| Year |
Citation |
Score |
| 2018 |
Mock A, VanDerslice J, Korlacki R, Woollam JA, Schubert M. Elevated temperature dependence of the anisotropic visible-to-ultraviolet dielectric function of monoclinic β-Ga2O3 Applied Physics Letters. 112: 041905. DOI: 10.1063/1.5010936 |
0.511 |
|
| 2017 |
Hofmann T, Knight S, Sekora D, Schmidt D, Herzinger CM, Woollam JA, Schubert E, Schubert M. Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry Applied Surface Science. 421: 513-517. DOI: 10.1016/J.Apsusc.2016.12.200 |
0.592 |
|
| 2017 |
Mock A, Carlson T, VanDerslice J, Mohrmann J, Woollam JA, Schubert E, Schubert M. Multiple-layered effective medium approximation approach to modeling environmental effects on alumina passivated highly porous silicon nanostructured thin films measured by in-situ Mueller matrix ellipsometry Applied Surface Science. 421: 663-666. DOI: 10.1016/J.Apsusc.2016.10.004 |
0.643 |
|
| 2014 |
Kühne P, Herzinger CM, Schubert M, Woollam JA, Hofmann T. Invited article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument. The Review of Scientific Instruments. 85: 071301. PMID 25085120 DOI: 10.1063/1.4889920 |
0.778 |
|
| 2013 |
Kühne P, Darakchieva V, Yakimova R, Tedesco JD, Myers-Ward RL, Eddy CR, Gaskill DK, Herzinger CM, Woollam JA, Schubert M, Hofmann T. Polarization selection rules for inter-Landau-level transitions in epitaxial graphene revealed by the infrared optical Hall effect. Physical Review Letters. 111: 077402. PMID 23992081 DOI: 10.1103/Physrevlett.111.077402 |
0.752 |
|
| 2012 |
Hofmann T, Schmidt D, Boosalis A, Kühne P, Herzinger C, Woollam J, Schubert E, Schubert M. Metal slanted columnar thin film THz optical sensors Mrs Proceedings. 1409. DOI: 10.1557/Opl.2012.780 |
0.79 |
|
| 2012 |
Hofmann T, Kühne P, Schöche S, Chen J, Forsberg U, Janzén E, Ben Sedrine N, Herzinger CM, Woollam JA, Schubert M, Darakchieva V. Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures Applied Physics Letters. 101: 192102. DOI: 10.1063/1.4765351 |
0.76 |
|
| 2011 |
Hofmann T, Schmidt D, Boosalis A, Kühne P, Skomski R, Herzinger CM, Woollam JA, Schubert M, Schubert E. THz dielectric anisotropy of metal slanted columnar thin films Applied Physics Letters. 99: 081903. DOI: 10.1063/1.3626846 |
0.811 |
|
| 2011 |
Schöche S, Shi J, Boosalis A, Kühne P, Herzinger CM, Woollam JA, Schaff WJ, Eastman LF, Schubert M, Hofmann T. Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures Applied Physics Letters. 98. DOI: 10.1063/1.3556617 |
0.775 |
|
| 2011 |
Hofmann T, Boosalis A, Kühne P, Herzinger CM, Woollam JA, Gaskill DK, Tedesco JL, Schubert M. Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry Applied Physics Letters. 98: 041906. DOI: 10.1063/1.3548543 |
0.776 |
|
| 2011 |
Hofmann T, Herzinger C, Tedesco J, Gaskill D, Woollam J, Schubert M. Terahertz ellipsometry and terahertz optical-Hall effect Thin Solid Films. 519: 2593-2600. DOI: 10.1016/J.Tsf.2010.11.069 |
0.613 |
|
| 2010 |
Hofmann T, Herzinger CM, Boosalis A, Tiwald TE, Woollam JA, Schubert M. Variable-wavelength frequency-domain terahertz ellipsometry. The Review of Scientific Instruments. 81: 023101. PMID 20192479 DOI: 10.1063/1.3297902 |
0.56 |
|
| 2010 |
Saenger M, Sun J, Schädel M, Hilfiker J, Schubert M, Woollam J. Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells Thin Solid Films. 518: 1830-1834. DOI: 10.1016/J.Tsf.2009.09.042 |
0.652 |
|
| 2009 |
Hofmann T, Herzinger CM, Woollam JA, Schubert M. Materials characterization using THz ellipsometry Materials Research Society Symposium Proceedings. 1163: 19-24. DOI: 10.1557/Proc-1163-K08-04 |
0.639 |
|
| 2009 |
Hofmann T, Herzinger CM, Woollam JA, Schubert M. Materials Characterization using THz Ellipsometry Mrs Proceedings. 1163. DOI: 10.1557/PROC-1163-K08-04 |
0.599 |
|
| 2009 |
Hofmann T, Herzinger CM, Tiwald TE, Woollam JA, Schubert M. Hole diffusion profile in a p- p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry Applied Physics Letters. 95. DOI: 10.1063/1.3184567 |
0.513 |
|
| 2008 |
Sarkar A, Viitala T, Hofmann T, Tiwald TE, Woollam JA, Kjerstad A, Laderian B, Schubert M. Monitoring Organic Thin Film Growth In Aqueous Solution In-situ With A Combined Quartz Crystal Microbalance and Ellipsometry Mrs Proceedings. 1146. DOI: 10.1557/Proc-1146-Nn09-02 |
0.565 |
|
| 2008 |
Saenger MF, Schädel M, Hofmann T, Hilfiker J, Sun J, Tiwald T, Schubert M, Woollam JA. Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells Mrs Proceedings. 1123. DOI: 10.1557/Proc-1123-1123-P02-02 |
0.6 |
|
| 2008 |
Hofmann T, Herzinger CM, Schade U, Mross M, Woollam JA, Schubert M. Terahertz Ellipsometry Using Electron-Beam Based Sources Mrs Proceedings. 1108. DOI: 10.1557/Proc-1108-A08-04 |
0.577 |
|
| 2008 |
Goyal DK, Pribil GK, Woollam JA, Subramanian A. Detection of ultrathin biological films using vacuum ultraviolet spectroscopic ellipsometry Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 149: 26-33. DOI: 10.1016/J.Mseb.2007.11.034 |
0.521 |
|
| 2007 |
Nosal WH, Thompson DW, Tiwald TE, Sarkar S, Subramanian A, Woollam JA. Vacuum ultraviolet optical analysis of spin-cast chitosan films modified by succinic anhydride and glycidyl phenyl ether Surface and Interface Analysis. 39: 747-751. DOI: 10.1002/Sia.2581 |
0.822 |
|
| 2006 |
Aouadi SM, Zhang Y, Basnyat P, Stadler S, Filip P, Williams M, Hilfiker JN, Singh N, Woollam JA. Physical and chemical properties of sputter-deposited TaC(x)N(y) films. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 18: 1977-86. PMID 21697570 DOI: 10.1088/0953-8984/18/6/013 |
0.447 |
|
| 2006 |
Aouadi SM, Bohnhoff A, Amriou T, Williams M, Hilfiker JN, Singh N, Woollam JA. Vacuum ultra-violet spectroscopic ellipsometry study of single- and multi-phase nitride protective films. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 18: S1691-701. PMID 21690857 DOI: 10.1088/0953-8984/18/32/S01 |
0.402 |
|
| 2005 |
Nosal WH, Thompson DW, Yan L, Sarkar S, Subramanian A, Woollam JA. Infrared optical properties and AFM of spin-cast chitosan films chemically modified with 1,2 Epoxy-3-phenoxy-propane. Colloids and Surfaces. B, Biointerfaces. 46: 26-31. PMID 16199143 DOI: 10.1016/J.Colsurfb.2005.08.006 |
0.818 |
|
| 2005 |
Nosal WH, Thompson DW, Yan L, Sarkar S, Subramanian A, Woollam JA. UV-vis-infrared optical and AFM study of spin-cast chitosan films. Colloids and Surfaces. B, Biointerfaces. 43: 131-7. PMID 15935626 DOI: 10.1016/J.Colsurfb.2004.08.022 |
0.816 |
|
| 2005 |
Thompson DW, Woollam JA. Enhancing infrared response of adsorbed biomaterials using ellipsometry and textured surfaces Spectroscopy. 19: 147-164. DOI: 10.1155/2005/851748 |
0.343 |
|
| 2005 |
Nosal WH, Thompson DW, Sarkar S, Subramanian A, Woollam JA. Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films Spectroscopy. 19: 267-274. DOI: 10.1155/2005/498649 |
0.808 |
|
| 2005 |
Thompson DW, Snyder PG, Castro L, Yan L, Kaipa P, Woollam JA. Optical characterization of porous alumina from vacuum ultraviolet to midinfrared Journal of Applied Physics. 97. DOI: 10.1063/1.1921336 |
0.469 |
|
| 2005 |
