Joel C. Weber, Ph.D.
Affiliations: | 2014 | Mechanical Engineering | University of Colorado, Boulder, Boulder, CO, United States |
Area:
Mechanical Engineering, Materials Science Engineering, NanotechnologyGoogle:
"Joel Weber"Parents
Sign in to add mentorVictor M. Bright | grad student | 2014 | CU Boulder | |
(Advancing microscope and probe design for near-field scanning microwave microscopy.) |
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Publications
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Blanchard P, Brubaker M, Harvey T, et al. (2025) Characterization of Sub-Monolayer Contaminants at the Regrowth Interface in GaN Nanowires Grown by Selective-Area Molecular Beam Epitaxy. Crystals. 8 |
Spann BT, Weber JC, Brubaker MD, et al. (2023) Semiconductor Thermal and Electrical Properties Decoupled by Localized Phonon Resonances. Advanced Materials (Deerfield Beach, Fla.). e2209779 |
Brubaker MD, Genter KL, Weber JC, et al. (2018) Core-shell GaN nanowire LEDs by N-polar selective area growth. Proceedings of Spie--the International Society For Optical Engineering. 10725 |
Blanchard P, Brubaker M, Harvey T, et al. (2018) Characterization of Sub-Monolayer Contaminants at the Regrowth Interface in GaN Nanowires Grown by Selective-Area Molecular Beam Epitaxy Crystals. 8: 178 |
Weber J, Brubaker M, Wallis T, et al. (2017) Lithographic sonication patterning of large area GaN nanopillar forests grown on a Si substrate Microelectronic Engineering. 181: 43-46 |
Berweger S, Weber JC, John J, et al. (2015) Microwave near-field imaging of two-dimensional semiconductors. Nano Letters. 15: 1122-7 |
Weber JC, Blanchard PT, Sanders AW, et al. (2014) GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy. Nanotechnology. 25: 415502 |
Imtiaz A, Wallis TM, Weber JC, et al. (2014) Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope Applied Physics Letters. 104 |
Weber JC, Blanchard PT, Sanders AW, et al. (2014) Gallium nitride nanowire probe for near-field scanning microwave microscopy Applied Physics Letters. 104 |
Weber JC, Schlager JB, Sanford NA, et al. (2012) A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics. The Review of Scientific Instruments. 83: 083702 |