| Year |
Citation |
Score |
| 2019 |
Trusheim ME, Wan NH, Chen KC, Ciccarino CJ, Flick J, Sundararaman R, Malladi G, Bersin E, Walsh M, Lienhard B, Bakhru H, Narang P, Englund D. Lead-related quantum emitters in diamond Physical Review B. 99. DOI: 10.1103/Physrevb.99.075430 |
0.307 |
|
| 2017 |
Schröder T, Walsh M, Zheng J, Mouradian S, Li L, Malladi G, Bakhru H, Lu M, Stein A, Heuck M, Englund D. Scalable fabrication of coupled NV center - photonic crystal cavity systems by self-aligned N ion implantation Optical Materials Express. 7: 1514-1524. DOI: 10.1364/Ome.7.001514 |
0.314 |
|
| 2017 |
Schulz A, Bakhru H, DeRosa D, Higashiya S, Rane-Fondacaro M, Haldar P. Quantifying lithium in the solid electrolyte interphase layer and beyond using Lithium- Nuclear Reaction Analysis technique Journal of Power Sources. 360: 129-135. DOI: 10.1016/J.Jpowsour.2017.06.010 |
0.302 |
|
| 2016 |
Souhan B, Chen C, Lu M, Stein A, Bakhru H, Grote R, Bergman K, Green W, Osgood R. Ar+-Implanted Si-Waveguide Photodiodes for Mid-Infrared Detection Photonics. 3: 46. DOI: 10.3390/Photonics3030046 |
0.394 |
|
| 2015 |
Huang HC, Zhang L, Malladi G, Dadap JI, Manandhar S, Kisslinger K, Vemuri RSR, Shutthanandan V, Bakhru H, Osgood RM. Radiation damage by light- and heavy-ion bombardment of single-crystal LiNbO3 Optical Materials Express. 5: 1071-1088. DOI: 10.1364/Ome.5.001071 |
0.362 |
|
| 2015 |
Haberl AW, Skala WG, Bakhru H. Monitoring of Ion Purity in High-energy Implant via RBS Physics Procedia. 66: 270-277. DOI: 10.1016/J.Phpro.2015.05.034 |
0.422 |
|
| 2015 |
Huang HC, Malladi G, Zhang L, Dadap JI, Kisslinger K, Bakhru H, Osgood RM. Characterization of selective etching and patterning by sequential light- and heavy-ion irradiation of LiNbO3 Optical Materials. 46: 1-5. DOI: 10.1016/J.Optmat.2015.03.019 |
0.39 |
|
| 2014 |
Souhan B, Grote RR, Chen CP, Huang HC, Driscoll JB, Lu M, Stein A, Bakhru H, Bergman K, Green WM, Osgood RM. Si⁺-implanted Si-wire waveguide photodetectors for the mid-infrared. Optics Express. 22: 27415-24. PMID 25401890 DOI: 10.1364/Oe.22.027415 |
0.352 |
|
| 2014 |
Huang HC, Dadap JI, Malladi G, Kymissis I, Bakhru H, Osgood RM. Helium-ion-induced radiation damage in LiNbO₃ thin-film electro-optic modulators. Optics Express. 22: 19653-61. PMID 25321048 DOI: 10.1364/Oe.22.019653 |
0.382 |
|
| 2014 |
Souhan B, Grote RR, Driscoll JB, Lu M, Stein A, Bakhru H, Osgood RM. Metal-semiconductor-metal ion-implanted Si waveguide photodetectors for C-band operation. Optics Express. 22: 9150-8. PMID 24787805 DOI: 10.1364/Oe.22.009150 |
0.384 |
|
| 2014 |
Trusheim ME, Li L, Laraoui A, Chen EH, Bakhru H, Schröder T, Gaathon O, Meriles CA, Englund D. Scalable fabrication of high purity diamond nanocrystals with long-spin-coherence nitrogen vacancy centers. Nano Letters. 14: 32-6. PMID 24199716 DOI: 10.1021/Nl402799U |
0.301 |
|
| 2014 |
Malladi G, Huang M, Murray T, Novak S, Matsubayashi A, Labella V, Bakhru H. Synthesis and properties of ferromagnetic nanostructures embedded within a high-quality crystalline silicon matrix via ion implantation and nanocavity assisted gettering processes Journal of Applied Physics. 116. DOI: 10.1063/1.4892096 |
0.397 |
|
| 2014 |
Borja J, Plawsky JL, Lu TM, Bakhru H, Gill WN. Current leakage relaxation and charge trapping in ultra-porous low- k materials Journal of Applied Physics. 115. DOI: 10.1063/1.4866692 |
0.312 |
|
| 2014 |
Li L, Schröder T, Chen EH, Bakhru H, Englund D. One-dimensional photonic crystal cavities in single-crystal diamond Photonics and Nanostructures - Fundamentals and Applications. DOI: 10.1016/J.Photonics.2015.03.002 |
