Julian C. Burton, Ph.D.

Affiliations: 
2000 Rutgers University, New Brunswick, New Brunswick, NJ, United States 
Area:
Physical Chemistry, Analytical Chemistry
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Parents

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Frederick H. Long grad student 2000 Rutgers, New Brunswick
 (Characterization of silicon carbide using Raman spectroscopy.)
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Publications

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Burton JC, Pophristic M, Long FH, et al. (1999) Optical characterization of SiC wafers Materials Research Society Symposium - Proceedings. 572: 201-206
Burton JC, Sun L, Pophristic M, et al. (1998) Spatial characterization of doped SiC wafers by Raman spectroscopy Journal of Applied Physics. 84: 6268-6273
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