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Scott Johnston - Publications

Affiliations: 
Hardware Engineer Apple Inc. 
 2013-2018 Stanford University, Palo Alto, CA 
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Johnston SR, Ng E, Fong SW, Mok WY, Park J, Zalden P, Sakdinawat A, Wong HP, Mabuchi H, Shen Z. Scanning microwave imaging of optically patterned Ge2Sb2Te5 Applied Physics Letters. 114: 093106. DOI: 10.1063/1.5052018  0.383
2018 Johnston SR, Ma EY, Shen ZX. Optically coupled methods for microwave impedance microscopy. The Review of Scientific Instruments. 89: 043703. PMID 29716321 DOI: 10.1063/1.5011391  0.432
2017 Johnston SR, Yang Y, Cui Y, Ma EY, Kämpfe T, Eng LM, Zhou J, Chen Y, Lu M, Shen Z. Measurement of surface acoustic wave resonances in ferroelectric domains by microwave microscopy Journal of Applied Physics. 122: 074101. DOI: 10.1063/1.4997474  0.409
2016 Wei Z, Ma EY, Cui YT, Johnston S, Yang Y, Agarwal K, Kelly MA, Shen ZX, Chen X. Quantitative analysis of effective height of probes in microwave impedance microscopy. The Review of Scientific Instruments. 87: 094701. PMID 27782549 DOI: 10.1063/1.4962242  0.519
2016 Zalden P, Shu MJ, Chen F, Wu X, Zhu Y, Wen H, Johnston S, Shen ZX, Landreman P, Brongersma M, Fong SW, Wong HP, Sher MJ, Jost P, Kaes M, et al. Picosecond Electric-Field-Induced Threshold Switching in Phase-Change Materials. Physical Review Letters. 117: 067601. PMID 27541475 DOI: 10.1103/Physrevlett.117.067601  0.452
2016 Wei Z, Cui YT, Ma EY, Johnston S, Yang Y, Chen R, Kelly M, Shen ZX, Chen X. Quantitative Theory for Probe-Sample Interaction With Inhomogeneous Perturbation in Near-Field Scanning Microwave Microscopy Ieee Transactions On Microwave Theory and Techniques. DOI: 10.1109/Tmtt.2016.2537801  0.523
2016 Wei Z, Ma EY, Cui YT, Johnston S, Yang Y, Agarwal K, Kelly MA, Shen ZX, Chen X. Quantitative analysis of effective height of probes in microwave impedance microscopy Review of Scientific Instruments. 87. DOI: 10.1063/1.4962242  0.479
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