0.361 |
|
| 2013 |
Sahoo SK, Bakhru H, Kumar S, Misra D, Wolden CA, Mohapatra YN, Agrawal DC. Field Dependent Carrier Transport Mechanisms in Metal-Insulator–Metal Devices with Ba 0.8 Sr 0.2 TiO 3 / ZrO 2 Heterostructured Thin Films as the Dielectric Mrs Proceedings. 1547: 53-60. DOI: 10.1557/Opl.2013.855 |
0.328 |
|
| 2013 |
Huang HC, Dadap JI, Gaathon O, Herman IP, Osgood RM, Bakhru S, Bakhru H. A micro-Raman spectroscopic investigation of He+-irradiation damage in LiNbO3 Optical Materials Express. 3: 126-142. DOI: 10.1364/Ome.3.000126 |
0.337 |
|
| 2013 |
Borja J, Plawsky JL, Gill WN, Bakhru H, He M, Lu TM. Penetration of copper-manganese self-forming barrier into SiO2 pore-sealed SiCOH during deposition Ecs Journal of Solid State Science and Technology. 2. DOI: 10.1149/2.021309Jss |
0.355 |
|
| 2013 |
Vanamurthy LH, Huang M, Bakhru H, Furukawa T, Berliner N, Herman J, Zhu Z, Ronsheim P, Doris B. Subnanometer-resolution depth profiling of boron atoms and lattice defects in silicon ultrashallow junctions by ion beam techniques Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 31. DOI: 10.1116/1.4795208 |
0.78 |
|
| 2013 |
Bishop SM, Briggs BD, Rice PZ, Capulong JO, Bakhru H, Cady NC. Ion implantation synthesis and conduction of tantalum oxide resistive memory layers Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 31. DOI: 10.1116/1.4771987 |
0.386 |
|
| 2013 |
Gaathon O, Hodges JS, Chen EH, Li L, Bakhru S, Bakhru H, Englund D, Osgood RM. Planar fabrication of arrays of ion-exfoliated single-crystal-diamond membranes with nitrogen-vacancy color centers Optical Materials. 35: 361-365. DOI: 10.1016/J.Optmat.2012.09.020 |
0.385 |
|
| 2012 |
Bishop SM, Rice ZP, Briggs BD, Bakhru H, Cady NC. Synthesis of resistive memory oxides by ion implantation Materials Research Society Symposium Proceedings. 1430: 111-116. DOI: 10.1557/Opl.2012.934 |
0.375 |
|
| 2012 |
Sahoo SK, Bakhru H, Kumar S, Misra D, Mohapatra YN, Agrawal DC. Relaxor behavior in Ba0.8Sr0.2TiO3/ ZrO2 heterostructured thin films Materials Research Society Symposium Proceedings. 1454: 89-96. DOI: 10.1557/Opl.2012.1254 |
0.391 |
|
| 2012 |
Hodges JS, Li L, Lu M, Chen EH, Trusheim ME, Allegri S, Yao X, Gaathon O, Bakhru H, Englund D. Long-lived NV - spin coherence in high-purity diamond membranes New Journal of Physics. 14. DOI: 10.1088/1367-2630/14/9/093004 |
0.319 |
|
| 2012 |
Gaathon O, Adam JD, Krishnaswamy SV, Kysar JW, Bakhru S, Bakhru H, Welch DO, Osgood RM. Planar single-crystal thin-films of YAG obtained by ion implantation and thermal exfoliation: Mechanical properties Optical Materials. 35: 25-28. DOI: 10.1016/J.Optmat.2012.06.009 |
0.474 |
|
| 2011 |
Ofan A, Lilienblum M, Gaathon O, Sehrbrock A, Hoffmann A, Bakhru S, Bakhru H, Irsen S, Osgood RM, Soergel E. Large-area regular nanodomain patterning in He-irradiated lithium niobate crystals. Nanotechnology. 22: 285309. PMID 21646696 DOI: 10.1088/0957-4484/22/28/285309 |
0.332 |
|
| 2011 |
Kadakia N, Huang M, Bakhru H. Fabrication of subsurface metallic nanoparticles for enhanced carrier generation in silicon-based photovoltaics Materials Research Society Symposium Proceedings. 1322: 21-26. DOI: 10.1557/Opl.2011.1104 |
0.336 |
|
| 2011 |
Ofan A, Gaathon O, Zhang L, Evans-Lutterodt K, Bakhru S, Bakhru H, Zhu Y, Welch D, Osgood RM. Twinning and dislocation pileups in heavily implanted LiNbO3 Physical Review B - Condensed Matter and Materials Physics. 83. DOI: 10.1103/Physrevb.83.064104 |