Arwin H, Karlsson LM, Kozarcanin A, Thompson DW, Tiwald T, Woollam JA. Carbonic anhydrase adsorption in porous silicon studied with infrared ellipsometry Physica Status Solidi (a) Applications and Materials Science. 202: 1688-1692. DOI: 10.1002/Pssa.200461228 |
0.31 |
|
| 2005 |
Nosal WH, Thompson DW, Sarkar S, Subramanian A, Woollam JA. Quantitative oscillator analysis of IR-optical spectra on spin-cast chitosan films Spectroscopy. 19: 267-274. |
0.806 |
|
| 2004 |
Subramanian A, Sarkar S, Woollam JA, Nosal WH. Synthesis and characterization of albumin binding surfaces for implantable surfaces. Biomedical Sciences Instrumentation. 40: 1-6. PMID 15133926 |
0.744 |
|
| 2004 |
Yan L, Woollam JA. Optical modeling of Iridium thin film erosion under oxygen plasma exposure Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 22: 2177-2181. DOI: 10.1116/1.1781182 |
0.409 |
|
| 2004 |
Woods BW, Thompson DW, Woollam JA. Gold-alumina cermet photothermal films Thin Solid Films. 469: 31-37. DOI: 10.1016/J.Tsf.2004.06.182 |
0.48 |
|
| 2003 |
Thompson DW, Pfeiffer G, Berberov E, Castro L, Woollam JA. Infrared and visible ellipsometric studies of cholera toxin in ELISA structures Proceedings of Spie - the International Society For Optical Engineering. 4965: 138-146. DOI: 10.1117/12.479262 |
0.419 |
|
| 2003 |
Woollam JA, Bungay C, Yan L, Thompson DW, Hilfiker J. Application of spectroscopic ellipsometry to characterization of optical thin films Proceedings of Spie - the International Society For Optical Engineering. 4932: 393-404. DOI: 10.1117/12.474854 |
0.382 |
|
| 2003 |
Hilfiker JN, Bungay CL, Synowicki RA, Tiwald TE, Herzinger CM, Johs B, Pribil GK, Woollam JA. Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared Journal of Vacuum Science and Technology. 21: 1103-1108. DOI: 10.1116/1.1569928 |
0.456 |
|
| 2003 |
Woollam JA, Bungay C, Hilfiker J, Tiwald T. VUV and IR spectroellipsometric studies of polymer surfaces Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 208: 35-39. DOI: 10.1016/S0168-583X(03)00983-2 |
0.421 |
|
| 2003 |
Woods BW, Thompson DW, Woollam JA. Cermet film space optical coatings European Space Agency, (Special Publication) Esa Sp. 445-450. |
0.314 |
|
| 2002 |
Yan L, Woollam JA, Franke E. Oxygen plasma effects on optical properties of ZnSe films Journal of Vacuum Science and Technology, Part a: Vacuum, Surfaces and Films. 20: 693-701. DOI: 10.1116/1.1463085 |
0.415 |
|
| 2002 |
Yan L, Woollam JA. Optical constants and roughness study of dc magnetron sputtered iridium films Journal of Applied Physics. 92: 4386-4392. DOI: 10.1063/1.1509091 |
0.51 |
|
| 2002 |
Franke E, Neumann H, Schubert M, Trimble CL, Yan L, Woollam JA. Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices Surface & Coatings Technology. 285-288. DOI: 10.1016/S0257-8972(01)01608-5 |
0.539 |
|
| 2001 |
Zangooie S, Schubert M, Trimble C, Thompson DW, Woollam JA. Infrared ellipsometry characterization of porous silicon bragg reflectors. Applied Optics. 40: 906-12. PMID 18357071 DOI: 10.1364/Ao.40.000906 |
0.567 |
|
| 2001 |
Zangooie S, Schubert M, Tiwald TE, Woollam JA. Infrared optical properties of aged porous GaAs Journal of Materials Research. 16: 1241-1244. DOI: 10.1557/Jmr.2001.0173 |
0.583 |
|
| 2001 |
Zangooie S, Schubert M, Tiwald TE, Woollam JA. Infrared optical properties of aged porous GaAs Journal of Materials Research. 16: 1241-1244. DOI: 10.1557/JMR.2001.0173 |
0.508 |
|
| 2001 |
Sossna E, Degen A, Rangelow IW, Drzik M, Hudek P, Tiwald TE, Woollam JA. Mechanical, geometrical, and electrical characterization of silicon membranes for open stencil masks Journal of Vacuum Science & Technology B. 19: 2665-2670. DOI: 10.1116/1.1417548 |
0.312 |
|
| 2001 |
Yan L, Gao X, Bungay C, Woollam JA. Study of surface chemical changes and erosion rates for CV-1144-O silicone under electron cyclotron resonance oxygen plasma exposure Journal of Vacuum Science and Technology, Part a: Vacuum, Surfaces and Films. 19: 447-454. DOI: 10.1116/1.1340652 |
0.353 |
|
| 2001 |
Kouklin N, Menon L, Wong AZ, Thompson DW, Woollam JA, Williams PF, Bandyopadhyay S. Giant photoresistivity and optically controlled switching in self-assembled nanowires Applied Physics Letters. 79: 4423-4425. DOI: 10.1063/1.1427156 |
0.377 |
|
| 2001 |
Woollam JA, Hilfiker JN, Bungay CL, Synowicki RA, Tiwald TE, Thompson DW. Spectroscopic ellipsometry from the vacuum ultraviolet to the far infrared Characterization and Metrology For Ulsi Technology. 550: 511-518. DOI: 10.1063/1.1354448 |
0.449 |
|
| 2001 |
Zangooie S, Schubert M, Thompson DW, Woollam JA. Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs Applied Physics Letters. 78: 937-939. DOI: 10.1063/1.1343490 |
0.533 |
|
| 2001 |
Franke E, Schubert M, Trimble CL, DeVries MJ, Woollam JA. Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV Thin Solid Films. 388: 283-289. DOI: 10.1016/S0040-6090(00)01881-2 |
0.655 |
|
| 2001 |
Schubert M, Kasic A, Einfeldt S, Hommel D, Köhler U, As DJ, Off J, Kuhn B, Scholz F, Woollam JA. Infrared Ellipsometry – a Novel Tool for Characterization of Group‐III Nitride Heterostructures for Optoelectronic Device Applications Physica Status Solidi B-Basic Solid State Physics. 228: 437-440. DOI: 10.1002/1521-3951(200111)228:2<437::Aid-Pssb437>3.0.Co;2-E |
0.323 |
|
| 2000 |
Schubert M, Kasic A, Tiwald TE, Woollam JA, Harle V, Scholz F. Phonons and free carriers in a strained hexagonal GaN-AlN superlattice measured by infrared ellipsometry and Raman spectroscopy Materials Research Society Symposium - Proceedings. 595. DOI: 10.1557/Proc-595-F99W11.39 |
0.549 |
|
| 2000 |
Sossna E, Kassing R, Rangelow IW, Herzinger CM, Tiwald TE, Woollam JA, Wagner T. Thickness analysis of silicon membranes for stencil masks Journal of Vacuum Science & Technology B. 18: 3259-3263. DOI: 10.1116/1.1319827 |
0.329 |
|
| 2000 |
Zollner S, Demkov AA, Liu R, Fejes PL, Gregory RB, Alluri P, Curless JA, Yu Z, Ramdani J, Droopad R, Tiwald TE, Hilfiker JN, Woollam JA. Optical properties of bulk and thin-film SrTiO[sub 3] on Si and Pt Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 18: 2242. DOI: 10.1116/1.1303741 |
0.489 |
|
| 2000 |
Franke E, Schubert M, Woollam JA, Hecht J, Wagner G, Neumann H, Bigl F. In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films Journal of Applied Physics. 87: 2593-2599. DOI: 10.1063/1.372224 |
0.612 |
|
| 2000 |
Franke EB, Trimble CL, Hale JS, Schubert M, Woollam JA. Infrared switching electrochromic devices based on tungsten oxide Journal of Applied Physics. 88: 5777-5784. DOI: 10.1063/1.1319325 |
0.517 |
|
| 2000 |
Franke E, Trimble CL, DeVries MJ, Woollam JA, Schubert M, Frost F. Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry Journal of Applied Physics. 88: 5166-5174. DOI: 10.1063/1.1313784 |
0.622 |
|
| 2000 |
Franke EB, Trimble CL, Schubert M, Woollam JA, Hale JS. All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region Applied Physics Letters. 77: 930-932. DOI: 10.1063/1.1288810 |
0.555 |
|
| 2000 |
Franke EB, Trimble CL, Schubert M, Woollam JA, Hale JS. All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region Applied Physics Letters. 77: 930. DOI: 10.1063/1.1288810 |
