Amy V. Kauppila, Ph.D.
Affiliations: | 2012 | Electrical Engineering and Computer Science | Vanderbilt University, Nashville, TN |
Area:
Electronics and Electrical EngineeringGoogle:
"Amy Kauppila"Parents
Sign in to add mentor| Bharat L. Bhuva | grad student | 2012 | Vanderbilt | |
| (Analysis of parameter variation impact on the single event response in sub-100 nm CMOS storage cells.) | ||||
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Publications
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| Gaspard N, Jagannathan S, Diggins Z, et al. (2013) Effect of threshold voltage implants on single-event error rates of D flip-flops in 28-nm bulk CMOS Ieee International Reliability Physics Symposium Proceedings. SE.7.1-SE.7.3 |
| Kauppila AV, Bhuva BL, Loveless TD, et al. (2012) Effect of negative bias temperature instability on the single event upset response of 40 nm flip-flops Ieee Transactions On Nuclear Science. 59: 2651-2657 |
| Kauppila AV, Ball DR, Bhuva BL, et al. (2012) Impact of process variations on upset reversal in a 65 nm flip-flop Ieee Transactions On Nuclear Science. 59: 886-892 |
| Kauppila JS, Haeffner TD, Ball DR, et al. (2011) Circuit-level layout-aware single-event sensitive-area analysis of 40-nm bulk CMOS flip-flops using compact modeling Ieee Transactions On Nuclear Science. 58: 2680-2686 |
| Kauppila AV, Bhuva BL, Massengill LW, et al. (2011) Impact of process variations and charge sharing on the single-event-upset response of flip-flops Ieee Transactions On Nuclear Science. 58: 2658-2663 |
| Kauppila AV, Bhuva BL, Kauppila JS, et al. (2011) Impact of process variations on SRAM single event upsets Ieee Transactions On Nuclear Science. 58: 834-839 |
| Kauppila AV, Bhuva BL, Massengill LW, et al. (2011) Impact of process variations on charge-sharing induced upset reversal in a 65nm flip-flop Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 262-265 |
| Kauppila AV, Loveless TD, Vaughn GL, et al. (2009) Analysis of the single event effects for a 90nm CMOS phase-locked loop Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 201-206 |
| Kauppila AV, Vaughn GL, Kauppila JS, et al. (2007) Probabilistic evaluation of analog single event transients Ieee Transactions On Nuclear Science. 54: 2131-2136 |