0.365 |
|
| 2011 |
Bishop SM, Bakhru H, Novak SW, Briggs BD, Matyi RJ, Cady NC. Ion implantation synthesized copper oxide-based resistive memory devices Applied Physics Letters. 99. DOI: 10.1063/1.3662036 |
0.341 |
|
| 2011 |
Kadakia N, Naczas S, Bakhru H, Huang M. Method for silicon surface texturing using ion implantation Aip Conference Proceedings. 1336: 337-340. DOI: 10.1063/1.3586115 |
0.302 |
|
| 2011 |
Sahoo SK, Misra D, Sahoo M, MacDonald CA, Bakhru H, Agrawal DC, Mohapatra YN, Majumder SB, Katiyar RS. Improved dielectric properties and their temperature insensitivity in multilayered Ba0.8Sr0.2TiO3/ZrO2 thin films Journal of Applied Physics. 109. DOI: 10.1063/1.3563576 |
0.396 |
|
| 2010 |
He M, Ou Y, Wang P, Vanamurthy LH, Bakhru H, Lu T. Barrier Metal Ions Drift into Porous Low k Dielectrics under Bias-Temperature stress Mrs Proceedings. 1249. DOI: 10.1557/Proc-1249-F05-09 |
0.76 |
|
| 2010 |
Gaathon O, Ofan A, Dadap JI, Vanamurthy L, Bakhru S, Bakhru H, Osgood RM. Fabrication of freestanding LiNbO3 thin films via He implantation and femtosecond laser ablation Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 28: 462-465. DOI: 10.1116/1.3384056 |
0.776 |
|
| 2010 |
He M, Novak S, Vanamurthy L, Bakhru H, Plawsky J, Lu TM. Cu penetration into low-k dielectric during deposition and bias-temperature stress Applied Physics Letters. 97. DOI: 10.1063/1.3529492 |
0.753 |
|
| 2010 |
Lilienblum M, Ofan A, Hoffmann A, Gaathon O, Vanamurthy L, Bakhru S, Bakhru H, Osgood RM, Soergel E. Low-voltage nanodomain writing in He-implanted lithium niobate crystals Applied Physics Letters. 96. DOI: 10.1063/1.3319839 |
0.757 |
|
| 2010 |
He M, Ou Y, Wang PI, Vanamurthy LH, Bakhru H, Lu TM. Barrier metal ions drift into porous low K dielectrics under bias-temperature stress Materials Research Society Symposium Proceedings. 1249: 231-235. |
0.78 |
|
| 2009 |
Chen TL, Kou A, Ofan A, Gaathon O, Osgood RM, Gang O, Vanamurthy L, Bakhru S, Bakhru H. Oxide heterogrowth on ion-exfoliated thin-film complex oxide substrates Thin Solid Films. 518: 269-273. DOI: 10.1016/J.Tsf.2009.06.004 |
0.773 |
|
| 2008 |
Ou Y, Wang PI, Vanamurthy LH, Bakhru H, Lu TM, Spencer G. Thermal stability study of pore sealing using parylene N Journal of the Electrochemical Society. 155. DOI: 10.1149/1.2967719 |
0.759 |
|
| 2008 |
Oktyabrsky S, Yakimov M, Tokranov V, Kambhampati R, Bakhru H, Koveshnikov S, Tsai W, Zhu F, Lee J. Challanges and progrss in III-V MOSFETs for CMOS circuits International Journal of High Speed Electronics and Systems. 18: 761-772. DOI: 10.1142/S0129156408005746 |
0.363 |
|
| 2008 |
Ofan A, Gaathon O, Vanamurthy L, Bakhru S, Bakhru H, Evans-Lutterodt K, Osgood RM. Origin of highly spatially selective etching in deeply implanted complex oxides Applied Physics Letters. 93. DOI: 10.1063/1.3013821 |
0.772 |
|
| 2007 |
Djukic D, Roth RM, Osgood RM, Evans-Lutterodt K, Bakhru H, Bakhru S, Welch D. X-ray microbeam probing of elastic strains in patterned He+ implanted single-crystal LiNb O3 Applied Physics Letters. 91. DOI: 10.1063/1.2776859 |
0.301 |
|
| 2007 |
Djukic D, Cerda-Pons G, Roth RM, Osgood RM, Bakhru S, Bakhru H. Electro-optically tunable second-harmonic-generation gratings in ion-exfoliated thin films of periodically poled lithium niobate Applied Physics Letters. 90. DOI: 10.1063/1.2728739 |
0.387 |
|
| 2007 |