0.446 |
|
| 2000 |
Gao X, DeVries MJ, Thompson DW, Woollam JA. Dielectric tensor for interfaces and individual layers in magnetic multilayer structures Journal of Applied Physics. 88: 2775-2780. DOI: 10.1063/1.1287415 |
0.364 |
|
| 2000 |
Bungay CL, Tiwald TE, Devries MJ, Dworak BJ, Woollam JA. Characterization of UV irradiated space application polymers by spectroscopic ellipsometry Polymer Engineering and Science. 40: 300-309. DOI: 10.1002/Pen.11163 |
0.314 |
|
| 1999 |
Schubert M, Tiwald TE, Woollam JA. Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry. Applied Optics. 38: 177-87. PMID 18305601 DOI: 10.1364/Ao.38.000177 |
0.632 |
|
| 1999 |
Schubert M, Kasic A, Tiwald T, Woollam J, Harle V, Scholz F. Phonons and Free Carriers in a Strained Hexagonal GaN-AlN Superlattice Measured by Infrared Ellipsometry and Raman Spectroscopy Mrs Proceedings. 595. DOI: 10.1557/PROC-595-F99W11.39 |
0.495 |
|
| 1999 |
DeVries MJ, Trimble C, Tiwald TE, Thompson DW, Woollam JA, Hale JS. Optical Constants Of Crystalline Wo3 Deposited By Magnetron Sputtering Journal of Vacuum Science and Technology. 17: 2906-2910. DOI: 10.1116/1.581958 |
0.476 |
|
| 1999 |
Schubert M, Hofmann T, Rheinländer B, Pietzonka I, Sass T, Gottschalch V, Woollam JA. Near-band-gap CuPt-order-induced birefringence in Al 0.48 Ga 0.52 InP 2 Physical Review B. 60: 16618-16634. DOI: 10.1103/Physrevb.60.16618 |
0.542 |
|
| 1999 |
Tiwald TE, Woollam JA, Zollner S, Christiansen J, Gregory RB, Wetteroth T, Wilson SR, Powell AR. Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry Physical Review B. 60: 11464-11474. DOI: 10.1103/Physrevb.60.11464 |
0.354 |
|
| 1999 |
Gao X, Woollam JA, Kirby RD, Sellmyer DJ, Tanaka CT, Nowak J, Moodera JS. Dielectric tensor for magneto-optic NiMnSb Physical Review B. 59: 9965-9971. DOI: 10.1103/Physrevb.59.9965 |
0.42 |
|
| 1999 |
Schubert M, Woollam JA, Leibiger G, Rheinländer B, Pietzonka I, Saß T, Gottschalch V. Isotropic dielectric functions of highly disordered AlxGa1−xInP (0⩽x⩽1) lattice matched to GaAs Journal of Applied Physics. 86: 2025-2033. DOI: 10.1063/1.371003 |
0.399 |
|
| 1999 |
Hale JS, Woollam JA. Prospects for IR emissivity control using electrochromic structures Thin Solid Films. 339: 174-180. DOI: 10.1016/S0040-6090(98)01335-2 |
0.404 |
|
| 1999 |
Schubert M, Woollam J, Kasic A, Rheinländer B, Off J, Kuhn B, Scholz F. Free-Carrier Response and Lattice Modes of Group III-Nitride Heterostructures Measured by Infrared Ellipsometry Physica Status Solidi (B). 216: 655-658. DOI: 10.1002/(Sici)1521-3951(199911)216:1<655::Aid-Pssb655>3.0.Co;2-8 |
0.606 |
|
| 1999 |
Zollner S, Liu R, Konkar A, Gutt J, Wilson SR, Tiwald TI, Woollam JA, Hilfiker JN. Dielectric Function of Polycrystalline SiC from 190 nm to 15 μm Physica Status Solidi B-Basic Solid State Physics. 215: 21-25. DOI: 10.1002/(Sici)1521-3951(199909)215:1<21::Aid-Pssb21>3.0.Co;2-O |
0.324 |
|
| 1998 |
Tiwald TE, Thompson DW, Woollam JA. Optical determination of shallow carrier profiles using Fourier transform infrared ellipsometry Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 16: 312-315. DOI: 10.1116/1.589802 |
0.404 |
|
| 1998 |
Gao X, Hale J, Heckens S, Woollam JA. Studies of metallic multilayer structures, optical properties, and oxidation using in situ spectroscopic ellipsometry Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 16: 429-435. DOI: 10.1116/1.581094 |
0.342 |
|
| 1998 |
Meldrim J, Kirby R, DeVries M, Woollam J, Sellmyer D. Magnetic and magneto-optic study of a layered Co/Pt-Dysprosium-iron-garnet system Ieee Transactions On Magnetics. 34: 1991-1993. DOI: 10.1109/20.706767 |
0.365 |
|
| 1998 |
Hilfiker JN, Carpio R, Synowicki RA, Woollam JA. Metrology applications in lithography with variable angle spectroscopic ellipsometry Characterization and Metrology For Ulsi Technology. 449: 543-547. DOI: 10.1063/1.56841 |
0.489 |
|
| 1998 |
Woollam JA, Hilfiker JN, Herzinger CM, Synowicki RA, Liphardt M. Metrology standards with ellipsometers Characterization and Metrology For Ulsi Technology. 449: 352-356. DOI: 10.1063/1.56818 |
0.342 |
|
| 1998 |
Tiwald TE, Miller AD, Woollam JA. Measurement of silicon doping profiles using infrared ellipsometry combined with anodic oxidation sectioning Characterization and Metrology For Ulsi Technology. 449: 221-225. DOI: 10.1063/1.56798 |
0.388 |
|
| 1998 |
Franke E, Schubert M, Hecht J, Neumann H, Tiwald TE, Thompson DW, Yao H, Woollam JA, Hahn J. In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures Journal of Applied Physics. 84: 526-532. DOI: 10.1063/1.368083 |
0.634 |
|
| 1998 |
Gao X, DeVries MJ, Thompson DW, Woollam JA. Thickness dependence of interfacial magneto-optic effects in Pt/Co multilayers Journal of Applied Physics. 83: 6747-6749. DOI: 10.1063/1.367807 |
0.415 |
|
| 1998 |
Herzinger CM, Johs B, McGahan WA, Woollam JA, Paulson W. Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation Journal of Applied Physics. 83: 3323-3336. DOI: 10.1063/1.367101 |
0.454 |
|
| 1998 |
Kirkpatrick SR, Rohde SL, Mihut DM, Kurruppu ML, Swanson JR, Thomson D, Woollam JA. Process monitoring and control of low temperature reactively sputtered A1N Thin Solid Films. 332: 16-20. DOI: 10.1016/S0040-6090(98)01020-7 |
0.311 |
|
| 1998 |
Tiwald TE, Thompson DW, Woollam JA, Pepper SV. Determination of the mid-IR optical constants of water and lubricants using IR ellipsometry combined with an ATR cell Thin Solid Films. 313: 718-721. DOI: 10.1016/S0040-6090(97)00984-X |
0.36 |
|
| 1998 |
Bungay CL, Tiwald TE, Thompson DW, DeVries MJ, Woollam JA, Elman JF. IR ellipsometry studies of polymers and oxygen plasma-treated polymers Thin Solid Films. 313: 713-717. DOI: 10.1016/S0040-6090(97)00983-8 |
0.427 |
|
| 1998 |
Schubert M, Franke E, Neumann H, Tiwald TE, Thompson DW, Woollam JA, Hahn J. Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry Thin Solid Films. 692-696. DOI: 10.1016/S0040-6090(97)00979-6 |
0.625 |
|
| 1998 |
Snyder PG, Tiwald TE, Thompson DW, Ianno NJ, Woollam JA, Mauk MG, Shellenbarger ZA. Infrared free carrier response of In0.15Ga0.85As0.17Sb0.83 epilayers on GaSb Thin Solid Films. 313: 667-670. DOI: 10.1016/S0040-6090(97)00974-7 |
0.373 |
|
| 1998 |
Tiwald TE, Thompson DW, Woollam JA, Paulson W, Hance R. Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles Thin Solid Films. 313: 661-666. DOI: 10.1016/S0040-6090(97)00973-5 |
0.366 |
|
| 1998 |
Gao X, Glenn DW, Woollam JA. In situ ellipsometric diagnostics of multilayer thin film deposition during sputtering Thin Solid Films. 313: 511-515. DOI: 10.1016/S0040-6090(97)00875-4 |
0.431 |
|
| 1998 |
Thompson DW, DeVries MJ, Tiwald TE, Woollam JA. Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry Thin Solid Films. 313: 341-346. DOI: 10.1016/S0040-6090(97)00843-2 |
0.431 |
|
| 1998 |
Hale JS, DeVries M, Dworak B, Woollam JA. Visible and infrared optical constants of electrochromic materials for emissivity modulation applications Thin Solid Films. 313: 205-209. DOI: 10.1016/S0040-6090(97)00818-3 |
0.438 |
|
| 1997 |
