James C. Switzer, Ph.D.

Affiliations: 
2013 Materials Science State University of New York at Binghamton, Vestal, NY, United States 
Area:
Materials Science Engineering
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"James Switzer"

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Mark D. Poliks grad student 2013 SUNY Binghamton
 (Characterization of physical vapor deposited and patterned thin films for roll-to-roll flexible passive and active electronic devices.)
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Publications

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Shan S, Zhao W, Luo J, et al. (2014) Flexibility characteristics of a polyethylene terephthalate chemiresistor coated with a nanoparticle thin film assembly Journal of Materials Chemistry C. 2: 1893-1903
Hamasha MM, Alzoubi K, Switzer JC, et al. (2012) Reliability of sputtered aluminum thin film on flexible substrate under high cyclic bending fatigue conditions Ieee Transactions On Components, Packaging and Manufacturing Technology. 2: 2007-2016
Hamasha MM, Alzoubi K, Switzer JC, et al. (2011) A study on crack propagation and electrical resistance change of sputtered aluminum thin film on poly ethylene terephthalate substrate under stretching Thin Solid Films. 519: 7918-7924
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