Roth RM, Djukic D, Lee YS, Osgood RM, Lewis PA, Bakhru S, Bakhru H. Fabrication and material properties of submicrometer SrTiO3 films exfoliated using crystal ion slicing Applied Physics Letters. 90. DOI: 10.1063/1.2711655 |
0.453 |
|
| 2007 |
Vanamurthy LH, Haberl AW, Bakhru H. Application of ion beams in the study of depth profiling of nitrogen Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 261: 516-519. DOI: 10.1016/J.Nimb.2007.03.043 |
0.767 |
|
| 2007 |
Lovelace B, Bakhru H, Haberl AW, Benenson RE. Polymer ERD standards and charge integration for low intensity He ion microbeams Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 261: 452-455. DOI: 10.1016/J.Nimb.2007.03.036 |
0.311 |
|
| 2007 |
Moran PD, Chen A, Tangtrakarn N, Lawrence M, Bakhru S, Bakhru H. He ion implantation and the refractive index depth profile in relaxor ferroelectric optical waveguides Journal of Electronic Materials. 36: 1724-1731. DOI: 10.1007/S11664-007-0240-3 |
0.421 |
|
| 2006 |
Ee YC, Juneja JS, Wang PI, Lu TM, Bakhru H, Chan L, Law SB, Yong C, Chen Z, Xu S. Bias-temperature stability of Ti-Si-N-O films Journal of the Electrochemical Society. 153. DOI: 10.1149/1.2184070 |
0.404 |
|
| 2006 |
Lee YS, Djukic D, Roth RM, Laibowitz R, Izuhara T, Osgood RM, Bakhru S, Bakhru H, Si W, Welch D. Fabrication of patterned single-crystal SrTiO 3 thin films by ion slicing and anodic bonding Applied Physics Letters. 89. DOI: 10.1063/1.2355457 |
0.433 |
|
| 2006 |
Adhikari AR, Huang M, Bakhru H, Vajtai R, Ryu CY, Ajayan PM. Stability of ion implanted single-walled carbon nanotubes: Thermogravimetric and Raman analysis Journal of Applied Physics. 100. DOI: 10.1063/1.2353643 |
0.408 |
|
| 2006 |
Roth RM, Djukic D, Lee YS, Osgood RM, Bakhru S, Laulicht B, Dunn K, Bakhru H, Wu L, Huang M. Compositional and structural changes in LiNbO 3 following deep He + ion implantation for film exfoliation Applied Physics Letters. 89. DOI: 10.1063/1.2352798 |
0.444 |
|
| 2006 |
Dasgupta V, Litombe N, Bailey WE, Bakhru H. Ion implantation of rare-earth dopants in ferromagnetic thin films Journal of Applied Physics. 99. DOI: 10.1063/1.2173212 |
0.429 |
|
| 2006 |
Adhikari AR, Huang MB, Bakhru H, Talapatra S, Ajayan PM, Ryu CY. Effects of proton irradiation on thermal stability of single-walled carbon nanotubes mat Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 245: 431-434. DOI: 10.1016/J.Nimb.2005.12.001 |
0.32 |
|
| 2006 |
Ten Eyck GA, Pimanpang S, Bakhru H, Lu TM, Wang GC. Atomic layer deposition of Pd on an oxidized metal substrate Chemical Vapor Deposition. 12: 290-294. DOI: 10.1002/Cvde.200506456 |
0.369 |
|
| 2006 |
Carrow BP, Bakhru H, Wang PI, Chen Y, Senkevich JJ. Dehydrohalogenation in alpha-functionalized poly-p-xylylenes Chemical Vapor Deposition. 12: 239-244. DOI: 10.1002/Cvde.200506426 |
0.323 |
|
| 2005 |
Roth RM, Izuhara T, Espinola RL, Djukic D, Osgood RM, Bakhru S, Bakhru H. Integrable wide-free-spectral-range Fabry-Perot optical filters using free-standing LiNbO3 thin films. Optics Letters. 30: 994-6. PMID 15906981 DOI: 10.1364/Ol.30.000994 |
0.422 |
|
| 2005 |
Nandini A, Roy U, Patel ZP, Bakhru H. First Pass Study of Surface Modified Porous Low-k by Ion Implantation for Zero Thickness Barrier Requirement of Cu/MSQ/Si Stacks in Copper Metallization Scheme Mrs Proceedings. 863. DOI: 10.1557/PROC-863-B2.6 |
0.352 |
|
| 2005 |
Adhikari AR, Huang M, Ryu C, Ajayan P, Bakhru H. Effects of MeV Ions on Thermal Stability of Single Walled Carbon Nanotubes Mrs Proceedings. 887. DOI: 10.1557/Proc-0887-Q02-03 |
0.369 |
|
| 2005 |
