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Hui Tian, Ph.D.

Affiliations: 
2000 Stanford University, Palo Alto, CA 
Area:
Electrical Engineering
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"Hui Tian"
Mean distance: 13358.2
 
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Abbas El Gamal grad student 2000 Stanford
 (Noise analysis in CMOS image sensors.)

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Publications

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Tian H, Liu X, Lim S, et al. (2001) Active pixel sensors fabricated in a standard 0.18-μm CMOS technology Proceedings of Spie. 4306: 441-449
Tian H, El Gamal A. (2001) Analysis of 1/f noise in switched MOSFET circuits Ieee Transactions On Circuits and Systems Ii: Analog and Digital Signal Processing. 48: 151-157
Tian H, Fowler B, El Gamal A. (2001) Analysis of temporal noise in CMOS photodiode active pixel sensor Ieee Journal of Solid-State Circuits. 36: 92-101
Tian H, Gamal AE. (2000) Analysis of 1/f noise in CMOS APS Electronic Imaging. 3965: 168-176
Tian H, Fowler BA, Gamal AE. (1999) Analysis of temporal noise in CMOS APS Electronic Imaging. 3649: 177-185
Yang DXD, Tian H, Fowler BA, et al. (1999) Characterization of CMOS image sensors with Nyquist rate pixel-level ADC Electronic Imaging. 3650: 52-62
Fowler B, El Gamal A, Yang D, et al. (1998) A method for estimating quantum efficiency for CMOS image sensors Proceedings of Spie - the International Society For Optical Engineering. 3301: 178-185
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