Edward Mccluskey

Computer Science Stanford University, Palo Alto, CA 
"Edward Mccluskey"


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Samuel Caldwell grad student 1956 MIT


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Janusz A. (John) Brzozowski grad student 1962 Princeton (E-Tree)
Samuel Henry Fuller grad student 1972 Stanford
Daniel P. Siewiorek grad student 1972 Stanford
Jacob A. Abraham grad student 1974 Stanford (E-Tree)
Joseph L. A. Hughes grad student 1986 Stanford (E-Tree)
Nur A. Touba grad student 1996 Stanford (E-Tree)
Wei-Je Huang grad student 2001 Stanford
Nahmsuk Oh grad student 2001 Stanford
Philip P. Shirvani grad student 2001 Stanford
Chien-Mo Li grad student 2002 Stanford
Shu-Yi Yu grad student 2002 Stanford
Mehdi Baradaran Tahoori grad student 2003 Stanford
Ahmad A. Al-Yamani grad student 2004 Stanford
Erik Chmelar grad student 2004 Stanford
Kyoung Y. Cho grad student 2008 Stanford
Francois-Fabien Ferhani grad student 2008 Stanford
Donghwi Lee grad student 2008 Stanford
Intaik Park grad student 2009 Stanford
Jackwang Lee grad student 2010 Stanford
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Iribarren C, Phelps BH, Darbinian JA, et al. (2011) Circulating angiopoietins-1 and -2, angiopoietin receptor Tie-2 and vascular endothelial growth factor-A as biomarkers of acute myocardial infarction: a prospective nested case-control study. Bmc Cardiovascular Disorders. 11: 31
Al-Yamani AA, McCluskey EJ. (2010) Test set compression through alternation between deterministic and pseudorandom test patterns Journal of Electronic Testing: Theory and Applications (Jetta). 26: 513-521
Lee J, Park I, McCluskey EJ. (2008) Error sequence analysis Proceedings of the Ieee Vlsi Test Symposium. 255-260
Ferhani FF, Saxena NR, McCluskey EJ, et al. (2008) How many test patterns are useless? Proceedings of the Ieee Vlsi Test Symposium. 23-28
Park I, Lee D, Chmelar E, et al. (2008) Inconsistent fails due to limited tester timing accuracy Proceedings of the Ieee Vlsi Test Symposium. 47-52
Park I, McCluskey EJ. (2008) Launch-on-shift-capture transition tests Proceedings - International Test Conference
Lee J, McCluskey EJ. (2008) Failing frequency signature analysis Proceedings - International Test Conference
Cho KY, Mitra S, McCluskey EJ. (2008) California scan architecture for high quality and low power testing Proceedings - International Test Conference
Cho KY, McCluskey EJ. (2007) Test set reordering using the gate exhaustive test metric Proceedings of the Ieee Vlsi Test Symposium. 199-204
Ferhani FF, McCluskey EJ. (2007) Classifying bad chips and ordering test sets Proceedings - International Test Conference
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