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Onur Guzey, Ph.D. - Publications

Affiliations: 
2008 Electrical & Computer Engineering University of California, Santa Barbara, Santa Barbara, CA, United States 
Area:
Computer Engineering
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2008 Wang LC, Guzey O. Functional test-bench refinement through automatic constraint extraction Proceedings - International Test Conference. DOI: 10.1109/TEST.2008.4700676  0.334
2008 Guzey O, Wang LC, Bhadra J. Enhancing signal controllability in functional test-benches through automatic constraint extraction Proceedings - International Test Conference. DOI: 10.1109/TEST.2007.4437615  0.51
2008 Guzey O, Wang LC, Levitt J, Foster H. Functional test selection based on unsupervised support vector analysis Proceedings - Design Automation Conference. 262-267. DOI: 10.1109/DAC.2008.4555820  0.616
2007 Guzey O, Wang LC. Coverage-directed test generation through automatic constraint extraction Proceedings - Ieee International High-Level Design Validation and Test Workshop, Hldvt. 151-158. DOI: 10.1109/HLDVT.2007.4392805  0.483
2007 Guzey O, Wen C, Wang LC, Feng T, Miller H, Abadir MS. Extracting a simplified view of design functionality based on vector simulation Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics). 4383: 34-49.  0.335
2006 Wen CHP, Guzey O, Wang LC, Yang J. Simulation-based functional test justification using a Boolean data miner Ieee International Conference On Computer Design, Iccd 2006. 300-307. DOI: 10.1109/ICCD.2006.4380832  0.467
2006 Guzey O, Wen C, Wang LC, Feng T, Abadir MS. Extracting a simplified view of design functionality via vector simulation Proceedings - Ieee International High-Level Design Validation and Test Workshop, Hldvt. 195-202. DOI: 10.1109/HLDVT.2006.319991  0.307
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