Juneja JS, Eyck GAT, Bakhru H, Lu TM. Pressure dependent Parylene-N pore sealant penetration in porous low- κ dielectrics Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 2232-2235. DOI: 10.1116/1.2040427 |
0.317 |
|
| 2005 |
Rane MV, Efstathiadis H, Bakhru H, Rupich MW, Li X, Zhang W, Kodenkandath T, Haldar P. Fluorine analysis and microstructural evolution in coated YBCO conductor deposited by metal trifluoroacetate process Ieee Transactions On Applied Superconductivity. 15: 2638-2641. DOI: 10.1109/Tasc.2005.847688 |
0.396 |
|
| 2005 |
Patel ZP, Roy ANU, Bakhru H, Lu TM. Preliminary evaluation of interfacial stability of surface modified porous methyl silsesquioxane by ion implantation for copper metallization scheme Thin Solid Films. 476: 322-325. DOI: 10.1016/J.Tsf.2004.10.029 |
0.46 |
|
| 2005 |
Djukic D, Izuhara T, Roth RM, Osgood RMJ, Bakhru S, Bakhru H. Extremely thin, single-crystal films of linbo3 fabricated using localized he+ ion-implantation Optics Infobase Conference Papers. |
0.358 |
|
| 2004 |
Djukic D, Roth R, Yardley J, Osgood R, Bakhru S, Bakhru H. Low-voltage planar-waveguide electrooptic prism scanner in Crystal-Ion-Sliced thin-film LiNbO3. Optics Express. 12: 6159-64. PMID 19488260 DOI: 10.1364/Opex.12.006159 |
0.417 |
|
| 2004 |
Djukic D, Roth R, Yardley JT, Osgood RM, Bakhru S, Bakhru H. Low-voltage planar-waveguide electrooptic prism scanner in crystal-ion-sliced thin-film LiNbO3 Optics Express. 12: 6159-6164. DOI: 10.1364/OPEX.12.006159 |
0.309 |
|
| 2004 |
Izunara T, Roth R, Djukic D, Radojevic AM, Osgood RM, Bakhru S, Bakhru H. Metal-oxide lift-off for optimized heterointegration of photonic circuits Proceedings of Spie - the International Society For Optical Engineering. 5356: 74-80. DOI: 10.1117/12.537850 |
0.312 |
|
| 2003 |
Moon KS, Levy M, Hong YK, Bakhru H, Bakhru S. Microscale Patterning of Mesoscopic PZN-PT Single Crystal Films by Crystal ion Slicing and Laser-Induced Etching Ferroelectrics Letters Section. 30: 47-57. DOI: 10.1080/713931707 |
0.421 |
|
| 2003 |
Izuhara T, Gheorma IL, Osgood RM, Roy AN, Bakhru H, Tesfu YM, Reeves ME. Single-crystal barium titanate thin films by ion slicing Applied Physics Letters. 82: 616-618. DOI: 10.1063/1.1540727 |
0.437 |
|
| 2003 |
Izuhara T, Roth R, Osgood RM, Bakhru S, Bakhru H. Low-voltage tunable TE/TM converter on ion-sliced lithium niobate thin film Electronics Letters. 39: 1118-1119. DOI: 10.1049/El:20030741 |
0.398 |
|
| 2002 |
Roy ANU, Patel ZP, Mallikarjunan A, Bakhru H, Lu T-. Mechanical Enhancement Of Nanoporous Low-K Films As Interlayer Dielectrics By Ion Implantation Mrs Proceedings. 734. DOI: 10.1557/Proc-734-B5.3 |
0.443 |
|
| 2002 |
Nandini A, Roy U, Mallikarjunan A, Kumar A, Fortin J, Shekhawat GS, Geer R, Dovidenko K, Lifshin E, Bakhru H, Lu TM. Modification of Low ĸ Materials for ULSI Multilevel Interconnects by Ion Implantation Mrs Proceedings. 716: 349-354. DOI: 10.1557/Proc-716-B7.19 |
0.386 |
|
| 2002 |
Levy M, Ghimire S, Bandyopadhyay AK, Hong YK, Moon K, Bakhru S, Bakhru H. PZN-PT single-crystal thin film monomorph actuator Ferroelectrics, Letters Section. 29: 29-40. DOI: 10.1080/07315170214360 |
0.388 |
|
| 2002 |
Izuhara T, Osgood RM, Levy M, Reeves ME, Wang YG, Roy AN, Bakhru H. Low-loss crystal-ion-sliced single-crystal potassium tantalate films Applied Physics Letters. 80: 1046-1048. DOI: 10.1063/1.1446214 |
0.452 |
|
| 2001 |
Rogojevic S, Jain A, Wang F, Gill WN, Wayner PC, Plawsky JL, Lu TM, Yang GR, Lanford WA, Kumar A, Bakhru H, Roy AN. Interactions between silica xerogel and tantalum Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 19: 354-360. DOI: 10.1116/1.1347047 |
