Julian C. Burton, Ph.D.
|2000||Rutgers University, New Brunswick, New Brunswick, NJ, United States|
Area:Physical Chemistry, Analytical Chemistry
Mean distance: (not calculated yet)
ParentsSign in to add mentor
ChildrenSign in to add trainee
CollaboratorsSign in to add collaborator
BETA: Related publications
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.
|Burton JC, Pophristic M, Long FH, et al. (1999) Optical characterization of SiC wafers Materials Research Society Symposium - Proceedings. 572: 201-206|
|Burton JC, Sun L, Pophristic M, et al. (1998) Spatial characterization of doped SiC wafers by Raman spectroscopy Journal of Applied Physics. 84: 6268-6273|