Schubert M, Rheinländer B, Franke E, Neumann H, Tiwald TE, Woollam JA, Hahn J, Richter F. Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example Physical Review B. 56: 13306-13313. DOI: 10.1103/Physrevb.56.13306 |
0.65 |
|
| 1997 |
Wierman KW, Hilfiker JN, Sabiryanov RF, Jaswal SS, Kirby RD, Woollam JA. Optical and magneto-optical constants of MnPt3 Physical Review B. 55: 3093-3099. DOI: 10.1103/Physrevb.55.3093 |
0.385 |
|
| 1997 |
Gao X, Glenn DW, Heckens S, Thompson DW, Woollam JA. Spectroscopic ellipsometry and magneto-optic Kerr effects in Co/Pt multilayers Journal of Applied Physics. 82: 4525-4531. DOI: 10.1063/1.366188 |
0.431 |
|
| 1997 |
Franke E, Schubert M, Neumann H, Tiwald TE, Thompson DW, Woollam JA, Hahn J, Richter F. Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range Journal of Applied Physics. 82: 2906-2911. DOI: 10.1063/1.366123 |
0.643 |
|
| 1997 |
Gao X, Heckens S, Woollam JA. In-situ ellipsometric control of magnetic multilayer deposition (abstract) Journal of Applied Physics. 81: 3845-3845. DOI: 10.1063/1.364727 |
0.449 |
|
| 1997 |
Wierman KW, Hilfiker JN, Sabiryanov RF, Jaswal S, Kirby RD, Woollam JA. Optical and magneto-optical properties of MnPt3 films (abstract) Journal of Applied Physics. 81: 5674-5674. DOI: 10.1063/1.364692 |
0.51 |
|
| 1997 |
Gao X, Thompson DW, Woollam JA. Determination of the interfacial magneto-optical effects in Co/Pt multilayer structures Applied Physics Letters. 70: 3203-3205. DOI: 10.1063/1.119152 |
0.393 |
|
| 1997 |
Franke E, Neumann H, Schubert M, Tiwald TE, Woollam JA, Hahn J. Infrared ellipsometry on hexagonal and cubic boron nitride thin films Applied Physics Letters. 70: 1668-1670. DOI: 10.1063/1.118655 |
0.646 |
|
| 1997 |
Johs B, Herzinger C, He P, Pittal S, Woollam J, Wagner T. Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multi-wavelength ellipsometry Materials Science and Engineering B-Advanced Functional Solid-State Materials. 44: 134-138. DOI: 10.1016/S0921-5107(96)01779-5 |
0.333 |
|
| 1997 |
Synowicki RA, Hale JS, Kubik RD, Nafis S, Woollam JA. Microstructural characterization of SiOx surface contaminants on ashed aluminum thin films Surface & Coatings Technology. 90: 150-155. DOI: 10.1016/S0257-8972(96)03111-8 |
0.426 |
|
| 1997 |
Synowicki RA, Hale JS, Kubik RD, Nafis S, Woollam JA. Microstructural characterization of SiOx surface contaminants on ashed aluminum thin films Surface and Coatings Technology. 90: 150-155. |
0.313 |
|
| 1996 |
Schubert M, Cramer C, Woollam JA, Herzinger CM, Johs B, Schmiedel H, Rheinländer B. Generalized transmission ellipsometry for twisted biaxial dielectric media: application to chiral liquid crystals Journal of the Optical Society of America A. 13: 1930. DOI: 10.1364/Josaa.13.001930 |
0.534 |
|
| 1996 |
Schubert M, Woollam JA, Johs B, Herzinger CM, Rheinländer B. Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2 Journal of the Optical Society of America A. 13: 875. DOI: 10.1364/Josaa.13.000875 |
0.59 |
|
| 1996 |
Synowicki RA, Hale JS, McGahan WA, Ianno NJ, Woollam JA. Oxygen plasma asher contamination: An analysis of sources and remedies Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 14: 3075-3081. DOI: 10.1116/1.580174 |
0.332 |
|
| 1996 |
Hilfiker JN, Glenn DW, Heckens S, Woollam JA, Wierman KW. In situ and ex situ optical characterization of electro deposited magneto-optic materials Journal of Applied Physics. 79: 6193-6195. DOI: 10.1063/1.362069 |
0.494 |
|
| 1996 |
Herzinger CM, Snyder PG, Celii FG, Kao Y-, Chow D, Johs B, Woollam JA. Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry Journal of Applied Physics. 79: 2663-2674. DOI: 10.1063/1.361137 |
0.393 |
|
| 1996 |
Schubert M, Rheinländer B, Woollam JA, Johs B, Herzinger CM. Extension of rotating-analyzer ellipsometry to generalized ellipsometry: Determination of the dielectric function tensor from uniaxial TiO<inf>2</inf> Journal of the Optical Society of America a: Optics and Image Science, and Vision. 13: 875-883. |
0.305 |
|
| 1995 |
Synowicki RA, Hale JS, Spady B, Reiser M, Nafis S, Woollam JA. Thin film materials exposure to low Earth orbit aboard Space Shuttle Journal of Spacecraft and Rockets. 32: 97-102. DOI: 10.2514/3.26580 |
0.435 |
|
| 1995 |
Snyder PG, Ianno NJ, Wigert B, Pittal S, Johs B, Woollam JA. Spectroscopic ellipsometric monitoring of electron cyclotron resonance plasma etching of GaAs and AlGaAs Journal of Vacuum Science & Technology B. 13: 2255-2259. DOI: 10.1116/1.588059 |
0.334 |
|
| 1995 |
Zhang YB, Woollam JA. Annealing effects of Co/Ni multilayers Ieee Transactions On Magnetics. 31: 3262-3264. DOI: 10.1109/20.490343 |
0.309 |
|
| 1995 |
Herzinger CM, Yao H, Snyder PG, Celii FG, Kao YC, Johs B, Woollam JA. Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis Journal of Applied Physics. 77: 4677-4687. DOI: 10.1063/1.359435 |
0.419 |
|
| 1995 |
Herzinger CM, Snyder PG, Johs B, Woollam JA. InP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry Journal of Applied Physics. 77: 1715-1724. DOI: 10.1063/1.358864 |
0.393 |
|
| 1995 |
Schubert M, Gottschalch V, Herzinger CM, Yao H, Snyder PG, Woollam JA. Optical constants of GaxIn1−xP lattice matched to GaAs Journal of Applied Physics. 77: 3416-3419. DOI: 10.1063/1.358632 |
0.61 |
|
| 1995 |
Heckens S, Woollam JA. In-situ ellipsometry on sputtered dielectric and magneto-optic thin films Thin Solid Films. 270: 65-68. DOI: 10.1016/0040-6090(95)06883-X |
0.467 |
|
| 1995 |
Hilfiker JN, Thompson DW, Hale JS, Woollam JA. In-situ ellipsometric characterization of the electrodeposition of metal films Thin Solid Films. 270: 73-77. DOI: 10.1016/0040-6090(95)06851-1 |
0.426 |
|
| 1995 |
Zollner S, Herzinger CM, Woollam JA, Iyer SS, Powell AP, Eberl K. Piezo-optical response of Si1-yCy alloys grown pseudomorphically on Si (001) Solid State Communications. 96: 305-308. DOI: 10.1016/0038-1098(95)00441-6 |
0.315 |
|
| 1994 |
Paulson WM, Hegde RI, Doris BB, Kaushik V, Tobin PJ, Fitch J, McGahan WA, Woollam JA. Nucleation and Growth of CVD Si Thin Films: AFM, SE and Tem Analysis Mrs Proceedings. 355: 77-82. DOI: 10.1557/Proc-355-77 |
0.361 |
|
| 1994 |
McGahan WA, Woollam JA. Optical characterization and modeling of amorphous hydrogenated carbon films Mrs Proceedings. 349: 453-464. DOI: 10.1557/Proc-349-453 |
0.489 |
|
| 1994 |
Zhang YB, Shan ZS, Woollam JA, Shen JX, Sellmyer DJ. Anisotropy and magneto-optical properties of sputtered Co/Ni multilayer thin films Ieee Transactions On Magnetics. 30: 4440-4442. DOI: 10.1109/20.334113 |
0.419 |
|
| 1994 |
Hilfiker JN, Zhang YB, Woollam JA. Optical Property Influence on Magneto-optics of CoNi and TbCo Multilayers on Noble Metal Alloy Substrates* Ieee Transactions On Magnetics. 30: 4437-4439. DOI: 10.1109/20.334112 |
0.341 |
|
| 1994 |
Zhang YB, He P, Woollam JA, Shen JX, Kirby RD, Sellmyer DJ. Magnetic and magneto-optic properties of sputtered Co/Ni multilayers Journal of Applied Physics. 75: 6495-6497. DOI: 10.1063/1.356975 |
0.362 |
|
| 1994 |
Shen JX, Wierman KW, Zhang YB, Kirby RD, Woollam JA, Sellmyer DJ. Magneto-optical and structural properties of bialdyig/fe multilayers Journal of Applied Physics. 75: 6670-6672. DOI: 10.1063/1.356890 |
0.373 |
|
| 1994 |