0.345 |
|
| 2001 |
Harris W, Tarte LL, Bakhru H, Gibson W, Wu D, Geer RE, Wollman DA. Energy dispersive x-ray analysis using a microcalorimeter detector Characterization and Metrology For Ulsi Technology. 550: 412-415. DOI: 10.1063/1.1354434 |
0.327 |
|
| 2001 |
Windover D, Barnet E, Summers J, Gribbin C, Lu T-, Kumar A, Bakhru H, Lee SL. Development of an in-line X-ray reflectivity technique for metal film thickness measurement Characterization and Metrology For Ulsi Technology. 550: 243-248. DOI: 10.1063/1.1354405 |
0.338 |
|
| 2001 |
Rout B, Ghose SK, Mahapatra DP, Dev BN, Bakhru H, Haberl AW. Status of ion microbeam facility at the Institute of Physics, Bhubaneswar, India Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 181: 110-115. DOI: 10.1016/S0168-583X(01)00568-7 |
0.343 |
|
| 2001 |
Kumar A, Bakhru H, Fortin JB, Yang GR, Lu TM, Jin C, Lee WW. Thermal stability of xerogel films Thin Solid Films. 396: 5-8. DOI: 10.1016/S0040-6090(01)01161-0 |
0.422 |
|
| 2000 |
Radojevic AM, Levy M, Osgood RM, Jundt DH, Kumar A, Bakhru H. Second-order optical nonlinearity of 10-mum-thick periodically poled LiNbO(3) films. Optics Letters. 25: 1034-6. PMID 18064264 DOI: 10.1364/Ol.25.001034 |
0.416 |
|
| 2000 |
Mallikarjunan A, Murarka SP, Steinbruchel C, Kumar A, Bakhru H. Electrical behavior of Cu thin fluorinated PECVD oxide MIS capacitors Journal of the Electrochemical Society. 147: 3502-3507. DOI: 10.1149/1.1393927 |
0.386 |
|
| 2000 |
Liu R, Guo R, Bhalla AS, Cross LE, Levy M, Osgood RM, Kumar A, Bakhru H. Dielectric and pyroelectric properties of crystal ion sliced (CIS) LiNbO3thin film Ferroelectrics. 248: 45-56. DOI: 10.1080/00150190008223668 |
0.41 |
|
| 2000 |
Rachford FJ, Levy M, Osgood RM, Kumar A, Bakhru H. Magnetization and FMR studies of crystal-ion-sliced narrow linewidth gallium-doped yttrium iron garnet Journal of Applied Physics. 87: 6253-6255. DOI: 10.1063/1.373422 |
0.455 |
|
| 2000 |
Kumar A, Bakhru H, Jin C, Lee WW, Lu T-. Metal diffusion barriers for porous SiO2 Journal of Applied Physics. 87: 3567-3569. DOI: 10.1063/1.372381 |
0.374 |
|
| 2000 |
Levy M, Osgood RM, Bhalla AS, Guo R, Cross LE, Kumar A, Sankaran S, Bakhru H. Stress tuning in crystal ion slicing to form single-crystal potassium tantalate films Applied Physics Letters. 77: 2124-2126. DOI: 10.1063/1.1314294 |
0.464 |
|
| 1999 |
Levy M, Osgood R, Rachford FJ, Kumar A, Bakhru H. Narrow-Linewidth Yttrium Iron Garnet Films for Heterogeneous Integration Mrs Proceedings. 603. DOI: 10.1557/Proc-603-119 |
0.407 |
|
| 1999 |
Rachford FJ, Levy M, Osgood RM, Kumar A, Bakhru H. Magnetization and ferromagnetic resonance studies in implanted and crystal ion sliced bismuth-substituted yttrium iron garnet films Journal of Applied Physics. 85: 5217-5219. DOI: 10.1063/1.369948 |
0.45 |
|
| 1999 |
Radojevic AM, Levy M, Osgood RM, Kumar A, Bakhru H, Tian C, Evans C. Large etch-selectivity enhancement in the epitaxial liftoff of single-crystal LiNbO3 films Applied Physics Letters. 74: 3197-3199. DOI: 10.1063/1.124115 |
0.465 |
|
| 1999 |
Kumar A, Bakhru H, Wang B, Yang GR, Fortin J, McDonald J, Lu TM. Study of fluorine diffusion in metallized polymers using ion beam techniques Materials Chemistry and Physics. 59: 136-138. DOI: 10.1016/S0254-0584(99)00024-3 |
0.401 |
|
| 1998 |
Levy M, Osgood R, Kumar A, Bakhru H, Liu R, Cross E. Crystal Ion-Slicing of Magnetic and Ferroelectric Oxide Films Mrs Proceedings. 517. DOI: 10.1557/Proc-517-475 |
