Year |
Citation |
Score |
2011 |
Keenan C, Chandril S, Myers TH, Lederman D. In-situ stoichiometry determination using x-ray fluorescence generated by reflection-high-energy-electron-diffraction Journal of Applied Physics. 109. DOI: 10.1063/1.3592219 |
0.645 |
|
2009 |
Chandril S, Keenan C, Myers TH, Lederman D. In situ thin film and multilayer structural characterization using x-ray fluorescence induced by reflection high energy electron diffraction Journal of Applied Physics. 106. DOI: 10.1063/1.3177346 |
0.618 |
|
2008 |
Keenan C, Chandril S, Myers TH, Lederman D, Ramos-Moore E, Cabrera AL. Properties of YMn O3 self-assembled nanocrystalline prisms on GaN Applied Physics Letters. 92. DOI: 10.1063/1.2831003 |
0.607 |
|
2008 |
Swartz CH, Durbin SM, Anderson PA, Carder D, Reeves RJ, Chandril S, Myers TH, Kennedy VJ, Ahrenkiel SP. Mg doping of InN and the use of yttrium-stabilised zirconia substrates Physica Status Solidi (C) Current Topics in Solid State Physics. 5: 508-510. DOI: 10.1002/Pssc.200777470 |
0.417 |
|
2007 |
Liu T, Chandril S, Ptak AJ, Korakakis D, Myers TH. Bismuth surfactant effects for GaAsN and beryllium doping of GaAsN and GaInAsN grown by molecular beam epitaxy Journal of Crystal Growth. 304: 402-406. DOI: 10.1016/J.Jcrysgro.2007.04.013 |
0.463 |
|
2006 |
Liu T, Chandril S, Schires ED, Wu N, Chen X, Korakakis D, Myers TH. Changes in optical properties of GaAsN during annealing Materials Research Society Symposium Proceedings. 891: 541-545. DOI: 10.1557/Proc-0891-Ee11-05 |
0.499 |
|
2006 |
Anderson PA, Swartz CH, Carder D, Reeves RJ, Durbin SM, Chandril S, Myers TH. Buried p -type layers in Mg-doped InN Applied Physics Letters. 89. DOI: 10.1063/1.2378489 |
0.396 |
|
2006 |
Swartz CH, Chandril S, Tompkins RP, Giles NC, Myers TH, Edwall DD, Piquette EG, Kim CS, Vurgaftman I, Meyer JR. Accurate measurement of composition, carrier concentration, and photoconductive lifetime in Hg i-xCd xTe grown by molecular beam epitaxy Journal of Electronic Materials. 35: 1360-1368. DOI: 10.1007/S11664-006-0269-8 |
0.614 |
|
2006 |
Lee K, Tompkins RP, Chandril S, Keenan C, Schires ED, Lederman D, Myers TH. Advances in the use of RHEED-TRAX and cathodoluminescence for in-situ growth characterization and control Materials Research Society Symposium Proceedings. 967: 130-158. |
0.604 |
|
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