Year |
Citation |
Score |
2010 |
Hampton MJ, Templeton JL, DeSimone JM. Direct patterning of CdSe quantum dots into sub-100 nm structures. Langmuir : the Acs Journal of Surfaces and Colloids. 26: 3012-5. PMID 20102224 DOI: 10.1021/La904787K |
0.554 |
|
2009 |
Ray EA, Hampton MJ, Lopez R. Simple demonstration of visible evanescent-wave enhancement with far-field detection. Optics Letters. 34: 2048-50. PMID 19571995 DOI: 10.1364/Fio.2010.Fthy1 |
0.353 |
|
2009 |
Alexander KD, Hampton MJ, Zhang S, Dhawan A, Xu H, Lopez R. A high-throughput method for controlled hot-spot fabrication in SERS-active gold nanoparticle dimer arrays Journal of Raman Spectroscopy. 40: 2171-2175. DOI: 10.1002/Jrs.2392 |
0.307 |
|
2009 |
Williams SS, Hampton MJ, Retterer ST, Templeton JL, Samulski ET, DeSimone JM. Nanopatterned organic materials for photovoltaic devices Technical Proceedings of the 2009 Nsti Nanotechnology Conference and Expo, Nsti-Nanotech 2009. 2: 443-446. |
0.461 |
|
2008 |
Hampton MJ, Williams SS, Zhou Z, Nunes J, Ko DH, Templeton JL, Samulski ET, DeSimone JM. The Patterning of Sub-500 nm Inorganic Oxide Structures. Advanced Materials (Deerfield Beach, Fla.). 20: 2667-73. PMID 25213887 DOI: 10.1002/Adma.200702495 |
0.565 |
|
2008 |
Hampton MJ, Williams SS, Zhou Z, Nunes J, Ko DH, Templeton JL, DeSimone JM, Samulski ET. The patterning of sub-500 nm inorganic oxide and semiconducting polymeric structures Proceedings of Spie - the International Society For Optical Engineering. 7047. DOI: 10.1117/12.794890 |
0.625 |
|
2008 |
Williams SS, Hampton MJ, Gowrishankar V, Ding IK, Zhang L, Ko DH, Templeton JL, DeSimone JM, McGehee MD, Samulski ET. A soft lithography route to nanopatterned photovoltaic devices Proceedings of Spie - the International Society For Optical Engineering. 7047. DOI: 10.1117/12.794853 |
0.532 |
|
2008 |
Williams SS, Hampton MJ, Gowrishankar V, Ding IK, Templeton JL, Samulski ET, DeSimone JM, McGehee MD. Nanostructured titania-polymer photovoltaic devices made using PFPE-based nanomolding techniques Chemistry of Materials. 20: 5229-5234. DOI: 10.1021/Cm800729Q |
0.588 |
|
Show low-probability matches. |