0.429 |
|
| 1998 |
Kim SE, Steinbruichel C, Kumar A, Bakhru H. Characterizaton of Pecvd Fluorinated Silicon Oxides and Stabilization of Interaction with Metals Mrs Proceedings. 511: 191. DOI: 10.1557/Proc-511-191 |
0.371 |
|
| 1998 |
Bakhru H, Kumar A, Kaplan T, Delarosa M, Fortin J, Yang G, Lu T, Kim S, Steinbruchel C, Tang X, Moore JA, Wang B, McDonald J, Nitta S, Pisupatti V, et al. Ion Beam Techniques for Low K Materials Characterization Mrs Proceedings. 511. DOI: 10.1557/Proc-511-125 |
0.405 |
|
| 1998 |
Nielsen MC, Kim JY, Rymaszewski EJ, Lu TM, Kumar A, Bakhru H. Composite and multilayered TaOx-TiOy high dielectric constant thin films Ieee Transactions On Components Packaging and Manufacturing Technology Part B. 21: 274-279. DOI: 10.1109/96.704938 |
0.383 |
|
| 1998 |
Levy M, Osgood RM, Kumar A, Bakhru H. Crystal ion slicing of single-crystal magnetic garnet films Journal of Applied Physics. 83: 6759-6761. DOI: 10.1063/1.367673 |
0.438 |
|
| 1998 |
Levy M, Osgood RM, Liu R, Cross LE, Cargill GS, Kumar A, Bakhru H. Fabrication of single-crystal lithium niobate films by crystal ion slicing Applied Physics Letters. 73: 2293-2295. DOI: 10.1063/1.121801 |
0.341 |
|
| 1998 |
Rout B, Ghose SK, Sundaravel B, Kuri G, Mahapatra DP, Dev BN, Sen P, Bakhru H, Haberl AW. Micro ion-beam facility at the Institute of Physics, Bhubaneswar Radiation Physics and Chemistry. 51: 677. DOI: 10.1016/S0969-806X(97)00235-1 |
0.319 |
|
| 1998 |
Bakhru H, Kumar A, Haberl A. Industrial applications of high energy microbeams Radiation Physics and Chemistry. 51: 631-635. DOI: 10.1016/S0969-806X(97)00227-2 |
0.354 |
|
| 1997 |
Levy M, Osgood RM, Kumar A, Bakhru H. Epitaxial liftoff of thin oxide layers: Yttrium iron garnets onto GaAs Applied Physics Letters. 71: 2617-2619. DOI: 10.1063/1.120192 |
0.378 |
|
| 1997 |
Kumar A, Haberl A, Bakhru H, Rout B. Improved high energy microbeam techniques Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 130: 219-223. DOI: 10.1016/S0168-583X(97)00169-9 |
0.378 |
|
| 1996 |
Yang G-, Mathur D, Wu XM, Dabral S, McDonald JF, Lu T-, Bakhru H. Microstructures of parylene-N thin films and the effect on copper diffusion Journal of Electronic Materials. 25: 1778-1783. DOI: 10.1007/S11664-996-0035-Y |
0.415 |
|
| 1995 |
Liu Wâ, Lakshmikumar ST, Knorr DB, Rymaszewski EJ, Ta Tâ, Bakhru H. Thermally stable amorphous BaxTi2âxOy thin films Applied Physics Letters. 66: 809-811. DOI: 10.1063/1.113428 |
0.408 |
|
| 1995 |
Bakhru H, Nickles E, Haberl AW. Industrial applications of high energy micro-beams Nuclear Inst. and Methods in Physics Research, B. 99: 410-413. DOI: 10.1016/0168-583X(94)00566-4 |
0.351 |
|
| 1992 |
Dabral S, Yang GR, Lu TM, McDonald JF, Bakhru H. Secondary ion mass spectroscopic characterization of silver and aluminum diffusion in paryiene Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 10: 2764-2766. DOI: 10.1116/1.577907 |
0.339 |
|
| 1992 |
Yang GR, Dabral S, Wu XM, Lu TM, McDonald JF, Bakhru H. Reduction in diffusion of copper in parylene by thermal pretreatment Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 10: 916-919. DOI: 10.1116/1.577695 |
0.336 |
|
| 1991 |
Liu J, Ortiz CR, Zhang Y, Bakhru H, Corbett JW. Effects of hydrogen on the barrier height of a titanium Schottky diode on p-type silicon. Physical Review. B, Condensed Matter. 44: 8918-8922. PMID 9998851 DOI: 10.1103/Physrevb.44.8918 |
0.312 |
|
| 1991 |
