Kenneth R. Farmer - Publications

Affiliations: 
New Jersey Institute of Technology, Newark, NJ, United States 
Area:
Condensed Matter Physics

7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2006 Wang X, Li B, Roman HT, Russo OL, Chin K, Farmer KR. Acousto-optical PD detection for transformers Ieee Transactions On Power Delivery. 21: 1068-1073. DOI: 10.1109/Tpwrd.2005.861242  0.352
2006 Wang X, Li B, Russo OL, Roman HT, Chin KK, Farmer KR. Diaphragm design guidelines and an optical pressure sensor based on MEMS technique Microelectronics Journal. 37: 50-56. DOI: 10.1016/J.Mejo.2005.06.015  0.316
2005 Wang X, Li B, Xiao Z, Russo OL, Roman HT, Chin K, Farmer KR. Power engineering letters: Acoustic energy shifting in transformer oil at different temperatures Ieee Transactions On Power Delivery. 20: 2356-2357. DOI: 10.1109/Tpwrd.2005.844238  0.304
2005 Wang X, Li B, Xiao Z, Lee SH, Roman H, Russo OL, Chin KK, Farmer KR. An ultra-sensitive optical MEMS sensor for partial discharge detection Journal of Micromechanics and Microengineering. 15: 521-527. DOI: 10.1088/0960-1317/15/3/012  0.37
2003 Khusid B, Yeksel M, Acrivos A, Markarian N, Farmer KR. Manipulation of particle motions and their segregation in micro-fluidics by positive dielectrophoresis American Society of Mechanical Engineers, Materials Division (Publication) Md. 98: 241-245. DOI: 10.1115/Imece2003-43008  0.322
2003 Markarian N, Yeksel M, Khusid B, Farmer KR, Acrivos A. Particle motions and segregation in dielectrophoretic microfluidics Journal of Applied Physics. 94: 4160-4169. DOI: 10.1063/1.1600845  0.315
2003 Markarian N, Yeksel M, Khusid B, Farmer K, Acrivos A. Limitations on the scale of an electrode array for trapping particles in microfluidics by positive dielectrophoresis Applied Physics Letters. 82: 4839-4841. DOI: 10.1063/1.1587882  0.303
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