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Simeon D. Realov, Ph.D. - Publications

Affiliations: 
2012 Electrical Engineering Columbia University, New York, NY 
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2 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2013 Realov S, Shepard KL. Analysis of random telegraph noise in 45-nm CMOS using on-chip characterization system Ieee Transactions On Electron Devices. 60: 1716-1722. DOI: 10.1109/Ted.2013.2254118  0.336
2013 Realov S, Shepard KL. On-chip combined C-V/I-V characterization system in 45-nm CMOS technology Ieee Journal of Solid-State Circuits. 48: 814-826. DOI: 10.1109/Jssc.2013.2237695  0.336
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