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Wei-Kan Chu grad student 1993 University of Houston (Physics Tree)
 (Anisotropy of the transport properties in YBa2Cu3O7-δ (110) thin films.)
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Acharya J, Goul R, Wu JZ. (2020) High Tunnelling Magnetoresistance in Magnetic Tunnel Junctions with Sub-nm thick Al2O3 Tunnel Barriers Fabricated Using Atomic Layer Deposition. Acs Applied Materials & Interfaces
Wu JZ, Acharya J, Goul R. (2020) In vacuo atomic layer deposition and electron tunneling characterization of ultrathin dielectric films for metal/insulator/metal tunnel junctions Journal of Vacuum Science and Technology. 38: 40802
Liu B, Gutha RR, Kattel B, et al. (2019) Using Silver Nanoparticles-Embedded Silica Metafilms as Substrates to Enhance the Performance of Perovskite Photodetectors. Acs Applied Materials & Interfaces
Acharya J, Goul R, Romine D, et al. (2019) Effect of Al2O3 Seed-Layer on the Dielectric and Electrical Properties of Ultrathin MgO Films Fabricated using In Situ Atomic Layer Deposition. Acs Applied Materials & Interfaces
Gong M, Ewing D, Casper M, et al. (2019) Controllable synthesis of monodispersed Fe1-xS2 nanocrystals for high performance optoelectronic devices. Acs Applied Materials & Interfaces
Gong M, Sakidja R, Goul R, et al. (2019) High-Performance All-Inorganic CsPbCl3 Perovskite Nanocrystal Photodetectors with Superior Stability. Acs Nano
Sebastian MA, Gautam B, Ebbing CR, et al. (2019) Comparison Study of the Flux Pinning Enhancement of YBa 2 Cu 3 O 7−δ Thin Films With BaHfO 3 + Y 2 O 3 Single- and Mixed-Phase Additions Ieee Transactions On Applied Superconductivity. 29: 1-5
Goul R, Wilt J, Acharya J, et al. (2019) Electron tunneling properties of Al2O3 tunnel barrier made using atomic layer deposition in multilayer devices Aip Advances. 9: 025018
Wu L, Qin L, Zhang Y, et al. (2018) High-sensitivity light detection via gate tuning of organometallic perovskite/PCBM bulk heterojunctions on ferroelectric Pb0.92La0.08Zr0.52Ti0.48O3 gated graphene field effect transistors. Acs Applied Materials & Interfaces
Acharya J, Wilt JS, Liu B, et al. (2018) Probing the Dielectric Properties of Ultrathin Al/Al2O3/Al Trilayers Fabricated Using in situ Sputtering and Atomic Layer Deposition. Acs Applied Materials & Interfaces
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