Calvin K. Chan, Ph.D.

Affiliations: 
Princeton University, Princeton, NJ 
Google:
"Calvin Chan"
Mean distance: 14.99
 
SNBCP

Parents

Sign in to add mentor
Antoine Kahn grad student 2008 Princeton
 (Materials, properties, and applications of nitrogen-doped organic semiconductors.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Nieuwendaal RC, Ro HW, Germack DS, et al. (2012) Measuring domain sizes and compositional heterogeneities in P3HT-PCBM bulk heterojunction thin films with 1H spin diffusion NMR spectroscopy Advanced Functional Materials. 22: 1255-1266
O'Connor B, Chan EP, Chan C, et al. (2010) Correlations between mechanical and electrical properties of polythiophenes. Acs Nano. 4: 7538-44
Conrad BR, Chan CK, Loth MA, et al. (2010) Characterization of a soluble anthradithiophene derivative Applied Physics Letters. 97
Chan CK, Richter LJ, Dinardo B, et al. (2010) High performance airbrushed organic thin film transistors Applied Physics Letters. 96
Germack DS, Chan CK, Joseph Kline R, et al. (2010) Interfacial segregation in polymer/fullerene blend films for photovoltaic devices Macromolecules. 43: 3828-3836
Germack DS, Chan CK, Hamadani BH, et al. (2009) Substrate-dependent interface composition and charge transport in films for organic photovoltaics Applied Physics Letters. 94
Chan CK, Zhao W, Kahn A, et al. (2009) Influence of chemical doping on the performance of organic photovoltaic cells Applied Physics Letters. 94
Chan CK, Kahn A. (2009) N-doping of pentacene by decamethylcobaltocene Applied Physics a: Materials Science and Processing. 95: 7-13
Tal O, Epstein I, Snir O, et al. (2008) Measurements of the Einstein relation in doped and undoped molecular thin films Physical Review B - Condensed Matter and Materials Physics. 77
Zhan X, Haldi A, Risko C, et al. (2008) Fluorenyl-substituted silole molecules: Geometric, electronic, optical, and device properties Journal of Materials Chemistry. 18: 3157-3166
See more...