |
Score |
2002 |
Brillson LJ, Bradley ST, Goss SH, Sun X, Murphy MJ, Schaff WJ, Eastman LF, Look DC, Molnar RJ, Ponce FA, Ikeo N, Sakai Y. Low-energy electron-excited nanoluminescence studies of GaN and related materials Applied Surface Science. 190: 498-507. DOI: 10.1016/S0169-4332(01)00925-4 |
0.545 |
|
2001 |
Waldron EL, Schubert EF, Graff JW, Osinsky A, Murphy MJ, Schaff WF. Polarization effects in AlxGa1-xN/GaN superlattices Materials Research Society Symposium - Proceedings. 639: G11.1.1-G11.1.6. DOI: 10.1557/Proc-639-G11.1 |
0.436 |
|
2001 |
Eastman LF, Tilak V, Smart J, Green BM, Chumbes EM, Dimitrov R, Kim H, Ambacher OS, Weimann N, Prunty T, Murphy M, Schaff WJ, Shealy JR. Undoped AlGaN/GaN HEMTs for microwave power amplification Ieee Transactions On Electron Devices. 48: 479-485. DOI: 10.1109/16.906439 |
0.765 |
|
2001 |
Bradley ST, Young AP, Brillson LJ, Murphy MJ, Schaff WJ, Eastman LF. Influence of AlGaN deep level defects on AlGaN/GaN 2-DEG carrier confinement Ieee Transactions On Electron Devices. 48: 412-415. DOI: 10.1109/16.906428 |
0.616 |
|
2001 |
Brillson LJ, Young AP, Jessen GH, Levin TM, Bradley ST, Goss SH, Bae J, Ponce FA, Murphy MJ, Schaff WJ, Eastman LF. Low energy electron-excited nano-luminescence spectroscopy of GaN surfaces and interfaces Applied Surface Science. 175: 442-449. DOI: 10.1016/S0169-4332(01)00098-8 |
0.545 |
|
2001 |
Bradley ST, Young AP, Brillson LJ, Murphy MJ, Schaff WJ. Role of barrier and buffer layer defect states in AlGaN/GaN HEMT structures Journal of Electronic Materials. 30: 123-128. DOI: 10.1007/S11664-001-0004-4 |
0.462 |
|
2000 |
Eustis TJ, Silcox J, Murphy MJ, Schaff WJ. Evidence From EELS of Oxygen in the Nucleation Layer of a MBE Grown III-N HEMT Mrs Internet Journal of Nitride Semiconductor Research. 5: 188-194. DOI: 10.1557/S1092578300004269 |
0.324 |
|
2000 |
Tilak V, Dimitrov R, Murphy M, Green B, Smart J, Schaff WJ, Shealy JR, Eastman LF. Electric and morphology studies of ohmic contacts on AlGaN/GaN Materials Research Society Symposium - Proceedings. 622: T741-T746. DOI: 10.1557/Proc-622-T7.4.1 |
0.761 |
|
2000 |
Ambacher O, Link A, Hackenbuchner S, Stutzmann M, Dimitrov R, Murphy M, Smart J, Shealy JR, Green B, Schaff WJ, Eastman LF. 2DEGs and 2DHGs induced by spontaneous and piezoelectric polarization in AlGaN/GaN heterostructures Materials Research Society Symposium - Proceedings. 622: T5101-T5106. DOI: 10.1557/Proc-622-T5.10.1 |
0.747 |
|
2000 |
Dimitrov R, Tilak V, Murphy M, Schaff WJ, Eastman LF, Lima AP, Miskys C, Ambacher O, Stutzmann M. Lateral polarity heterostructures by overgrowth of patterned AlxGa1-xN nucleation layers Materials Research Society Symposium - Proceedings. 622: T461-T466. DOI: 10.1557/Proc-622-T4.6.1 |
0.715 |
|
2000 |
Young AP, Bae J, Brillson LJ, Murphy MJ, Schaff WJ. Depth-resolved spectroscopy of interface defects in AlGaN/GaN heterostructure field effect transistors device structures Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 2309-2312. DOI: 10.1116/1.1305283 |
0.499 |
|
2000 |
Dimitrov R, Murphy M, Smart J, Schaff W, Shealy JR, Eastman LF, Ambacher O, Stutzmann M. Two-dimensional electron gases in Ga-face and N-face AlGaN/GaN heterostructures grown by plasma-induced molecular beam epitaxy and metalorganic chemical vapor deposition on sapphire Journal of Applied Physics. 87: 3375-3380. DOI: 10.1063/1.372353 |
0.723 |
|
2000 |
Ambacher O, Foutz B, Smart J, Shealy JR, Weimann NG, Chu K, Murphy M, Sierakowski AJ, Schaff WJ, Eastman LF, Dimitrov R, Mitchell A, Stutzmann M. Two dimensional electron gases induced by spontaneous and piezoelectric polarization in undoped and doped AlGaN/GaN heterostructures Journal of Applied Physics. 87: 334-344. DOI: 10.1063/1.371866 |
0.772 |
|
2000 |
Garrido JA, Foutz BE, Smart JA, Shealy JR, Murphy MJ, Schaff WJ, Eastman LF, Munoz E. Low-frequency noise and mobility fluctuations in AlGaN/GaN heterostructure field-effect transistors Applied Physics Letters. 76: 3442-3444. DOI: 10.1063/1.126672 |
0.657 |
|
2000 |
