Christopher W. Hollars, Ph.D.
Affiliations: | 2000 | University of Kansas, Lawrence, KS, United States |
Area:
Analytical Chemistry, Physical ChemistryGoogle:
"Christopher Hollars"Mean distance: (not calculated yet)
Parents
Sign in to add mentor| Robert C. Dunn | grad student | 2000 | University of Kansas | |
| (Investigating lipid membrane structure with near -field scanning optical microscopy.) | ||||
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Publications
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| Hollars CW, Puls J, Bakajin O, et al. (2006) Bio-assay based on single molecule fluorescence detection in microfluidic channels. Analytical and Bioanalytical Chemistry. 385: 1384-8 |
| Talley CE, Jackson JB, Oubre C, et al. (2005) Surface-enhanced Raman scattering from individual au nanoparticles and nanoparticle dimer substrates. Nano Letters. 5: 1569-74 |
| Schaldach CM, Bench G, DeYoreo JJ, et al. (2005) Non-DNA Methods for Biological Signatures Microbial Forensics. 251-294 |
| Talley CE, Jusinski L, Hollars CW, et al. (2004) Intracellular pH sensors based on surface-enhanced raman scattering. Analytical Chemistry. 76: 7064-8 |
| Chan JW, Esposito AP, Talley CE, et al. (2004) Reagentless identification of single bacterial spores in aqueous solution by confocal laser tweezers Raman spectroscopy. Analytical Chemistry. 76: 599-603 |
| Esposito AP, Talley CE, Huser T, et al. (2003) Analysis of single bacterial spores by micro-Raman spectroscopy. Applied Spectroscopy. 57: 868-71 |
| Hollars CW, Dunn RC. (2000) Probing single molecule orientations in model lipid membranes with near-field scanning optical microscopy The Journal of Chemical Physics. 112: 7822-7830 |
| Vickery SA, Hollars CW, Dunn RC. (2000) Probing Biological Samples with Near-Field Optics Microscopy and Microanalysis. 6: 826-827 |
| Hollars CW, Dunn RC. (1998) Submicron structure in L-alpha-dipalmitoylphosphatidylcholine monolayers and bilayers probed with confocal, atomic force, and near-field microscopy. Biophysical Journal. 75: 342-53 |
| Shiku H, Hollars CW, Lee MA, et al. (1998) Probing biological systems with near-field optics Proceedings of Spie - the International Society For Optical Engineering. 3273: 156-164 |