Year |
Citation |
Score |
2023 |
Dukes MD, Krans NA, Marusak K, Walden S, Eldred T, Franks A, Larson B, Guo Y, Nackashi D, Damiano J. A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management. Journal of Visualized Experiments : Jove. PMID 37427942 DOI: 10.3791/65446 |
0.514 |
|
2015 |
Allard LF, Bigelow WC, Wu Z, Overbury SH, Unocic KA, Chi M, Carpenter WB, Walden FS, Thomas RL, Gardiner DS, Jacobs BW, Nackashi DP, Damiano J. Computer-Controlled In Situ Gas Reactions via a MEMS-based Closed-Cell System Microscopy and Microanalysis. 21: 97-98. DOI: 10.1017/S1431927615001282 |
0.475 |
|
2014 |
Unocic RR, Sacci RL, Brown GM, Veith GM, Dudney NJ, More KL, Walden FS, Gardiner DS, Damiano J, Nackashi DP. Quantitative electrochemical measurements using in situ ec-S/TEM devices. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 452-61. PMID 24618013 DOI: 10.1017/S1431927614000166 |
0.537 |
|
2014 |
Allard LF, Bigelow WC, Zhang S, Pan X, Wu Z, Overbury SH, Carpenter WB, Walden FS, Thomas RL, Gardiner DS, Jacobs BW, Nackashi DP, Damiano J. Controlled in Situ gas reaction studies of catalysts at high temperature and pressure with atomic resolution Microscopy and Microanalysis. 20: 1572-1573. DOI: 10.1017/S1431927614009593 |
0.548 |
|
2013 |
Allard L, Wittig J, Chi M, More K, Bigelow W, Damiano J, Nackashi D. Novel Closed-Cell Gas-Reaction Holder Allows Characterization of Behavior of Bimetallic Nanoparticles at Elevated Temperatures and Gas Pressures Microscopy and Microanalysis. 19: 1474-1475. DOI: 10.1017/S1431927613009367 |
0.479 |
|
2012 |
Allard LF, Overbury SH, Bigelow WC, Katz MB, Nackashi DP, Damiano J. Novel MEMS-based gas-cell/heating specimen holder provides advanced imaging capabilities for in situ reaction studies. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 18: 656-66. PMID 22835379 DOI: 10.1017/S1431927612001249 |
0.548 |
|
2012 |
Allard L, Overbury S, Katz M, Bigelow W, Nackashi D, Damiano J. Innovative Closed-Cell Reactor Permits In Situ Heating and Gas Reactions with Atomic Resolution at Atmospheric Pressure Microscopy and Microanalysis. 18: 1118-1119. DOI: 10.1017/S1431927612007441 |
0.488 |
|
2010 |
Allard L, Bigelow W, Overbury S, Nackashi D, Damiano J. Development of a Novel Environmental Cell for In-Situ Gas Reaction Experiments via Aberration-Corrected STEM Imaging Microscopy and Microanalysis. 16: 296-297. DOI: 10.1017/S1431927610062495 |
0.478 |
|
2009 |
He T, Corley DA, Lu M, Di Spigna NH, He J, Nackashi DP, Franzon PD, Tour JM. Controllable molecular modulation of conductivity in silicon-based devices. Journal of the American Chemical Society. 131: 10023-30. PMID 19569647 DOI: 10.1021/Ja9002537 |
0.778 |
|
2009 |
Allard LF, Bigelow WC, Jose-Yacaman M, Nackashi DP, Damiano J, Mick SE. A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures. Microscopy Research and Technique. 72: 208-15. PMID 19165742 DOI: 10.1002/Jemt.20673 |
0.756 |
|
2008 |
Damiano J, Nackashi DP, Mick SE. A MEMS-based technology platform for in-situ TEM heating studies Microscopy and Microanalysis. 14: 1332-1333. DOI: 10.1017/S1431927608088363 |
0.746 |
|
2008 |
Allard LF, Bigelow WC, Nackashi D, Damiano J, Mick SE. A new paradigm for ultra-high-resolution imaging at elevated temperatures Microscopy and Microanalysis. 14: 792-793. DOI: 10.1017/S1431927608086406 |
0.728 |
|
2008 |
Briceno M, Hattar K, Damiano J, Nackashi D, Robertson IM. In-situ TEM observations on the sintering process of colloidal gold using an ultra-fast heating stage Microscopy and Microanalysis. 14: 1336-1337. DOI: 10.1017/S1431927608082408 |
0.5 |
|
2008 |
He T, Lu M, Yao J, He J, Chen B, Di Spigna NH, Nackashi DP, Franzon PD, Tour JM. Reversible modulation of conductance in silicon devices via UV/visible-light irradiation Advanced Materials. 20: 4541-4546. DOI: 10.1002/Adma.200703084 |
0.781 |
|
2007 |
Quispe J, Damiano J, Mick SE, Nackashi DP, Fellmann D, Ajero TG, Carragher B, Potter CS. An improved holey carbon film for cryo-electron microscopy. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 13: 365-71. PMID 17900388 DOI: 10.1017/S1431927607070791 |
