Donald C. DeGroot

Affiliations: 
University of Colorado, Boulder, Boulder, CO, United States 
Area:
Electronics and Electrical Engineering
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"Donald DeGroot"
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Publications

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Rolain Y, Van Moer W, Jargon JA, et al. (2007) On Peculiarities of $S$-Parameter Measurements Ieee Transactions On Instrumentation and Measurement. 56: 1967-1972
Jargon JA, Splett JD, Vecchia DF, et al. (2007) An Empirical Model for the Warm-Up Drift of a Commercial Harmonic Phase Standard Ieee Transactions On Instrumentation and Measurement. 56: 931-937
Booth JC, Leong K, Schima SA, et al. (2005) Phase-sensitive measurements of nonlinearity in high-temperature superconductor thin films Ieee Transactions On Applied Superconductivity. 15: 1000-1003
Jargon JA, DeGroot DC, Gupta KC. (2004) Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements. Journal of Research of the National Institute of Standards and Technology. 109: 407-27
Booth JC, Schima SA, DeGroot DC. (2003) Description of the nonlinear behavior of superconductors using a complex conductivity Ieee Transactions On Applied Superconductivity. 13: 315-319
Jargon J, Gupta KC, Cidronali A, et al. (2003) Expanding definitions of gain by taking harmonic content into account International Journal of Rf and Microwave Computer-Aided Engineering. 13: 357-369
Remley KA, Williams DF, DeGroot DC, et al. (2001) Effects of nonlinear diode junction capacitance on the nose-to-nose calibration Ieee Microwave and Wireless Components Letters. 11: 196-198
Jargon JA, Gupta KC, DeGroot DC. (2001) Applications of artificial neural networks to RF and microwave measurements International Journal of Rf and Microwave Computer-Aided Engineering. 12: 3-24
Jargon JA, Gupta KC, DeGroot DC. (2000) Artificial neural network modeling for improved on-wafer OSLT calibration standards International Journal of Rf and Microwave Computer-Aided Engineering. 10: 319-328
Milanovic V, Ozgur M, Degroot DC, et al. (1998) Characterization of broad-band transmission for coplanar waveguides on cmos silicon substrates Ieee Transactions On Microwave Theory and Techniques. 46: 632-640
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