Zuoguang Liu, Ph.D.
Affiliations: | 2012 | Electrical Engineering | Yale University, New Haven, CT |
Area:
Electronics and Electrical Engineering, General PhysicsGoogle:
"Zuoguang Liu"Parents
Sign in to add mentor| Tso-Ping Ma | grad student | 2012 | Yale | |
| (Advanced High-k Dielectrics for MOS Transistors Based on Silicon and III-V Channels.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Liu Z, Cui S, Shekhter P, et al. (2011) Effect of H on interface properties of Al2O3/In0.53Ga0.47As Applied Physics Letters. 99: 222104 |
| Shekhter P, Kornblum L, Liu Z, et al. (2011) Effect of hydrogen on the chemical bonding and band structure at the Al2O3/In0.53Ga0.47As interface Applied Physics Letters. 99: 232103 |
| Reiner JW, Cui S, Liu Z, et al. (2010) Inelastic electron tunneling spectroscopy study of thin gate dielectrics. Advanced Materials (Deerfield Beach, Fla.). 22: 2962-8 |
| Cui S, Peng C, Zhang W, et al. (2010) High-Quality $\hbox{Al}_{2}\hbox{O}_{3}$ for Low-Voltage High-Speed High-Temperature (Up to 250 $^{\circ}\hbox{C}$) Nonvolatile Memory Technology Ieee Electron Device Letters. 31: 1443-1445 |
| Liu Z, Cui S, Kornblum L, et al. (2010) Inelastic electron tunneling spectroscopy study of ultrathin Al2O3–TiO2 dielectric stack on Si Applied Physics Letters. 97: 202905 |
| Liu Z, Ma TP. (2010) Determination of energy and spatial distributions of traps in ultrathin dielectrics by use of inelastic electron tunneling spectroscopy Applied Physics Letters. 97: 172102 |
| Liu Z, Guo D, Xiu K, et al. (2010) Intrinsic effective mobility extraction with extremely scaled gate dielectrics Applied Physics Letters. 97: 23509 |