Schaff WJ, Wu H, Praharaj CJ, Murphy M, Eustis T, Foutz B, Ambacher O, Eastman LF. GaN/SiC heterojunction bipolar transistors Solid-State Electronics. 44: 259-264. DOI: 10.1016/S0038-1101(99)00232-4 |
0.77 |
|
1999 |
Murphy MJ, Foutz BE, Chu K, Wu H, Yeo W, Schaff WJ, Ambacher O, Eastman LF, Eustis TJ, Dimitrov R, Stutzmann M, Rieger W. Normal and Inverted Algan/Gan Based Piezoelectric Field Effect Transistors Grown by Plasma Induced Molecular Beam Epitaxy Mrs Internet Journal of Nitride Semiconductor Research. 4: 840-845. DOI: 10.1557/S1092578300003501 |
0.701 |
|
1999 |
Eustis TJ, Silcox J, Murphy MJ, Schaff WJ. Evidence from EELS of Oxygen in the Nucleation Layer of a MBE grown III-N HEMT Mrs Proceedings. 595. DOI: 10.1557/Proc-595-F99W3.31 |
0.324 |
|
1999 |
Foutz BE, Murphy MJ, Ambacher O, Tilak V, Smart JA, Shealy JR, Schaff WJ, Eastman LF. The Influence of Spontaneous and Piezoelectric Polarization on Novel AlGaN/GaN/InGaN Device Structures Mrs Proceedings. 572: 501. DOI: 10.1557/Proc-572-501 |
0.77 |
|
1999 |
Fung AK, Cai C, Ruden PP, Nathan MI, Chen MY, McDermott BT, Sullivan GJ, Hove JMV, Boutros K, Redwing J, Yange JW, Chene Q, Khane MA, Schaff W, Murphy M. Hydrostatic and uniaxial stress dependence and photo induced effects on the channel conductance of n-A1GaN/GaN heterostructures grown on sapphire substrates Mrs Proceedings. 572. DOI: 10.1557/Proc-572-495 |
0.355 |
|
1999 |
Murphy MJ, Chu K, Wu H, Yeo W, Schaff WJ, Ambacher O, Smart J, Shealy JR, Eastman LF, Eustis TJ. Molecular beam epitaxial growth of normal and inverted two-dimensional electron gases in AlGaN/GaN based heterostructures Journal of Vacuum Science & Technology B. 17: 1252-1254. DOI: 10.1116/1.590733 |
0.793 |
|
1999 |
Ambacher O, Smart J, Shealy JR, Weimann NG, Chu K, Murphy M, Schaff WJ, Eastman LF, Dimitrov R, Wittmer L, Stutzmann M, Rieger W, Hilsenbeck J. Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures Journal of Applied Physics. 85: 3222-3233. DOI: 10.1063/1.369664 |
0.776 |
|
1999 |
Murphy MJ, Chu K, Wu H, Yeo W, Schaff WJ, Ambacher O, Eastman LF, Eustis TJ, Silcox J, Dimitrov R, Stutzmann M. High-frequency AlGaN/GaN polarization-induced high electron mobility transistors grown by plasma-assisted molecular-beam epitaxy Applied Physics Letters. 75: 3653-3655. DOI: 10.1063/1.125418 |
0.751 |
|
1999 |
Foutz BE, Ambacher O, Murphy MJ, Tilak V, Eastman LF. Polarization Induced Charge at Heterojunctions of the III–V Nitrides and Their Alloys Physica Status Solidi B-Basic Solid State Physics. 216: 415-418. DOI: 10.1002/(Sici)1521-3951(199911)216:1<415::Aid-Pssb415>3.0.Co;2-W |
0.674 |
|
1999 |
Ambacher O, Dimitrov R, Stutzmann M, Foutz BE, Murphy MJ, Smart JA, Shealy JR, Weimann NG, Chu K, Chumbes M, Green B, Sierakowski AJ, Schaff WJ, Eastman LF. Role of Spontaneous and Piezoelectric Polarization Induced Effects in Group-III Nitride Based Heterostructures and Devices Physica Status Solidi B-Basic Solid State Physics. 216: 381-389. DOI: 10.1002/(Sici)1521-3951(199911)216:1<381::Aid-Pssb381>3.0.Co;2-O |
0.788 |
|
1998 |
Murphy MJ, Foutz BE, Chu K, Wu H, Yeo W, Schaff WJ, Ambacher O, Eastman LF, Eustis TJ, Dimitrov R, Stutzmann M, Rieger W. Normal and Inverted Algan/Gan Based Piezoelectric Field effect Transistors Grown by Plasma Induced Molecular Beam Epitaxy Mrs Proceedings. 537. DOI: 10.1557/Proc-537-G8.4 |
0.701 |
|
1998 |
Evoy S, Harnett CK, Craighead HG, Eustis TJ, Davis WA, Murphy MJ, Schaff WJ, Eastman LF. Low temperature scanning tunneling microscope-induced luminescence of GaN Journal of Vacuum Science & Technology B. 16: 1943-1947. DOI: 10.1116/1.590112 |
0.34 |
|
1997 |
Eastman L, Chu K, Schaff W, Murphy M, Weimann NG, Eustis T. High Frequency AlGaN/GaN MODFET's Mrs Internet Journal of Nitride Semiconductor Research. 2. DOI: 10.1557/S1092578300001435 |
0.627 |
|
1996 |
Eastman L, Burm J, Schaff W, Murphy M, Chu K, Amano H, Akasaki I. Research on GaN MODFET's Mrs Internet Journal of Nitride Semiconductor Research. 1. DOI: 10.1557/S1092578300001769 |
0.602 |
|
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