0.737 |
|
2007 |
Franzon P, Nackashi D, Amsinck C, Dispigna N, Sonkusale S. Molecular electronics - Devices and circuits technology Ifip International Federation For Information Processing. 240: 1-10. DOI: 10.1007/978-0-387-73661-7_1 |
0.775 |
|
2006 |
He T, He J, Lu M, Chen B, Pang H, Reus WF, Nolte WM, Nackashi DP, Franzon PD, Tour JM. Controlled modulation of conductance in silicon devices by molecular monolayers. Journal of the American Chemical Society. 128: 14537-41. PMID 17090037 DOI: 10.1021/Ja063571L |
0.619 |
|
2006 |
Di Spigna NH, Nackashi DP, Amsinck CJ, Sonkusale SR, Franzon PD. Deterministic nanowire fanout and interconnect without any critical translational alignment Ieee Transactions On Nanotechnology. 5: 356-361. DOI: 10.1109/Tnano.2006.876926 |
0.729 |
|
2006 |
Kriplani NM, Nackashi DP, Amsinck CJ, Di Spigna NH, Steer MB, Franzon PD, Rick RL, Solomon GC, Reimers JR. Physically based molecular device model in a transient circuit simulator Chemical Physics. 326: 188-196. DOI: 10.1016/J.Chemphys.2006.03.003 |
0.745 |
|
2005 |
Amsinck CJ, Di Spigna NH, Nackashi DP, Franzon PD. Scaling constraints in nanoelectronic random-access memories. Nanotechnology. 16: 2251-60. PMID 20818005 DOI: 10.1088/0957-4484/16/10/047 |
0.747 |
|
2005 |
Wilson JM, Bashirullah R, Nackashi DP, Winick DA, Franzon PD. An integrated self-masking technique for providing low-loss metallized RF MEMS devices in a polysilicon only MEMS process Proceedings of Spie - the International Society For Optical Engineering. 5836: 138-152. DOI: 10.1117/12.607592 |
0.635 |
|
2005 |
Nackashi DP, Amsinck CJ, Dispigna NH, Franzon PD. Molecular electronic latches and memories 2005 5th Ieee Conference On Nanotechnology. 2: 89-92. DOI: 10.1109/NANO.2005.1500658 |
0.785 |
|
2005 |
Sonkusale SR, Amsinck CJ, Nackashi DP, Di Spigna NH, Barlage D, Johnson M, Franzon PD. Fabrication of wafer scale, aligned sub-25 nm nanowire and nanowire templates using planar edge defined alternate layer process Physica E: Low-Dimensional Systems and Nanostructures. 28: 107-114. DOI: 10.1016/J.Physe.2005.01.010 |
0.741 |
|
2005 |
Sonkusale SR, Amsinck CJ, Nackashi DP, Di Spigna NH, Barlage D, Johnson M, Franzon PD. Wafer scale aligned sub-25nm metal nanowires on Silicon (110) using PEDAL lift-off process 2005 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2005 Technical Proceedings. 255-258. |
0.733 |
|
2004 |
Seminario JM, Ma Y, Agapito LA, Yan L, Araujo RA, Bingi S, Vadlamani NS, Chagarlamudi K, Sudarshan TS, Myrick ML, Colavita PE, Franzon PD, Nackashi DP, Cheng L, Yao Y, et al. Clustering effects on discontinuous gold film NanoCells. Journal of Nanoscience and Nanotechnology. 4: 907-17. PMID 15570981 DOI: 10.1166/Jnn.2004.104 |
0.538 |
|
2004 |
Nackashi DP, Di Spigna NH, Winick DA, Amsinck CJ, Cheng L, Tour JM, Franzon PD. Discontinuous gold films for nanocell memories 2004 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2004. 3: 45-48. |
0.754 |
|
2003 |
Tour JM, Cheng L, Nackashi DP, Yao Y, Flatt AK, St Angelo SK, Mallouk TE, Franzon PD. NanoCell electronic memories. Journal of the American Chemical Society. 125: 13279-83. PMID 14570505 DOI: 10.1021/Ja036369G |
0.588 |
|
2002 |
Tour JM, Van Zandt WL, Husband CP, Husband SM, Wilson LS, Franzon PD, Nackashi DP. Nanocell logic gates for molecular computing Ieee Transactions On Nanotechnology. 1: 100-108. DOI: 10.1109/Tnano.2002.804744 |
0.641 |
|
2001 |
Wilson J, Bashirullah R, Nackashi D, Winick D, Duewer B, Franzon PD. Design of rotating MEMS tunable capacitors for use at RF and Microwave frequencies Proceedings of Spie - the International Society For Optical Engineering. 4593: 186-197. DOI: 10.1117/12.448850 |
0.576 |
|
2001 |
Nackashi DP, Franzon PD. Molectronics: A circuit design perspective Proceedings of Spie - the International Society For Optical Engineering. 4236: 80-88. DOI: 10.1117/12.418782 |
0.593 |
|
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