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Sudhakar M. Pandit

Affiliations: 
Mechanical Engineering-Engineering Mechanics Michigan Technological University, USA 
Area:
Mechanical Engineering
Website:
https://www.mtu.edu/mechanical/people/emeriti-faculty/pandit/
Google:
"Sudhakar Pandit"
Bio:

https://books.google.com/books?id=rtfPAAAAMAAJ
https://www.proquest.com/openview/c557b50a84736818b0831eb4df6957ee/1

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Parents

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Shien-Ming Sam Wu grad student 1973 UW Madison
 (Data Dependent Systems: Modeling Analysis and Optimal Control Via Time Series)

Children

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Kamlakar P. Rajurkar grad student 1981 Michigan Technological University
Huanran Xue grad student 2003 Michigan Technological University
Jason T. Dreyer grad student 2009 Michigan Technological University

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Publications

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Rickli JL, Camelio JA, Dreyer JT, et al. (2011) Fault detection and prognosis of assembly locating systems using piezoelectric transducers Journal of Intelligent Manufacturing. 22: 909-918
Dreyer J, Rao MD, Pandit SM. (2007) Estimation of sound absorption of three-dimensional treatments based on impedance tube measurements Noise Control Engineering Journal. 55: 466-475
Mattson SG, Pandit SM. (2006) Statistical moments of autoregressive model residuals for damage localisation Mechanical Systems and Signal Processing. 20: 627-645
Roth JT, Pandit SM. (2000) Development of a Cutting Direction and Sensor Orientation Independent Monitoring Technique for End-Milling Journal of Manufacturing Science and Engineering-Transactions of the Asme. 122: 671-677
Pandit SM, Chan DP. (1999) Data-dependent systems profilometry of two-dimensional surfaces. Applied Optics. 38: 6540-9
Roth JT, Pandit SM. (1999) Monitoring end-mill wear and predicting tool failure using accelerometers Journal of Manufacturing Science and Engineering-Transactions of the Asme. 121: 559-567
Jordache N, Pandit SM, Cronin KM. (1999) Finite Element Geometry Creation Using Three-Dimensional Laser Profilometry Journal of Manufacturing Science and Engineering-Transactions of the Asme. 121: 87-92
Pandit SM, Guo R. (1997) Profile Recognition and Mensuration in Machine Vision Journal of Manufacturing Science and Engineering-Transactions of the Asme. 119: 417-424
Pandit SM, Paul D, Roth JT. (1996) Monitoring and diagnosis of bearing defects using data dependent systems Integrated Computer-Aided Engineering. 3: 268-278
Pandit SM, Jordache N. (1995) Interferogram analysis based on the data-dependent systems method for nanometrology applications. Applied Optics. 34: 6695-703
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