Woollam JA, McGaham WA, Johs B. Spectroscopic ellipsometry studies of indium tin oxide and other flat panel display multilayer materials Thin Solid Films. 241: 44-46. DOI: 10.1016/0040-6090(94)90393-X |
0.469 |
|
| 1994 |
McGahan WA, Makovicka T, Hale J, Woollam JA. Modified Forouhi and Bloomer dispersion model for the optical constants of amorphous hydrogenated carbon thin films Thin Solid Films. 253: 57-61. DOI: 10.1016/0040-6090(94)90294-1 |
0.454 |
|
| 1994 |
Johs BD, McGahan WA, Woollam JA. Optical analysis of complex multilayer structures using multiple data types Thin Solid Films. 253: 25-27. DOI: 10.1016/0040-6090(94)90288-7 |
0.468 |
|
| 1993 |
Synowicki RA, Hale JS, Woollam JA. Low Earth Simulation and Materials Characterization Journal of Spacecraft and Rockets. 30: 116-119. DOI: 10.2514/3.25478 |
0.439 |
|
| 1993 |
Xiong Y, Snyder PG, Woollam JA. Photoellipsometry determination of surface Fermi level in GaAs (100) Journal of Vacuum Science and Technology. 11: 1075-1082. DOI: 10.1116/1.578444 |
0.33 |
|
| 1993 |
He P, Shan ZS, Woollam JA, Sellmyer DJ. Nanostructural effects and interface magnetism in Co/Pd multilayers Journal of Applied Physics. 73: 5954-5956. DOI: 10.1063/1.353482 |
0.31 |
|
| 1993 |
Synowicki RA, Hale JS, Ianno NJ, Woollam JA, D.Hambourger P. Low Earth orbit effects on indium tin oxide and polyester and comparison with laboratory simulations Surface and Coatings Technology. 62: 499-503. DOI: 10.1016/0257-8972(93)90290-5 |
0.346 |
|
| 1993 |
Yao H, Woollam JA, Wang PJ, Tejwani MJ, Alterovitz SA. Spectroscopic ellipsometric characterization of Si/Si1-xGex strained-layer supperlattices Applied Surface Science. 63: 52-56. DOI: 10.1016/0169-4332(93)90063-H |
0.324 |
|
| 1993 |
Ianno NJ, Nafis S, Snyder PG, Johs B, Woollam JA. In situ spectroscopic ellipsometry studies of electron cyclotron resonance (ECR) plasma etching of oxides of silicon and GaAs Applied Surface Science. 63: 17-21. DOI: 10.1016/0169-4332(93)90057-I |
0.343 |
|
| 1993 |
Machlab H, McGahan WA, Woollam JA, Cole K. Thermal characterization of thin films by photothermally induced laser beam deflection Thin Solid Films. 224: 22-27. DOI: 10.1016/0040-6090(93)90452-U |
0.342 |
|
| 1993 |
McGahan WA, Johs B, Woollam JA. Techniques for ellipsometric measurement of the thickness and optical constants of thin absorbing films Thin Solid Films. 234: 443-446. DOI: 10.1016/0040-6090(93)90303-7 |
0.478 |
|
| 1993 |
Yi-Ming Xiong, Snyder PG, Woollam JA. Photoellipsometry: a modulation spectroscopy method applied to n-type GaAs Thin Solid Films. 234: 399-401. DOI: 10.1016/0040-6090(93)90294-Y |
0.319 |
|
| 1993 |
Nafis S, Ianno NJ, Snyder PG, McGahan WA, Johs B, Woollam JA. Electron cyclotron resonance etching of semiconductor structures studied by in-situ spectroscopic ellipsometry Thin Solid Films. 233: 253-255. DOI: 10.1016/0040-6090(93)90101-T |
0.34 |
|
| 1993 |
Orloff GJ, Woollam JA, He P, McGahan WA, McNeil JR, Jacobson RD, Johs B. Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg1−xCdxTe Thin Solid Films. 233: 46-49. DOI: 10.1016/0040-6090(93)90058-W |
0.338 |
|
| 1992 |
Nafis S, Ianno NJ, Snyder PG, Woollam JA, Johs B. In Situ Studies of Electron Cyclotron Resonance Plasma Etching of Semiconductors by Spectroscopic Ellipsometry Mrs Proceedings. 279: 819. DOI: 10.1557/Proc-279-819 |
0.353 |
|
| 1992 |
Woollam JA, Snyder PG, Yao HW, Johs BD. In-situ and ex-situ ellipsometric characterization for semiconductor technology (Invited Paper) Semiconductors. 1678: 246-257. DOI: 10.1117/12.60459 |
0.417 |
|
| 1992 |
Snyder PG, Xiong YM, Woollam JA, Ai-Jumaily GA, Gagliardi FJ. Graded refractive index silicon oxynitride thin film characterized by spectroscopic ellipsometry Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 10: 1462-1466. DOI: 10.1116/1.578266 |
0.482 |
|
| 1992 |
Xiong YM, Snyder PG, Woollam JA, Krosche ER. Silicon nstride/siiicon oxynitride/siiicon dioxide thin film multilayer characterized by variable angle spectroscopic eilipsometry Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 10: 950-954. DOI: 10.1116/1.577884 |
0.442 |
|
| 1992 |
Machlab H, McGahan WA, Woollam JA. Thermal diffusivity measurements by photothermal laser beam deflection (PTD): data analysis using the Levenberg-Marquardt algorithm Thin Solid Films. 215: 103-107. DOI: 10.1016/0040-6090(92)90709-K |
0.357 |
|
| 1992 |
Belkind A, Orban Z, Vossen JL, Woollam JA. Optical properties of RuO2 films deposited by reactive sputtering Thin Solid Films. 207: 242-247. DOI: 10.1016/0040-6090(92)90131-T |
0.48 |
|
| 1992 |
Xiong Y‐, Snyder PG, Woollam JA, Al‐Jumaily GA, Gagliardi FJ, Mizerka LJ. Optical Characterization of Silicon Oxynitride Thin Films by Variable Angle Spectroscopic Ellipsometry Surface and Interface Analysis. 18: 124-128. DOI: 10.1002/Sia.740180211 |
0.499 |
|
| 1992 |
Snyder PG, Xiong Y‐, Woollam JA, Krosche ER, Strausser Y. Characterization of polycrystalline silicon thin‐film multilayers by variable angle spectroscopic ellipsometry Surface and Interface Analysis. 18: 113-118. DOI: 10.1002/Sia.740180209 |
0.382 |
|
| 1991 |
McDANIEL TW, Sequeda FO, McGAHAN WA, Woollam JA. Optical And Magneto-Optical Performance Of Optimized Disk Structures Journal of the Magnetics Society of Japan. 15. DOI: 10.3379/Jmsjmag.15.S1_361 |
0.445 |
|
| 1991 |
Snyder PG, Xiong Y, Woollam JA, Krosche ER. Variable Angle Spectroscopic Ellipsometric Characterization of Polycrystalline Silicon thin Film Multilayer Structures Mrs Proceedings. 238: 605. DOI: 10.1557/Proc-238-605 |
0.419 |
|
| 1991 |
Hale JS, Synowicki RA, Nafis S, Woollam JA. Atomic Oxygen Plasma Effects on Cvd Deposited Diamond-Like Carbon Films Mrs Proceedings. 236: 307. DOI: 10.1557/Proc-236-307 |
0.34 |
|
| 1991 |
McGahan WA, He P, Woollam JA. Optical and Magneto-optical modeling of Ultra-thin Film Multilayers Mrs Proceedings. 231: 497. DOI: 10.1557/Proc-231-497 |
0.459 |
|
| 1991 |
Reed CP, Deangelis RJ, Liou SH, Nafis S, Woollam JA, Lee KW, Jacob RJ. Substructure-Magnetic Property Correlation in Co/ag Composite Thin Films Mrs Proceedings. 231: 329. DOI: 10.1557/Proc-231-329 |
0.351 |
|
| 1991 |
Johs B, Edwards JL, Shiralagi KT, Droopad R, Choi KY, Maracas GN, Meyer D, Cooney GT, Woollam JA. Real-Time Analysis Of In-Situ Spectroscopic Ellipsometric Data During Mbe Growth Of III-V Semiconductors Mrs Proceedings. 222: 75. DOI: 10.1557/Proc-222-75 |
0.342 |
|
| 1991 |
Liou SH, Malhotra S, Shan ZS, Sellmyer DJ, Nafis S, Woollam JA, Reed CP, Deangelis RJ, Chow GM. The process-controlled magnetic properties of nanostructured Co/Ag composite films Journal of Applied Physics. 70: 5882-5884. DOI: 10.1063/1.350094 |
0.398 |
|
| 1991 |
He P, McGahan WA, Nafis S, Woollam JA, Shan ZS, Liou S, Sequeda F, McDaniel T, Do H. Sputtering pressure effect on microstructure of surface and interface, and on coercivity of Co/Pt multilayers Journal of Applied Physics. 70: 6044-6046. DOI: 10.1063/1.350066 |
0.362 |
|
| 1991 |
Nafis S, Woollam JA, Shan ZS, Sellmyer DJ. Temperature and thickness dependence of coercivity and magnetization of Co/Cu and Co/Si multilayers Journal of Applied Physics. 70: 6050-6052. DOI: 10.1063/1.350042 |
