Janak H. Patel

Affiliations: 
University of Illinois, Urbana-Champaign, Urbana-Champaign, IL 
Area:
Electronics and Electrical Engineering, Computer Science
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"Janak Patel"

Children

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Kaushik Roy grad student 1990 UIUC (E-Tree)
Liyang Lai grad student 2005 UIUC
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Publications

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Lai L, Patel JH, Rinderknecht T, et al. (2005) Hardware efficient LBIST with complementary weights Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 2005: 479-481
Sharma M, Patel JH. (2004) What does robust testing a subset of paths, tell us about the untested paths in the circuit? Proceedings of the Ieee Vlsi Test Symposium. 31-36
Xiang D, Patel JH. (2004) Partial scan design based on circuit state information and functional analysis Ieee Transactions On Computers. 53: 276-287
Shah MA, Patel JH. (2004) Enhancement of the Illinois Scan Architecture for use with multiple scan inputs Proceedings - Ieee Computer Society Annual Symposium On Vlsi: Emerging Trends in Vlsi Systems Design. 167-172
Iyer RK, Sanders WH, Patel JH, et al. (2004) The evolution of dependable computing at the University of Illinois Ifip Advances in Information and Communication Technology. 156: 135-164
Lai L, Rinderknecht T, Cheng WT, et al. (2004) Logic BIST using constrained scan cells Proceedings of the Ieee Vlsi Test Symposium. 199-205
Lai L, Patel JH, Rinderknecht T, et al. (2004) Logic BIST with scan chain segmentation Proceedings - International Test Conference. 57-66
Patel JH, Lumetta SS, Reddy SM. (2003) Application of Saluja-Karpovsky compactors to test responses with many unknowns Proceedings of the Ieee Vlsi Test Symposium. 2003: 107-112
Sharma M, Patel JH, Rearick J. (2003) Test data compression and test time reduction of longest-path-per-gate tests based on Illinois scan architecture Proceedings of the Ieee Vlsi Test Symposium. 2003: 15-21
Pandey AR, Patel JH. (2002) Reconfiguration technique for reducing test time and test data volume in Illinois Scan Architecture based designs Proceedings of the Ieee Vlsi Test Symposium. 2002: 9-15
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