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Gary D. Powell, Ph.D. - Publications

Affiliations: 
2000 North Carolina State University, Raleigh, NC 
Area:
Electronic Materials, Optics
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5 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2006 Brinkley MK, Powell GD, Aspnes DE. Systematic approach for analyzing reflectance-difference spectra: Application to silicon-dielectric interfaces Applied Physics Letters. 88. DOI: 10.1063/1.2204844  0.427
2003 Aspnes DE, Hansen JK, Peng HJ, Powell GD, Wang JFT. Simplified bond-hyperpolarizability model of second- and fourth-harmonic generation: Application to Si-SiO2 interfaces Physica Status Solidi (B) Basic Research. 240: 509-517. DOI: 10.1002/Pssb.200303825  0.484
2002 Wang JFT, Powell GD, Johnson RS, Lucovsky G, Aspnes DE. Simplified bond-hyperpolarizability model of second harmonic generation: Application to Si-dielectric interfaces Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 1699-1705. DOI: 10.1116/1.1493783  0.456
2000 Edwards NV, Madsen LD, Robbie K, Powell GD, Järrendahl K, Cobet C, Esser N, Richter W, Aspnes DE. Real-time assessment of overlayer removal on 4H-SiC surfaces: Techniques and relevance to contact formation Materials Science Forum. 338: 1033-1036. DOI: 10.4028/Www.Scientific.Net/Msf.338-342.1033  0.465
2000 Edwards NV, Järrendahl K, Aspnes DE, Robbie K, Powell GD, Cobet C, Esser N, Richter W, Madsen LD. Real-time assessment of selected surface preparation regimens for 4H-SiC surfaces using spectroscopic ellipsometry Surface Science. 464: L703-L707. DOI: 10.1016/S0039-6028(00)00689-0  0.457
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