Constantine P. Vlahacos, Ph.D.
Affiliations: | 2009 | Electrical Engineering | University of Maryland, College Park, College Park, MD |
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"Constantine Vlahacos"Mean distance: 14.61
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Sign in to add mentorFrederick Charles Wellstood | grad student | 2009 | University of Maryland | |
(A scanning SQUID microscope for imaging high-frequency magnetic fields.) |
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Publications
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Vlahacos CP, Matthews J, Wellstood FC. (2011) A cryo-cooled scanning Squid microscope for imaging high-frequency magnetic fields Ieee Transactions On Applied Superconductivity. 21: 412-415 |
Kim Z, Vlahacos CP, Hoffman JE, et al. (2011) Thin-film superconducting resonator tunable to the ground-state hyperfine splitting of 87Rb Aip Advances. 1 |
Grover JA, Hoffman JE, Kim Z, et al. (2011) Cold atoms coupled to a superconducting flux qubit Optics Infobase Conference Papers |
Grover JA, Hoffman JE, Kim Z, et al. (2011) Cold atoms coupled to a superconducting flux qubit Optics Infobase Conference Papers |
Matthews J, Vlahacos CP, Kwon SP, et al. (2005) Sampling method to extend bandwidth of scanning SQUID microscopes Ieee Transactions On Applied Superconductivity. 15: 688-691 |
Lee SC, Vlahacos CP, Feenstra BJ, et al. (2000) Magnetic permeability imaging of metals with a scanning near-field microwave microscope Applied Physics Letters. 77: 4404-4406 |
Steinhauer DE, Vlahacos CP, Wellstood FC, et al. (2000) Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope Review of Scientific Instruments. 71: 2751-2758 |
Anlage SM, Steinhauer DE, Vlahacos CP, et al. (1999) Superconducting material diagnostics using a scanning near-field microwave microscope Ieee Transactions On Applied Superconductivity. 9: 4127-4132 |
Steinhauer DE, Vlahacos CP, Wellstood FC, et al. (1999) Imaging of microwave permittivity, tunability, and damage recover in (Ba, Sr)TiO3 thin films Applied Physics Letters. 75: 3180-3182 |
Dutta SK, Vlahacos CP, Steinhauer DE, et al. (1999) Imaging microwave electric fields using a near-field scanning microwave microscope Applied Physics Letters. 74: 156-158 |