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Theodore H. Scabarozi, Ph.D. - Publications

Affiliations: 
2009 Drexel University, Philadelphia, PA, United States 
Area:
Materials Science Engineering
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8 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Scabarozi TH, Benjamin S, Adamson B, Applegate J, Roche J, Pfeiffer E, Steinmetz C, Lunk C, Barsoum MW, Hettinger JD, Lofland SE. Combinatorial investigation of the stoichiometry, electronic transport and elastic properties of (Cr1-xVx)2GeC thin films Scripta Materialia. 66: 85-88. DOI: 10.1016/J.Scriptamat.2011.10.001  0.518
2011 Barsoum MW, Scabarozi TH, Amini S, Hettinger JD, Lofland SE. Electrical and thermal properties of Cr 2GeC Journal of the American Ceramic Society. 94: 4123-4126. DOI: 10.1111/J.1551-2916.2011.04886.X  0.518
2011 Scabarozi TH, Hettinger JD, Lofland SE, Lu J, Hultman L, Jensen J, Eklund P. Epitaxial growth and electrical-transport properties of Ti 7Si2C5 thin films synthesized by reactive sputter-deposition Scripta Materialia. 65: 811-814. DOI: 10.1016/J.Scriptamat.2011.07.038  0.375
2009 Scabarozi TH, Gennaoui C, Roche J, Flemming T, Wittenberger K, Hann P, Adamson B, Rosenfeld A, Barsoum MW, Hettinger JD, Lofland SE. Combinatorial investigation of (Ti1-xNbx)2 AlC Applied Physics Letters. 95. DOI: 10.1063/1.3207748  0.516
2009 Scabarozi TH, Amini S, Leaffer O, Ganguly A, Gupta S, Tambussi W, Clipper S, Spanier JE, Barsoum MW, Hettinger JD, Lofland SE. Thermal expansion of select Mn+1AXn(M=early transition metal, A=A group element, X=C or N) phases measured by high temperature x-ray diffraction and dilatometry Journal of Applied Physics. 105. DOI: 10.1063/1.3021465  0.548
2009 Scabarozi TH, Roche J, Rosenfeld A, Lim SH, Salamanca-Riba L, Yong G, Takeuchi I, Barsoum MW, Hettinger JD, Lofland SE. Synthesis and characterization of Nb2AlC thin films Thin Solid Films. 517: 2920-2923. DOI: 10.1016/J.Tsf.2008.12.047  0.559
2008 Scabarozi TH, Amini S, Finkel P, Leaffer OD, Spanier JE, Barsoum MW, Drulis M, Drulis H, Tambussi WM, Hettinger JD, Lofland SE. Electrical, thermal, and elastic properties of the MAX-phase Ti2 SC Journal of Applied Physics. 104. DOI: 10.1063/1.2959738  0.581
2008 Scabarozi TH, Eklund P, Emmerlich J, Högberg H, Meehan T, Finkel P, Barsoum MW, Hettinger JD, Hultman L, Lofland SE. Weak electronic anisotropy in the layered nanolaminate Ti 2 GeC Solid State Communications. 146: 498-501. DOI: 10.1016/J.Ssc.2008.03.026  0.546
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