Joel C. Weber, Ph.D.

Affiliations: 
2014 Mechanical Engineering University of Colorado, Boulder, Boulder, CO, United States 
Area:
Mechanical Engineering, Materials Science Engineering, Nanotechnology
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"Joel Weber"

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Victor M. Bright grad student 2014 CU Boulder
 (Advancing microscope and probe design for near-field scanning microwave microscopy.)
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Publications

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Blanchard P, Brubaker M, Harvey T, et al. (2025) Characterization of Sub-Monolayer Contaminants at the Regrowth Interface in GaN Nanowires Grown by Selective-Area Molecular Beam Epitaxy. Crystals. 8
Spann BT, Weber JC, Brubaker MD, et al. (2023) Semiconductor Thermal and Electrical Properties Decoupled by Localized Phonon Resonances. Advanced Materials (Deerfield Beach, Fla.). e2209779
Brubaker MD, Genter KL, Weber JC, et al. (2018) Core-shell GaN nanowire LEDs by N-polar selective area growth. Proceedings of Spie--the International Society For Optical Engineering. 10725
Blanchard P, Brubaker M, Harvey T, et al. (2018) Characterization of Sub-Monolayer Contaminants at the Regrowth Interface in GaN Nanowires Grown by Selective-Area Molecular Beam Epitaxy Crystals. 8: 178
Weber J, Brubaker M, Wallis T, et al. (2017) Lithographic sonication patterning of large area GaN nanopillar forests grown on a Si substrate Microelectronic Engineering. 181: 43-46
Berweger S, Weber JC, John J, et al. (2015) Microwave near-field imaging of two-dimensional semiconductors. Nano Letters. 15: 1122-7
Weber JC, Blanchard PT, Sanders AW, et al. (2014) GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy. Nanotechnology. 25: 415502
Imtiaz A, Wallis TM, Weber JC, et al. (2014) Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope Applied Physics Letters. 104
Weber JC, Blanchard PT, Sanders AW, et al. (2014) Gallium nitride nanowire probe for near-field scanning microwave microscopy Applied Physics Letters. 104
Weber JC, Schlager JB, Sanford NA, et al. (2012) A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics. The Review of Scientific Instruments. 83: 083702
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