Xin Sun

Affiliations: 
2010 Electrical Engineering & Computer Sciences University of California, Berkeley, Berkeley, CA, United States 
Google:
"Xin Sun"
Mean distance: (not calculated yet)
 

Parents

Sign in to add mentor
Tsu-Jae King Liu grad student 2010 UC Berkeley
 (Nanoscale bulk MOSFET design and process technology for reduced variability.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Ho B, Sun X, Shin C, et al. (2013) Design Optimization of Multigate Bulk MOSFETs Ieee Transactions On Electron Devices. 60: 28-33
Ho B, Sun X, Xu N, et al. (2012) First Demonstration of Quasi-Planar Segmented-Channel MOSFET Design for Improved Scalability Ieee Transactions On Electron Devices. 59: 2273-2276
Sun X, Moroz V, Damrongplasit N, et al. (2011) Variation study of the planar ground-plane bulk MOSFET, SOI FinFET, and trigate bulk MOSFET designs Ieee Transactions On Electron Devices. 58: 3294-3299
Shin C, Damrongplasit N, Sun X, et al. (2011) Performance and yield benefits of quasi-planar bulk CMOS technology for 6-T SRAM at the 22-nm node Ieee Transactions On Electron Devices. 58: 1846-1854
Sun X, Liu TK. (2010) Spacer Gate Lithography for Reduced Variability Due to Line Edge Roughness Ieee Transactions On Semiconductor Manufacturing. 23: 311-315
Sun X, Liu TK. (2009) Scale-Length Assessment of the Trigate Bulk MOSFET Design Ieee Transactions On Electron Devices. 56: 2840-2842
Shin C, Sun X, Liu TK. (2009) Study of Random-Dopant-Fluctuation (RDF) Effects for the Trigate Bulk MOSFET Ieee Transactions On Electron Devices. 56: 1538-1542
Sun X, Lu Q, Moroz V, et al. (2008) Tri-gate bulk MOSFET design for CMOS scaling to the end of the roadmap Ieee Electron Device Letters. 29: 491-493
Sun X, Lu Q, Takeuchi H, et al. (2007) Selective enhancement of SiO2 etch rate by Ar-ion implantation for improved etch depth control Electrochemical and Solid-State Letters. 10: 89-91
See more...