0.304 |
|
| 1991 |
Yao H, Snyder PG, Woollam JA. Temperature dependence of optical properties of GaAs Journal of Applied Physics. 70: 3261-3267. DOI: 10.1063/1.349285 |
0.374 |
|
| 1991 |
He P, McGahan WA, Woollam JA, Sequeda F, McDaniel T, Do H. Magneto-optical Kerr effect and perpendicular magnetic anisotropy of evaporated and sputtered Co/Pt multilayer structures Journal of Applied Physics. 69: 4021-4028. DOI: 10.1063/1.348411 |
0.46 |
|
| 1991 |
Kirby RD, Shen JX, Woollam JA, Sellmyer DJ. Magneto-optic properties of uranium-based compounds Journal of Applied Physics. 69: 4574-4576. DOI: 10.1063/1.348314 |
0.323 |
|
| 1991 |
McGahan WA, He P, Chen LY, Bonafede S, Woollam JA, Sequeda F, McDaniel T, Do H. Optical and magneto‐optical characterization of TbFeCo thin films in trilayer structures Journal of Applied Physics. 69: 4568-4570. DOI: 10.1063/1.348312 |
0.501 |
|
| 1991 |
Chen LY, He P, Nafis S, McGahan WA, Woollam JA, Sellmyer DJ. Magneto-optic and optical characterization of Tb/Co compositionally modulated amorphous films Journal of Applied Physics. 69: 5989-5991. DOI: 10.1063/1.347814 |
0.405 |
|
| 1991 |
Alterovitz SA, Sieg RM, Yao HD, Snyder PG, Woollam JA, Pamulapati J, Bhattacharya PK, Sekula-Moise PAPA. Study of InGaAs-based modulation doped field effect transistor structures using variable-angle spectroscopic ellipsometry Thin Solid Films. 206: 288-293. DOI: 10.1016/0040-6090(91)90437-3 |
0.378 |
|
| 1991 |
Synowicki R, Kubik RD, Hale JS, Peterkin J, Nafis S, Woollam JA, Zaat S. Oxygen plasma ashing effects on aluminum and titanium space protective coatings Thin Solid Films. 206: 254-258. DOI: 10.1016/0040-6090(91)90431-V |
0.349 |
|
| 1991 |
Xiong YM, Snyder PG, Woollam JA, Al-Jumaily GA, Gagliardi FJ, Krosche ER. Controlled index of refraction silicon oxynitride films characterized by variable angle spectroscopic ellipsometry Thin Solid Films. 206: 248-253. DOI: 10.1016/0040-6090(91)90430-6 |
0.514 |
|
| 1991 |
De BN, Ianno NJ, Snyder PG, Woollam JA, Pouch JJ. Coloration of glass exposed to atomic oxygen Journal of Materials Engineering. 13: 213-216. DOI: 10.1007/Bf02834180 |
0.379 |
|
| 1990 |
Woollam JA, De BN, Orzeszko S, Ianno NJ, Snyder PG, Alterovitz SA, Pouch JJ, Wu RLC, Ingram DC. Diamondlike Carbon Applications in Infrared Optics and Microelectronics Materials Science Forum. 577-608. DOI: 10.4028/Www.Scientific.Net/Msf.52-53.577 |
0.389 |
|
| 1990 |
Yao H, Snyder PG, Woollam JA. GaAs(100) Surface Modifications at Elevated Temperatures, Studied By In-Situ Spectroscopic Ellipsometry Mrs Proceedings. 202. DOI: 10.1557/Proc-202-339 |
0.324 |
|
| 1990 |
Erington KB, Mcgahan W, Ianno NJ, Woollam JA. Pulsed Laser Deposition of Magneto-Optic Material Mrs Proceedings. 191. DOI: 10.1557/Proc-191-97 |
0.355 |
|
| 1990 |
Xiong Y, Snyder PG, Woollam JA, Krosche ER, Strausser Y. Characterization of Polysilicon Thin Films by Variable Angle Spectroscopic Ellipsometry Mrs Proceedings. 182: 219. DOI: 10.1557/Proc-182-219 |
0.393 |
|
| 1990 |
Chen LY, Woollam JA. Rotating analyzer magneto-optic spectroscopy Proceedings of Spie - the International Society For Optical Engineering. 1166: 267-277. DOI: 10.1117/12.962897 |
0.33 |
|
| 1990 |
McGahan WA, He P, Chen LY, Woollam JA. Characterization of Component Films in Multilayer Magneto-Optic Structures Ieee Transactions On Magnetics. 26: 1346-1348. DOI: 10.1109/20.104370 |
0.353 |
|
| 1990 |
Snyder PG, Woollam JA, Alterovitz SA, Johs B. Modeling AlxGa1-xAs optical constants as functions of composition Journal of Applied Physics. 68: 5925-5926. DOI: 10.1063/1.346921 |
0.356 |
|
| 1990 |
Chen LY, McGahan WA, Shan ZS, Sellmyer DJ, Woollam JA. Kerr effect of two-medium layered systems Journal of Applied Physics. 67: 7547-7555. DOI: 10.1063/1.345818 |
0.377 |
|
| 1990 |
McGahan WA, Chen LY, Woollam JA. Variable angle of incidence analysis of magneto-optic multilayers Journal of Applied Physics. 67: 4801-4802. DOI: 10.1063/1.344792 |
0.417 |
|
| 1990 |
He P, De BN, Chen LY, Zhao Y, Woollam JA, Miller M, Simpson E. Ellipsometric analysis of computer disk structures Journal of Applied Physics. 67: 4878-4880. DOI: 10.1063/1.344765 |
0.305 |
|
| 1990 |
Chen LY, McGahan WA, Shan ZS, Sellmyer DJ, Woollam JA. Enhancement of magneto-optical Kerr effects Journal of Applied Physics. 67: 5337-5339. DOI: 10.1063/1.344603 |
0.421 |
|
| 1990 |
Woollam JA, Snyder PG, Merkel KG, Alterovitz SA. Ellipsometric characterization of multilayer transistor structures Materials Science and Engineering B. 5: 291-294. DOI: 10.1016/0921-5107(90)90071-I |
0.339 |
|
| 1990 |
Woollam JA, Snyder PG. Fundamentals and applications of variable angle spectroscopic ellipsometry Materials Science and Engineering B. 5: 279-283. DOI: 10.1016/0921-5107(90)90069-N |
0.374 |
|
| 1989 |
Datta T, Woollam JA, Notohamiprodjo W. Optical-absorption edge and disorder effects in hydrogenated amorphous diamondlike carbon films. Physical Review. B, Condensed Matter. 40: 5956-5960. PMID 9992658 DOI: 10.1103/Physrevb.40.5956 |
0.4 |
|
| 1989 |
Datta T, Woollam JA. Generalized model for the optical absorption edge in a-Si:H. Physical Review. B, Condensed Matter. 39: 1953-1954. PMID 9948419 DOI: 10.1103/Physrevb.39.1953 |
0.35 |
|
| 1989 |
Woollam JA, De BN, Chen LY, Pouch JJ, Alterovitz SA. Diamondlike Carbon as a Moisture Barrier and Antireflecting Coating on Optical Materialst Mrs Proceedings. 152: 27. DOI: 10.1557/Proc-152-27 |
0.465 |
|
| 1989 |
Sellmyer DJ, Woollam JA, Shan ZS, McGahan WA. Magnetic and Magneto-Optical Properties of Nanostructured Rare Earth-Transition Metal Multilayered Films Mrs Proceedings. 150. DOI: 10.1557/Proc-150-51 |
0.43 |
|
| 1989 |
McGahan WA, Woollam JA. Reflection of Polarized Light from Multiply Overcoated Magneto-Optic Materials: A Simplified Analysis Method Mrs Proceedings. 150: 255. DOI: 10.1557/Proc-150-255 |
0.357 |
|
| 1989 |
Merkel KG, Snyder PG, Alterovitz SA, Rai AK, Woollam JA. Characterization of multilayer gaas/algaas transistor structures by variable angle spectroscopic ellipsometry Japanese Journal of Applied Physics. 28: 1118-1123. DOI: 10.1143/Jjap.28.1118 |
0.347 |
|
| 1989 |
De BN, Orzeszko S, Woollam JA, Ingram DC, McCormick AJ. Diamondlike carbon for infrared optics Proceedings of Spie - the International Society For Optical Engineering. 969: 60-65. DOI: 10.1117/12.948141 |
0.322 |
|
| 1989 |
McGahan WA, Shan ZS, Massengale AM, Tiwald TE, Woollam JA. Optical- and magneto-optical measurements using a variable angle of incidence spectroscopic ellipsometer: Application to DyCo multilayers Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 7: 1271-1272. DOI: 10.1116/1.576267 |
0.401 |
|
| 1989 |
Meyer DE, Dillon RO, Woollam JA. Radio-frequency plasma chemical vapor deposition growth of diamond Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 7: 2325-2327. DOI: 10.1116/1.575936 |
0.346 |
|
| 1989 |
De BN, Woollam JA. Ellipsometric study of Al2O3/Ag/Si and SiO 2/Ag/quartz ashed in an oxygen plasma Journal of Applied Physics. 66: 5602-5607. DOI: 10.1063/1.343665 |
0.316 |
|
