Ahmad A. Al-Yamani, Ph.D.
Affiliations: | 2004 | Stanford University, Palo Alto, CA |
Google:
"Ahmad Al-Yamani"Parents
Sign in to add mentor| Edward J. Mccluskey | grad student | 2004 | Stanford | |
| (Deterministic built -in self test for digital circuits.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Al-Yamani AA, McCluskey EJ. (2010) Test set compression through alternation between deterministic and pseudorandom test patterns Journal of Electronic Testing: Theory and Applications (Jetta). 26: 513-521 |
| El-Maleh AH, Ali MI, Al-Yamani AA. (2009) Reconfigurable broadcast scan compression using relaxation-based test vector decomposition Iet Computers and Digital Techniques. 3: 143-161 |
| Al-Yamani A, Devta-Prasanna N, Gunda A. (2008) Comparative study of centralised and distributed compatibility-based test data compression Iet Computers and Digital Techniques. 2: 108-117 |
| Al-Yamani AA. (2008) Enhanced digital test and characterization of controlled-impedance buffers Arabian Journal For Science and Engineering. 33: 131-141 |
| Al-Yamani AA, Ramsundar S, Pradhan DK. (2007) A defect tolerance scheme for nanotechnology circuits Ieee Transactions On Circuits and Systems I: Regular Papers. 54: 2402-2409 |
| Al-Yamani A, Devta-Prasanna N, Chmelar E, et al. (2007) Scan test cost and power reduction through systematic scan reconfiguration Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 26: 907-918 |
| El-Maleh AH, Ali MI, Al-Yamani AA. (2007) A reconfigurable broadcast scan compression scheme using relaxation based test vector decomposition Proceedings of the Asian Test Symposium. 91-94 |
| Al-Yamani AA, Devta-Prasanna N, Gunda A. (2007) Systematic scan reconfiguration Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 738-743 |
| Al-Yamani AA. (2007) Energy-delay efficient test Iet Computers and Digital Techniques. 1: 653-658 |
| Al-Yamani AA. (2006) DFT for controlled-impedance I/O buffers Proceedings - Design Automation Conference. 405-410 |