Udayan Ganguly, Ph.D.

Affiliations: 
2006 Cornell University, Ithaca, NY, United States 
Area:
Electronics and Electrical Engineering, Materials Science Engineering
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"Udayan Ganguly"

Parents

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Edwin C. Kan grad student 2006 Cornell
 (Integration of carbon and silicon based nanoelectronics.)
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Publications

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Saraswat V, Prasad S, Khanna A, et al. (2020) Reaction-Drift Model for Switching Transients in Pr₀.₇Ca₀.₃MnO₃-Based Resistive RAM Ieee Transactions On Electron Devices. 67: 3610-3617
Lashkare S, Subramoney S, Ganguly U. (2020) Nanoscale Side-Contact Enabled Three Terminal Pr 0.7 Ca 0.3 MnO 3 Resistive Random Access Memory for In-Memory Computing Ieee Electron Device Letters. 41: 1344-1347
Vardhan PH, Amita, Ganguly S, et al. (2019) Threshold Voltage Variability in Nanosheet GAA Transistors Ieee Transactions On Electron Devices. 66: 4433-4438
Panwar N, Ganguly U. (2019) Temperature Effects in SET/RESET Voltage–Time Dilemma in Pr 0.7 Ca 0.3 MnO 3 -Based RRAM Ieee Transactions On Electron Devices. 66: 829-832
Khilwani D, Moghe V, Lashkare S, et al. (2019) PrxCa1−xMnO3 based stochastic neuron for Boltzmann machine to solve “maximum cut” problem Apl Materials. 7: 91112
Dutta S, Chavan T, Mohapatra NR, et al. (2019) Electrical Tunability of Partially Depleted Silicon on Insulator (PD-SOI) Neuron Solid-State Electronics. 160: 107623
Vardhan PH, Ganguly S, Ganguly U. (2019) An accurate expression to estimate the metal gate granularity induced threshold voltage variability in NWFETs Solid-State Electronics. 152: 65-71
Das B, Schulze J, Ganguly U. (2018) Transient Phenomena in Sub-Bandgap Impact Ionization in Si n-i-p-i-n Diode Ieee Transactions On Electron Devices. 65: 3414-3420
Kumbhare P, Ganguly U. (2018) Ionic Transport Barrier Tuning by Composition in Pr 1– x Ca x MnO 3 -Based Selector-Less RRAM and Its Effect on Memory Performance Ieee Transactions On Electron Devices. 65: 2479-2484
Lashkare S, Kumbhare P, Saraswat V, et al. (2018) Transient Joule Heating-Based Oscillator Neuron for Neuromorphic Computing Ieee Electron Device Letters. 39: 1437-1440
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