Lane LC, Nason TC, Yang GR, Lu TM, Bakhru H. Secondary ion mass spectrometry study of the thermal stability of Cu/refractory metal/Si structures Journal of Applied Physics. 69: 6719-6721. DOI: 10.1063/1.348973 |
0.366 |
|
| 1991 |
Bakhru H. Ion beam analysis techniques at SUNY-Albany Nuclear Inst. and Methods in Physics Research, B. 56: 757-760. DOI: 10.1016/0168-583X(91)95020-E |
0.334 |
|
| 1991 |
Yang GR, Dabral S, You L, McDonald JF, Lu TM, Bakhru H. Correlation between copper diffusion and phase change in parylene Journal of Electronic Materials. 20: 571-576. DOI: 10.1007/Bf02666020 |
0.338 |
|
| 1990 |
Benenson RE, Berning P, Bakhru H. Ion-beam mixing in micron-size widths Nuclear Inst. and Methods in Physics Research, B. 45: 519-522. DOI: 10.1016/0168-583X(90)90890-7 |
0.38 |
|
| 1988 |
Yapsir AS, Hadizad P, Lu T, Corelli JC, Corbett JW, Lanford WA, Bakhru H. Defect centers and changes in the electrical characteristics of Al/n-type Si Schottky diodes induced by hydrogen-ion implantations. Physical Review. B, Condensed Matter. 37: 8982-8987. PMID 9944268 DOI: 10.1103/Physrevb.37.8982 |
0.372 |
|
| 1988 |
Yapsir AS, Lu TM, Hadizad P, Corelli JC, Sugerman A, Bakhru H. Electrical characteristics of hydrogen implanted silicon Schottky diodes having large difference in metal work function Journal of Applied Physics. 63: 5040-5043. DOI: 10.1063/1.340400 |
0.414 |
|
| 1987 |
Yapsir AS, Hadizad P, Lu TM, Corelli JC, Corbett JW, Lanford WA, Bakhru H. The Effects of High and Low Dose Hydrogen Ion Implantations on Al/n-Si Schottky Diodes Mrs Proceedings. 104. DOI: 10.1557/Proc-104-297 |
0.375 |
|
| 1987 |
Yapsir AS, Hadizad P, Lu TM, Corelli JC, Lanford WA, Bakhru H. Effects of hydrogen ion implantation on Al/Si Schottky diodes Applied Physics Letters. 50: 1530-1532. DOI: 10.1063/1.97821 |
0.356 |
|
| 1987 |
Morris WG, Fesseha S, Bakhru H. Microbeam RBS and PIXE applied to microelectronics Nuclear Inst. and Methods in Physics Research, B. 24: 635-637. DOI: 10.1016/S0168-583X(87)80213-6 |
0.315 |
|
| 1986 |
Raicu B, Bakhru H, Fesseha S, Gibson WM. A New Application of Rbs-Pixe with High Energy Microbeam Mrs Proceedings. 69. DOI: 10.1557/Proc-69-293 |
0.403 |
|
| 1985 |
Wang JJ, Welsch G, Bakhru H, Mashayekhi A, Gibson W. Tem evaluation of ion-implanted and fatigued metal surface layers Nuclear Inst. and Methods in Physics Research, B. 7: 228-234. DOI: 10.1016/0168-583X(85)90559-2 |
0.367 |
|
| 1985 |
Morris WG, Bakhru H, Haberl AW. Materials characterization with a He+ microbeam Nuclear Inst. and Methods in Physics Research, B. 10: 697-699. DOI: 10.1016/0168-583X(85)90086-2 |
0.305 |
|
| 1983 |
Welsch G, Wang JJ, Bakhru H, Mashayekhi A, Gibson W, MacCrone RK. Fatigue deformation behavior of nitrogen-ion-implanted surface layers of type 304 stainless steel Thin Solid Films. 107: 305-314. DOI: 10.1016/0040-6090(83)90410-8 |
0.363 |
|
| 1982 |
Johnston WG, Mogro-Campero A, Walter JL, Bakhru H. Crystalline-to-amorphous phase transformation by ion bombardment of the alloy Fe75B25 Materials Science and Engineering. 55: 121-133. DOI: 10.1016/0025-5416(82)90091-X |
0.387 |
|
| 1981 |
Berkowitz A, Johnston W, Mogro-Campero A, Walter J, Bakhru H. Structure and Properties Changes During Ion Bombardment of Crystalline Fe75B25 Mrs Proceedings. 7. DOI: 10.1557/Proc-7-195 |
0.351 |
|
| 1981 |
Lyons W, James AS, MacCrone RK, Bakhru H, Sen S, Gibson W, Burr C, Kumnick AJ, Welch GE. Fatigue and internal friction behavior of nitrogen- and neon-implanted copper Thin Solid Films. 84: 347-353. DOI: 10.1016/0040-6090(81)90167-X |
0.377 |
|
| Show low-probability matches. |