| 1989 |
McGahan WA, Chen LY, Shan ZS, Sellmyer DJ, Woollam JA. Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures Applied Physics Letters. 55: 2479-2481. DOI: 10.1063/1.102004 |
0.368 |
|
| 1989 |
Liou SH, Aylesworth KD, Ianno NJ, Johs B, Thompson D, Meyer D, Woollam JA, Barry C. Highly oriented Tl2Ba2Ca2Cu 3O10 thin films by pulsed laser evaporation Applied Physics Letters. 54: 760-762. DOI: 10.1063/1.101473 |
0.396 |
|
| 1989 |
De BN, Zhao Y, Snyder PG, Woollam JA, Coutts TJ, Li X. Effects of oxygen “ashing” on indium-tin oxide thin films Surface & Coatings Technology. 647-653. DOI: 10.1016/S0257-8972(89)80026-X |
0.419 |
|
| 1989 |
Koss V, Belkind A, Memarzadeh K, Woollam JA. Determination of optical constants of silver layers in ZnO/Ag/ZnO coatings using variable angle spectroscopic ellipsometry Solar Energy Materials. 19: 67-78. DOI: 10.1016/0165-1633(89)90024-5 |
0.375 |
|
| 1988 |
Meyer DE, Swartzlander AB, lanno NJ, Nelson AJ, Woollam JA. Growth of diamond by rf plasma-assisted chemical vapor deposition Journal of Materials Research. 3: 1397-1403. DOI: 10.1557/Jmr.1988.1397 |
0.368 |
|
| 1988 |
Oh JE, Woollam JA, Pouch JJ, Alterovitz SA, Ingram DC. Amorphous Ta‐rich Ta–Cu films as diffusion barriers between Au and GaAs Journal of Vacuum Science & Technology B. 6: 825-830. DOI: 10.1116/1.584348 |
0.38 |
|
| 1988 |
Pouch JJ, Alterovitz SA, Woollam JA, Oh JE. Summary Abstract: Surface analysis of amorphous Ta-Cu thin films deposited on GaAs Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 6: 983-984. DOI: 10.1116/1.575045 |
0.377 |
|
| 1988 |
Memarzadeh K, Woollam JA, Belkind A. Variable angle of incidence spectroscopic ellipsometric characterization of TiO2/Ag/TiO2 optical coatings Journal of Applied Physics. 64: 3407-3410. DOI: 10.1063/1.342491 |
0.395 |
|
| 1988 |
Tiwald TE, Mcgahan WA, Shan ZS, Massengale AM, Woollam JA. Variable angle spectroscopic magnetoââ¬Âoptics and ellipsometry: Application to DyCo multilayers (abstract) Journal of Applied Physics. 64: 5769. DOI: 10.1063/1.342253 |
0.331 |
|
| 1988 |
Orzeszko S, Woollam JA, Ingram DC, McCormick AW. Optical properties of ion-beam-deposited ion-modified diamondlike (a-C:H) carbon Journal of Applied Physics. 64: 2611-2616. DOI: 10.1063/1.341651 |
0.421 |
|
| 1988 |
Orzeszko S, De BN, Woollam JA, Pouch JJ, Alterovitz SA, Ingram DC. Thin-film hermeticity - A quantitative analysis of diamondlike carbon using variable angle spectroscopic ellipsometry Journal of Applied Physics. 64: 4175-4180. DOI: 10.1063/1.341331 |
0.379 |
|
| 1988 |
Tiwald TE, Woollam JA, Sellmyer DJ. Ellipsometric and magneto-optic properties of sputtered dysprosium-iron multilayers Journal of Applied Physics. 63: 3215-3217. DOI: 10.1063/1.340843 |
0.397 |
|
| 1988 |
Alterovitz SA, Snyder PG, Merkel KG, Woollam JA, Radulescu DC, Eastman LF. Variable angle spectroscopic ellipsometry - Application to GaAs-AlGaAs multilayer homogeneity characterization Journal of Applied Physics. 63: 5081-5084. DOI: 10.1063/1.340406 |
0.338 |
|
| 1988 |
Snyder PG, De BN, Merkel KG, Woollam JA, Langer DW, Stutz CE, Jones R, Rai AK, Evans K. Measurement of superlattice optical properties by variable angle spectroscopic ellipsometry Superlattices and Microstructures. 4: 97-99. DOI: 10.1016/0749-6036(88)90273-X |
0.377 |
|
| 1988 |
Woollam JA, Snyder PG, Rost MC. Variable angle spectroscopic ellipsometry: A non-destructive characterization technique for ultrathin and multilayer materials Thin Solid Films. 166: 317-323. DOI: 10.1016/0040-6090(88)90393-8 |
0.324 |
|
| 1987 |
Tiwald TE, Woollam JA, Shan ZS, Sellmyer DJ. Ellipsometric, Magneto-Optic, and Magnetic Properties of Sputtered Rare Earth-Transition Metal Multilayers Mrs Proceedings. 103. DOI: 10.1557/Proc-103-239 |
0.411 |
|
| 1987 |
Snyder PG, Merkel KG, De BN, Woollam JA, Langer DW, Stutz CE, Jones R, Rai AK, Evans K. Superlattice Optical Properties Measured by Variable Angle Spectroscopic Ellipsometry Mrs Proceedings. 102: 165. DOI: 10.1557/Proc-102-165 |
0.389 |
|
| 1987 |
Memarzadeh K, Woollam JA, Belkind A. Ellipsometric study of ZnO/Ag/ZnO optical coatings: Determination of layer thicknesses and optical constants Proceedings of Spie - the International Society For Optical Engineering. 823: 54-63. DOI: 10.1117/12.941868 |
0.325 |
|
| 1987 |
Snyder PG, Oh JE, Woollam JA, Owens RE. Ellipsometric analysis of built-in electric fields in semiconductor heterostructures Applied Physics Letters. 51: 770-772. DOI: 10.1063/1.98862 |
0.331 |
|
| 1987 |
Oh JE, Woollam JA, Pouch JJ. Interactions of amorphous TaxCu1-x (x=0.93 and 0.80) alloy films with Au overlayers and GaAs substrates Applied Physics Letters. 50: 1722-1724. DOI: 10.1063/1.97727 |
0.353 |
|
| 1987 |
Woollam JA, Snyder PG, McCormick AW, Rai AK, Ingram D, Pronko PP. Ellipsometric measurements of molecular‐beam‐epitaxy‐grown semiconductor multilayer thicknesses: A comparative study Journal of Applied Physics. 62: 4867-4871. DOI: 10.1063/1.338992 |
0.33 |
|
| 1986 |
Woollam JA, Snyder PG, McCOrmick AW, Rai AK, Ingram DC, Pronko PP, Geddes JJ. Comparative Thickness Measurements of Heterojunction Layers by Ellipsometric, RBS, and XTEM Analysis Mrs Proceedings. 77. DOI: 10.1557/Proc-77-755 |
0.335 |
|
| 1986 |
Oh JE, Lamb JD, Snyder PG, Woollam JA. Summary Abstract: Interfacial properties of “diamondlike” Amorphous carbon films on InP: Metal-insulator-semiconductor structures Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 4: 1022-1023. DOI: 10.1116/1.573444 |
0.382 |
|
| 1986 |
Snyder PG, Rost MC, Bu-Abbud GH, Woollam JA, Alterovitz SA. Variable angle of incidence spectroscopic ellipsometry: Application to GaAs-AlxGa1-xAs multiple heterostructures Journal of Applied Physics. 60: 3293-3302. DOI: 10.1063/1.337695 |
0.361 |
|
| 1986 |
Oh JE, Woollam JA, Aylesworth KD, Sellmyer DJ, Pouch JJ. Thermal and structural stability of cosputtered amorphous Ta xCu1-x alloy thin films on GaAs Journal of Applied Physics. 60: 4281-4286. DOI: 10.1063/1.337470 |
0.395 |
|
| 1986 |
Snyder PG, Rost MC, Bu‐Abbud GH, Oh J, Woollam JA, Poker D, Aspnes DE, Ingram D, Pronko P. Study of Mo‐, Au‐, and Ni‐implanted molybdenum laser mirrors by multiple angle of incidence spectroscopic ellipsometry Journal of Applied Physics. 60: 779-788. DOI: 10.1063/1.337429 |
0.361 |
|
| 1986 |
Bu‐Abbud GH, Mathine DL, Snyder P, Woollam JA, Poker D, Bennett J, Ingram D, Pronko PP. Roughness studies of ion beam processed molybdenum surfaces Journal of Applied Physics. 59: 257-262. DOI: 10.1063/1.336873 |
0.362 |
|
| 1986 |
Bu-Abbud GH, Bashara NM, Woollam JA. Variable wavelength, variable angle ellipsometry including a sensitivities correlation test Thin Solid Films. 138: 27-41. DOI: 10.1016/0040-6090(86)90212-9 |
0.497 |
|
| 1986 |
Ingram DC, Woollam JA, Bu-Abbud G. Mass density and hydrogen concentration in "diamond-like" carbon films: Proton recoil, Rutherford backscattering and ellipsometric analysis Thin Solid Films. 137: 225-230. DOI: 10.1016/0040-6090(86)90023-4 |
0.377 |
|
| 1986 |
