Achintya Halder, Ph.D.

2006 Georgia Institute of Technology, Atlanta, GA 
Electronics and Electrical Engineering
"Achintya Halder"


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Abhijit Chatterjee grad student 2006 Georgia Tech
 (Efficient alternate test generation for RF transceiver architectures.)
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Chakraborti T, Chatterjee A, Halder A, et al. (2015) Automated emotion recognition employing a novel modified binary quantum-behaved gravitational search algorithm with differential mutation Expert Systems
Halder A, Bhattacharya S. (2012) Spectroscopic and quantum chemical investigation on non-covalent interaction in chromophore appended fullerene complexes of calix[4]arene Spectrochimica Acta - Part a: Molecular and Biomolecular Spectroscopy. 99: 335-341
Halder A, Mukherjee DC, Bhattacharya S. (2010) Photophysical investigations on determination of ionicity and electronic structures for the non-covalent complexes of calix[4]resorcinarene with fullerenes C60 and C70 in the solution state Journal of Solution Chemistry. 39: 1327-1340
Halder A, Bhattacharya S, Chatterjee A. (2008) System-level specification testing of wireless transceivers Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 16: 263-276
Halder A, Chatterjee A. (2006) Low-cost production testing of wireless transmitters Proceedings of the Ieee International Conference On Vlsi Design. 2006: 437-442
Halder A, Chatterjee A. (2005) Low-cost alternate EVM test for wireless receiver systems Proceedings of the Ieee Vlsi Test Symposium. 255-260
Halder A, Chatterjee A. (2005) Low-cost production test of BER for wireless receivers Proceedings of the Asian Test Symposium. 2005: 64-69
Halder A, Chatterjee A. (2005) Test generation for specification test of analog circuits using efficient test response observation methods Microelectronics Journal. 36: 820-832
Akbay SS, Halder A, Chatterjee A, et al. (2004) Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs Ieee Transactions On Advanced Packaging. 27: 352-363
Halder A, Chatterjee A. (2004) Automated test generation and test point selection for specification test of analog circuits Proceedings - 5th International Symposium On Quality Electronic Design, Isqued 2004. 401-406
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