Simeon D. Realov, Ph.D. - Publications
Affiliations: | 2012 | Electrical Engineering | Columbia University, New York, NY |
Year | Citation | Score | |||
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2013 | Realov S, Shepard KL. Analysis of random telegraph noise in 45-nm CMOS using on-chip characterization system Ieee Transactions On Electron Devices. 60: 1716-1722. DOI: 10.1109/Ted.2013.2254118 | 0.336 | |||
2013 | Realov S, Shepard KL. On-chip combined C-V/I-V characterization system in 45-nm CMOS technology Ieee Journal of Solid-State Circuits. 48: 814-826. DOI: 10.1109/Jssc.2013.2237695 | 0.336 | |||
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