Achintya Halder, Ph.D.
Affiliations: | 2006 | Georgia Institute of Technology, Atlanta, GA |
Area:
Electronics and Electrical EngineeringGoogle:
"Achintya Halder"Parents
Sign in to add mentor| Abhijit Chatterjee | grad student | 2006 | Georgia Tech | |
| (Efficient alternate test generation for RF transceiver architectures.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Halder A, Bhattacharya S, Chatterjee A. (2008) System-level specification testing of wireless transceivers Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 16: 263-276 |
| Halder A, Chatterjee A. (2006) Low-cost production testing of wireless transmitters Proceedings of the Ieee International Conference On Vlsi Design. 2006: 437-442 |
| Halder A, Chatterjee A. (2005) Low-cost alternate EVM test for wireless receiver systems Proceedings of the Ieee Vlsi Test Symposium. 255-260 |
| Halder A, Chatterjee A. (2005) Low-cost production test of BER for wireless receivers Proceedings of the Asian Test Symposium. 2005: 64-69 |
| Halder A, Chatterjee A. (2005) Test generation for specification test of analog circuits using efficient test response observation methods Microelectronics Journal. 36: 820-832 |
| Bhattacharya S, Halder A, Srinivasan G, et al. (2005) Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications Journal of Electronic Testing. 21: 323-339 |
| Akbay SS, Halder A, Chatterjee A, et al. (2004) Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs Ieee Transactions On Advanced Packaging. 27: 352-363 |
| Halder A, Chatterjee A. (2004) Automated test generation and test point selection for specification test of analog circuits Proceedings - 5th International Symposium On Quality Electronic Design, Isqued 2004. 401-406 |
| Halder A, Bhattacharya S, Chatterjee A. (2003) Automatic multitone alternate test generaton for RF circuits using behavioral models Ieee International Test Conference (Tc). 665-673 |
| Halder A, Chatterjee A. (2001) Specification based digital compatible built-in test of embdded analog circuits Proceedings of the Asian Test Symposium. 344-349 |