Oh JE, Lamb JD, Snyder PG, Woollam JA, Liu DC. InP MIS structures with diamondlike amorphous carbon films deposited by ion-beam sputtering and from plasma Solid State Electronics. 29: 933-940. DOI: 10.1016/0038-1101(86)90017-1 |
0.358 |
|
| 1985 |
Nataraian V, Lamb JD, Woollam JA, Liu DC, Gulino DA. “Diamondlike” carbon films: Optical absorption, dielectric properties, and hardness dependence on deposition parameters Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 3: 681-685. DOI: 10.1116/1.573280 |
0.47 |
|
| 1985 |
Lamb JD, Woollam JA. Dielectric properties of "diamondlike" carbon prepared by rf plasma deposition Journal of Applied Physics. 57: 5420-5423. DOI: 10.1063/1.334866 |
0.357 |
|
| 1985 |
Ingram DC, McCormick AW, Pronko PP, Carlson JD, Woollam JA. Hydrogen analysis as a function of depth for hydrogenous films and polymers by proton recoil detection Nuclear Inst. and Methods in Physics Research, B. 6: 430-434. DOI: 10.1016/0168-583X(85)90669-X |
0.323 |
|
| 1985 |
Alterovitz SA, Bu-Abbud GH, Woollam JA. Analytic solutions for optimized ellipsometric measurements of interfaces and surface layers in thin film structures Thin Solid Films. 123: 183-196. DOI: 10.1016/0040-6090(85)90159-2 |
0.423 |
|
| 1984 |
Mathine D, Dillon RO, Khan AA, Bu‐Abbud G, Woollam JA, Liu DC, Banks B, Domitz S. Summary Abstract: Optical, Raman, and photoemission results on amorphous ‘‘diamondlike’’ carbon films Journal of Vacuum Science and Technology. 2: 365-366. DOI: 10.1116/1.572742 |
0.456 |
|
| 1984 |
Khan AA, Woollam JA, Chung Y. Interfacial effects due to tunneling to insulator gap states in amorphous carbon on silicon metal-insulator-semiconductor structures Journal of Applied Physics. 55: 4299-4303. DOI: 10.1063/1.333040 |
0.311 |
|
| 1984 |
Woollam JA, Natarajan V, Lamb J, Khan AA, Bu-Abbud G, Mathine D, Rubin D, Dillon RO, Banks B, Pouch J, Gulino DA, Domitz S, Liu DC, Ingram D. Optical and interfacial electronic properties of diamond-like carbon films Thin Solid Films. 119: 121-126. DOI: 10.1016/0040-6090(84)90164-0 |
0.466 |
|
| 1984 |
Khan AA, Woollam JA, Chung Y. High frequency capacitance-voltage and conductance-voltage characteristics of d.c. sputter deposited a-carbon/silicon MIS structures Solid State Electronics. 27: 385-391. DOI: 10.1016/0038-1101(84)90173-4 |
0.307 |
|
| 1984 |
Khan AA, Woollam JA, Yun C. 150. Interfacial electrical properties of amorphous, d.c. sputter-deposited carbon films on crystalline silicon☆ Carbon. 22: 220-221. DOI: 10.1016/0008-6223(84)90367-1 |
0.381 |
|
| 1984 |
Dillon RO, Woollam JA, Katkanant V. Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films Physical Review B. 29: 3482-3489. DOI: 10.1016/0008-6223(84)90365-8 |
0.388 |
|
| 1984 |
Mathine D, Khan AA, BuAbbud G, Woollam JA, Banks BA, Domitz S. 147. Optical properties of r.f. plasma deposited and ion beam deposited amorphous carbon films Carbon. 22: 220. DOI: 10.1016/0008-6223(84)90364-6 |
0.39 |
|
| 1984 |
Alterovitz SA, Bu-Abbud GH, Woollam JA, Liu DC. STRUCTURAL AND CHEMICAL ANALYSIS OF A SILICON NITRIDE FILM ON GaAs BY NULL ELLIPSOMETRY Physica Status Solidi (a) Applied Research. 85: 69-76. DOI: 10.1002/Pssa.2210850108 |
0.428 |
|
| 1983 |
Pronko PP, McCormick AW, Ingram DC, Rai AK, Woollam JA, Appleton BR, Poker DB. Ion Irradiation Smoothing And Film Bonding For Laser Mirrors. Mrs Proceedings. 27: 559-564. DOI: 10.1557/Proc-27-559 |
0.323 |
|
| 1983 |
Bu-Abbud GH, Alterovitz SA, Bashara NM, Woollam JA. Summary Abstract: Multiple-wavelength-angle-of-incidence ellipsometry: Application to silicon nitride-gallium arsenide structures Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 1: 619-620. DOI: 10.1116/1.572190 |
0.306 |
|
| 1983 |
Khan AA, Woollam JA, Chung Y, Banks B. Interfacial Electrical Properties of Ion-Beam Sputter Deposited Amorphous Carbon on Silicon Ieee Electron Device Letters. 4: 146-149. DOI: 10.1109/Edl.1983.25682 |
0.36 |
|
| 1983 |
Khan AA, Mathine D, Woollam JA, Chung Y. Optical properties of "diamondlike" carbon films: An ellipsometric study Physical Review B. 28: 7229-7235. DOI: 10.1103/Physrevb.28.7229 |
0.471 |
|
| 1983 |
Alterovitz SA, Bu-Abbud GH, Woollam JA, Liu DC. An enhanced sensitivity null ellipsometry technique for studying films on substrates: Application to silicon nitride on gallium arsenide Journal of Applied Physics. 54: 1559-1569. DOI: 10.1063/1.332137 |
0.467 |
|
| 1983 |
Chung Y, Langer DW, Singh HP, Woollam JA. Surface states at the GaAs-germanium nitride interface Thin Solid Films. 103: 193-199. DOI: 10.1016/0040-6090(83)90435-2 |
0.396 |
|
| 1982 |
Peng YK, Bu‐Abbud G, Alterovitz SA, Woollam JA, Bayraktarogulu B, Langer D, Liu D, Haugland E. Summary Abstract: Ellipsometric studies of sputtered silicon nitride on n‐GaAs Journal of Vacuum Science and Technology. 20: 713-714. DOI: 10.1116/1.571637 |
0.318 |
|
| 1981 |
Alterovitz SA, Haugland EJ, Woollam JA, Engelhardt JJ, Webb GW. Superconducting critical field of Nb3Ge1-xSnx pseudobinaries Physical Review B. 23: 4485-4492. DOI: 10.1103/Physrevb.23.4485 |
0.301 |
|
| 1980 |
Woollam JA, Haugland EJ, Dowell MB, Yavrouian A, Lozier AG, Matulka G. Electronic properties of metal chloride intercalants of graphite Synthetic Metals. 2: 309-320. DOI: 10.1016/0379-6779(80)90060-0 |
0.301 |
|
| 1978 |
Somoano RB, Yen SPS, Hadek V, Khanna SK, Novotny M, Datta T, Hermann AM, Woollam JA. Optical, spin-resonance, and magnetoresistance studies of /tetrathiatetracene/2/iodide/3 - The nature of the ground state Physical Review B. 17: 2853-2857. DOI: 10.1103/Physrevb.17.2853 |
0.342 |
|
| 1978 |
Alterovitz SA, Woollam JA. Scaling laws for pinning forces in inhomogeneous superconductors Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties. 38: 619-634. DOI: 10.1080/13642817808246338 |
0.317 |
|
| 1978 |
Woollam JA, Alterovitz SA, Chi KC, Dillon RO, Bunshah RF. Superconducting properties of evaporated copper molybdenum sulfide films Journal of Applied Physics. 49: 6027-6030. DOI: 10.1063/1.324572 |
0.354 |
|
| 1978 |
Woollam JA, Alterovitz SA, Haugland EJ. Hall effect and magnetoresistivity in the ternary molybdenum sulfides Physics Letters A. 68: 122-124. DOI: 10.1016/0375-9601(78)90778-8 |
0.416 |
|
| 1978 |
Chi KC, Dillon RO, Bunshah RF, Alterovitz S, Woollam JA. Reactively evaporated films of copper molybdenum sulfide Thin Solid Films. 54: 259-262. DOI: 10.1016/0040-6090(78)90381-4 |
0.393 |
|
| 1978 |
Woollam JA, Alterovitz SA. Normal state properties of the ternary molybdenum sulfides Solid State Communications. 27: 669-671. DOI: 10.1016/0038-1098(78)90468-4 |
0.321 |
|
| 1977 |
Chi KC, Dillon RO, Bunshah RF, Alterovitz S, Martin DC, Woollam JA. Evaporated films of superconducting copper molybdenum sulfide Thin Solid Films. 47. DOI: 10.1016/0040-6090(77)90053-0 |
0.386 |
|
| 1977 |
Woollam JA, Somoano RB. Physics and chemistry of MoS2 intercalation compounds Materials Science and Engineering. 31: 289-295. DOI: 10.1016/0025-5416(77)90048-9 |
0.31 |
|
| 1976 |
Woollam JA, Somoano RB. Superconducting critical fields of alkali and alkaline-earth intercalates of MoS2 Physical Review B. 13: 3843-3853. DOI: 10.1103/Physrevb.13.3843 |
0.33 |
|
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